{"id":"https://openalex.org/W836711816","doi":null,"title":"Changes in chemical and optical properties of thin film metal mirrors on LDEF","display_name":"Changes in chemical and optical properties of thin film metal mirrors on LDEF","publication_year":1995,"publication_date":"1995-02-01","ids":{"openalex":"https://openalex.org/W836711816","mag":"836711816"},"language":"en","primary_location":{"id":"pmh:oai:casi.ntrs.nasa.gov:19950017487","doi":null,"is_oa":true,"landing_page_url":"http://hdl.handle.net/2060/19950017487","pdf_url":"http://hdl.handle.net/2060/19950017487","source":{"id":"https://openalex.org/S4306402118","display_name":"NASA Technical Reports Server (NASA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4210124779","host_organization_name":"National Aeronautics and Space Administration","host_organization_lineage":["https://openalex.org/I4210124779"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"CASI","raw_type":"NASA. Langley Research Center, LDEF: 69 Months in Space. Third Post-Retrieval Symposium, Part 2; p 703-725"},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"http://hdl.handle.net/2060/19950017487","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5108237774","display_name":"Palmer N. Peters","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1294504835","display_name":"Marshall Space Flight Center","ror":"https://ror.org/02epydz83","country_code":"US","type":"facility","lineage":["https://openalex.org/I1294504835","https://openalex.org/I4210124779"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"P. N. Peters","raw_affiliation_strings":["NASA, Marshall Space Flight Center Huntsville, AL, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NASA, Marshall Space Flight Center Huntsville, AL, United States","institution_ids":["https://openalex.org/I1294504835"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034053253","display_name":"James M. Zwiener","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"James M. Zwiener","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042650133","display_name":"John C. Gregory","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I82495205","display_name":"University of Alabama in Huntsville","ror":"https://ror.org/02zsxwr40","country_code":"US","type":"education","lineage":["https://openalex.org/I82495205"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"J. C. Gregory","raw_affiliation_strings":["Alabama, University, Huntsville, AL, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Alabama, University, Huntsville, AL, United States","institution_ids":["https://openalex.org/I82495205"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030515066","display_name":"Ganesh N. Raikar","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I82495205","display_name":"University of Alabama in Huntsville","ror":"https://ror.org/02zsxwr40","country_code":"US","type":"education","lineage":["https://openalex.org/I82495205"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ganesh N. Raikar","raw_affiliation_strings":["Alabama, University, Huntsville, AL, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Alabama, University, Huntsville, AL, United States","institution_ids":["https://openalex.org/I82495205"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004983844","display_name":"Ligia C. Christl","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I82495205","display_name":"University of Alabama in Huntsville","ror":"https://ror.org/02zsxwr40","country_code":"US","type":"education","lineage":["https://openalex.org/I82495205"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Ligia C. Christl","raw_affiliation_strings":["Alabama, University, Huntsville, AL, United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Alabama, University, Huntsville, AL, United States","institution_ids":["https://openalex.org/I82495205"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110234717","display_name":"Donald R. Wilkes","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210154085","display_name":"AZ Technology (United States)","ror":"https://ror.org/05y6gdf04","country_code":"US","type":"company","lineage":["https://openalex.org/I4210154085"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Donald R. Wilkes","raw_affiliation_strings":["AZ Technology Huntsville, AL., United States"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"AZ Technology Huntsville, AL., United States","institution_ids":["https://openalex.org/I4210154085"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.14386876,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":93},"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12449","display_name":"Spacecraft Design and Technology","score":0.2921999990940094,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12449","display_name":"Spacecraft Design and Technology","score":0.2921999990940094,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11723","display_name":"Optical Coatings and Gratings","score":0.23989999294281006,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.0731000006198883,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/long-duration-exposure-facility","display_name":"Long Duration Exposure Facility","score":0.7129999995231628},{"id":"https://openalex.org/keywords/space-environment-effects","display_name":"space environment effects","score":0.4860000014305115},{"id":"https://openalex.org/keywords/atomic-oxygen","display_name":"atomic oxygen","score":0.7129999995231628},{"id":"https://openalex.org/keywords/molecular-contamination","display_name":"molecular contamination","score":0.9169999957084656},{"id":"https://openalex.org/keywords/optical-reflectance","display_name":"optical reflectivity","score":0.8899999856948853},{"id":"https://openalex.org/keywords/infrared-reflectance","display_name":"infrared reflectivity","score":0.996999979019165},{"id":"https://openalex.org/keywords/metal-oxidation","display_name":"metal oxidation","score":0.8050000071525574},{"id":"https://openalex.org/keywords/copper","display_name":"copper","score":0.5569999814033508},{"id":"https://openalex.org/keywords/nickel","display_name":"nickel","score":0.8259999752044678},{"id":"https://openalex.org/keywords/platinum","display_name":"platinum","score":0.8579999804496765},{"id":"https://openalex.org/keywords/gold","display_name":"gold","score":0.921999990940094},{"id":"https://openalex.org/keywords/molybdenum","display_name":"molybdenum","score":0.9049999713897705},{"id":"https://openalex.org/keywords/tungsten","display_name":"tungsten","score":0.9980000257492065},{"id":"https://openalex.org/keywords/tin","display_name":"tin","score":0.8529999852180481},{"id":"https://openalex.org/keywords/film-thickness","display_name":"film