{"id":"https://openalex.org/W904534405","doi":"https://doi.org/10.1016/j.ijleo.2015.05.127","title":"The ablation of Ta2O5 film by pulsed nanosecond Gaussian laser beams","display_name":"The ablation of Ta2O5 film by pulsed nanosecond Gaussian laser beams","publication_year":2015,"publication_date":"2015-06-06","ids":{"openalex":"https://openalex.org/W904534405","doi":"https://doi.org/10.1016/j.ijleo.2015.05.127","mag":"904534405"},"language":"en","primary_location":{"id":"doi:10.1016/j.ijleo.2015.05.127","doi":"https://doi.org/10.1016/j.ijleo.2015.05.127","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ijleo.2015.05.127","pdf_url":null,"source":{"id":"https://openalex.org/S201441698","display_name":"Optik","issn_l":"0030-4026","issn":["0030-4026","1618-1336"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optik","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5001230731","display_name":"Jinghua Han","orcid":"https://orcid.org/0000-0002-0056-3992","observed_orcids":["https://orcid.org/0000-0002-0056-3992"]},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jinghua Han","raw_affiliation_strings":["College of Electronics & Information Engineering, Sichuan University, Chengdu 610064, China","College of Electronics and Information Engineering,Sichuan University, Chengdu 610064,China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronics & Information Engineering, Sichuan University, Chengdu 610064, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"College of Electronics and Information Engineering,Sichuan University, Chengdu 610064,China)","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043780028","display_name":"Yaguo Li","orcid":"https://orcid.org/0000-0003-1839-3351","observed_orcids":["https://orcid.org/0000-0003-1839-3351"]},"institutions":[{"id":"https://openalex.org/I4402554102","display_name":"Chengdu Fine Optical Engineering Research Center","ror":"https://ror.org/05r2q4835","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4402554102"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yaguo Li","raw_affiliation_strings":["Fine Optical Engineering Research Center, Chengdu 610041, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fine Optical Engineering Research Center, Chengdu 610041, China","institution_ids":["https://openalex.org/I4402554102"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5007454648","display_name":"Weixing Fan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weixing Fan","raw_affiliation_strings":["College of Electronics & Information Engineering, Sichuan University, Chengdu 610064, China","College of Electronics and Information Engineering,Sichuan University, Chengdu 610064,China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronics & Information Engineering, Sichuan University, Chengdu 610064, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"College of Electronics and Information Engineering,Sichuan University, Chengdu 610064,China)","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5072432276","display_name":"Changtao He","orcid":"https://orcid.org/0009-0003-4699-4856","observed_orcids":["https://orcid.org/0009-0003-4699-4856"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Changtao He","raw_affiliation_strings":["Southwest Institute of Technical Physics, Chengdu 610041, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southwest Institute of Technical Physics, Chengdu 610041, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010897633","display_name":"Pingqiu Wang","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Pingqiu Wang","raw_affiliation_strings":["Southwest Institute of Technical Physics, Chengdu 610041, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southwest Institute of Technical Physics, Chengdu 610041, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027606942","display_name":"Guoying Feng","orcid":"https://orcid.org/0000-0002-4533-1423","observed_orcids":["https://orcid.org/0000-0002-4533-1423"]},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guoying Feng","raw_affiliation_strings":["College of Electronics & Information Engineering, Sichuan University, Chengdu 610064, China","College of Electronics and Information Engineering,Sichuan University, Chengdu 610064,China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronics & Information Engineering, Sichuan University, Chengdu 610064, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"College of Electronics and Information Engineering,Sichuan University, Chengdu 610064,China)","institution_ids":["https://openalex.org/I24185976"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5017506466","display_name":"Chao Guo","orcid":"https://orcid.org/0000-0001-7156-7088","observed_orcids":["https://orcid.org/0000-0001-7156-7088"]},"institutions":[{"id":"https://openalex.org/I24185976","display_name":"Sichuan University","ror":"https://ror.org/011ashp19","country_code":"CN","type":"education","lineage":["https://openalex.org/I24185976"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Guo","raw_affiliation_strings":["College of Electronics & Information Engineering, Sichuan University, Chengdu 610064, China","College of Electronics and Information Engineering,Sichuan University, Chengdu 