{"id":"https://openalex.org/W2022999037","doi":"https://doi.org/10.1002/scj.4690191109","title":"Test effort\u2010dependent software reliability growth models and comparisons of goodness\u2010of\u2010fit","display_name":"Test effort\u2010dependent software reliability growth models and comparisons of goodness\u2010of\u2010fit","publication_year":1988,"publication_date":"1988-11-01","ids":{"openalex":"https://openalex.org/W2022999037","doi":"https://doi.org/10.1002/scj.4690191109","mag":"2022999037"},"language":"en","primary_location":{"id":"doi:10.1002/scj.4690191109","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690191109","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036005891","display_name":"Shigeru Yamada","orcid":"https://orcid.org/0000-0001-9998-6938"},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]},{"id":"https://openalex.org/I1304132090","display_name":"Sony (Taiwan)","ror":"https://ror.org/0214y7014","country_code":"TW","type":"company","lineage":["https://openalex.org/I1304132090","https://openalex.org/I4210143797"]},{"id":"https://openalex.org/I163770644","display_name":"Okayama University","ror":"https://ror.org/02pc6pc55","country_code":"JP","type":"education","lineage":["https://openalex.org/I163770644"]},{"id":"https://openalex.org/I81672605","display_name":"Orion Corporation (United Kingdom)","ror":"https://ror.org/01ny43313","country_code":"GB","type":"company","lineage":["https://openalex.org/I4210118237","https://openalex.org/I81672605"]}],"countries":["GB","JP","TW"],"is_corresponding":true,"raw_author_name":"Shigeru Yamada","raw_affiliation_strings":["Faculty of Engineering, Hiroshima University, Higashi-Hiroshima, Japan 724","Shigeru Yamada graduated in 1975 from Dept. Manage., Fac. Eng., Hiroshima University, He then affiliated with QA Div. Nippon Denso Co. and obtained his Master's degree in 1977. from 1977-1980, and obtained a Dr. of Engineering degree in 1983 from Hiroshima Univ. Assistant Professor 1983-1988, Dept. Electronic Eng., Fac. Eng., Okayama University. Presently, he is an Associate Professor, Dept. Industrial and Syst. Eng., Fac. Eng., Hiroshima University. He is engaged in research on reliability engineering, software reliability and quality assurance. He is the author of Software Reliability Evaluation, and other books. Dr. Yamada is a member of the Inf. Proc. SOC. Jap.; Jap. OR SOC.; Jap. SOC. Manage. Eng.; and I.E.E.E","I.E.E.E","Jap. SOC. Manage. Eng","Jap. OR SOC","Shigeru Yamada graduated in 1975 from Dept. Manage., Fac. Eng., Hiroshima University, He then affiliated with QA Div. Nippon Denso Co. and obtained his Master's degree in 1977. from 1977-1980, and obtained a Dr. of Engineering degree in 1983 from Hiroshima Univ. Assistant Professor 1983-1988, Dept. Electronic Eng., Fac. Eng., Okayama University. Presently, he is an Associate Professor, Dept. Industrial and Syst. Eng., Fac. Eng., Hiroshima University. He is engaged in research on reliability engineering, software reliability and quality assurance. He is the author of Software Reliability Evaluation, and other books. Dr. Yamada is a member of the Inf. Proc. SOC. Jap"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Hiroshima University, Higashi-Hiroshima, Japan 724","institution_ids":["https://openalex.org/I113306721"]},{"raw_affiliation_string":"Shigeru Yamada graduated in 1975 from Dept. Manage., Fac. Eng., Hiroshima University, He then affiliated with QA Div. Nippon Denso Co. and obtained his Master's degree in 1977. from 1977-1980, and obtained a Dr. of Engineering degree in 1983 from Hiroshima Univ. Assistant Professor 1983-1988, Dept. Electronic Eng., Fac. Eng., Okayama University. Presently, he is an Associate Professor, Dept. Industrial and Syst. Eng., Fac. Eng., Hiroshima University. He is engaged in research on reliability engineering, software reliability and quality assurance. He is the author of Software Reliability Evaluation, and other books. Dr. Yamada is a member of the Inf. Proc. SOC. Jap.; Jap. OR SOC.; Jap. SOC. Manage. Eng.; and I.E.E.E","institution_ids":["https://openalex.org/I163770644"]},{"raw_affiliation_string":"I.E.E.E","institution_ids":[]},{"raw_affiliation_string":"Jap. SOC. Manage. Eng","institution_ids":["https://openalex.org/I1304132090"]},{"raw_affiliation_string":"Jap. OR SOC","institution_ids":["https://openalex.org/I81672605"]},{"raw_affiliation_string":"Shigeru Yamada graduated in 1975 from Dept. Manage., Fac. Eng., Hiroshima University, He then affiliated with QA Div. Nippon Denso Co. and obtained his Master's degree in 1977. from 1977-1980, and obtained a Dr. of Engineering degree in 1983 from Hiroshima Univ. Assistant Professor 1983-1988, Dept. Electronic Eng., Fac. Eng., Okayama University. Presently, he is an Associate Professor, Dept. Industrial and Syst. Eng., Fac. Eng., Hiroshima University. He is engaged in research on reliability engineering, software reliability and quality assurance. He is the author of Software Reliability Evaluation, and other books. Dr. Yamada is a member of the Inf. Proc. SOC. Jap","institution_ids":["https://openalex.org/I163770644"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5036005891"],"corresponding_institution_ids":["https://openalex.org/I113306721","https://openalex.org/I1304132090","https://openalex.org/I163770644","https://openalex.org/I81672605"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.27480046,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"19","issue":"11","first_page":"87","last_page":"96"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9955000281333923,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/goodness-of-fit","display_name":"Goodness