{"id":"https://openalex.org/W1969776553","doi":"https://doi.org/10.1002/scj.4690240502","title":"A test\u2010path determination method based on define\u2010use chains: Test conditions and program fault overlooks","display_name":"A test\u2010path determination method based on define\u2010use chains: Test conditions and program fault overlooks","publication_year":1993,"publication_date":"1993-01-01","ids":{"openalex":"https://openalex.org/W1969776553","doi":"https://doi.org/10.1002/scj.4690240502","mag":"1969776553"},"language":"en","primary_location":{"id":"doi:10.1002/scj.4690240502","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690240502","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5109520138","display_name":"Takeshi Nakajo","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},{"id":"https://openalex.org/I96679780","display_name":"Chuo University","ror":"https://ror.org/03qvqb743","country_code":"JP","type":"education","lineage":["https://openalex.org/I96679780"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takeshi Nakajo","raw_affiliation_strings":["Faculty of Science and Engineering, Chuo University, Tokyo, Japan 112","Takeshi Nakajo graduated in 1979 from Department of Reaction Chemistry, Faculty of Engineering, University of Tokyo and received the Doctor of Engineering degree in 1986 from the same university. He was an Assistant at Faculty of Engineering, the University of Tokyo from 1987 to 1991, and then a Lecturer at Faculty of Science and Engineering, Chuo University since 1991. His special field is quality control, software engineering, and system engineering. He is a member of the Japanese Society of Quality Control, the Information Processing Society of Japan, and the IEEE Computer Society"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Science and Engineering, Chuo University, Tokyo, Japan 112","institution_ids":["https://openalex.org/I96679780"]},{"raw_affiliation_string":"Takeshi Nakajo graduated in 1979 from Department of Reaction Chemistry, Faculty of Engineering, University of Tokyo and received the Doctor of Engineering degree in 1986 from the same university. He was an Assistant at Faculty of Engineering, the University of Tokyo from 1987 to 1991, and then a Lecturer at Faculty of Science and Engineering, Chuo University since 1991. His special field is quality control, software engineering, and system engineering. He is a member of the Japanese Society of Quality Control, the Information Processing Society of Japan, and the IEEE Computer Society","institution_ids":["https://openalex.org/I74801974","https://openalex.org/I96679780"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002605508","display_name":"Ichiro Yamaguchi","orcid":null},"institutions":[{"id":"https://openalex.org/I4210165591","display_name":"Network Group (Czechia)","ror":"https://ror.org/055hmgs82","country_code":"CZ","type":"company","lineage":["https://openalex.org/I4210165591"]},{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["CZ","JP"],"is_corresponding":false,"raw_author_name":"Ichiro Yamaguchi","raw_affiliation_strings":["Ichiro Yamaguchi graduated in 1988 from Department of Reaction Chemistry, Faculty of engineering University of Tokyo and received a Master of Engineering degree in 1990 from the same university. He joined TG Information Network Co. Ltd. in 1990 and has been engaged in the development of AI systems. During the period of attendance at the university, he was engaged in research on software testing. He is a member of the Japanese Society of Quality Control","System Technology Dept., TG Information Network, Co. Ltd., Chiba, Japan 260"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ichiro Yamaguchi graduated in 1988 from Department of Reaction Chemistry, Faculty of engineering University of Tokyo and received a Master of Engineering degree in 1990 from the same university. He joined TG Information Network Co. Ltd. in 1990 and has been engaged in the development of AI systems. During the period of attendance at the university, he was engaged in research on software testing. He is a member of the Japanese Society of Quality Control","institution_ids":["https://openalex.org/I4210165591","https://openalex.org/I74801974"]},{"raw_affiliation_string":"System Technology Dept., TG Information Network, Co. Ltd., Chiba, Japan 260","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5109921106","display_name":"Hitoshi Kume","orcid":null},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hitoshi Kume","raw_affiliation_strings":["Faculty of Engineering, The University of Tokyo, Tokyo, Japan 113","Hitoshi Kume graduated in 1960 from Department of Chemical Engineering, Faculty of Engineering, University of Tokyo and received the Doctor of Engineering in 1965 from the same university. He was an Associate Professor at Faculty of Engineering, Seikei University of Tokyo from 1965 to 1974, an Associate Professor at Faculty of Engineering, University of Tokyo from 1974 to 1980, and then a Professor there since 1980. His special field is quality control and statistical methods. He is a member of the Japanese Society of Quality Control and the American Society for Quality Control"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, The University of Tokyo, Tokyo, Japan 113","institution_ids":["https://openalex.org/I74801974"]},{"raw_affiliation_string":"Hitoshi Kume graduated in 1960 from Department of Chemical Engineering, Faculty of Engineering, University of Tokyo and received the Doctor of Engineering in 1965 from the same university. He was an Associate Professor at Faculty of Engineering, Seikei University of Tokyo from 1965 to 1974, an Associate Professor at Faculty of Engineering, University of Tokyo from 1974 to 1980, and then a Professor there since 1980. His special field is quality control and statistical methods. He is a member of the Japanese Society of Quality Control and the American Society for Quality Control","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.632,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.72133758,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"24","issue":"5","first_page":"14","last_page":"29"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10743","display_name":"Software Testing and Debugging Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14025","display_name":"Educational Technology and