{"id":"https://openalex.org/W2019180726","doi":"https://doi.org/10.1002/scj.4690220905","title":"Method of diagnosing single bridging faults in combinational circuit","display_name":"Method of diagnosing single bridging faults in combinational circuit","publication_year":1991,"publication_date":"1991-01-01","ids":{"openalex":"https://openalex.org/W2019180726","doi":"https://doi.org/10.1002/scj.4690220905","mag":"2019180726"},"language":"en","primary_location":{"id":"doi:10.1002/scj.4690220905","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690220905","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5084876589","display_name":"Teruhiko Yamada","orcid":null},"institutions":[{"id":"https://openalex.org/I16656306","display_name":"Meiji University","ror":"https://ror.org/02rqvrp93","country_code":"JP","type":"education","lineage":["https://openalex.org/I16656306"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Teruhiko Yamada","raw_affiliation_strings":["School of Science and Technology, Meiji University, Kawasaki, Japan 214","Teruhiko Yamada obtained a B.S. in Electrical Engineering from Himeji Institute of Technology in 1969 and an M.S. from Kyoto University i n 1971. He has a Dr . of Eng. degree. He joined Central Research Laboratory of NEC Corporation in 1971.In 1986 he became an Associate Professor onthe Faculty of Engineering of Meiji University.Since 1989 he has been an Associate Professor in the School of Sciences and Engineering, Meiji University. He has been working in the areas of logic circuit testing and LSI-CAD, and is the author of the book Theory of Logic Circuit (Morikita Publishing). He is a member of IEEE and of the Information Processing Society of Japan"],"affiliations":[{"raw_affiliation_string":"School of Science and Technology, Meiji University, Kawasaki, Japan 214","institution_ids":["https://openalex.org/I16656306"]},{"raw_affiliation_string":"Teruhiko Yamada obtained a B.S. in Electrical Engineering from Himeji Institute of Technology in 1969 and an M.S. from Kyoto University i n 1971. He has a Dr . of Eng. degree. He joined Central Research Laboratory of NEC Corporation in 1971.In 1986 he became an Associate Professor onthe Faculty of Engineering of Meiji University.Since 1989 he has been an Associate Professor in the School of Sciences and Engineering, Meiji University. He has been working in the areas of logic circuit testing and LSI-CAD, and is the author of the book Theory of Logic Circuit (Morikita Publishing). He is a member of IEEE and of the Information Processing Society of Japan","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103732372","display_name":"Kouji Yamazaki","orcid":null},"institutions":[{"id":"https://openalex.org/I16656306","display_name":"Meiji University","ror":"https://ror.org/02rqvrp93","country_code":"JP","type":"education","lineage":["https://openalex.org/I16656306"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kouji Yamazaki","raw_affiliation_strings":["Kouji Yamazaki obtained a B.S. in 1989 in Electronic Communications Engineering from Meiji University, where he is currently in the graduate program.His research is on diagnosis of logic circuits","School of Science and Technology, Meiji University, Kawasaki, Japan 214"],"affiliations":[{"raw_affiliation_string":"Kouji Yamazaki obtained a B.S. in 1989 in Electronic Communications Engineering from Meiji University, where he is currently in the graduate program.His research is on diagnosis of logic circuits","institution_ids":[]},{"raw_affiliation_string":"School of Science and Technology, Meiji University, Kawasaki, Japan 214","institution_ids":["https://openalex.org/I16656306"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5084876589"],"corresponding_institution_ids":["https://openalex.org/I16656306"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.13418647,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"22","issue":"9","first_page":"43","last_page":"51"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9889000058174133,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/bridging","display_name":"Bridging (networking)","score":0.8185041546821594},{"id":"https://openalex.org/keywords/combinational-logic","display_name":"Combinational logic","score":0.7592114210128784},{"id":"https://openalex.org/keywords/computation","display_name":"Computation","score":0.6320996284484863},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5925406217575073},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.5876979231834412},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5642574429512024},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.5168302655220032},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4756172299385071},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.4514835476875305},{"id":"https://openalex.org/keywords/logic-gate","display_name":"Logic gate","score":0.24956491589546204},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13594073057174683},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07259359955787659}],"concepts":[{"id":"https://openalex.org/C174348530","wikidata":"https://www.wikidata.org/wiki/Q188635","display_name":"Bridging (networking)","level":2,"score":0.8185041546821594},{"id":"https://openalex.org/C81409106","wikidata":"https://www.wikidata.org/wiki/Q76505","display_name":"Combinational logic","level":3,"score":0.7592114210128784},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.6320996284484863},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5925406217575073},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.5876979231834412},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5642574429512024},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.5168302655220032},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4756172299385071},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.4514835476875305},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.24956491589546204},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13594073057174683},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07259359955787659},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/scj.4690220905","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690220905","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":4,"referenced_works":["https://openalex.org/W2001482367","https://openalex.org/W2044741679","https://openalex.org/W2173124859","https://openalex.org/W2796880069"],"related_works":["https://openalex.org/W2169619406","https://openalex.org/W2117563988","https://openalex.org/W2091833418","https://openalex.org/W2120257283","https://openalex.org/W2021253405","https://openalex.org/W2913077774","https://openalex.org/W2145089576","https://openalex.org/W2132684947","https://openalex.org/W1635574009","https://openalex.org/W1493811107"],"abstract_inverted_index":{"Abstract":[0],"A":[1],"diagnosis":[2,29,44],"method":[3,15],"for":[4,73,115],"single":[5,74],"bridging":[6],"faults":[7,76],"in":[8],"combinational":[9],"circuits":[10],"is":[11,25,46,82,108],"proposed.":[12],"In":[13],"this":[14],"the":[16,23,34,43,49,53,61,70,79,86,89,93],"cause":[17],"of":[18,42,51,55,66,88,95,129],"an":[19],"error":[20],"observed":[21],"at":[22],"outputs":[24],"analyzed":[26],"using":[27,69],"a":[28,119,126],"table":[30,45],"constructed":[31],"based":[32],"on":[33],"circuit":[35,90],"and":[36,57,91],"its":[37],"test":[38,71],"patterns.":[39],"The":[40,64],"size":[41,87],"proportional":[47,84],"to":[48,85,102,104],"number":[50,54,94],"nets":[52],"tests":[56],"much":[58],"smaller":[59],"than":[60],"fault":[62,97,113,117],"dictionary.":[63],"results":[65],"experiments":[67],"conducted":[68],"patterns":[72],"stuck\u2010at":[75],"show":[77],"that":[78,92,110],"testing":[80],"time":[81],"nearly":[83],"possible":[96],"locations":[98],"can":[99,122],"be":[100,123],"reduced":[101],"20":[103],"30.":[105],"Hence,":[106],"it":[107],"expected":[109],"by":[111],"conducting":[112],"simulations":[114],"those":[116],"possibilities,":[118],"maximal":[120],"resolution":[121],"obtained":[124],"within":[125],"reasonable":[127],"amount":[128],"computation":[130],"time.":[131]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}