{"id":"https://openalex.org/W2072136654","doi":"https://doi.org/10.1002/scj.4690260302","title":"Multiple fault diagnosis in combinational circuits using sensitizing input\u2010pairs","display_name":"Multiple fault diagnosis in combinational circuits using sensitizing input\u2010pairs","publication_year":1995,"publication_date":"1995-01-01","ids":{"openalex":"https://openalex.org/W2072136654","doi":"https://doi.org/10.1002/scj.4690260302","mag":"2072136654"},"language":"en","primary_location":{"id":"doi:10.1002/scj.4690260302","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690260302","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089518349","display_name":"N. Yanagida","orcid":null},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Nobuhiro Yanagida","raw_affiliation_strings":["Faculty of Engineering, Ehime University, Matsuyama, Japan 790","Nobuhiro Yanagida received his B.E. and M.E. degrees in Computer Science from Ehime University, Matsuyama, Japan in 1992 and 1994, respectively. Currently, he is a Ph.D. candidate in System Engineering, Ehime University. His research interests are fault diagnosis and test generation"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Ehime University, Matsuyama, Japan 790","institution_ids":["https://openalex.org/I43545212"]},{"raw_affiliation_string":"Nobuhiro Yanagida received his B.E. and M.E. degrees in Computer Science from Ehime University, Matsuyama, Japan in 1992 and 1994, respectively. Currently, he is a Ph.D. candidate in System Engineering, Ehime University. His research interests are fault diagnosis and test generation","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101529866","display_name":"Hiroshi Takahashi","orcid":"https://orcid.org/0000-0002-3654-6457"},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroshi Takahashi","raw_affiliation_strings":["Faculty of Engineering, Ehime University, Matsuyama, Japan 790","Hiroshi Takahashi received his B.E. and M.E. degrees in Electronics Engineering from Saga University, Saga, Japan in 1988 and 1990, respectively. Later, he received his Ph.D. Since 1990 he has been an Assistant Professor in the Department of Computer Science, Ehime University. His research interests are fault diagnosis and test generation. He is a member of the IPS"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Ehime University, Matsuyama, Japan 790","institution_ids":["https://openalex.org/I43545212"]},{"raw_affiliation_string":"Hiroshi Takahashi received his B.E. and M.E. degrees in Electronics Engineering from Saga University, Saga, Japan in 1988 and 1990, respectively. Later, he received his Ph.D. Since 1990 he has been an Assistant Professor in the Department of Computer Science, Ehime University. His research interests are fault diagnosis and test generation. He is a member of the IPS","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110073346","display_name":"Yuzo Takamatsu","orcid":null},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuzo Takamatsu","raw_affiliation_strings":["Faculty of Engineering, Ehime University, Matsuyama, Japan 790","Yuzo Takamatsu received his B.E. degree in Electrical Engineering from Ehime University, Matsuyama, Japan in 1966 and his Ph.D. degree from Osaka University, Osaka, Japan in 1976. From 1967 he was an Assistant Professor and from 1975 to 1987 he was an Associate Professor in the Department of Electronic Engineering, Saga University. Since 1987 he has been a Professor in the Department of Computer Science, Ehime University. His research interests are switching theory, logical design, fault diagnosis, and test generation. Dr. Takamatsu is a member of the IEEE and IPS"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Ehime University, Matsuyama, Japan 790","institution_ids":["https://openalex.org/I43545212"]},{"raw_affiliation_string":"Yuzo Takamatsu received his B.E. degree in Electrical Engineering from Ehime University, Matsuyama, Japan in 1966 and his Ph.D. degree from Osaka University, Osaka, Japan in 1976. From 1967 he was an Assistant Professor and from 1975 to 1987 he was an Associate Professor in the Department of Electronic Engineering, Saga University. Since 1987 he has been a Professor in the Department of Computer Science, Ehime University. His research interests are switching theory, logical design, fault diagnosis, and test generation. Dr. Takamatsu is a member of the IEEE and IPS","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5089518349"],"corresponding_institution_ids":["https://openalex.org/I43545212"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.16379554,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"26","issue":"3","first_page":"17","last_page":"29"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.834610641002655},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.7021560668945312},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6780948638916016},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.6158617734909058},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6150205731391907},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5945540070533752},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5819382667541504},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5167721509933472},{"id":"https://openalex.org/keywords/partition","display_name":"Partition (number theory)","score":0.5105980038642883},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.45753270387649536},{"id":"https://openalex.org/keywords/test-set","display_name":"Test set","score":0.4392608106136322},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.43314486742019653},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.4328271448612213},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3966500163078308},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3256085216999054},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2566610872745514},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1352025270462036},{"id":"https://openalex.org/keywords/combinatorics","display_name":"Combinatorics","score":0.09815019369125366},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.09619173407554626}],"concepts":[{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.834610641002655},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.7021560668945312},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6780948638916016},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.6158617734909058},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6150205731391907},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5945540070533752},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5819382667541504},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5167721509933472},{"id":"https://openalex.org/C42812","wikidata":"https://www.wikidata.org/wiki/Q1082910","display_name":"Partition (number theory)","level":2,"score":0.5105980038642883},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.45753270387649536},{"id":"https://openalex.org/C169903167","wikidata":"https://www.wikidata.org/wiki/Q3985153","display_name":"Test set","level":2,"score":0.4392608106136322},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.43314486742019653},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.4328271448612213},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3966500163078308},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3256085216999054},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2566610872745514},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1352025270462036},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.09815019369125366},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.09619173407554626},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/scj.4690260302","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690260302","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1907242073","https://openalex.org/W2001482367","https://openalex.org/W2021463588","https://openalex.org/W2033631420","https://openalex.org/W2107944635","https://openalex.org/W2122516313","https://openalex.org/W2142690547","https://openalex.org/W2149910123","https://openalex.org/W2164564825","https://openalex.org/W2165247104","https://openalex.org/W2796880069","https://openalex.org/W4233482225","https://openalex.org/W4236231374"],"related_works":["https://openalex.org/W2340957901","https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W3147038789","https://openalex.org/W2068571131","https://openalex.org/W1555400249","https://openalex.org/W2115005577","https://openalex.org/W2092357065","https://openalex.org/W2913077774","https://openalex.org/W1493811107"],"abstract_inverted_index":{"Abstract":[0],"This":[1],"paper":[2,44],"presents":[3],"a":[4,20,28,63,68,72,75,105,111,118],"new":[5],"method":[6,30,76,123],"for":[7,31,79,104],"multiple":[8,80],"fault":[9,81],"diagnosis":[10,82],"of":[11,19,38,47,110,150],"combinational":[12],"circuits":[13,26,128],"using":[14],"sensitizing":[15,48,52,64,69],"input\u2010pairs.":[16],"A":[17,99],"partition":[18],"circuit":[21,86,113],"under":[22],"test":[23,33],"into":[24],"subtree":[25,73,85,112],"and":[27,71,91,134,154],"generation":[29],"diagnostic":[32,39],"are":[34,143],"described.":[35],"The":[36,121],"set":[37],"tests":[40],"used":[41],"in":[42,83,160],"this":[43],"is":[45,77,102,124],"one":[46],"input\u2010pairs":[49],"that":[50,140],"generate":[51],"paths":[53],"including":[54],"checkpoints":[55],"on":[56,88,157],"them.":[57],"By":[58],"studying":[59],"the":[60,84,89,92,161],"relation":[61],"between":[62],"path":[65],"generated":[66],"by":[67],"input\u2010pair":[70],"circuit,":[74],"presented":[78],"based":[87],"fault\u2010free":[90],"faulty":[93],"responses":[94],"observed":[95],"at":[96,107],"primary":[97,119],"outputs.":[98],"deduction":[100],"algorithm":[101],"described":[103],"value":[106],"an":[108],"output":[109],"which":[114],"does":[115],"not":[116],"have":[117],"output.":[120],"proposed":[122],"applied":[125],"to":[126,147],"benchmark":[127],"having":[129],"double":[130],"faults,":[131,133],"triple":[132],"fourfold":[135],"faults.":[136],"Experimental":[137],"results":[138],"show":[139],"suspected":[141],"faults":[142,156],"identified":[144],"within":[145],"8":[146],"30":[148],"percent":[149],"all":[151,158],"stuck\u2010at":[152],"0":[153],"1":[155],"lines":[159],"circuit.":[162]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}