Assessment","score":0.9854999780654907,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6996263265609741},{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.6499577760696411},{"id":"https://openalex.org/keywords/path","display_name":"Path (computing)","score":0.6215238571166992},{"id":"https://openalex.org/keywords/selection","display_name":"Selection (genetic algorithm)","score":0.5995151400566101},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.590577244758606},{"id":"https://openalex.org/keywords/principal","display_name":"Principal (computer security)","score":0.5668604969978333},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.556937575340271},{"id":"https://openalex.org/keywords/test","display_name":"Test (biology)","score":0.5531948804855347},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5260381698608398},{"id":"https://openalex.org/keywords/white-box-testing","display_name":"White-box testing","score":0.471659779548645},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.42255374789237976},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.4124566614627838},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.37765902280807495},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.34354108572006226},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.17634403705596924},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.15447410941123962},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.12570375204086304},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.10707393288612366}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6996263265609741},{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.6499577760696411},{"id":"https://openalex.org/C2777735758","wikidata":"https://www.wikidata.org/wiki/Q817765","display_name":"Path (computing)","level":2,"score":0.6215238571166992},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.5995151400566101},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.590577244758606},{"id":"https://openalex.org/C144559511","wikidata":"https://www.wikidata.org/wiki/Q2986279","display_name":"Principal (computer security)","level":2,"score":0.5668604969978333},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.556937575340271},{"id":"https://openalex.org/C2777267654","wikidata":"https://www.wikidata.org/wiki/Q3519023","display_name":"Test (biology)","level":2,"score":0.5531948804855347},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5260381698608398},{"id":"https://openalex.org/C162443782","wikidata":"https://www.wikidata.org/wiki/Q1066228","display_name":"White-box testing","level":5,"score":0.471659779548645},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.42255374789237976},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.4124566614627838},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.37765902280807495},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.34354108572006226},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.17634403705596924},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.15447410941123962},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.12570375204086304},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.10707393288612366},{"id":"https://openalex.org/C151730666","wikidata":"https://www.wikidata.org/wiki/Q7205","display_name":"Paleontology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/scj.4690240502","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690240502","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.47999998927116394}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W1985551847","https://openalex.org/W2100890245","https://openalex.org/W2121669067","https://openalex.org/W2124019729"],"related_works":["https://openalex.org/W2378076731","https://openalex.org/W4286888643","https://openalex.org/W3210795196","https://openalex.org/W236190221","https://openalex.org/W2379779959","https://openalex.org/W2333822231","https://openalex.org/W2088988140","https://openalex.org/W2803103875","https://openalex.org/W2103019253","https://openalex.org/W2394141650"],"abstract_inverted_index":{"Abstract":[0],"When":[1],"selecting":[2],"the":[3,25,30,41,47,64,78,91,102,106,125,146,151,171,179,191,196],"set":[4],"of":[5,14,20,43,49,67,105,110,127,138,161,167,186,190],"conditions":[6,74,95],"to":[7,46,89,134,144],"be":[8],"tested":[9,119],"in":[10,63,170,178],"modular":[11],"white\u2010box":[12],"testing":[13,80],"fundamental":[15],"program":[16,50,57,97,107],"functions,":[17],"various":[18],"kinds":[19],"criteria":[21,45],"are":[22,132,157],"available,":[23],"including":[24],"branch":[26],"coverage":[27],"criterion":[28],"and":[29,52,96,150,154,182],"all\u2010uses":[31,180],"criterion.":[32],"But":[33],"there":[34],"has":[35],"been":[36,60],"very":[37],"little":[38],"research":[39],"on":[40,120],"relationship":[42,92],"these":[44],"overlooking":[48],"faults,":[51],"as":[53,108,143],"a":[54,136],"consequence":[55],"many":[56],"faults":[58],"have":[59],"discovered":[61],"only":[62],"later":[65],"phases":[66],"development":[68],"or":[69],"at":[70],"customer":[71],"sites,":[72],"where":[73],"not":[75],"covered":[76],"by":[77,100],"original":[79],"occurred.":[81],"In":[82],"this":[83],"paper,":[84],"an":[85],"attempt":[86],"is":[87,118,174,184],"made":[88],"identify":[90],"between":[93,113],"test":[94,140,200],"fault":[98],"overlooks":[99,192],"expressing":[101],"data":[103],"flows":[104],"chains":[109],"define\u2010use":[111],"relationships":[112],"two":[114],"variables.":[115],"The":[116,130,165],"approach":[117],"commercial":[121],"software":[122],"products":[123],"for":[124,199],"control":[126],"measuring":[128],"equipment.":[129],"results":[131],"used":[133,198],"develop":[135],"method":[137,173,197],"choosing":[139],"paths":[141],"so":[142],"prevent":[145],"principal":[147],"overlook":[148],"types,":[149],"detection":[152],"ability":[153],"computational":[155],"efficiency":[156],"compared":[158],"with":[159,176],"those":[160],"conventional":[162],"selection":[163],"criteria.":[164],"number":[166],"tests":[168],"required":[169],"new":[172],"comparable":[175],"that":[177,193],"method,":[181],"it":[183],"capable":[185],"preventing":[187],"almost":[188],"all":[189],"arise":[194],"from":[195],"path":[201],"selection.":[202]},"counts_by_year":[{"year":2013,"cited_by_count":1}],"updated_date":"2026-06-23T06:36:01.041984","created_date":"2025-10-10T00:00:00"}