{"id":"https://openalex.org/W4313450997","doi":"https://doi.org/10.1002/aisy.202200317","title":"Predicting AFM Topography from Optical Microscope Images Using Deep\u2010Learning","display_name":"Predicting AFM Topography from Optical Microscope Images Using Deep\u2010Learning","publication_year":2022,"publication_date":"2022-12-20","ids":{"openalex":"https://openalex.org/W4313450997","doi":"https://doi.org/10.1002/aisy.202200317"},"language":"en","primary_location":{"id":"doi:10.1002/aisy.202200317","is_oa":true,"landing_page_url":"https://doi.org/10.1002/aisy.202200317","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/aisy.202200317","source":{"id":"https://openalex.org/S4210212817","display_name":"Advanced Intelligent Systems","issn_l":"2640-4567","issn":["2640-4567"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Intelligent Systems","raw_type":"journal-article"},"type":"article","indexed_in":["crossref","doaj"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/aisy.202200317","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060718300","display_name":"Jaewoo Jeong","orcid":"https://orcid.org/0000-0001-8789-792X"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jaewoo Jeong","raw_affiliation_strings":["Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066816643","display_name":"Taeyeong Kim","orcid":"https://orcid.org/0000-0001-9335-1894"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Taeyeong Kim","raw_affiliation_strings":["Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062818004","display_name":"Bong Jae Lee","orcid":"https://orcid.org/0000-0002-6842-7444"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Bong Jae Lee","raw_affiliation_strings":["Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024241386","display_name":"Jungchul Lee","orcid":"https://orcid.org/0000-0001-7880-8657"},"institutions":[{"id":"https://openalex.org/I157485424","display_name":"Korea Advanced Institute of Science and Technology","ror":"https://ror.org/05apxxy63","country_code":"KR","type":"education","lineage":["https://openalex.org/I157485424"]}],"countries":["KR"],"is_corresponding":true,"raw_author_name":"Jungchul Lee","raw_affiliation_strings":["Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea"],"affiliations":[{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering Korea Advanced Institute of Science and Technology  291, Daehak-ro Yuseong-gu Daejeon 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Department of Mechanical Engineering, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]},{"raw_affiliation_string":"Center for Extreme Thermal Physics and Manufacturing, Korea Advanced Institute of Science and Technology, 291, Daehak-ro, Yuseong-gu, Daejeon, 34141 Republic of Korea","institution_ids":["https://openalex.org/I157485424"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5024241386","https://openalex.org/A5062818004"],"corresponding_institution_ids":["https://openalex.org/I157485424"],"apc_list":{"value":2750,"currency":"USD","value_usd":2750},"apc_paid":{"value":2750,"currency":"USD","value_usd":2750},"fwci":0.4565,"has_fulltext":true,"cited_by_count":4,"citation_normalized_percentile":{"value":0.6370587,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":99},"biblio":{"volume":"5","issue":"1","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10923","display_name":"Force Microscopy Techniques and Applications","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11799","display_name":"Adhesion, Friction, and Surface Interactions","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12466","display_name":"Near-Field Optical Microscopy","score":0.9966999888420105,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/atomic-force-microscopy","display_name":"Atomic force microscopy","score":0.6560481786727905},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5367037057876587},{"id":"https://openalex.org/keywords/microscopy","display_name":"Microscopy","score":0.48837345838546753},{"id":"https://openalex.org/keywords/nanotechnology","display_name":"Nanotechnology","score":0.45331454277038574},{"id":"https://openalex.org/keywords/optical-microscope","display_name":"Optical