{"id":"https://openalex.org/W2085795272","doi":"https://doi.org/10.1002/scj.4690230908","title":"High\u2010speed template matching algorithm using information of contour points","display_name":"High\u2010speed template matching algorithm using information of contour points","publication_year":1992,"publication_date":"1992-01-01","ids":{"openalex":"https://openalex.org/W2085795272","doi":"https://doi.org/10.1002/scj.4690230908","mag":"2085795272"},"language":"en","primary_location":{"id":"doi:10.1002/scj.4690230908","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690230908","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036190639","display_name":"Manabu Hashimoto","orcid":"https://orcid.org/0000-0001-9909-3531"},"institutions":[{"id":"https://openalex.org/I1245340","display_name":"Mitsubishi Heavy Industries (Germany)","ror":"https://ror.org/043tqah33","country_code":"DE","type":"company","lineage":["https://openalex.org/I1245340","https://openalex.org/I1306287861","https://openalex.org/I4210117815"]},{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["DE","JP"],"is_corresponding":false,"raw_author_name":"Manabu Hashimoto","raw_affiliation_strings":["Industrial Electronics and Systems Laboratory, Mitsubishi Electric Corporation, Amagasaki, Japan 661","Manabu Hashimoto received a B.E. and an M.E. in Welding Engineering from Osaka University in 1985and 1987, respectively. In 1987 he joined the Manufacturing Development Laboratory of MitsubishiElectric Corporation, and since 1989 he has been working for the Industrial Electronics and SystemsLaboratory. He has been engaged in research on machine vision systems and on the development ofautomated systems. He is a member of the Institute of Electronics, Information , and CommunicationEngineers of Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Electronics and Systems Laboratory, Mitsubishi Electric Corporation, Amagasaki, Japan 661","institution_ids":["https://openalex.org/I4210133125"]},{"raw_affiliation_string":"Manabu Hashimoto received a B.E. and an M.E. in Welding Engineering from Osaka University in 1985and 1987, respectively. In 1987 he joined the Manufacturing Development Laboratory of MitsubishiElectric Corporation, and since 1989 he has been working for the Industrial Electronics and SystemsLaboratory. He has been engaged in research on machine vision systems and on the development ofautomated systems. He is a member of the Institute of Electronics, Information , and CommunicationEngineers of Japan","institution_ids":["https://openalex.org/I1245340"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100620014","display_name":"Kazuhiko Sumi","orcid":"https://orcid.org/0000-0002-9165-5912"},"institutions":[{"id":"https://openalex.org/I39854257","display_name":"Mitsubishi Electric (Germany)","ror":"https://ror.org/04ccqwj03","country_code":"DE","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I39854257","https://openalex.org/I4210133125"]},{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]},{"id":"https://openalex.org/I4210159266","display_name":"Mitsubishi Electric (United States)","ror":"https://ror.org/053jnhe44","country_code":"US","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125","https://openalex.org/I4210159266"]}],"countries":["DE","JP","US"],"is_corresponding":false,"raw_author_name":"Kazuhiko Sumi","raw_affiliation_strings":["Industrial Electronics and Systems Laboratory, Mitsubishi Electric Corporation, Amagasaki, Japan 661","Kanihiko Sumi received a B.E. and an M.E. in Electrical Engineering from Kyoto University in 1982 and 1984, respectively. Since 1984 he has been engaged in research and development of industrial vision system in Mitsubishi Electric Corp. During 1989 and 1990, he was at the Center for Automation Research, University of Maryland, as Visiting Research Assistant. Currently, he is a member of the Industrial Electronics and Systems Laboratory, Mitsubishi Electric Corp"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Electronics and Systems Laboratory, Mitsubishi Electric Corporation, Amagasaki, Japan 661","institution_ids":["https://openalex.org/I4210133125"]},{"raw_affiliation_string":"Kanihiko Sumi received a B.E. and an M.E. in Electrical Engineering from Kyoto University in 1982 and 1984, respectively. Since 1984 he has been engaged in research and development of industrial vision system