{"id":"https://openalex.org/W4413781281","doi":"https://doi.org/10.1002/qre.70053","title":"Reliability Assessment of Hybrid Hardware\u2010Software Fault Systems Based on GSPN Under Mixed Uncertainties","display_name":"Reliability Assessment of Hybrid Hardware\u2010Software Fault Systems Based on GSPN Under Mixed Uncertainties","publication_year":2025,"publication_date":"2025-08-28","ids":{"openalex":"https://openalex.org/W4413781281","doi":"https://doi.org/10.1002/qre.70053"},"language":"en","primary_location":{"id":"doi:10.1002/qre.70053","is_oa":false,"landing_page_url":"https://doi.org/10.1002/qre.70053","pdf_url":null,"source":{"id":"https://openalex.org/S165633816","display_name":"Quality and Reliability Engineering International","issn_l":"0748-8017","issn":["0748-8017","1099-1638"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Quality and Reliability Engineering International","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5082978484","display_name":"Rongxing Duan","orcid":"https://orcid.org/0000-0003-3683-5870"},"institutions":[{"id":"https://openalex.org/I141649914","display_name":"Nanchang University","ror":"https://ror.org/042v6xz23","country_code":"CN","type":"education","lineage":["https://openalex.org/I141649914"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Rongxing Duan","raw_affiliation_strings":["School of Information Engineering Nanchang University  Nanchang Jiangxi China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Engineering Nanchang University  Nanchang Jiangxi China","institution_ids":["https://openalex.org/I141649914"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100809058","display_name":"Qi Zhong","orcid":null},"institutions":[{"id":"https://openalex.org/I141649914","display_name":"Nanchang University","ror":"https://ror.org/042v6xz23","country_code":"CN","type":"education","lineage":["https://openalex.org/I141649914"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qi Zhong","raw_affiliation_strings":["School of Information Engineering Nanchang University  Nanchang Jiangxi China"],"raw_orcid":"https://orcid.org/0009-0003-8742-3056","affiliations":[{"raw_affiliation_string":"School of Information Engineering Nanchang University  Nanchang Jiangxi China","institution_ids":["https://openalex.org/I141649914"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101569532","display_name":"Yihe Lin","orcid":"https://orcid.org/0009-0002-8236-4459"},"institutions":[{"id":"https://openalex.org/I141649914","display_name":"Nanchang University","ror":"https://ror.org/042v6xz23","country_code":"CN","type":"education","lineage":["https://openalex.org/I141649914"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yihe Lin","raw_affiliation_strings":["School of Information Engineering Nanchang University  Nanchang Jiangxi China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Engineering Nanchang University  Nanchang Jiangxi China","institution_ids":["https://openalex.org/I141649914"]}]},{"author_position":"middle","author":{"id":null,"display_name":"Zikang Zou","orcid":null},"institutions":[{"id":"https://openalex.org/I141649914","display_name":"Nanchang University","ror":"https://ror.org/042v6xz23","country_code":"CN","type":"education","lineage":["https://openalex.org/I141649914"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zikang Zou","raw_affiliation_strings":["School of Information Engineering Nanchang University  Nanchang Jiangxi China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Engineering Nanchang University  Nanchang Jiangxi China","institution_ids":["https://openalex.org/I141649914"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006283370","display_name":"Guoxin Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I141649914","display_name":"Nanchang University","ror":"https://ror.org/042v6xz23","country_code":"CN","type":"education","lineage":["https://openalex.org/I141649914"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guoxin Cheng","raw_affiliation_strings":["School of Information Engineering Nanchang University  Nanchang Jiangxi China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Engineering Nanchang University  Nanchang Jiangxi China","institution_ids":["https://openalex.org/I141649914"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5102010677","display_name":"Tong Zhou","orcid":"https://orcid.org/0000-0003-4381-5480"},"institutions":[{"id":"https://openalex.org/I141649914","display_name":"Nanchang University","ror":"https://ror.org/042v6xz23","country_code":"CN","type":"education","lineage":["https://openalex.org/I141649914"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tong Zhou","raw_affiliation_strings":["School of Information Engineering Nanchang University  Nanchang Jiangxi China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Information Engineering Nanchang University  Nanchang Jiangxi China","institution_ids":["https://openalex.org/I141649914"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5082978484"],"corresponding_institution_ids":["https://openalex.org/I141649914"],"apc_list":{"value":4330,"currency":"USD","value_usd":4330},"apc_paid":null,"fwci":1.3895,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.85479927,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":97,"max":98},"biblio":{"volume":"41","issue":"8","first_page":"3622","last_page":"3638"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7827359437942505},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5937300324440002},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.565373957157135},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5025496482849121},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.454334557056427},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.4483698904514313},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.44416308403015137},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3242377042770386},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.26414626836776733},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.19346949458122253},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