{"id":"https://openalex.org/W83165826","doi":"https://doi.org/10.1007/978-3-319-08994-2_16","title":"Reliability Simulation Models for Hot Carrier Degradation","display_name":"Reliability Simulation Models for Hot Carrier Degradation","publication_year":2014,"publication_date":"2014-10-04","ids":{"openalex":"https://openalex.org/W83165826","doi":"https://doi.org/10.1007/978-3-319-08994-2_16","mag":"83165826"},"language":"en","primary_location":{"id":"doi:10.1007/978-3-319-08994-2_16","doi":"https://doi.org/10.1007/978-3-319-08994-2_16","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-08994-2_16","pdf_url":null,"source":{"id":"https://openalex.org/S4306463937","display_name":"Springer eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Hot Carrier Degradation in Semiconductor Devices","raw_type":"book-chapter"},"volume":{"id":"https://openalex.org/W2485848341","display_name":"Hot Carrier Degradation in Semiconductor Devices"},"type":"book-chapter","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070534850","display_name":"A.J. Scholten","orcid":"https://orcid.org/0000-0003-1861-883X","observed_orcids":["https://orcid.org/0000-0003-1861-883X"]},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":true,"raw_author_name":"A. J. Scholten","raw_affiliation_strings":["NXP Semiconductors, Eindhoven, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":null,"display_name":"B. De Vries","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I109147379","display_name":"NXP (Netherlands)","ror":"https://ror.org/059be4e97","country_code":"NL","type":"company","lineage":["https://openalex.org/I109147379"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"B. De Vries","raw_affiliation_strings":["NXP Semiconductors, Eindhoven, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Eindhoven, The Netherlands","institution_ids":["https://openalex.org/I109147379"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060056829","display_name":"J. Bisschop","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Bisschop","raw_affiliation_strings":["NXP Semiconductors, Nijmegen, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Nijmegen, The Netherlands","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5019015062","display_name":"Guido T. Sasse","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"G. T. Sasse","raw_affiliation_strings":["NXP Semiconductors, Nijmegen, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NXP Semiconductors, Nijmegen, The Netherlands","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5070534850"],"corresponding_institution_ids":["https://openalex.org/I109147379"],"apc_list":null,"apc_paid":null,"fwci":1.2715,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.73523291,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":87,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"477","last_page":"517"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.5034000277519226,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.5034000277519226,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.13259999454021454,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.07280000299215317,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hot-carrier-degradation","display_name":"hot carrier degradation","score":0.8809999823570251},{"id":"https://openalex.org/keywords/circuit-reliability","display_name":"circuit reliability","score":0.7919999957084656},{"id":"https://openalex.org/keywords/transient-stress","display_name":"transient stress","score":0.6890000104904175},{"id":"https://openalex.org/keywords/analytical-degradation-model","display_name":"analytical degradation model","score":0.4390000104904175}],"concepts":[{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.7368041276931763},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7013791799545288},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6882996559143066},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48031800985336304},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23323684930801392},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0728507936000824},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0716198980808258},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.03595307469367981},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/978-3-319-08994-2_16","doi":"https://doi.org/10.1007/978-3-319-08994-2_16","is_oa":false,"landing_page_url":"https://doi.org/10.1007/978-3-319-08994-2_16","pdf_url":null,"source":{"id":"https://openalex.org/S4306463937","display_name":"Springer eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Hot Carrier Degradation in Semiconductor Devices","raw_type":"book-chapter"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":39,"referenced_works":["https://openalex.org/W39827286","https://openalex.org/W69844381","https://openalex.org/W140381716","https://openalex.org/W158754393","https://openalex.org/W1544964413","https://openalex.org/W1837519801","https://openalex.org/W1862967631","https://openalex.org/W1935786328","https://openalex.org/W1979006344","https://openalex.org/W1999806435","https://openalex.org/W2009945983","https://openalex.org/W2031517912","https://openalex.org/W2032754058","https://openalex.org/W2036537371","https://openalex.org/W2068111547","https://openalex.org/W2068765570","https://openalex.org/W2069501134","https://openalex.org/W2077451903","https://openalex.org/W2096995644","https://openalex.org/W2099138617","https://openalex.org/W2103442796","https://openalex.org/W2107079616","https://openalex.org/W2109810058","https://openalex.org/W2111757673","https://openalex.org/W2112049292","https://openalex.org/W2132222201","https://openalex.org/W2137519107","https://openalex.org/W2143080724","https://openalex.org/W2144059086","https://openalex.org/W2147980014","https://openalex.org/W2152063733","https://openalex.org/W2153865451","https://openalex.org/W2160557949","https://openalex.org/W2169317892","https://openalex.org/W2169883292","https://openalex.org/W2171010928","https://openalex.org/W2276665090","https://openalex.org/W2543260924","https://openalex.org/W2544177383"],"related_works":["https://openalex.org/W2544177383","https://openalex.org/W1968623838","https://openalex.org/W2134521100","https://openalex.org/W2152020254","https://openalex.org/W2118632356","https://openalex.org/W1014564894","https://openalex.org/W2163982090","https://openalex.org/W2148675985","https://openalex.org/W2103123542","https://openalex.org/W1743670555"],"abstract_inverted_index":null,"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2014,"cited_by_count":1}],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2016-06-24T00:00:00"}