{"id":"https://openalex.org/W2059579836","doi":"https://doi.org/10.1002/cta.4490230603","title":"Nullator\u2010norator approach to analogue circuit diagnosis using general\u2010purpose analysis programmes","display_name":"Nullator\u2010norator approach to analogue circuit diagnosis using general\u2010purpose analysis programmes","publication_year":1995,"publication_date":"1995-11-01","ids":{"openalex":"https://openalex.org/W2059579836","doi":"https://doi.org/10.1002/cta.4490230603","mag":"2059579836"},"language":"en","primary_location":{"id":"doi:10.1002/cta.4490230603","is_oa":false,"landing_page_url":"https://doi.org/10.1002/cta.4490230603","pdf_url":null,"source":{"id":"https://openalex.org/S92132303","display_name":"International Journal of Circuit Theory and Applications","issn_l":"0098-9886","issn":["0098-9886","1097-007X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Circuit Theory and Applications","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5025436491","display_name":"Samuil L. Farchy","orcid":null},"institutions":[{"id":"https://openalex.org/I31151848","display_name":"Technical University of Sofia","ror":"https://ror.org/052prhs50","country_code":"BG","type":"education","lineage":["https://openalex.org/I31151848"]}],"countries":["BG"],"is_corresponding":true,"raw_author_name":"Samuil L. Farchy","raw_affiliation_strings":["Department of Theoretical Electrical Engineering, Technical University, 1756 Sofia, Bulgaria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Theoretical Electrical Engineering, Technical University, 1756 Sofia, Bulgaria","institution_ids":["https://openalex.org/I31151848"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038822902","display_name":"Elisaveta D. Gadzheva","orcid":null},"institutions":[{"id":"https://openalex.org/I24768866","display_name":"Bulgarian Academy of Sciences","ror":"https://ror.org/01x8hew03","country_code":"BG","type":"government","lineage":["https://openalex.org/I24768866"]}],"countries":["BG"],"is_corresponding":false,"raw_author_name":"Elisaveta D. Gadzheva","raw_affiliation_strings":["Center of Informatics and Computer Technology, Bulgarian Academy of Science, 1113 Sofia, Bulgaria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center of Informatics and Computer Technology, Bulgarian Academy of Science, 1113 Sofia, Bulgaria","institution_ids":["https://openalex.org/I24768866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052642389","display_name":"Lyudmila H. Raykovska","orcid":null},"institutions":[{"id":"https://openalex.org/I31151848","display_name":"Technical University of Sofia","ror":"https://ror.org/052prhs50","country_code":"BG","type":"education","lineage":["https://openalex.org/I31151848"]}],"countries":["BG"],"is_corresponding":false,"raw_author_name":"Lyudmila H. Raykovska","raw_affiliation_strings":["Department of Electronic Manufacturing Technology, Technical University, 1756 Sofia, Bulgaria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronic Manufacturing Technology, Technical University, 1756 Sofia, Bulgaria","institution_ids":["https://openalex.org/I31151848"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5043931370","display_name":"Todor G. Kouyoumdjiev","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Todor G. Kouyoumdjiev","raw_affiliation_strings":["ECoCoMS, 24 Assen Zlatarov Str., 1504 Sofia, Bulgaria"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ECoCoMS, 24 Assen Zlatarov Str., 1504 Sofia, Bulgaria","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5025436491"],"corresponding_institution_ids":["https://openalex.org/I31151848"],"apc_list":{"value":3660,"currency":"USD","value_usd":3660},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":26,"citation_normalized_percentile":{"value":0.15500795,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"23","issue":"6","first_page":"571","last_page":"585"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.6752662658691406},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6139618754386902},{"id":"https://openalex.org/keywords/network-analysis","display_name":"Network analysis","score":0.5471028089523315},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5140112638473511},{"id":"https://openalex.org/keywords/decomposition","display_name":"Decomposition","score":0.4937015473842621},{"id":"https://openalex.org/keywords/switched-capacitor","display_name":"Switched capacitor","score":0.4623817801475525},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.46092697978019714},{"id":"https://openalex.org/keywords/isolation","display_name":"Isolation (microbiology)","score":0.45663243532180786},{"id":"https://openalex.org/keywords/identification","display_name":"Identification (biology)","score":0.45213809609413147},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.42944082617759705},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4106692671775818},{"id":"https://openalex.org/keywords/computer-engineering","display_name":"Computer