{"id":"https://openalex.org/W1988407149","doi":"https://doi.org/10.1002/scj.4690221003","title":"Fault detection of ttl combinational circuits based on supply current","display_name":"Fault detection of ttl combinational circuits based on supply current","publication_year":1991,"publication_date":"1991-01-01","ids":{"openalex":"https://openalex.org/W1988407149","doi":"https://doi.org/10.1002/scj.4690221003","mag":"1988407149"},"language":"en","primary_location":{"id":"doi:10.1002/scj.4690221003","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690221003","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052190532","display_name":"Masaki Hashizume","orcid":null},"institutions":[{"id":"https://openalex.org/I922474255","display_name":"Tokushima University","ror":"https://ror.org/044vy1d05","country_code":"JP","type":"education","lineage":["https://openalex.org/I922474255"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Masaki Hashizume","raw_affiliation_strings":["Faculty of Engineering, Tokushima University, Tokushima, Japan 770","Masaki Hashizume graduated in 1979 from the Dept. Electrical Eng., Fac. Eng., Tokushima University, where he obtained a Master's degree in 1981 and affiliated with NTT. He was an Assistant in 1983 at the Tech. College, Tokushima University; Assistantin 1990 on the Fac.Eng., Tokushima University. He is engaged in research on CAD for design of logic circuits and fault diagnosis of logic circuits","Masaki Hashizume graduated in 1979 from the Dept. Electrical Eng., Fac. Eng., Tokushima University, where he obtained a Master's degree in 1981 and affiliated with NTT. He was an Assistant in 1983 at the Tech. College, Tokushima University","Assistantin 1990 on the Fac.Eng., Tokushima University. He is engaged in research on CAD for design of logic circuits and fault diagnosis of logic circuits"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Tokushima University, Tokushima, Japan 770","institution_ids":["https://openalex.org/I922474255"]},{"raw_affiliation_string":"Masaki Hashizume graduated in 1979 from the Dept. Electrical Eng., Fac. Eng., Tokushima University, where he obtained a Master's degree in 1981 and affiliated with NTT. He was an Assistant in 1983 at the Tech. College, Tokushima University; Assistantin 1990 on the Fac.Eng., Tokushima University. He is engaged in research on CAD for design of logic circuits and fault diagnosis of logic circuits","institution_ids":[]},{"raw_affiliation_string":"Masaki Hashizume graduated in 1979 from the Dept. Electrical Eng., Fac. Eng., Tokushima University, where he obtained a Master's degree in 1981 and affiliated with NTT. He was an Assistant in 1983 at the Tech. College, Tokushima University","institution_ids":["https://openalex.org/I922474255"]},{"raw_affiliation_string":"Assistantin 1990 on the Fac.Eng., Tokushima University. He is engaged in research on CAD for design of logic circuits and fault diagnosis of logic circuits","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5010434727","display_name":"Takeorai Tamesada","orcid":null},"institutions":[{"id":"https://openalex.org/I922474255","display_name":"Tokushima University","ror":"https://ror.org/044vy1d05","country_code":"JP","type":"education","lineage":["https://openalex.org/I922474255"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takeorai Tamesada","raw_affiliation_strings":["Faculty of Engineering, Tokushima University, Tokushima, Japan 770","Takeomi Tamesada graduated in 1963 from the Dept. Electrical Eng., Fac. Eng., Tokushima University, where he obtained a Master's degree in Electrical Eng. in 1966 and a Dr. of Eng. degree from Kyoto University. He was an Assistant in the Dept. Electrical Eng., Tokushima University, an Assistant, Lecturer and Assoc. Prof. in the Dept. Electronic Eng., Tokushima University, and is presently a Prof. of Elect. Eng. Systems, Dept. Elect. Eng., Tokushima University. H i s major areas of research are transition mechanism and analysis of flip-flop, tri-phase,and multiphase multivibrator, sequential circuit with quasi-stable state, control ofelectrically powered prosthetic hand, prediction and therapy of spinal side curvature by evoked electromyograph, multivibrator using logic gate, high-speed computation algorithms, CAD/fault diagnosis of logic systems. He is interested in CAD fault detection and analog cir- cuits and opto-electronic circuits. He is the author of five books (co-author), including Electronic Circuit I and11 (Asakura Publ. Co.) and Electronic Computer I (Asakura Publ. Co.). He is a member of IEEE"],"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Tokushima University, Tokushima, Japan 770","institution_ids":["https://openalex.org/I922474255"]},{"raw_affiliation_string":"Takeomi Tamesada graduated in 1963 from the Dept. Electrical Eng., Fac. Eng., Tokushima University, where he obtained a Master's degree in Electrical Eng. in 1966 and a Dr. of Eng. degree from Kyoto University. He was an Assistant in the Dept. Electrical Eng., Tokushima University, an Assistant, Lecturer and Assoc. Prof. in the Dept. Electronic Eng., Tokushima University, and is presently a Prof. of Elect. Eng. Systems, Dept. Elect. Eng., Tokushima University. H i s major areas of research are transition mechanism and analysis of flip-flop, tri-phase,and multiphase multivibrator, sequential circuit with quasi-stable state, control ofelectrically powered prosthetic hand, prediction and therapy of spinal side curvature by evoked electromyograph, multivibrator using logic gate, high-speed computation algorithms, CAD/fault diagnosis of logic systems. He is interested in CAD fault detection and analog cir- cuits and opto-electronic circuits. He is the author of five books (co-author), including Electronic Circuit I and11 (Asakura Publ. Co.) and Electronic Computer I (Asakura Publ. Co.). He is a member of