in Mitsubishi Electric Corp. During 1989 and 1990, he was at the Center for Automation Research, University of Maryland, as Visiting Research Assistant. Currently, he is a member of the Industrial Electronics and Systems Laboratory, Mitsubishi Electric Corp","institution_ids":["https://openalex.org/I39854257","https://openalex.org/I4210159266"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022042419","display_name":"Yoshikazu Sakaue","orcid":null},"institutions":[{"id":"https://openalex.org/I39854257","display_name":"Mitsubishi Electric (Germany)","ror":"https://ror.org/04ccqwj03","country_code":"DE","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I39854257","https://openalex.org/I4210133125"]},{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]}],"countries":["DE","JP"],"is_corresponding":false,"raw_author_name":"Yoshikazu Sakaue","raw_affiliation_strings":["Industrial Electronics and Systems Laboratory, Mitsubishi Electric Corporation, Amagasaki, Japan 661","Yoshikazu Sakuae graduated in 1957 from Hiroshima Prefectural Fukuyama Technical High School. He joined Mitsubishi Electric Corporation in 1957. He was engaged in research and development of automated systems in the Manufacturing Development Laboratory and Industrial Electronics and Systems Laboratory. He also has been engaged in development of inspection system using vision at the company's Kitaitami Works. He is a member of the Institute of Electrical Engineers of Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Electronics and Systems Laboratory, Mitsubishi Electric Corporation, Amagasaki, Japan 661","institution_ids":["https://openalex.org/I4210133125"]},{"raw_affiliation_string":"Yoshikazu Sakuae graduated in 1957 from Hiroshima Prefectural Fukuyama Technical High School. He joined Mitsubishi Electric Corporation in 1957. He was engaged in research and development of automated systems in the Manufacturing Development Laboratory and Industrial Electronics and Systems Laboratory. He also has been engaged in development of inspection system using vision at the company's Kitaitami Works. He is a member of the Institute of Electrical Engineers of Japan","institution_ids":["https://openalex.org/I39854257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112076527","display_name":"Shinjiro Kawato","orcid":null},"institutions":[{"id":"https://openalex.org/I36253440","display_name":"IEEE Computer Society","ror":"https://ror.org/05nxk6n24","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I36253440"]},{"id":"https://openalex.org/I4210110781","display_name":"ARCH Development Corporation","ror":"https://ror.org/021wdzv30","country_code":"US","type":"nonprofit","lineage":["https://openalex.org/I4210110781"]},{"id":"https://openalex.org/I4210133125","display_name":"Mitsubishi Electric (Japan)","ror":"https://ror.org/033y26782","country_code":"JP","type":"company","lineage":["https://openalex.org/I1306287861","https://openalex.org/I4210133125"]},{"id":"https://openalex.org/I4387930200","display_name":"Information Processing Society of Japan","ror":"https://ror.org/02v970d04","country_code":null,"type":"nonprofit","lineage":["https://openalex.org/I4387930200"]}],"countries":["JP","US"],"is_corresponding":false,"raw_author_name":"Shinjiro Kawato","raw_affiliation_strings":["Industrial Electronics and Systems Laboratory, Mitsubishi Electric Corporation, Amagasaki, Japan 661","Shinjiro Kawato received a B.E. and an M.E. from Nagoya Institute of Technology and from Osaka University in Japan in 1970 and 1972, respectively. He joined the Manufacturing Development Laboratory of Mitsubishi Electric Corporation in 1972 and was engaged in research and development of industrial vision systems. Since 1991, he has been with the ATR Auditory and Visual Perception Research Laboratories, Kyoto, Japan, where he is currently a Senior. Researcher. His current interest is on3-D computer vision theory based on multiple images. He is a member of the Institute of Electronics, Information and Communication Engineers, Japan; the Information ProcesSing Society of Japan; the Society of Instrument and Control Engineers; and the IEEE Computer Society","Shinjiro Kawato received a B.E. and an M.E. from Nagoya Institute of Technology and from Osaka University in Japan in 1970 and 1972, respectively. He joined the Manufacturing Development Laboratory of Mitsubishi Electric