{"id":"https://openalex.org/W4408983197","doi":"https://doi.org/10.1002/cta.4523","title":"A Low Overhead Double\u2010Node\u2010Upset Self\u2010Recoverable Latch Based on Polarity Design and Source Isolation Technology","display_name":"A Low Overhead Double\u2010Node\u2010Upset Self\u2010Recoverable Latch Based on Polarity Design and Source Isolation Technology","publication_year":2025,"publication_date":"2025-03-28","ids":{"openalex":"https://openalex.org/W4408983197","doi":"https://doi.org/10.1002/cta.4523"},"language":"en","primary_location":{"id":"doi:10.1002/cta.4523","is_oa":true,"landing_page_url":"https://doi.org/10.1002/cta.4523","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/cta.4523","source":{"id":"https://openalex.org/S92132303","display_name":"International Journal of Circuit Theory and Applications","issn_l":"0098-9886","issn":["0098-9886","1097-007X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Circuit Theory and Applications","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/cta.4523","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063284983","display_name":"Qiang Zhao","orcid":"https://orcid.org/0000-0002-0278-5804"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Zhao","raw_affiliation_strings":["School of Integrated Circuits Anhui University  Hefei China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits Anhui University  Hefei China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110981714","display_name":"Hao Wang","orcid":"https://orcid.org/0000-0002-0260-2000"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Wang","raw_affiliation_strings":["School of Integrated Circuits Anhui University  Hefei China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits Anhui University  Hefei China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100305835","display_name":"Lang Tian","orcid":null},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lang Tian","raw_affiliation_strings":["School of Integrated Circuits Anhui University  Hefei China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits Anhui University  Hefei China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010890352","display_name":"Shiyu Zhao","orcid":"https://orcid.org/0009-0009-4363-6002"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shiyu Zhao","raw_affiliation_strings":["School of Integrated Circuits Anhui University  Hefei China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits Anhui University  Hefei China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011435173","display_name":"Shengyue Zhang","orcid":"https://orcid.org/0000-0002-0065-1343"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shengyue Zhang","raw_affiliation_strings":["School of Integrated Circuits Anhui University  Hefei China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits Anhui University  Hefei China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5082970785","display_name":"Licai Hao","orcid":"https://orcid.org/0000-0002-0637-5132"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Licai Hao","raw_affiliation_strings":["School of Integrated Circuits Anhui University  Hefei China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits Anhui University  Hefei China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101549984","display_name":"Xin Li","orcid":"https://orcid.org/0000-0002-0125-5254"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xin Li","raw_affiliation_strings":["School of Integrated Circuits Anhui University  Hefei China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits Anhui University  Hefei China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5005392238","display_name":"Shibin Lu","orcid":null},"institutions":[{"id":"https://openalex.org/I174385955","display_name":"Hefei Normal University","ror":"https://ror.org/01b64k086","country_code":"CN","type":"education","lineage":["https://openalex.org/I174385955"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shibin Lu","raw_affiliation_strings":["School of Electronic Information and Integrated Circuits Hefei Normal University  Hefei China"],"affiliations":[{"raw_affiliation_string":"School of Electronic Information and Integrated Circuits Hefei Normal University  Hefei China","institution_ids":["https://openalex.org/I174385955"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075966974","display_name":"Chunyu Peng","orcid":"https://orcid.org/0000-0003-2408-5048"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chunyu Peng","raw_affiliation_strings":["School of Integrated Circuits Anhui University  Hefei China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits Anhui University  Hefei China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072637140","display_name":"Zhiting Lin","orcid":"https://orcid.org/0000-0002-3314-1606"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiting Lin","raw_affiliation_strings":["School of Integrated Circuits Anhui University  Hefei China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits Anhui University  Hefei China","institution_ids":["https://openalex.org/I143868143"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037391840","display_name":"Xiulong Wu","orcid":"https://orcid.org/0000-0002-5012-2570"},"institutions":[{"id":"https://openalex.org/I143868143","display_name":"Anhui University","ror":"https://ror.org/05th6yx34","country_code":"CN","type":"education","lineage":["https://openalex.org/I143868143"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xiulong Wu","raw_affiliation_strings":["School of Integrated Circuits Anhui University  Hefei China"],"affiliations":[{"raw_affiliation_string":"School of Integrated Circuits Anhui University  Hefei China","institution_ids":["https://openalex.org/I143868143"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":11,"corresponding_author_ids":["https://openalex.org/A5037391840"],"corresponding_institution_ids":["https://openalex.org/I143868143"],"apc_list":{"value":3660,"currency":"USD","value_usd":3660},"apc_paid":null,"fwci":0.7428,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.69954039,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":"53","issue":"11","first_page":"6665","last_page":"6674"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.996999979019165,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/polarity","display_name":"Polarity (international