.13332831859588623}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7827359437942505},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5937300324440002},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.565373957157135},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5025496482849121},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.454334557056427},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.4483698904514313},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.44416308403015137},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3242377042770386},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.26414626836776733},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.19346949458122253},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.13332831859588623},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/qre.70053","is_oa":false,"landing_page_url":"https://doi.org/10.1002/qre.70053","pdf_url":null,"source":{"id":"https://openalex.org/S165633816","display_name":"Quality and Reliability Engineering International","issn_l":"0748-8017","issn":["0748-8017","1099-1638"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Quality and Reliability Engineering International","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G5857754059","display_name":"\u4e0d\u786e\u5b9a\u6027\u4e0b\u57fa\u4e8e\u591a\u6e90\u5f02\u6784\u4fe1\u606f\u7684\u590d\u6742\u7cfb\u7edf\u52a8\u6001\u6545\u969c\u8bca\u65ad\u7b56\u7565\u7814\u7a76","funder_award_id":"71961017","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"},{"id":"https://openalex.org/G8929373420","display_name":null,"funder_award_id":"72461020","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W2026960979","https://openalex.org/W2053267746","https://openalex.org/W2073240183","https://openalex.org/W2154884120","https://openalex.org/W2159941357","https://openalex.org/W2171074376","https://openalex.org/W2488668998","https://openalex.org/W2775850263","https://openalex.org/W2883961236","https://openalex.org/W2890724577","https://openalex.org/W2898180010","https://openalex.org/W2949935624","https://openalex.org/W2950226745","https://openalex.org/W2964188185","https://openalex.org/W3008303763","https://openalex.org/W3034533917","https://openalex.org/W3086257582","https://openalex.org/W3093009359","https://openalex.org/W3100189175","https://openalex.org/W3117561904","https://openalex.org/W3125550087","https://openalex.org/W3183077285","https://openalex.org/W3214896570","https://openalex.org/W4210299266","https://openalex.org/W4211007335","https://openalex.org/W4213376862","https://openalex.org/W4220691527","https://openalex.org/W4226040094","https://openalex.org/W4311457596","https://openalex.org/W4317435533","https://openalex.org/W4366000560","https://openalex.org/W4372329045","https://openalex.org/W4377968252","https://openalex.org/W4386275740","https://openalex.org/W4386852177","https://openalex.org/W4388440948","https://openalex.org/W4388451120","https://openalex.org/W4389141964","https://openalex.org/W4398785278"],"related_works":["https://openalex.org/W2767601850","https://openalex.org/W2617887951","https://openalex.org/W82714704","https://openalex.org/W2246057640","https://openalex.org/W2120051590","https://openalex.org/W1519020487","https://openalex.org/W2538450276","https://openalex.org/W1894599085","https://openalex.org/W2112914176","https://openalex.org/W2029915748"],"abstract_inverted_index":{"ABSTRACT":[0],"With":[1],"the":[2,10,71,113,132,140,149,171,183,191,196],"increasing":[3],"complexity":[4],"and":[5,27,41,61,65,76,97,106,143,153,161,186,193],"intelligence":[6],"of":[7,12,59,73,115,182,195],"system":[8,13,36,119,188],"equipment,":[9],"likelihood":[11],"failures":[14,18,58],"also":[15],"rises.":[16],"Such":[17],"can":[19],"lead":[20],"to":[21,34,69,103,111,167,177],"severe":[22],"consequences,":[23],"including":[24],"property":[25],"damage":[26],"personal":[28],"injury.":[29],"Therefore,":[30],"it":[31],"is":[32,175],"essential":[33],"assess":[35,112],"reliability":[37,48],"in":[38,205],"a":[39,47,124,163,179,209],"reasonable":[40],"accurate":[42],"manner.":[43],"This":[44],"paper":[45,122],"proposes":[46],"analysis":[49,129,181],"method":[50,174,198],"for":[51,87],"complex":[52],"systems":[53,207],"that":[54],"comprehensively":[55],"considers":[56],"hybrid":[57,74],"software":[60,75],"hardware,":[62],"mixed":[63],"uncertainties,":[64,108],"human":[66,116,168],"errors.":[67,169],"Specifically,":[68],"address":[70],"characteristics":[72],"hardware":[77],"failures,":[78],"Generalized":[79],"Stochastic":[80],"Petri":[81],"Nets":[82],"(GSPN)":[83],"models":[84],"are":[85,101,199],"developed":[86],"various":[88],"failure":[89,184],"modes.":[90],"Markov":[91],"Chain":[92],"Monte":[93,172],"Carlo":[94,173],"(MCMC)":[95],"sampling":[96,100],"inverse":[98],"transform":[99],"used":[102],"simulate":[104],"cognitive":[105],"random":[107],"respectively.":[109],"Furthermore,":[110],"impact":[114],"errors":[117],"on":[118],"reliability,":[120],"this":[121],"uses":[123],"Proportional":[125],"Hazards":[126],"Model":[127],"(PHM)":[128],"framework,":[130],"integrating":[131],"Common":[133],"Performance":[134],"Condition":[135],"(CPC)":[136],"factors":[137],"set":[138],"from":[139],"Cognitive":[141],"Reliability":[142],"Error":[144],"Analysis":[145],"Method":[146],"technique":[147],"with":[148],"Decision":[150],"Making":[151],"Trial":[152],"Evaluation":[154],"Laboratory":[155],"(DEMATEL)\u2013Analytic":[156],"Network":[157],"Process":[158],"(ANP)":[159],"method,":[160],"constructs":[162],"GSPN":[164],"subnet":[165],"dedicated":[166],"Additionally,":[170],"employed":[176],"perform":[178],"quantitative":[180],"model":[185],"determine":[187],"reliability.":[189],"Finally,":[190],"accuracy":[192],"effectiveness":[194],"proposed":[197],"validated":[200],"using":[201],"an":[202],"equipment":[203],"module":[204],"command\u2010and\u2010control":[206],"as":[208],"case":[210],"study.":[211]},"counts_by_year":[{"year":2026,"cited_by_count":2}],"updated_date":"2026-07-25T15:57:00.446498","created_date":"2025-10-10T00:00:00"}