thickness","score":0.7350000143051147}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.7070409059524536},{"id":"https://openalex.org/C544153396","wikidata":"https://www.wikidata.org/wiki/Q11426","display_name":"Metal","level":2,"score":0.6554701924324036},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.6448903679847717},{"id":"https://openalex.org/C2776798109","wikidata":"https://www.wikidata.org/wiki/Q11391","display_name":"Ultraviolet","level":2,"score":0.5182685256004333},{"id":"https://openalex.org/C158355884","wikidata":"https://www.wikidata.org/wiki/Q11388","display_name":"Infrared","level":2,"score":0.4838108420372009},{"id":"https://openalex.org/C175708663","wikidata":"https://www.wikidata.org/wiki/Q899559","display_name":"X-ray photoelectron spectroscopy","level":2,"score":0.4770195484161377},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.41564080119132996},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.4007970094680786},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3840342164039612},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2381245195865631},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.1876751184463501},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.17202237248420715},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.09270471334457397},{"id":"https://openalex.org/C46141821","wikidata":"https://www.wikidata.org/wiki/Q209402","display_name":"Nuclear magnetic resonance","level":1,"score":0.08934289216995239},{"id":"https://openalex.org/C107872376","wikidata":"https://www.wikidata.org/wiki/Q321355","display_name":"Environmental chemistry","level":1,"score":0.08475792407989502},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06327778100967407}],"mesh":[],"locations_count":2,"locations":[{"id":"pmh:oai:casi.ntrs.nasa.gov:19950017487","doi":null,"is_oa":true,"landing_page_url":"http://hdl.handle.net/2060/19950017487","pdf_url":"http://hdl.handle.net/2060/19950017487","source":{"id":"https://openalex.org/S4306402118","display_name":"NASA Technical Reports Server (NASA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4210124779","host_organization_name":"National Aeronautics and Space Administration","host_organization_lineage":["https://openalex.org/I4210124779"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"CASI","raw_type":"NASA. Langley Research Center, LDEF: 69 Months in Space. Third Post-Retrieval Symposium, Part 2; p 703-725"},{"id":"mag:836711816","doi":null,"is_oa":false,"landing_page_url":"https://ntrs.nasa.gov/api/citations/19950017487/downloads/19950017487.pdf","pdf_url":null,"source":{"id":"https://openalex.org/S4306402118","display_name":"NASA Technical Reports Server (NASA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4210124779","host_organization_name":"National Aeronautics and Space Administration","host_organization_lineage":["https://openalex.org/I4210124779"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:oai:casi.ntrs.nasa.gov:19950017487","doi":null,"is_oa":true,"landing_page_url":"http://hdl.handle.net/2060/19950017487","pdf_url":"http://hdl.handle.net/2060/19950017487","source":{"id":"https://openalex.org/S4306402118","display_name":"NASA Technical Reports Server (NASA)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4210124779","host_organization_name":"National Aeronautics and Space Administration","host_organization_lineage":["https://openalex.org/I4210124779"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"CASI","raw_type":"NASA. Langley Research Center, LDEF: 69 Months in Space. Third Post-Retrieval Symposium, Part 2; p 703-725"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W836711816.pdf","grobid_xml":"https://content.openalex.org/works/W836711816.grobid-xml"},"referenced_works_count":6,"referenced_works":["https://openalex.org/W6509964","https://openalex.org/W1557681670","https://openalex.org/W1618263494","https://openalex.org/W1980658835","https://openalex.org/W2045317043","https://openalex.org/W2162123284"],"related_works":["https://openalex.org/W1656502095","https://openalex.org/W6990761979","https://openalex.org/W205818287","https://openalex.org/W1970760947","https://openalex.org/W2064885478","https://openalex.org/W2792047154","https://openalex.org/W2610773436","https://openalex.org/W2016193218","https://openalex.org/W2034251911","https://openalex.org/W2059692637"],"abstract_inverted_index":{"Thin":[0],"films":[1,35,49,80,107,115],"of":[2,29,33,85,93,119,140],"the":[3,24,30,53,82,120,138],"metals":[4],"Cu,":[5,75,141],"Ni,":[6,77],"Pt,":[7],"Au,":[8],"Sn,":[9],"Mo,":[10,76],"and":[11,26,43,62,69,78,87,108],"W":[12,79],"deposited":[13,116],"on":[14,23,81,105,117,158],"fused":[15],"silica":[16],"flats":[17],"were":[18,36,50,72],"exposed":[19,48],"at":[20],"ambient":[21],"temperature":[22],"leading":[25,83],"trailing":[27],"faces":[28],"LDEF.":[31],"Reflectances":[32],"these":[34],"measured":[37],"from":[38,153],"250":[39],"to":[40,52,90,95],"2500":[41],"nm":[42],"compared":[44],"with":[45,127,142,151],"controls.":[46],"The":[47,122],"subjected":[51],"LDEF":[54,86],"external":[55],"environment":[56],"including":[57],"atomic":[58],"oxygen,":[59],"molecular":[60],"contamination,":[61],"solar":[63],"ultraviolet.":[64],"Major":[65],"changes":[66,99],"in":[67,100,137],"optical":[68,101,123,134],"infrared":[70],"reflectance":[71],"seen":[73,104],"for":[74],"face":[84],"are":[88,103,109,125],"attributed":[89],"partial":[91],"conversion":[92],"metal":[94,96],"oxide.":[97],"Smaller":[98],"properties":[102],"all":[106],"probably":[110],"caused":[111],"by":[112],"thin":[113],"contaminant":[114],"top":[118],"metal.":[121],"measurements":[124],"correlated":[126],"film":[128],"thickness":[129],"measurements,":[130],"x-ray":[131,143],"photoelectron":[132],"spectroscopy,":[133],"calculations,":[135],"and,":[136],"case":[139],"diffraction":[144],"measurements.":[145],"In":[146],"a":[147,154],"few":[148],"cases,":[149],"comparisons":[150],"results":[152],"similar":[155],"UAH":[156],"experiment":[157],"STS-8":[159],"have":[160],"been":[161],"drawn.":[162]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}