{"id":"https://openalex.org/W7103878171","doi":"https://doi.org/10.1002/qre.70114","title":"Forty Years of Quality and Reliability Engineering International: Trends and Patterns From 1985\u20132024","display_name":"Forty Years of Quality and Reliability Engineering International: Trends and Patterns From 1985\u20132024","publication_year":2025,"publication_date":"2025-11-04","ids":{"openalex":"https://openalex.org/W7103878171","doi":"https://doi.org/10.1002/qre.70114"},"language":"en","primary_location":{"id":"doi:10.1002/qre.70114","is_oa":true,"landing_page_url":"https://doi.org/10.1002/qre.70114","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/qre.70114","source":{"id":"https://openalex.org/S165633816","display_name":"Quality and Reliability Engineering International","issn_l":"0748-8017","issn":["0748-8017","1099-1638"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Quality and Reliability Engineering International","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/qre.70114","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Xianghua Jiang","orcid":"https://orcid.org/0000-0002-8634-2591"},"institutions":[{"id":"https://openalex.org/I177725633","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48","country_code":"HK","type":"education","lineage":["https://openalex.org/I177725633"]},{"id":"https://openalex.org/I4210133369","display_name":"Decision Sciences (United States)","ror":"https://ror.org/03gcvf773","country_code":"US","type":"company","lineage":["https://openalex.org/I4210133369"]}],"countries":["HK","US"],"is_corresponding":false,"raw_author_name":"Xianghua Jiang","raw_affiliation_strings":["Department of Decisions, Operations and Technology, CUHK Business School Chinese University of Hong Kong Hong Kong China"],"affiliations":[{"raw_affiliation_string":"Department of Decisions, Operations and Technology, CUHK Business School Chinese University of Hong Kong Hong Kong China","institution_ids":["https://openalex.org/I177725633","https://openalex.org/I4210133369"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Aarnout Brombacher","orcid":null},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"Aarnout Brombacher","raw_affiliation_strings":["Department of Industrial Design Eindhoven University of Technology Eindhoven"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Design Eindhoven University of Technology Eindhoven","institution_ids":["https://openalex.org/I83019370"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Douglas C. Montgomery","orcid":null},"institutions":[{"id":"https://openalex.org/I55732556","display_name":"Arizona State University","ror":"https://ror.org/03efmqc40","country_code":"US","type":"education","lineage":["https://openalex.org/I55732556"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Douglas C. Montgomery","raw_affiliation_strings":["Arizona State University Tempe Arizona USA"],"affiliations":[{"raw_affiliation_string":"Arizona State University Tempe Arizona USA","institution_ids":["https://openalex.org/I55732556"]}]},{"author_position":"last","author":{"id":null,"display_name":"Loon\u2010Ching Tang","orcid":null},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Loon\u2010Ching Tang","raw_affiliation_strings":["Department of Industrial Systems Engineering and Management National University of Singapore Singapore Singapore"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Systems Engineering and Management National University of Singapore Singapore Singapore","institution_ids":["https://openalex.org/I165932596"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I165932596"],"apc_list":{"value":4330,"currency":"USD","value_usd":4330},"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.64060403,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"42","issue":"2","first_page":"525","last_page":"537"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11719","display_name":"Data Quality and Management","score":0.06909999996423721,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11719","display_name":"Data Quality and Management","score":0.06909999996423721,"subfield":{"id":"https://openalex.org/subfields/1803","display_name":"Management Science and Operations Research"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.03660000115633011,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12945","display_name":"Quality Function Deployment in Product Design","score":0.032099999487400055,"subfield":{"id":"https://openalex.org/subfields/1405","display_name":"Management of Technology and Innovation"},"field":{"id":"https://openalex.org/fields/14","display_name":"Business, Management and Accounting"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.745199978351593},{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.6147000193595886},{"id":"https://openalex.org/keywords/context","display_name":"Context (archaeology)","score":0.5952000021934509},{"id":"https://openalex.org/keywords/reliability-theory","display_name":"Reliability theory","score":0.4092999994754791},{"id":"https://openalex.org/keywords/bibliometrics","display_name":"Bibliometrics","score":0.3774999976158142}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.745199978351593},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.6147000193595886},{"id":"https://openalex.org/C2779343474","wikidata":"https://www.wikidata.org/wiki/Q3109175","display_name":"Context (archaeology)","level":2,"score":0.5952000021934509},{"id":"https://openalex.org/C201729545","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability