{"id":"https://openalex.org/W4320008294","doi":"https://doi.org/10.1002/aisy.202370003","title":"Predicting Atomic Force Microscopy Topography from Optical Microscopes Using Deep Learning","display_name":"Predicting Atomic Force Microscopy Topography from Optical Microscopes Using Deep Learning","publication_year":2023,"publication_date":"2023-01-01","ids":{"openalex":"https://openalex.org/W4320008294","doi":"https://doi.org/10.1002/aisy.202370003"},"language":"en","primary_location":{"id":"doi:10.1002/aisy.202370003","is_oa":true,"landing_page_url":"https://doi.org/10.1002/aisy.202370003","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/aisy.202370003","source":{"id":"https://openalex.org/S4210212817","display_name":"Advanced Intelligent Systems","issn_l":"2640-4567","issn":["2640-4567"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Intelligent Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/aisy.202370003","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060718300","display_name":"Jaewoo Jeong","orcid":"https://orcid.org/0000-0001-8789-792X"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaewoo Jeong","raw_affiliation_strings":["Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066816643","display_name":"Taeyeong Kim","orcid":"https://orcid.org/0000-0001-9335-1894"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taeyeong Kim","raw_affiliation_strings":["Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062818004","display_name":"Bong Jae Lee","orcid":"https://orcid.org/0000-0002-6842-7444"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Bong Jae Lee","raw_affiliation_strings":["Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024241386","display_name":"Jungchul Lee","orcid":"https://orcid.org/0000-0001-7880-8657"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jungchul Lee","raw_affiliation_strings":["Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5024241386","https://openalex.org/A5062818004"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":{"value":2750,"currency":"USD","value_usd":2750},"apc_paid":{"value":2750,"currency":"USD","value_usd":2750},"fwci":0.6377,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.59659916,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":"5","issue":"1","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9642999768257141,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9642999768257141,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9083999991416931,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/atomic-force-microscopy","display_name":"Atomic force microscopy","score":0.775056779384613},{"id":"https://openalex.org/keywords/optical-microscope","display_name":"Optical microscope","score":0.5944360494613647},{"id":"https://openalex.org/keywords/autoencoder","display_name":"Autoencoder","score":0.56584233045578},{"id":"https://openalex.org/keywords/microscopy","display_name":"Microscopy","score":0.5573604106903076},{"id":"https://openalex.org/keywords/magnetic-force-microscope","display_name":"Magnetic force microscope","score":0.5099292993545532},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4978158473968506},{"id":"https://openalex.org/keywords/microscope","display_name":"Microscope","score":0.490477055311203},{"id":"https://openalex.org/keywords/resolution","display_name":"Resolution (logic)","score":0.46617579460144043},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4326077997684479},{"id":"https://openalex.org/keywords/margin","display_name":"Margin (machine learning)","score":0.4280276894569397},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.30970266461372375},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3035358190536499},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.28876882791519165},{"id":"https://openalex.org/keywords/deep-learning","display_name":"Deep learning","score":0.283638596534729},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.25928202271461487},{"id":"https://openalex.org/keywords/scanning-electron-microscope","display_name":"Scanning electron microscope","score":0.13633006811141968},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.07698813080787659}],"concepts":[{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.775056779384613},{"id":"https://openalex.org/C77017923","wikidata":"https://www.wikidata.org/wiki/Q912313","display_name":"Optical microscope","level":3,"score":0.5944360494613647},{"id":"https://openalex.org/C101738243","wikidata":"https://www.wikidata.org/wiki/Q786435","display_name":"Autoencoder","level":3,"score":0.56584233045578},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.5573604106903076},{"id":"https://openalex.org/C181635281","wikidata":"https://www.wikidata.org/wiki/Q2799395","display_name":"Magnetic force microscope","level":4,"score":0.5099292993545532},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4978158473968506},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.490477055311203},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.46617579460144043},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4326077997684479},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.4280276894569397},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.30970266461372375},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3035358190536499},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.28876882791519165},{"id":"https://openalex.org/C108583219","wikidata":"https://www.wikidata.org/wiki/Q197536","display_name":"Deep learning","level":2,"score":0.283638596534729},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.25928202271461487},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.13633006811141968},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.07698813080787659},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.0},{"id":"https://openalex.org/C32546565","wikidata":"https://www.wikidata.org/wiki/Q856711","display_name":"Magnetization","level":3,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/aisy.202370003","is_oa":true,"landing_page_url":"https://doi.org/10.1002/aisy.202370003","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/aisy.202370003","source":{"id":"https://openalex.org/S4210212817","display_name":"Advanced Intelligent Systems","issn_l":"2640-4567","issn":["2640-4567"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Intelligent Systems","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1002/aisy.202370003","is_oa":true,"landing_page_url":"https://doi.org/10.1002/aisy.202370003","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/aisy.202370003","source":{"id":"https://openalex.org/S4210212817","display_name":"Advanced Intelligent Systems","issn_l":"2640-4567","issn":["2640-4567"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Intelligent Systems","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4320008294.pdf"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4386106354","https://openalex.org/W2517391003","https://openalex.org/W2385625896","https://openalex.org/W2035387987","https://openalex.org/W119975033","https://openalex.org/W2080823790","https://openalex.org/W2201509369","https://openalex.org/W2044594887","https://openalex.org/W1532628279","https://openalex.org/W2008350978"],"abstract_inverted_index":{"Atomic":[0],"Force":[1],"Microscopy":[2],"In":[3],"article":[4],"number":[5],"2200317,":[6],"Bong":[7],"Jae":[8],"Lee,":[9],"Jaewoo":[10],"Jeong,":[11],"and":[12,66],"co-workers":[13],"present":[14],"a":[15,50],"deep":[16],"learning":[17],"model":[18],"that":[19],"predicts":[20],"atomic":[21],"force":[22],"microscope":[23,28],"(AFM)":[24],"topographies":[25],"from":[26,45],"optical":[27],"(OM)":[29],"images.":[30],"Using":[31],"the":[32,37],"proposed":[33],"multi-domain":[34],"autoencoder":[35],"model,":[36],"upscale":[38],"resolution":[39],"of":[40,53,68],"1.72":[41],"fold":[42],"is":[43],"achieved":[44],"OM":[46],"to":[47],"AFM":[48],"with":[49],"~15%":[51],"margin":[52],"error.":[54],"Based":[55],"on":[56],"such":[57],"proficiency,":[58],"its":[59],"simultaneous":[60],"applications":[61],"in":[62],"surface":[63],"morphological":[64],"classification":[65],"simulation":[67],"dynamic":[69],"surfaces\u2019":[70],"transformation":[71],"are":[72],"successfully":[73],"demonstrated.":[74]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":1}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}