{"id":"https://openalex.org/W2063902761","doi":"https://doi.org/10.1002/scj.4690170606","title":"A discrete software reliability growth model with two types of errors","display_name":"A discrete software reliability growth model with two types of errors","publication_year":1986,"publication_date":"1986-01-01","ids":{"openalex":"https://openalex.org/W2063902761","doi":"https://doi.org/10.1002/scj.4690170606","mag":"2063902761"},"language":"en","primary_location":{"id":"doi:10.1002/scj.4690170606","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690170606","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5016423755","display_name":"Takeshi Kitaoka","orcid":null},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Takeshi Kitaoka","raw_affiliation_strings":["Graduate School of Engineering, Hiroshima University, Higashi-Hiroshima, Japan 724","Graduate School of Engineering, Hiroshima University, Higashi\u2010Hiroshima, Japan 724"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Hiroshima University, Higashi-Hiroshima, Japan 724","institution_ids":["https://openalex.org/I113306721"]},{"raw_affiliation_string":"Graduate School of Engineering, Hiroshima University, Higashi\u2010Hiroshima, Japan 724","institution_ids":["https://openalex.org/I113306721"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036005891","display_name":"Shigeru Yamada","orcid":"https://orcid.org/0000-0001-9998-6938"},"institutions":[{"id":"https://openalex.org/I136446963","display_name":"Okayama University of Science","ror":"https://ror.org/05aevyc10","country_code":"JP","type":"education","lineage":["https://openalex.org/I136446963"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shigeru Yamada","raw_affiliation_strings":["Okayama University of Science, Okayama, Japan 700"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Okayama University of Science, Okayama, Japan 700","institution_ids":["https://openalex.org/I136446963"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111465533","display_name":"Shunji Osaki","orcid":null},"institutions":[{"id":"https://openalex.org/I113306721","display_name":"Hiroshima University","ror":"https://ror.org/03t78wx29","country_code":"JP","type":"education","lineage":["https://openalex.org/I113306721"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Shunji Osaki","raw_affiliation_strings":["Faculty of Engineering, Hiroshima University, Higashi-Hiroshima, Japan 724","Faculty of Engineering, Hiroshima University Higashi-Hiroshima, Japan 724"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Faculty of Engineering, Hiroshima University, Higashi-Hiroshima, Japan 724","institution_ids":["https://openalex.org/I113306721"]},{"raw_affiliation_string":"Faculty of Engineering, Hiroshima University Higashi-Hiroshima, Japan 724","institution_ids":["https://openalex.org/I113306721"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.29404145,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"17","issue":"6","first_page":"50","last_page":"56"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9696000218391418,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7288649678230286},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.6973161101341248},{"id":"https://openalex.org/keywords/software-reliability-testing","display_name":"Software reliability testing","score":0.6722409129142761},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5668457746505737},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5566262602806091},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5000314712524414},{"id":"https://openalex.org/keywords/software-metric","display_name":"Software metric","score":0.41030141711235046},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.3374921679496765},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3340100646018982},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.06294840574264526}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7288649678230286},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.6973161101341248},{"id":"https://openalex.org/C52928878","wikidata":"https://www.wikidata.org/wiki/Q7554226","display_name":"Software reliability testing","level":5,"score":0.6722409129142761},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5668457746505737},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5566262602806091},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5000314712524414},{"id":"https://openalex.org/C82214349","wikidata":"https://www.wikidata.org/wiki/Q657339","display_name":"Software metric","level":5,"score":0.41030141711235046},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.3374921679496765},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3340100646018982},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.06294840574264526},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/scj.4690170606","is_oa":false,"landing_page_url":"https://doi.org/10.1002/scj.4690170606","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W22166167","https://openalex.org/W348934938","https://openalex.org/W1980595883","https://openalex.org/W2016577192","https://openalex.org/W2016919057","https://openalex.org/W2024686158","https://openalex.org/W2126055257","https://openalex.org/W2489618521","https://openalex.org/W6600909921","https://openalex.org/W6654527557"],"related_works":["https://openalex.org/W1521772560","https://openalex.org/W2382583096","https://openalex.org/W147463599","https://openalex.org/W2029555411","https://openalex.org/W3206587736","https://openalex.org/W2558027728","https://openalex.org/W2012057830","https://openalex.org/W2439389792","https://openalex.org/W4224250221","https://openalex.org/W2782366913"],"abstract_inverted_index":{"Abstract":[0],"As":[1],"the":[2,30,38,53,61,81,91,97,118,124,131,136,139,142,148,153,167],"social":[3],"missions":[4],"of":[5,37,83,90,100,120,126,135],"computer":[6],"systems":[7,21],"increase,":[8],"it":[9],"becomes":[10],"more":[11],"important":[12],"to":[13,25,43,73,141],"develop":[14],"high\u2010reliability":[15],"software.":[16],"For":[17],"this":[18,57],"reason":[19],"software":[20,34,45,75,101,127,154,162,168],"are":[22],"tested":[23],"repeatedly":[24],"remove":[26],"latent":[27],"errors":[28,102],"in":[29,52,104],"testing":[31,107],"phase":[32],"during":[33],"development.":[35],"One":[36],"most":[39],"interesting":[40],"methods":[41],"is":[42,110,128],"evaluate":[44,74],"reliability":[46,125,155,169],"by":[47],"using":[48],"test":[49,84,144,150],"data":[50],"observed":[51],"error\u2010detection":[54,62,92],"process.":[55,114],"In":[56,77],"paper":[58],"we":[59,79,116,146,158],"model":[60,67,140],"process":[63],"as":[64,87],"a":[65,88,111],"stochastic":[66],"and":[68,94,133,151],"introduce":[69],"several":[70],"effective":[71],"measures":[72],"reliability.":[76],"modeling":[78],"use":[80],"number":[82,99],"run":[85],"trials":[86],"unit":[89],"period":[93],"assume":[95],"that":[96],"cumulative":[98],"detected":[103],"an":[105,160],"arbitrary":[106],"time":[108],"interval":[109],"nonhomogeneous":[112],"Poisson":[113],"Further,":[115],"consider":[117],"difficulty":[119],"error":[121],"detection":[122],"because":[123],"evaluated":[129],"from":[130],"characteristics":[132],"frequency":[134],"errors.":[137],"Applying":[138],"actual":[143],"data,":[145],"perform":[147],"goodness\u2010of\u2010fit":[149],"infer":[152],"measures.":[156],"Finally,":[157],"discuss":[159],"optimum":[161],"release":[163],"problem":[164],"based":[165],"on":[166],"index.":[170]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}