of fit","score":0.7247926592826843},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6702942848205566},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.6034008860588074},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.517848789691925},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4956241846084595},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.493217408657074},{"id":"https://openalex.org/keywords/regression-testing","display_name":"Regression testing","score":0.4503532648086548},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.4443415403366089},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.3014877736568451},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.14822468161582947},{"id":"https://openalex.org/keywords/software-construction","display_name":"Software construction","score":0.13516691327095032},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.0898418128490448}],"concepts":[{"id":"https://openalex.org/C132480984","wikidata":"https://www.wikidata.org/wiki/Q2034239","display_name":"Goodness of fit","level":2,"score":0.7247926592826843},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6702942848205566},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.6034008860588074},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.517848789691925},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4956241846084595},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.493217408657074},{"id":"https://openalex.org/C161821725","wikidata":"https://www.wikidata.org/wiki/Q917415","display_name":"Regression testing","level":5,"score":0.4503532648086548},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.4443415403366089},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.3014877736568451},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.14822468161582947},{"id":"https://openalex.org/C186846655","wikidata":"https://www.wikidata.org/wiki/Q3398377","display_name":"Software construction","level":4,"score":0.13516691327095032},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0898418128490448},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/scj.4690191109","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690191109","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5299999713897705}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W124052719","https://openalex.org/W1980595883","https://openalex.org/W1983055498","https://openalex.org/W1987944138","https://openalex.org/W2016919057","https://openalex.org/W2024686158","https://openalex.org/W2047164750","https://openalex.org/W2081004173","https://openalex.org/W2117039703","https://openalex.org/W2126055257","https://openalex.org/W2168479209","https://openalex.org/W2490166567","https://openalex.org/W4249311238","https://openalex.org/W4300945981"],"related_works":["https://openalex.org/W2806903162","https://openalex.org/W3088324669","https://openalex.org/W3133844515","https://openalex.org/W1521772560","https://openalex.org/W2187840912","https://openalex.org/W4238386252","https://openalex.org/W2749345883","https://openalex.org/W2362944210","https://openalex.org/W4226182203","https://openalex.org/W2541762924"],"abstract_inverted_index":{"Abstract":[0],"Testing":[1],"in":[2,45,84],"software":[3,18,58,81,129,180],"development":[4,28],"is":[5,10,49,62,73,92,125,137,147,164,175,193,203],"very":[6],"important":[7],"since":[8],"it":[9],"the":[11,17,20,33,37,42,46,57,66,76,80,85,89,96,99,102,106,112,115,128,134,141,148,154,161,167,173,178,187,190,196,199],"final":[12],"refining":[13],"stage":[14],"before":[15],"realizing":[16],"to":[19,94,166],"user":[21],"and":[22,53,56,172],"requires":[23],"a":[24,138,185],"large":[25],"amount":[26],"of":[27,36,98,101,114,140,189,198],"resources.":[29],"In":[30],"this":[31],"paper,":[32],"time\u2010dependent":[34],"behavior":[35],"test":[38,116,143,170,201],"effort,":[39],"such":[40],"as":[41,75,109,111],"manpower":[43],"spent":[44],"testing":[47,86,122],"process,":[48],"represented":[50],"by":[51,105],"exponential":[52],"Rayleigh":[54],"functions,":[55],"reliability":[59,130,181],"growth":[60,182],"model":[61,136,163,192],"discussed,":[63],"which":[64],"includes":[65],"test\u2010effort":[67,103],"functions.":[68],"The":[69],"nonhomogeneous":[70],"Poisson":[71],"process":[72],"assumed":[74],"stochastic":[77],"principle":[78],"describing":[79],"error\u2010detection":[82],"phenomenon":[83],"procedure.":[87],"Especially,":[88],"variance":[90],"analysis":[91],"discussed":[93],"determine":[95],"significance":[97],"estimation":[100,150],"function":[104,139],"least\u2010square":[107],"method,":[108],"well":[110],"prediction":[113],"effort":[117,202],"invested":[118,142,200],"at":[119],"an":[120],"arbitrary":[121],"time.":[123],"It":[124],"shown":[126,159],"that":[127],"measure":[131],"derived":[132],"from":[133],"proposed":[135,162,191],"effort.":[144],"Not":[145],"only":[146],"point":[149],"presented,":[151],"but":[152],"also":[153],"interval":[155],"estimation.":[156],"Examples":[157],"are":[158],"where":[160,195],"applied":[165],"actually":[168],"observed":[169],"data,":[171],"goodness\u2010of\u2010fit":[174,188],"compared":[176],"with":[177],"existing":[179],"models.":[183],"As":[184],"result,":[186],"verified,":[194],"effect":[197],"considered.":[204]},"counts_by_year":[],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}