{"id":"https://openalex.org/W2039122401","doi":"https://doi.org/10.1002/(sici)1520-684x(199905)30:5<18::aid-scj3>3.0.co;2-o","title":"Random pattern testable design with partial circuit duplication and IDDQ testing","display_name":"Random pattern testable design with partial circuit duplication and IDDQ testing","publication_year":1999,"publication_date":"1999-05-01","ids":{"openalex":"https://openalex.org/W2039122401","doi":"https://doi.org/10.1002/(sici)1520-684x(199905)30:5<18::aid-scj3>3.0.co;2-o","mag":"2039122401"},"language":"en","primary_location":{"id":"doi:10.1002/(sici)1520-684x(199905)30:5<18::aid-scj3>3.0.co;2-o","is_oa":false,"landing_page_url":"https://doi.org/10.1002/(sici)1520-684x(199905)30:5<18::aid-scj3>3.0.co;2-o","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5062484119","display_name":"Hiroshi Yokoyama","orcid":"https://orcid.org/0000-0003-1857-665X"},"institutions":[{"id":"https://openalex.org/I203765153","display_name":"Akita University","ror":"https://ror.org/03hv1ad10","country_code":"JP","type":"education","lineage":["https://openalex.org/I203765153"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroshi Yokoyama","raw_affiliation_strings":["Department of Information Engineering, Mining College, Akita University, Akita, Japan 010-8502","Department of Information Engineering, Mining College, Akita University, Akita, Japan 010\u20108502"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Mining College, Akita University, Akita, Japan 010-8502","institution_ids":["https://openalex.org/I203765153"]},{"raw_affiliation_string":"Department of Information Engineering, Mining College, Akita University, Akita, Japan 010\u20108502","institution_ids":["https://openalex.org/I203765153"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084697545","display_name":"Xiaoqing Wen","orcid":"https://orcid.org/0000-0001-8305-604X"},"institutions":[{"id":"https://openalex.org/I4210107885","display_name":"Syntek Technologies (United States)","ror":"https://ror.org/01rpq5x59","country_code":"US","type":"company","lineage":["https://openalex.org/I4210107885"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiaoqing Wen","raw_affiliation_strings":["SynTest Technologies Inc., Sunnyvale, California 94086"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SynTest Technologies Inc., Sunnyvale, California 94086","institution_ids":["https://openalex.org/I4210107885"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012709277","display_name":"Hideo Tamamoto","orcid":null},"institutions":[{"id":"https://openalex.org/I203765153","display_name":"Akita University","ror":"https://ror.org/03hv1ad10","country_code":"JP","type":"education","lineage":["https://openalex.org/I203765153"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hideo Tamamoto","raw_affiliation_strings":["Department of Information Engineering, Mining College, Akita University, Akita, Japan 010-8502","Department of Information Engineering, Mining College, Akita University, Akita, Japan 010\u20108502"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Information Engineering, Mining College, Akita University, Akita, Japan 010-8502","institution_ids":["https://openalex.org/I203765153"]},{"raw_affiliation_string":"Department of Information Engineering, Mining College, Akita University, Akita, Japan 010\u20108502","institution_ids":["https://openalex.org/I203765153"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.13473483,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"30","issue":"5","first_page":"18","last_page":"27"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9969000220298767,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/iddq-testing","display_name":"Iddq testing","score":0.844195544719696},{"id":"https://openalex.org/keywords/testability","display_name":"Testability","score":0.7396560907363892},{"id":"https://openalex.org/keywords/random-testing","display_name":"Random testing","score":0.7076961398124695},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6335413455963135},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.6168071031570435},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.585321307182312},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4876083433628082},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.4874406158924103},{"id":"https://openalex.org/keywords/benchmark","display_name":"Benchmark (surveying)","score":0.47505995631217957},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.41993504762649536},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.3452169597148895},{"id":"https://openalex.org/keywords/parallel-computing","display_name":"Parallel computing","score":0.32904738187789917},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3148472011089325},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1840856969356537},{"id":"https://openalex.org/keywords/test-case","display_name":"Test case","score":0.11831077933311462},{"id":"https://openalex.org/keywords/programming-language","display_name":"Programming language","score":0.06587007641792297}],"concepts":[{"id":"https://openalex.org/C206678392","wikidata":"https://www.wikidata.org/wiki/Q5987815","display_name":"Iddq testing","level":3,"score":0.844195544719696},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.7396560907363892},{"id":"https://openalex.org/C106159264","wikidata":"https://www.wikidata.org/wiki/Q17146789","display_name":"Random