{"id":"https://openalex.org/W2013468463","doi":"https://doi.org/10.1002/1520-684x(200010)31:11<41::aid-scj5>3.0.co;2-f","title":"Static test compaction for IDDQ testing of bridging faults in sequential circuits","display_name":"Static test compaction for IDDQ testing of bridging faults in sequential circuits","publication_year":2000,"publication_date":"2000-01-01","ids":{"openalex":"https://openalex.org/W2013468463","doi":"https://doi.org/10.1002/1520-684x(200010)31:11<41::aid-scj5>3.0.co;2-f","mag":"2013468463"},"language":"en","primary_location":{"id":"doi:10.1002/1520-684x(200010)31:11<41::aid-scj5>3.0.co;2-f","is_oa":false,"landing_page_url":"https://doi.org/10.1002/1520-684x(200010)31:11<41::aid-scj5>3.0.co;2-f","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5080764382","display_name":"Yoshinobu Higami","orcid":"https://orcid.org/0000-0002-2909-6777"},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshinobu Higami","raw_affiliation_strings":["Department of Computer Science, Ehime University, Matsuyama, Japan 790-8577","Department of Computer Science, Ehime University, Matsuyama, Japan 790\u20108577"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Ehime University, Matsuyama, Japan 790-8577","institution_ids":["https://openalex.org/I43545212"]},{"raw_affiliation_string":"Department of Computer Science, Ehime University, Matsuyama, Japan 790\u20108577","institution_ids":["https://openalex.org/I43545212"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110218098","display_name":"Kewal K. Saluja","orcid":null},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kewal K. Saluja","raw_affiliation_strings":["Department of Electrical and Computer Engineering, University of Wisconsin\u2013Madison, Madison, Wisconsin 53706","Department of Electrical & Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, University of Wisconsin\u2013Madison, Madison, Wisconsin 53706","institution_ids":["https://openalex.org/I135310074"]},{"raw_affiliation_string":"Department of Electrical & Computer Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110073346","display_name":"Yuzo Takamatsu","orcid":null},"institutions":[{"id":"https://openalex.org/I43545212","display_name":"Ehime University","ror":"https://ror.org/017hkng22","country_code":"JP","type":"education","lineage":["https://openalex.org/I43545212"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yuzo Takamatsu","raw_affiliation_strings":["Department of Computer Science, Ehime University, Matsuyama, Japan 790-8577","Department of Computer Science, Ehime University, Matsuyama, Japan 790\u20108577"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Computer Science, Ehime University, Matsuyama, Japan 790-8577","institution_ids":["https://openalex.org/I43545212"]},{"raw_affiliation_string":"Department of Computer Science, Ehime University, Matsuyama, Japan 790\u20108577","institution_ids":["https://openalex.org/I43545212"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5111554225","display_name":"Kozo Kinoshita","orcid":null},"institutions":[{"id":"https://openalex.org/I98285908","display_name":"The University of Osaka","ror":"https://ror.org/035t8zc32","country_code":"JP","type":"education","lineage":["https://openalex.org/I98285908"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kozo Kinoshita","raw_affiliation_strings":["Graduate School of Engineering, Osaka University, Suita, Japan 565-0871","Graduate School of Engineering, Osaka University,Suita,Japan,565-0871"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Graduate School of Engineering, Osaka University, Suita, Japan 565-0871","institution_ids":["https://openalex.org/I98285908"]},{"raw_affiliation_string":"Graduate School of Engineering, Osaka University,Suita,Japan,565-0871","institution_ids":["https://openalex.org/I98285908"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.11794171,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"31","issue":"11","first_page":"41","last_page":"50"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9952999949455261,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.9859375357627869},{"id":"https://openalex.org/keywords/bridging","display_name":"Bridging (networking)","score":0.6117562055587769},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5404942631721497},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.5401169061660767},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.47698742151260376},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.4730096161365509},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.47036004066467285},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.45332637429237366},{"id":"https://openalex.org/keywords/compaction","display_name":"Compaction","score":0.4528352916240692},{"id":"https://openalex.org/keywords/test-method","display_name":"Test method","score":0.41979220509529114},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2623971402645111},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14532241225242615},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12601718306541443},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.06629818677902222}],"concepts":[{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.9859375357627869},{"id":"https://openalex.org/C174348530","wikidata":"https://www.wikidata.org/wiki/Q188635","display_name":"Bridging (networking)","level":2,"score":0.6117562055587769},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5404942631721497},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.5401169061660767},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.47698742151260376},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4730096161365509},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.47036004066467285},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.45332637429237366},{"id":"https://openalex.org/C196715460","wikidata":"https://www.wikidata.org/wiki/Q1414356","display_name":"Compaction","level":2,"score":0.4528352916240692},{"id":"https://openalex.org/C132519959","wikidata":"https://www.wikidata.org/wiki/Q3077373","display_name":"Test method","level":2,"score":0.41979220509529114},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2623971402645111},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14532241225242615},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12601718306541443},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.06629818677902222},{"id":"https://openalex.org/C187320778","wikidata":"https://www.wikidata.org/wiki/Q1349130","display_name":"Geotechnical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/1520-684x(200010)31:11<41::aid-scj5>3.0.co;2-f","is_oa":false,"landing_page_url":"https://doi.org/10.1002/1520-684x(200010)31:11<41::aid-scj5>3.0.co;2-f","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1681606397","https://openalex.org/W1972479656","https://openalex.org/W2005388837","https://openalex.org/W2026539765","https://openalex.org/W2050956910","https://openalex.org/W2123489233","https://openalex.org/W2135931142","https://openalex.org/W2137843962","https://openalex.org/W2145843054","https://openalex.org/W2147400189","https://openalex.org/W2148757937","https://openalex.org/W2152673094","https://openalex.org/W2174547182","https://openalex.org/W2542179834","https://openalex.org/W6643237947","https://openalex.org/W6678447862","https://openalex.org/W6679980185","https://openalex.org/W6680293625"],"related_works":["https://openalex.org/W2082374775","https://openalex.org/W2538904067","https://openalex.org/W1549680942","https://openalex.org/W2091833418","https://openalex.org/W2913077774","https://openalex.org/W4256030018","https://openalex.org/W2145089576","https://openalex.org/W2021253405","https://openalex.org/W1986228509","https://openalex.org/W2541320067"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,42,64],"static":[4],"test":[5,17,39,50],"compaction":[6,15,40],"method":[7,80],"for":[8,29,86],"IDDQ":[9,30,34],"testing":[10,26],"of":[11,33,63,77],"sequential":[12],"circuits.":[13,89],"Test":[14],"reduces":[16,25],"application":[18],"time":[19],"and":[20,23,37,54],"tester":[21],"memory":[22],"consequently":[24],"cost.":[27],"Particularly":[28],"testing,":[31],"measurement":[32],"is":[35,41,73,81],"time-consuming,":[36],"thus":[38],"very":[43],"important":[44],"issue.":[45],"In":[46],"the":[47,78],"proposed":[48,79],"method,":[49],"subsequences":[51,58],"are":[52],"removed":[53],"replaced":[55],"with":[56],"shorter":[57],"by":[59,83],"considering":[60],"state":[61],"transition":[62],"circuit":[65],"under":[66],"test,":[67],"so":[68],"that":[69],"original":[70],"fault":[71],"coverage":[72],"guaranteed.":[74],"The":[75],"effectiveness":[76],"demonstrated":[82],"experimental":[84],"results":[85],"ISCAS'89":[87],"benchmark":[88],"\u00a9":[90],"2000":[91,99],"Scripta":[92],"Technica,":[93],"Syst":[94],"Comp":[95],"Jpn,":[96],"31(11):":[97],"41\u201350,":[98]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}