Corporation in 1972 and was engaged in research and development of industrial vision systems. Since 1991, he has been with the ATR Auditory and Visual Perception Research Laboratories, Kyoto, Japan, where he is currently a Senior. Researcher. His current interest is on3-D computer vision theory based on multiple images. He is a member of the Institute of Electronics, Information and Communication Engineers, Japan","the IEEE Computer Society","the Information ProcesSing Society of Japan","the Society of Instrument and Control Engineers"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Industrial Electronics and Systems Laboratory, Mitsubishi Electric Corporation, Amagasaki, Japan 661","institution_ids":["https://openalex.org/I4210133125"]},{"raw_affiliation_string":"Shinjiro Kawato received a B.E. and an M.E. from Nagoya Institute of Technology and from Osaka University in Japan in 1970 and 1972, respectively. He joined the Manufacturing Development Laboratory of Mitsubishi Electric Corporation in 1972 and was engaged in research and development of industrial vision systems. Since 1991, he has been with the ATR Auditory and Visual Perception Research Laboratories, Kyoto, Japan, where he is currently a Senior. Researcher. His current interest is on3-D computer vision theory based on multiple images. He is a member of the Institute of Electronics, Information and Communication Engineers, Japan; the Information ProcesSing Society of Japan; the Society of Instrument and Control Engineers; and the IEEE Computer Society","institution_ids":["https://openalex.org/I4210110781"]},{"raw_affiliation_string":"Shinjiro Kawato received a B.E. and an M.E. from Nagoya Institute of Technology and from Osaka University in Japan in 1970 and 1972, respectively. He joined the Manufacturing Development Laboratory of Mitsubishi Electric Corporation in 1972 and was engaged in research and development of industrial vision systems. Since 1991, he has been with the ATR Auditory and Visual Perception Research Laboratories, Kyoto, Japan, where he is currently a Senior. Researcher. His current interest is on3-D computer vision theory based on multiple images. He is a member of the Institute of Electronics, Information and Communication Engineers, Japan","institution_ids":["https://openalex.org/I4210133125"]},{"raw_affiliation_string":"the IEEE Computer Society","institution_ids":["https://openalex.org/I36253440"]},{"raw_affiliation_string":"the Information ProcesSing Society of Japan","institution_ids":["https://openalex.org/I4387930200"]},{"raw_affiliation_string":"the Society of Instrument and Control Engineers","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":7,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4937,"has_fulltext":false,"cited_by_count":12,"citation_normalized_percentile":{"value":0.70546364,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"23","issue":"9","first_page":"78","last_page":"87"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10052","display_name":"Medical Image Segmentation Techniques","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10052","display_name":"Medical Image Segmentation Techniques","score":0.9965000152587891,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":0.9919000267982483,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.984499990940094,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/template-matching","display_name":"Template matching","score":0.781043529510498},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.648168683052063},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6075233221054077},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.605040431022644},{"id":"https://openalex.org/keywords/template","display_name":"Template","score":0.5744206309318542},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5479152798652649},{"id":"https://openalex.org/keywords/matching","display_name":"Matching (statistics)","score":0.5309600234031677},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.5026247501373291},{"id":"https://openalex.org/keywords/dilation","display_name":"Dilation (metric space)","score":0.4966793656349182},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.4475720524787903},{"id":"https://openalex.org/keywords/pattern-recognition","display_name":"Pattern recognition (psychology)","score":0.43579787015914917},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.4161273241043091},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2660284638404846}],"concepts":[{"id":"https://openalex.org/C158096908","wikidata":"https://www.wikidata.org/wiki/Q3983303","display_name":"Template matching","level":3,"score":0.781043529510498},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.648168683052063},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6075233221054077},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.605040431022644},{"id":"https://openalex.org/C82714645","wikidata":"https://www.wikidata.org/wiki/Q438331","display_name":"Template","level":2,"score":0.5744206309318542},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5479152798652649},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.5309600234031677},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.5026247501373291},{"id":"https://openalex.org/C2780757906","wikidata":"https://www.wikidata.org/wiki/Q5276676","display_name":"Dilation (metric space)","level":2,"score":0.4966793656349182},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.4475720524787903},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.43579787015914917},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.4161273241043091},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2660284638404846},{"id":"https://openalex.org/C114614502","wikidata":"https://www.wikidata.org/wiki/Q76592","display_name":"Combinatorics","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/scj.4690230908","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690230908","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1622620102","https://openalex.org/W1832233747","https://openalex.org/W2058794845","https://openalex.org/W2077467789","https://openalex.org/W2163009106","https://openalex.org/W3081727571","https://openalex.org/W6636620950"],"related_works":["https://openalex.org/W2361315595","https://openalex.org/W2602219756","https://openalex.org/W2092361839","https://openalex.org/W2360986010","https://openalex.org/W2383447469","https://openalex.org/W1605702723","https://openalex.org/W2371197140","https://openalex.org/W2172130785","https://openalex.org/W2089779414","https://openalex.org/W9684605"],"abstract_inverted_index":{"Abstract":[0],"Template":[1],"matching":[2,8,16,133],"is":[3,19,115,123,174],"a":[4,13],"useful":[5],"technique":[6,17,134],"for":[7,21],"images.":[9,102],"This":[10,148],"paper":[11],"proposes":[12],"high\u2010speed":[14],"template":[15,92,132,143],"which":[18,135],"effective":[20],"images":[22,163],"that":[23,120],"have":[24],"sharp":[25],"contours.":[26],"The":[27,84,103],"method":[28,113],"uses":[29,136],"only":[30],"the":[31,44,80,91,94,99,107,121,130,137,145,168,171],"image":[32,96],"contour":[33,64,81],"parts":[34],"as":[35],"one\u2010dimensional":[36],"templates.":[37],"Although":[38],"it":[39],"can":[40,72,87,156],"retain":[41],"fine":[42],"patterns,":[43],"data":[45],"compression":[46],"ratio":[47],"and":[48,61,93,144],"speed":[49],"are":[50,66],"very":[51],"high.":[52],"To":[53],"improve":[54],"reliability":[55],"of":[56,63,70,79,101,170],"matching,":[57],"gray":[58],"gradient":[59],"information":[60],"intensity":[62],"points":[65],"used.":[67],"Also,":[68],"dilation":[69],"contours":[71],"reduce":[73],"several":[74],"errors":[75],"due":[76],"to":[77,152],"disturbance":[78],"or":[82,125],"scaling.":[83],"algorithm":[85,105,111,122,149],"herein":[86],"indicate":[88],"differences":[89],"between":[90,140],"target":[95,146],"automatically":[97],"after":[98],"alignment":[100],"expanded":[104],"applying":[106],"sequential":[108],"similarity":[109],"detection":[110],"(SSDA)":[112],"also":[114],"discussed.":[116],"Software":[117],"simulation":[118],"proved":[119],"10":[124],"200":[126],"times":[127],"faster":[128],"than":[129],"conventional":[131],"cross\u2010correlation":[138],"estimation":[139],"two\u2010dimensional":[141],"(2\u2010D)":[142],"image.":[147],"was":[150],"applied":[151],"special":[153],"hardware.":[154],"It":[155],"align":[157],"two":[158],"512":[159,161],"\u00d7":[160,176],"pixels":[162],"in":[164],"40":[165],"ms":[166],"when":[167],"size":[169],"search":[172],"area":[173],"64":[175],"64.":[177]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":2},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-28T07:46:37.118299","created_date":"2025-10-10T00:00:00"}