engineering","score":0.40328821539878845},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3837026357650757},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.34388765692710876},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.33860063552856445},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2950563430786133},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12925922870635986}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.6752662658691406},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6139618754386902},{"id":"https://openalex.org/C32946077","wikidata":"https://www.wikidata.org/wiki/Q618079","display_name":"Network analysis","level":2,"score":0.5471028089523315},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5140112638473511},{"id":"https://openalex.org/C124681953","wikidata":"https://www.wikidata.org/wiki/Q339062","display_name":"Decomposition","level":2,"score":0.4937015473842621},{"id":"https://openalex.org/C103357873","wikidata":"https://www.wikidata.org/wiki/Q572656","display_name":"Switched capacitor","level":4,"score":0.4623817801475525},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.46092697978019714},{"id":"https://openalex.org/C2775941552","wikidata":"https://www.wikidata.org/wiki/Q25212305","display_name":"Isolation (microbiology)","level":2,"score":0.45663243532180786},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.45213809609413147},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.42944082617759705},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4106692671775818},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.40328821539878845},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3837026357650757},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.34388765692710876},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.33860063552856445},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2950563430786133},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12925922870635986},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C89423630","wikidata":"https://www.wikidata.org/wiki/Q7193","display_name":"Microbiology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C59822182","wikidata":"https://www.wikidata.org/wiki/Q441","display_name":"Botany","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/cta.4490230603","is_oa":false,"landing_page_url":"https://doi.org/10.1002/cta.4490230603","pdf_url":null,"source":{"id":"https://openalex.org/S92132303","display_name":"International Journal of Circuit Theory and Applications","issn_l":"0098-9886","issn":["0098-9886","1097-007X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of Circuit Theory and Applications","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W107719080","https://openalex.org/W1588380009","https://openalex.org/W1902533858","https://openalex.org/W1976891713","https://openalex.org/W2000260960","https://openalex.org/W2007452896","https://openalex.org/W2013236767","https://openalex.org/W2045455812","https://openalex.org/W2048773562","https://openalex.org/W2053218655","https://openalex.org/W2062505844","https://openalex.org/W2068355008","https://openalex.org/W2131984324","https://openalex.org/W2153691819"],"related_works":["https://openalex.org/W2124313625","https://openalex.org/W1976890648","https://openalex.org/W2116819859","https://openalex.org/W2090288129","https://openalex.org/W2038862772","https://openalex.org/W2381889521","https://openalex.org/W2129862008","https://openalex.org/W1991809200","https://openalex.org/W2971711290","https://openalex.org/W4313193714"],"abstract_inverted_index":{"Abstract":[0],"In":[1],"this":[2],"paper":[3],"a":[4,31,109],"decomposition":[5],"approach":[6],"to":[7,22],"diagnosis":[8,50,94],"and":[9,15,41,54,67,83,95,105],"fault":[10,96],"prediction":[11],"in":[12,89],"large":[13],"analogue":[14],"switched":[16],"capacitor":[17],"circuits":[18,101],"is":[19],"proposed,":[20],"reduced":[21],"an":[23],"analysis":[24,85],"of":[25,38,51,57,77,93,99,108],"the":[26,45,63,75,78,90,106,113],"corresponding":[27],"nullator\u2010norator":[28],"models":[29],"at":[30],"single":[32],"test":[33],"frequency.":[34],"Algorithms":[35],"for":[36,48,55,81],"isolation":[37],"faulty":[39,52,58],"nodes":[40,53],"subcircuits":[42],"are":[43,116],"presented.":[44,117],"topological":[46],"conditions":[47],"performing":[49],"identification":[56],"elements":[59],"have":[60,70,86],"been":[61,71,87,103],"considered.":[62],"element":[64],"tolerance":[65],"variations":[66],"measurement":[68],"errors":[69],"taken":[72],"into":[73],"account.":[74],"possibilities":[76],"general\u2010purpose":[79],"programmes":[80],"frequency":[82],"worst\u2010case":[84],"used":[88],"practical":[91],"implementation":[92],"prediction.":[97],"Diagnosis":[98],"benchmark":[100],"has":[102],"performed":[104],"results":[107],"computer":[110],"simulation":[111],"using":[112],"programme":[114],"PSpice":[115]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":3},{"year":2016,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":2}],"updated_date":"2026-05-21T06:26:12.895304","created_date":"2025-10-10T00:00:00"}