610064,China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electronics & Information Engineering, Sichuan University, Chengdu 610064, China","institution_ids":["https://openalex.org/I24185976"]},{"raw_affiliation_string":"College of Electronics and Information Engineering,Sichuan University, Chengdu 610064,China)","institution_ids":["https://openalex.org/I24185976"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5043780028"],"corresponding_institution_ids":["https://openalex.org/I4402554102"],"apc_list":{"value":2650,"currency":"USD","value_usd":2650},"apc_paid":null,"fwci":0.4429,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.727041,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":88,"max":96},"biblio":{"volume":"126","issue":"20","first_page":"2327","last_page":"2330"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10732","display_name":"Laser Material Processing Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13232","display_name":"Laser-Ablation Synthesis of Nanoparticles","score":0.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/tantalum-pentoxide-thin-films","display_name":"tantalum pentoxide thin films","score":0.796999990940094},{"id":"https://openalex.org/keywords/laser-ablation","display_name":"laser ablation","score":0.9419999718666077},{"id":"https://openalex.org/keywords/nanosecond-pulsed-laser","display_name":"nanosecond pulsed laser","score":0.8399999737739563},{"id":"https://openalex.org/keywords/gaussian-beam","display_name":"Gaussian beam","score":0.8870000243186951},{"id":"https://openalex.org/keywords/laser-induced-damage","display_name":"laser-induced damage","score":0.7570000290870667},{"id":"https://openalex.org/keywords/nanoparticle-formation","display_name":"nanoparticle formation","score":0.7730000019073486},{"id":"https://openalex.org/keywords/high-power-lasers","display_name":"high-power lasers","score":0.5210000276565552}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8383325338363647},{"id":"https://openalex.org/C2778902805","wikidata":"https://www.wikidata.org/wiki/Q322177","display_name":"Ablation","level":2,"score":0.6941012144088745},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6344473361968994},{"id":"https://openalex.org/C51141536","wikidata":"https://www.wikidata.org/wiki/Q838801","display_name":"Nanosecond","level":3,"score":0.5910570025444031},{"id":"https://openalex.org/C2779188808","wikidata":"https://www.wikidata.org/wiki/Q1806547","display_name":"Laser ablation","level":3,"score":0.5275651812553406},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.516465425491333},{"id":"https://openalex.org/C2778315978","wikidata":"https://www.wikidata.org/wiki/Q944873","display_name":"Gaussian beam","level":3,"score":0.4786011874675751},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.45986342430114746},{"id":"https://openalex.org/C22078206","wikidata":"https://www.wikidata.org/wiki/Q1418023","display_name":"Fluence","level":3,"score":0.4457988440990448},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.42224544286727905},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3628537058830261},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.12014108896255493},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.08237975835800171},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.0},{"id":"https://openalex.org/C146978453","wikidata":"https://www.wikidata.org/wiki/Q3798668","display_name":"Aerospace engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1016/j.ijleo.2015.05.127","doi":"https://doi.org/10.1016/j.ijleo.2015.05.127","is_oa":false,"landing_page_url":"https://doi.org/10.1016/j.ijleo.2015.05.127","pdf_url":null,"source":{"id":"https://openalex.org/S201441698","display_name":"Optik","issn_l":"0030-4026","issn":["0030-4026","1618-1336"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","jufo-1","poland-40","russia-white-list-2"],"host_organization":"https://openalex.org/P4310320990","host_organization_name":"Elsevier BV","host_organization_lineage":["https://openalex.org/P4310320990"],"host_organization_lineage_names":["Elsevier BV"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Optik","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1044250689","https://openalex.org/W1567727884","https://openalex.org/W1976267430","https://openalex.org/W1989225113","https://openalex.org/W1994974427","https://openalex.org/W2005606547","https://openalex.org/W2018155857","https://openalex.org/W2065287483","https://openalex.org/W2068338793","https://openalex.org/W2070363082","https://openalex.org/W2071624791","https://openalex.org/W2079089990","https://openalex.org/W2087723989","https://openalex.org/W2091811066","https://openalex.org/W2131720871","https://openalex.org/W2460110597","https://openalex.org/W2476694213"],"related_works":["https://openalex.org/W2051149457","https://openalex.org/W2019665834","https://openalex.org/W2131391764","https://openalex.org/W2129190170","https://openalex.org/W2085268971","https://openalex.org/W4393395555","https://openalex.org/W7132483426","https://openalex.org/W2080464617","https://openalex.org/W2060082992","https://openalex.org/W4393009113"],"abstract_inverted_index":null,"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2016,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}