theory","level":3,"score":0.4092999994754791},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.37880000472068787},{"id":"https://openalex.org/C178315738","wikidata":"https://www.wikidata.org/wiki/Q603441","display_name":"Bibliometrics","level":2,"score":0.3774999976158142},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.3750999867916107},{"id":"https://openalex.org/C539667460","wikidata":"https://www.wikidata.org/wiki/Q2414942","display_name":"Management science","level":1,"score":0.3734999895095825},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36550000309944153},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.34389999508857727},{"id":"https://openalex.org/C71405471","wikidata":"https://www.wikidata.org/wiki/Q757012","display_name":"Quality management","level":3,"score":0.33709999918937683},{"id":"https://openalex.org/C112930515","wikidata":"https://www.wikidata.org/wiki/Q4389547","display_name":"Risk analysis (engineering)","level":1,"score":0.28439998626708984},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.28049999475479126},{"id":"https://openalex.org/C2522767166","wikidata":"https://www.wikidata.org/wiki/Q2374463","display_name":"Data science","level":1,"score":0.2766000032424927},{"id":"https://openalex.org/C55587333","wikidata":"https://www.wikidata.org/wiki/Q1133029","display_name":"Engineering ethics","level":1,"score":0.26759999990463257}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1002/qre.70114","is_oa":true,"landing_page_url":"https://doi.org/10.1002/qre.70114","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/qre.70114","source":{"id":"https://openalex.org/S165633816","display_name":"Quality and Reliability Engineering International","issn_l":"0748-8017","issn":["0748-8017","1099-1638"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Quality and Reliability Engineering International","raw_type":"journal-article"},{"id":"pmh:oai:pure.tue.nl:publications/35379740-bd1f-49b8-af8a-90762da35280","is_oa":false,"landing_page_url":"https://research.tue.nl/en/publications/35379740-bd1f-49b8-af8a-90762da35280","pdf_url":null,"source":{"id":"https://openalex.org/S4406922641","display_name":"TU/e Research Portal","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Jiang, X, Brombacher, A, Montgomery, D C & Tang, L C 2026, 'Forty Years of Quality and Reliability Engineering International : Trends and Patterns From 1985\u20132024', Quality and Reliability Engineering International, vol. 42, no. 2, pp. 525-537. https://doi.org/10.1002/qre.70114","raw_type":"info:eu-repo/semantics/publishedVersion"}],"best_oa_location":{"id":"doi:10.1002/qre.70114","is_oa":true,"landing_page_url":"https://doi.org/10.1002/qre.70114","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/qre.70114","source":{"id":"https://openalex.org/S165633816","display_name":"Quality and Reliability Engineering International","issn_l":"0748-8017","issn":["0748-8017","1099-1638"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Quality and Reliability Engineering International","raw_type":"journal-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","score":0.4576852321624756,"display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":false},"content_urls":{"pdf":"https://content.openalex.org/works/W7103878171.pdf"},"referenced_works_count":21,"referenced_works":["https://openalex.org/W1602316786","https://openalex.org/W1950721392","https://openalex.org/W1964613567","https://openalex.org/W1973532150","https://openalex.org/W1973665104","https://openalex.org/W1974237200","https://openalex.org/W2007081974","https://openalex.org/W2017500112","https://openalex.org/W2038421255","https://openalex.org/W2049571606","https://openalex.org/W2057170464","https://openalex.org/W2060622051","https://openalex.org/W2064935016","https://openalex.org/W2115907712","https://openalex.org/W2151411627","https://openalex.org/W2215891809","https://openalex.org/W2263581110","https://openalex.org/W2390346197","https://openalex.org/W2650837227","https://openalex.org/W2790189590","https://openalex.org/W3121158818"],"related_works":[],"abstract_inverted_index":{"ABSTRACT":[0],"In":[1],"celebration":[2],"of":[3,7,20,36,54,100],"the":[4,21,34,95,98],"40th":[5],"anniversary":[6],"Quality":[8],"and":[9,38,44,67,74,87,89,104],"Reliability":[10],"Engineering":[11],"International":[12],"(QREI),":[13],"we":[14],"present":[15],"a":[16,61],"comprehensive":[17],"retrospective":[18],"analysis":[19],"journal's":[22],"publications":[23],"from":[24,63],"1985":[25],"to":[26],"2024.":[27],"We":[28],"highlight":[29],"how":[30],"QREI":[31],"has":[32],"influenced":[33],"evolution":[35],"quality":[37,65],"reliability":[39,68],"engineering":[40],"through":[41],"key":[42],"contributions":[43],"emerging":[45],"research":[46],"themes":[47],"over":[48],"four":[49],"decades.":[50],"Our":[51],"bibliometric":[52],"review":[53],"3726":[55],"articles":[56],"reveals":[57],"significant":[58],"trends,":[59],"including":[60],"shift":[62],"classical":[64],"control":[66],"topics":[69],"toward":[70],"advanced":[71],"data\u2010driven":[72],"methodologies":[73],"increased":[75],"interdisciplinary":[76],"collaboration.":[77],"The":[78],"findings":[79],"underscore":[80],"QREI's":[81],"growing":[82],"impact":[83],"on":[84],"both":[85],"theory":[86],"practice,":[88],"also":[90],"discuss":[91],"future":[92],"directions":[93],"for":[94],"journal":[96],"in":[97],"context":[99],"new":[101],"technological":[102],"challenges":[103],"opportunities.":[105]},"counts_by_year":[],"updated_date":"2026-03-11T06:11:40.159057","created_date":"2025-11-05T00:00:00"}