microscope","score":0.42511802911758423},{"id":"https://openalex.org/keywords/optics","display_name":"Optics","score":0.4167567789554596},{"id":"https://openalex.org/keywords/microscope","display_name":"Microscope","score":0.41105154156684875},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38528478145599365},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.15623822808265686},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.15126600861549377},{"id":"https://openalex.org/keywords/scanning-electron-microscope","display_name":"Scanning electron microscope","score":0.10821542143821716}],"concepts":[{"id":"https://openalex.org/C102951782","wikidata":"https://www.wikidata.org/wiki/Q49295","display_name":"Atomic force microscopy","level":2,"score":0.6560481786727905},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5367037057876587},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.48837345838546753},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.45331454277038574},{"id":"https://openalex.org/C77017923","wikidata":"https://www.wikidata.org/wiki/Q912313","display_name":"Optical microscope","level":3,"score":0.42511802911758423},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4167567789554596},{"id":"https://openalex.org/C67649825","wikidata":"https://www.wikidata.org/wiki/Q196538","display_name":"Microscope","level":2,"score":0.41105154156684875},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38528478145599365},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.15623822808265686},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.15126600861549377},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.10821542143821716}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1002/aisy.202200317","is_oa":true,"landing_page_url":"https://doi.org/10.1002/aisy.202200317","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/aisy.202200317","source":{"id":"https://openalex.org/S4210212817","display_name":"Advanced Intelligent Systems","issn_l":"2640-4567","issn":["2640-4567"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Intelligent Systems","raw_type":"journal-article"},{"id":"pmh:oai:doaj.org/article:c0b03a311ed444cf9d378149c6cf5940","is_oa":true,"landing_page_url":"https://doaj.org/article/c0b03a311ed444cf9d378149c6cf5940","pdf_url":null,"source":{"id":"https://openalex.org/S112646816","display_name":"SHILAP Revista de lepidopterolog\u00eda","issn_l":"0300-5267","issn":["0300-5267","2340-4078"],"is_oa":true,"is_in_doaj":true,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Advanced Intelligent Systems, Vol 5, Iss 1, Pp n/a-n/a (2023)","raw_type":"article"}],"best_oa_location":{"id":"doi:10.1002/aisy.202200317","is_oa":true,"landing_page_url":"https://doi.org/10.1002/aisy.202200317","pdf_url":"https://onlinelibrary.wiley.com/doi/pdfdirect/10.1002/aisy.202200317","source":{"id":"https://openalex.org/S4210212817","display_name":"Advanced Intelligent Systems","issn_l":"2640-4567","issn":["2640-4567"],"is_oa":true,"is_in_doaj":true,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Advanced Intelligent Systems","raw_type":"journal-article"},"sustainable_development_goals":[],"awards":[{"id":"https://openalex.org/G2267656407","display_name":null,"funder_award_id":"2020R1A4A2002728","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G3034753964","display_name":null,"funder_award_id":"grant","funder_id":"https://openalex.org/F4320320671","funder_display_name":"National Research Foundation"},{"id":"https://openalex.org/G342704958","display_name":null,"funder_award_id":"funded","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G5338453953","display_name":null,"funder_award_id":"NRF-2020R1A2C3004885","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G6242139587","display_name":null,"funder_award_id":"2020R1A2C3004885","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G648436014","display_name":null,"funder_award_id":"NRF-2020R1A4A2002728","funder_id":"https://openalex.org/F4320328359","funder_display_name":"Ministry of Science and ICT, South Korea"},{"id":"https://openalex.org/G6618952035","display_name":null,"funder_award_id":"NRF-2020R1A4A2002728","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"},{"id":"https://openalex.org/G982292920","display_name":null,"funder_award_id":"NRF-20","funder_id":"https://openalex.org/F4320322120","funder_display_name":"National Research Foundation of Korea"}],"funders":[{"id":"https://openalex.org/F4320320671","display_name":"National Research