{"id":"https://openalex.org/W808580226","doi":null,"title":"Automated System Tests High-Power MOSFET's","display_name":"Automated System Tests High-Power MOSFET's","publication_year":1994,"publication_date":"1994-12-01","ids":{"openalex":"https://openalex.org/W808580226","mag":"808580226"},"language":"en","primary_location":{"id":"mag:808580226","doi":null,"is_oa":false,"landing_page_url":"https://ntrs.nasa.gov/search.jsp?R=19940000657","pdf_url":null,"source":{"id":"https://openalex.org/S4306520501","display_name":"NASA Tech Briefs","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"NASA Tech Briefs","raw_type":null},"volume":null,"type":"article","is_traditional":true,"indexed_in":[],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5041048169","display_name":"Steven W. Huston","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Steven W. Huston","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5044951459","display_name":"Isabel O. Wendt","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Isabel O. Wendt","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.08944588,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"18","issue":"12","first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.7333999872207642,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.7333999872207642,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.17180000245571136,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.0210999995470047,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-mosfet","display_name":"power MOSFET","score":0.8190000057220459},{"id":"https://openalex.org/keywords/test-automation","display_name":"test automation","score":0.7940000295639038},{"id":"https://openalex.org/keywords/high-voltage-testing","display_name":"high-voltage testing","score":0.8450000286102295},{"id":"https://openalex.org/keywords/high-current-testing","display_name":"high current testing","score":0.9490000009536743},{"id":"https://openalex.org/keywords/early-defect-detection","display_name":"early defect detection","score":0.6639999747276306},{"id":"https://openalex.org/keywords/power-semiconductor-devices","display_name":"power semiconductor devices","score":0.5299999713897705}],"concepts":[{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.8824134469032288},{"id":"https://openalex.org/C88653102","wikidata":"https://www.wikidata.org/wiki/Q570553","display_name":"Power MOSFET","level":5,"score":0.7750667333602905},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.6151090860366821},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.5747304558753967},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.5459328293800354},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.5087636113166809},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5009856224060059},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3968011140823364},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3932355046272278},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3589951694011688},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.335359126329422},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.16537895798683167},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"mag:808580226","doi":null,"is_oa":false,"landing_page_url":"https://ntrs.nasa.gov/search.jsp?R=19940000657","pdf_url":null,"source":{"id":"https://openalex.org/S4306520501","display_name":"NASA Tech Briefs","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":"NASA Tech Briefs","raw_type":null}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W7017373573","https://openalex.org/W758606516","https://openalex.org/W2350858183","https://openalex.org/W2765841212","https://openalex.org/W831317983","https://openalex.org/W2057679248","https://openalex.org/W2589817638","https://openalex.org/W2393360566","https://openalex.org/W4361768397","https://openalex.org/W2906293249"],"abstract_inverted_index":{"Computer-controlled":[0],"system":[1,30],"tests":[2],"metal-oxide/semiconductor":[3],"field-effect":[4],"transistors":[5],"(MOSFET's)":[6],"at":[7],"high":[8],"voltages":[9],"and":[10,42],"currents.":[11],"Measures":[12],"seven":[13],"parameters":[14],"characterizing":[15],"performance":[16],"of":[17,28,34],"MOSFET,":[18],"with":[19],"view":[20],"toward":[21],"obtaining":[22],"early":[23],"indication":[24],"MOSFET":[25,36],"defective.":[26],"Use":[27],"test":[29],"prior":[31],"to":[32],"installation":[33],"power":[35],"in":[37],"high-power":[38],"circuit":[39],"saves":[40],"time":[41],"money.":[43]},"counts_by_year":[],"updated_date":"2025-10-10T17:16:08.811792","created_date":"2016-06-24T00:00:00"}