IEEE","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5052190532"],"corresponding_institution_ids":["https://openalex.org/I922474255"],"apc_list":null,"apc_paid":null,"fwci":0.6783,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.72833638,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"22","issue":"10","first_page":"18","last_page":"29"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9896000027656555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.7281783819198608},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.6440359950065613},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6394550800323486},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6382290720939636},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.6029436588287354},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.5404828786849976},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5240897536277771},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.4679628312587738},{"id":"https://openalex.org/keywords/fault-indicator","display_name":"Fault indicator","score":0.4618699848651886},{"id":"https://openalex.org/keywords/current","display_name":"Current (fluid)","score":0.45563948154449463},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.41022342443466187},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38842636346817017},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3851583003997803},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.3447723388671875},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24001219868659973},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.19235661625862122},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.16913899779319763},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07237297296524048}],"concepts":[{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.7281783819198608},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.6440359950065613},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6394550800323486},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6382290720939636},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6029436588287354},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.5404828786849976},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5240897536277771},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.4679628312587738},{"id":"https://openalex.org/C21267803","wikidata":"https://www.wikidata.org/wiki/Q5438159","display_name":"Fault indicator","level":4,"score":0.4618699848651886},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.45563948154449463},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.41022342443466187},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38842636346817017},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3851583003997803},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3447723388671875},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24001219868659973},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.19235661625862122},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.16913899779319763},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07237297296524048},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C554190296","wikidata":"https://www.wikidata.org/wiki/Q47528","display_name":"Radar","level":2,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/scj.4690221003","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690221003","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W60485908","https://openalex.org/W76884972","https://openalex.org/W122496158","https://openalex.org/W133300052","https://openalex.org/W1511344426","https://openalex.org/W1632381123","https://openalex.org/W2000839129","https://openalex.org/W2139482572","https://openalex.org/W2159892588","https://openalex.org/W2173124859"],"related_works":["https://openalex.org/W2142519941","https://openalex.org/W4246237793","https://openalex.org/W3148663848","https://openalex.org/W2024194466","https://openalex.org/W3186790058","https://openalex.org/W2051500795","https://openalex.org/W2566529656","https://openalex.org/W2163103195","https://openalex.org/W1978303825","https://openalex.org/W3171530565"],"abstract_inverted_index":{"Abstract":[0],"This":[1],"paper":[2,113],"considers":[3],"a":[4,8,28,110,124,163],"method":[5,31,50,82,117,175],"of":[6,45,88,118,138,173,195,203],"detecting":[7],"fault":[9,29,46,86,119,125,198],"in":[10,52,100],"the":[11,17,22,33,38,43,49,53,59,69,74,81,84,91,97,102,115,131,133,136,139,144,153,157,167,174,180,193,197,200,204],"TTL":[12,181],"combinational":[13,34],"circuit":[14,35],"based":[15,36,56],"on":[16,37,58],"supply":[18,39,60,76,140,145,205],"current":[19,40,61,146],"flowing":[20],"into":[21],"circuit.":[23,183],"The":[24,171],"authors":[25],"have":[26],"proposed":[27,51],"detection":[30,87],"for":[32,72,143,179,199],"and":[41,63,135],"indicated":[42],"feasibility":[44],"detection.":[47,120],"However,":[48],"past":[54],"is":[55,65,127,156,176,187],"only":[57],"waveform,":[62,147],"it":[64],"required":[66],"to":[67,79,83,161],"determine":[68],"feature":[70,103,158],"vectors":[71],"all":[73],"measured":[75],"currents.":[77],"Consequently,":[78],"apply":[80],"practical":[85],"logic":[89,182],"circuits,":[90],"computational":[92],"complexity":[93],"as":[94,96,152],"well":[95],"computation":[98],"time":[99],"determining":[101],"vector":[104,159],"should":[105],"be":[106,150],"reduced.":[107],"From":[108],"such":[109],"viewpoint,":[111],"this":[112],"proposes":[114],"following":[116],"Whether":[121],"or":[122],"not":[123],"exists":[126],"determined":[128],"first":[129],"by":[130],"average,":[132],"maximum":[134],"minimum":[137],"current.":[141,206],"Only":[142],"which":[148,189],"cannot":[149],"decided":[151],"nonfaulty":[154],"circuit,":[155],"employed":[160],"make":[162],"further":[164],"decision":[165],"using":[166],"pattern":[168,202],"recognition":[169],"technique.":[170],"effectiveness":[172],"demonstrated":[177],"experimentally":[178],"Also,":[184],"an":[185],"algorithm":[186],"presented":[188],"can":[190],"determine,":[191],"from":[192],"set":[194],"faults,":[196],"reference":[201]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}