testing","level":4,"score":0.7076961398124695},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6335413455963135},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.6168071031570435},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.585321307182312},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4876083433628082},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.4874406158924103},{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.47505995631217957},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.41993504762649536},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3452169597148895},{"id":"https://openalex.org/C173608175","wikidata":"https://www.wikidata.org/wiki/Q232661","display_name":"Parallel computing","level":1,"score":0.32904738187789917},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3148472011089325},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1840856969356537},{"id":"https://openalex.org/C128942645","wikidata":"https://www.wikidata.org/wiki/Q1568346","display_name":"Test case","level":3,"score":0.11831077933311462},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.06587007641792297},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.0},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C205649164","wikidata":"https://www.wikidata.org/wiki/Q1071","display_name":"Geography","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1002/(sici)1520-684x(199905)30:5<18::aid-scj3>3.0.co;2-o","is_oa":false,"landing_page_url":"https://doi.org/10.1002/(sici)1520-684x(199905)30:5<18::aid-scj3>3.0.co;2-o","pdf_url":null,"source":{"id":"https://openalex.org/S58208175","display_name":"Systems and Computers in Japan","issn_l":"0882-1666","issn":["0882-1666","1520-684X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https://openalex.org/P4310320595","host_organization_name":"Wiley","host_organization_lineage":["https://openalex.org/P4310320595"],"host_organization_lineage_names":["Wiley"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Systems and Computers in Japan","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5099999904632568,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":34,"referenced_works":["https://openalex.org/W1506881247","https://openalex.org/W1555575363","https://openalex.org/W2021756047","https://openalex.org/W2052327858","https://openalex.org/W2106632970","https://openalex.org/W2123988074","https://openalex.org/W2127181941","https://openalex.org/W2133288230","https://openalex.org/W2139955070","https://openalex.org/W2140692776","https://openalex.org/W2150787880","https://openalex.org/W2154087083","https://openalex.org/W2156368823","https://openalex.org/W2157748808","https://openalex.org/W2159575479","https://openalex.org/W2159742780","https://openalex.org/W2170084487","https://openalex.org/W2215675469","https://openalex.org/W6630354965","https://openalex.org/W6674137191","https://openalex.org/W6676336115","https://openalex.org/W6677596083","https://openalex.org/W6678371896","https://openalex.org/W6678991663","https://openalex.org/W6680042322","https://openalex.org/W6680313436","https://openalex.org/W6680559477","https://openalex.org/W6682230839","https://openalex.org/W6682725335","https://openalex.org/W6682999413","https://openalex.org/W6683104756","https://openalex.org/W6683478789","https://openalex.org/W6683894502","https://openalex.org/W6684632632"],"related_works":["https://openalex.org/W2107525390","https://openalex.org/W2157191248","https://openalex.org/W295681459","https://openalex.org/W2150046587","https://openalex.org/W2164493372","https://openalex.org/W2114980936","https://openalex.org/W1594445436","https://openalex.org/W2128920253","https://openalex.org/W2142405811","https://openalex.org/W2164349885"],"abstract_inverted_index":{"The":[0,92],"Built-In":[1],"Self-Test":[2],"(BIST)":[3],"method":[4,76],"has":[5],"been":[6],"proposed":[7],"as":[8],"a":[9,44,115,135],"Design":[10],"for":[11,28,77],"Testability":[12],"(DFT)":[13],"approach":[14],"in":[15,58],"order":[16],"to":[17,53,96,100],"reduce":[18],"the":[19,31,108,111,118],"difficulty":[20],"of":[21,47,82,114,139],"LSI":[22],"testing.":[23,91],"Pseudo-random":[24],"testing":[25,99],"is":[26,50,95],"suitable":[27],"BIST":[29],"because":[30],"test":[32,48],"can":[33,131],"be":[34,132],"performed":[35],"at":[36],"low":[37],"cost":[38],"with":[39,134],"little":[40],"hardware":[41,140],"overhead.":[42,141],"However,":[43],"large":[45],"number":[46],"patterns":[49],"usually":[51],"required":[52],"achieve":[54],"sufficient":[55],"fault":[56,129],"coverage":[57,130],"random":[59,66,79,102],"testing,":[60],"since":[61],"not":[62],"all":[63],"circuits":[64,84,125],"are":[65],"pattern":[67,80,103],"testable.":[68],"In":[69],"this":[70],"paper,":[71],"we":[72],"present":[73],"an":[74],"innovative":[75],"improving":[78],"testability":[81],"logic":[83],"by":[85,106],"partial":[86],"circuit":[87,116],"duplication":[88],"and":[89,117],"IDDQ":[90,98],"fundamental":[93],"idea":[94],"use":[97],"detect":[101],"resistant":[104],"faults":[105],"using":[107],"difference":[109],"between":[110],"duplicated":[112],"part":[113],"original":[119],"part.":[120],"Experimental":[121],"results":[122],"on":[123],"benchmark":[124],"show":[126],"that":[127],"high":[128],"achieved":[133],"very":[136],"small":[137],"amount":[138],"\u00a9":[142],"1999":[143,151],"Scripta":[144],"Technica,":[145],"Syst":[146],"Comp":[147],"Jpn,":[148],"30(5):":[149],"18\u201327,":[150]},"counts_by_year":[],"updated_date":"2026-06-23T06:36:01.041984","created_date":"2025-10-10T00:00:00"}