{"id":"https://openalex.org/W3115449353","doi":"https://doi.org/10.1002/qre.2822","title":"Practical reliability growth modeling","display_name":"Practical reliability growth modeling","publication_year":2020,"publication_date":"2020-12-23","ids":{"openalex":"https://openalex.org/W3115449353","doi":"https://doi.org/10.1002/qre.2822","mag":"3115449353"},"language":"en","primary_location":{"id":"doi:10.1002/qre.2822","is_oa":false,"landing_page_url":"https://doi.org/10.1002/qre.2822","pdf_url":null,"source":{"id":"https://openalex.org/S165633816","display_name":"Quality and Reliability Engineering International","issn_l":"0748-8017","issn":["0748-8017","1099-1638"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Quality and Reliability Engineering International","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5012221715","display_name":"Joyce Cahoon","orcid":"https://orcid.org/0000-0001-7217-4702"},"institutions":[{"id":"https://openalex.org/I1290206253","display_name":"Microsoft (United States)","ror":"https://ror.org/00d0nc645","country_code":"US","type":"company","lineage":["https://openalex.org/I1290206253"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Joyce Cahoon","raw_affiliation_strings":["Microsoft Gray Systems Lab Redmond Washington","Microsoft Gray Systems Lab, Redmond, Washington"],"affiliations":[{"raw_affiliation_string":"Microsoft Gray Systems Lab Redmond Washington","institution_ids":["https://openalex.org/I1290206253"]},{"raw_affiliation_string":"Microsoft Gray Systems Lab, Redmond, Washington","institution_ids":["https://openalex.org/I1290206253"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5033800418","display_name":"Kate Sanborn","orcid":"https://orcid.org/0000-0001-5772-733X"},"institutions":[{"id":"https://openalex.org/I137902535","display_name":"North Carolina State University","ror":"https://ror.org/04tj63d06","country_code":"US","type":"education","lineage":["https://openalex.org/I137902535"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kate Sanborn","raw_affiliation_strings":["Department of Statistics North Carolina State University Raleigh North Carolina","Department of Statistics, North Carolina State University, Raleigh, North Carolina"],"affiliations":[{"raw_affiliation_string":"Department of Statistics North Carolina State University Raleigh North Carolina","institution_ids":["https://openalex.org/I137902535"]},{"raw_affiliation_string":"Department of Statistics, North Carolina State University, Raleigh, North Carolina","institution_ids":["https://openalex.org/I137902535"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049434797","display_name":"Alyson G. Wilson","orcid":"https://orcid.org/0000-0003-1461-6212"},"institutions":[{"id":"https://openalex.org/I137902535","display_name":"North Carolina State University","ror":"https://ror.org/04tj63d06","country_code":"US","type":"education","lineage":["https://openalex.org/I137902535"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Alyson Wilson","raw_affiliation_strings":["Department of Statistics North Carolina State University Raleigh North Carolina","Department of Statistics, North Carolina State University, Raleigh, North Carolina"],"affiliations":[{"raw_affiliation_string":"Department of Statistics North Carolina State University Raleigh North Carolina","institution_ids":["https://openalex.org/I137902535"]},{"raw_affiliation_string":"Department of Statistics, North Carolina State University, Raleigh, North Carolina","institution_ids":["https://openalex.org/I137902535"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5049434797"],"corresponding_institution_ids":["https://openalex.org/I137902535"],"apc_list":{"value":4330,"currency":"USD","value_usd":4330},"apc_paid":null,"fwci":0.6077,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.72503053,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"37","issue":"7","first_page":"3108","last_page":"3124"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7782449722290039},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6516324281692505},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5963723063468933},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.5578161478042603},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.3665512204170227},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2538662552833557},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.19362324476242065}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7782449722290039},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6516324281692505},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5963723063468933},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.5578161478042603},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.3665512204170227},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2538662552833557},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.19362324476242065},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/qre.2822","is_oa":false,"landing_page_url":"https://doi.org/10.1002/qre.2822","pdf_url":null,"source":{"id":"https://openalex.org/S165633816","display_name":"Quality and Reliability Engineering International","issn_l":"0748-8017","issn":["0748-8017","1099-1638"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Quality and Reliability Engineering International","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W28604436","https://openalex.org/W1493389067","https://openalex.org/W1974135355","https://openalex.org/W1975770532","https://openalex.org/W2079433789","https://openalex.org/W2111770734","https://openalex.org/W2144625306","https://openalex.org/W2333781627","https://openalex.org/W2510667177","https://openalex.org/W2790092024","https://openalex.org/W2897835569","https://openalex.org/W2913500244","https://openalex.org/W4237165034","https://openalex.org/W4242360587","https://openalex.org/W4253991977","https://openalex.org/W4299665420","https://openalex.org/W4317768232","https://openalex.org/W6725788948"],"related_works":["https://openalex.org/W2374901194","https://openalex.org/W2033512842","https://openalex.org/W2994319598","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3116237489","https://openalex.org/W1607054433"],"abstract_inverted_index":{"Abstract":[0],"Reliability":[1],"growth":[2,32,52,93],"models":[3,33,53,63,94],"are":[4,55,64],"commonly":[5,27],"used":[6,28],"in":[7,67],"the":[8,40,58,86],"Department":[9],"of":[10,30,85,91,98],"Defense":[11],"(DoD)":[12],"to":[13,80],"plan,":[14],"track,":[15],"and":[16,22,39,74,89],"project":[17],"reliability":[18,31,51,92],"during":[19],"system":[20],"acquisition":[21],"testing.":[23],"We":[24,46],"describe":[25],"two":[26,49],"classes":[29],"for":[34,43],"continuous":[35],"failure":[36],"time":[37],"data":[38],"metrics":[41],"appropriate":[42],"their":[44],"use.":[45],"also":[47],"present":[48],"Bayesian":[50,62],"that":[54],"based":[56],"on":[57],"DoD":[59,99],"models.":[60],"The":[61],"easily":[65],"interpretable":[66],"a":[68,82,96],"statistical":[69],"framework,":[70],"which":[71],"supports":[72],"estimation":[73],"uncertainty":[75],"quantification.":[76],"Our":[77],"goal":[78],"is":[79],"provide":[81],"practical":[83],"understanding":[84],"development,":[87],"implementation,":[88],"use":[90],"across":[95],"sequence":[97],"testing":[100],"events.":[101]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}