Foundation","ror":"https://ror.org/05s0g1g46"},{"id":"https://openalex.org/F4320322120","display_name":"National Research Foundation of Korea","ror":"https://ror.org/013aysd81"},{"id":"https://openalex.org/F4320328359","display_name":"Ministry of Science and ICT, South Korea","ror":"https://ror.org/01wpjm123"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W4313450997.pdf","grobid_xml":"https://content.openalex.org/works/W4313450997.grobid-xml"},"referenced_works_count":30,"referenced_works":["https://openalex.org/W855079161","https://openalex.org/W2022974873","https://openalex.org/W2090804874","https://openalex.org/W2165698076","https://openalex.org/W2253429366","https://openalex.org/W2270518385","https://openalex.org/W2551726731","https://openalex.org/W2588792456","https://openalex.org/W2755659751","https://openalex.org/W2773379445","https://openalex.org/W2892253951","https://openalex.org/W2904591139","https://openalex.org/W2905056310","https://openalex.org/W2914540228","https://openalex.org/W2948580189","https://openalex.org/W2963881378","https://openalex.org/W2965187129","https://openalex.org/W3013691153","https://openalex.org/W3016134467","https://openalex.org/W3098297200","https://openalex.org/W3118577024","https://openalex.org/W3119774682","https://openalex.org/W3159398191","https://openalex.org/W3161416871","https://openalex.org/W3202227130","https://openalex.org/W3203689172","https://openalex.org/W3217162796","https://openalex.org/W4205765055","https://openalex.org/W4206245975","https://openalex.org/W4224235393"],"related_works":["https://openalex.org/W4386106354","https://openalex.org/W2080823790","https://openalex.org/W2517391003","https://openalex.org/W2385625896","https://openalex.org/W119975033","https://openalex.org/W2006802527","https://openalex.org/W2001655186","https://openalex.org/W1532628279","https://openalex.org/W2607350649","https://openalex.org/W2201509369"],"abstract_inverted_index":{"Atomic":[0],"force":[1],"microscopy":[2],"(AFM)":[3],"is":[4,21,28,67,148,159,183],"routinely":[5],"used":[6],"as":[7],"a":[8,42,49,109],"metrological":[9],"tool":[10],"among":[11],"diverse":[12],"scientific":[13],"and":[14,27,80,139,177],"engineering":[15],"disciplines.":[16],"A":[17],"typical":[18],"AFM,":[19],"however,":[20],"intrinsically":[22],"limited":[23],"by":[24,47],"low":[25],"throughput":[26,127],"inoperable":[29],"under":[30,151],"extreme":[31,152],"conditions.":[32],"Thus,":[33],"this":[34,64,146],"work":[35],"attempts":[36],"to":[37,41,53,115,129,134],"provide":[38],"an":[39,103,155],"alternative":[40],"conventional":[43],"optical":[44],"microscope":[45],"(OM)":[46],"training":[48],"deep":[50],"learning":[51],"model":[52],"predict":[54],"surface":[55,58,79,89,174],"topography":[56,125],"from":[57,113],"OM":[59,114,130],"images.":[60],"The":[61,117],"feasibility":[62],"of":[63,98,105,179],"novel":[65],"methodology":[66],"shown":[68],"with":[69,108],"germanium\u2010on\u2010nothing":[70],"(GON)":[71],"samples,":[72],"which":[73],"are":[74,91],"self\u2010assembled":[75],"structures":[76],"that":[77],"undergo":[78],"sub\u2010surface":[81],"morphological":[82,175],"transformations":[83],"upon":[84],"high\u2010temperature":[85],"annealing.":[86],"Their":[87],"transformed":[88],"topographies":[90],"predicted":[92],"based":[93],"on":[94,162],"the":[95,165],"OM\u2010AFM":[96],"correlation":[97],"three":[99],"different":[100],"surfaces,":[101],"bearing":[102],"error":[104],"about":[106,121],"15%":[107],"1.72\u00d7":[110],"resolution":[111],"upscale":[112],"AFM.":[116],"OM\u2010based":[118],"approach":[119],"brings":[120],"significant":[122],"improvement":[123],"in":[124,156,169],"measurement":[126,158],"(equivalent":[128],"acquisition":[131],"rate,":[132],"up":[133],"200":[135],"frames":[136],"per":[137],"second)":[138],"area":[140],"(\u22481":[141],"mm":[142],"2":[143],").":[144],"Furthermore,":[145],"method":[147],"operable":[149],"even":[150],"environments":[153],"when":[154],"situ":[157],"impossible.":[160],"Based":[161],"such":[163],"competence,":[164],"model's":[166],"simultaneous":[167],"application":[168],"further":[170],"specimen":[171],"analysis,":[172],"namely":[173],"classification":[176],"simulation":[178],"dynamic":[180],"surfaces\u2019":[181],"transformation":[182],"also":[184],"demonstrated.":[185]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2}],"updated_date":"2026-03-27T14:29:43.386196","created_date":"2025-10-10T00:00:00"}