relations)","score":0.7321091890335083},{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation (microbiology)","score":0.7100138664245605},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6479640007019043},{"id":"https://openalex.org/keywords/node","display_name":"Node (physics)","score":0.5968384742736816},{"id":"https://openalex.org/keywords/upset","display_name":"Upset","score":0.5938568115234375},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5010683536529541},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3770466148853302},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3759937286376953},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3161865472793579},{"id":"https://openalex.org/keywords/chemistry","display_name":"Chemistry","score":0.11506962776184082}],"concepts":[{"id":"https://openalex.org/C2777361361","wikidata":"https://www.wikidata.org/wiki/Q1112585","display_name":"Polarity (international relations)","level":3,"score":0.7321091890335083},{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.7100138664245605},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6479640007019043},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.5968384742736816},{"id":"https://openalex.org/C2778002589","wikidata":"https://www.wikidata.org/wiki/Q2406791","display_name":"Upset","level":2,"score":0.5938568115234375},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5010683536529541},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3770466148853302},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3759937286376953},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3161865472793579},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.11506962776184082},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C1491633281","wikidata":"https://www.wikidata.org/wiki/Q7868","display_name":"Cell","level":2,"score":0.0},{"id":"https://openalex.org/C89423630","wikidata":"https://www.wikidata.org/wiki/Q7193","display_name":"Microbiology","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/cta.4523","is_oa":true,"landing_page_url":"https://doi.org/10.1002/cta.4523","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/cta.4523","source":{"id":"https://openalex.org/S92132303","display_name":"International Journal of Circuit Theory and Applications","issn_l":"0098-9886","issn":["0098-9886","1097-007X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Circuit Theory and Applications","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1002/cta.4523","is_oa":true,"landing_page_url":"https://doi.org/10.1002/cta.4523","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/cta.4523","source":{"id":"https://openalex.org/S92132303","display_name":"International Journal of Circuit Theory and Applications","issn_l":"0098-9886","issn":["0098-9886","1097-007X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Circuit Theory and Applications","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4408983197.pdf"},"referenced_works_count":44,"referenced_works":["https://openalex.org/W1659671481","https://openalex.org/W1899181454","https://openalex.org/W2015524290","https://openalex.org/W2023659251","https://openalex.org/W2050431855","https://openalex.org/W2089197452","https://openalex.org/W2093095207","https://openalex.org/W2138815251","https://openalex.org/W2142386325","https://openalex.org/W2143279430","https://openalex.org/W2529622066","https://openalex.org/W2558274594","https://openalex.org/W2578302800","https://openalex.org/W2769731910","https://openalex.org/W2808868355","https://openalex.org/W2894057114","https://openalex.org/W2971710811","https://openalex.org/W2980034044","https://openalex.org/W2997361554","https://openalex.org/W3000209635","https://openalex.org/W3008392074","https://openalex.org/W3010963881","https://openalex.org/W3046446688","https://openalex.org/W3088899692","https://openalex.org/W3183821998","https://openalex.org/W3193856086","https://openalex.org/W3199363867","https://openalex.org/W4225252527","https://openalex.org/W4308544387","https://openalex.org/W4312546227","https://openalex.org/W4320170196","https://openalex.org/W4365420287","https://openalex.org/W4377235607","https://openalex.org/W4384026284","https://openalex.org/W4387587595","https://openalex.org/W4388117470","https://openalex.org/W4388903371","https://openalex.org/W4389207700","https://openalex.org/W4390045069","https://openalex.org/W4390120102","https://openalex.org/W4391468691","https://openalex.org/W4399110696","https://openalex.org/W4403021813","https://openalex.org/W4406727903"],"related_works":["https://openalex.org/W2028180791","https://openalex.org/W607682241","https://openalex.org/W320153218","https://openalex.org/W2352434195","https://openalex.org/W2619155","https://openalex.org/W2361293896","https://openalex.org/W1968403090","https://openalex.org/W3205431322","https://openalex.org/W4200618691","https://openalex.org/W2001819439"],"abstract_inverted_index":{"ABSTRACT":[0],"With":[1],"the":[2,7,13,43,53,57,74,90,96],"advancement":[3],"of":[4,15,45,76,104],"nanotechnology":[5],"and":[6,37,60,68,72,80,115,121],"continuous":[8],"reduction":[9,103],"in":[10,87,106,110,113,117],"transistor":[11],"dimensions,":[12],"impact":[14],"double\u2010node\u2010upset":[16],"(DNU)":[17],"is":[18],"intensifying.":[19],"This":[20],"paper":[21],"introduces":[22],"a":[23],"novel":[24],"low":[25,77,81],"overhead":[26,59],"DNU":[27,92],"self\u2010recoverable":[28,93],"latch":[29,33,49,94,98],"(LODSL).":[30],"The":[31,48],"LODSL":[32,97],"uses":[34],"polarity":[35],"design":[36],"source":[38],"isolation":[39],"technology":[40],"to":[41,64,89],"reduce":[42],"number":[44],"sensitive":[46],"nodes.":[47],"does":[50],"not":[51],"adopt":[52],"redundant":[54],"design,":[55,95],"reduces":[56],"circuit":[58],"area,":[61,114],"adopts":[62],"D":[63],"Q":[65],"transmission":[66],"pathway":[67],"clock":[69],"gating":[70],"technology,":[71],"has":[73,99,124],"characteristics":[75],"power":[78,107],"consumption":[79],"delay.":[82],"Simulation":[83],"results":[84],"indicate":[85],"that,":[86],"comparison":[88],"recent":[91],"achieved":[100],"an":[101],"average":[102],"50.8%":[105],"consumption,":[108],"40.3%":[109],"delay,":[111],"35.6%":[112],"79.4%":[116],"power\u2010delay\u2010area":[118],"product":[119],"(PDAP),":[120],"it":[122],"still":[123],"good":[125],"robustness":[126],"under":[127],"different":[128],"PVT":[129],"conditions.":[130]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}