{"id":"https://openalex.org/W800701192","doi":"https://doi.org/10.1007/978-0-387-35311-1_42","title":"Boundary-Scan Testing for Mixed \u2014 Signal MCMs","display_name":"Boundary-Scan Testing for Mixed \u2014 Signal MCMs","publication_year":1997,"publication_date":"1997-01-01","ids":{"openalex":"https://openalex.org/W800701192","doi":"https://doi.org/10.1007/978-0-387-35311-1_42","mag":"800701192"},"language":"en","primary_location":{"id":"doi:10.1007/978-0-387-35311-1_42","doi":"https://doi.org/10.1007/978-0-387-35311-1_42","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-0-387-35311-1_42","pdf_url":"https://link.springer.com/content/pdf/10.1007%2F978-0-387-35311-1_42.pdf","source":{"id":"https://openalex.org/S4306463937","display_name":"Springer eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI: Integrated Systems on Silicon","raw_type":"book-chapter"},"volume":{"id":"https://openalex.org/W2493836963","display_name":"VLSI: Integrated Systems on Silicon"},"type":"book-chapter","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"bronze","oa_url":"https://link.springer.com/content/pdf/10.1007%2F978-0-387-35311-1_42.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5063280452","display_name":"Hans G. Kerkhoff","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"H. G. Kerkhoff","raw_affiliation_strings":["MESA Research Institute, University of Twente, Enschede, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MESA Research Institute, University of Twente, Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"middle","author":{"id":null,"display_name":"G. Boom","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"G. Boom","raw_affiliation_strings":["MESA Research Institute, University of Twente, Enschede, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MESA Research Institute, University of Twente, Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5023213938","display_name":"H. Speek","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I94624287","display_name":"University of Twente","ror":"https://ror.org/006hf6230","country_code":"NL","type":"education","lineage":["https://openalex.org/I94624287"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"H. Speek","raw_affiliation_strings":["MESA Research Institute, University of Twente, Enschede, The Netherlands"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"MESA Research Institute, University of Twente, Enschede, The Netherlands","institution_ids":["https://openalex.org/I94624287"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I94624287"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":2,"citation_normalized_percentile":{"value":0.15503876,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"515","last_page":"525"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9907000064849854,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.003599999938160181,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.00139999995008111,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/boundary-scan-testing","display_name":"boundary-scan testing","score":0.9769999980926514},{"id":"https://openalex.org/keywords/multichip-modules","display_name":"multichip modules","score":0.878000020980835},{"id":"https://openalex.org/keywords/mixed-signal-testing","display_name":"mixed-signal testing","score":0.8539999723434448},{"id":"https://openalex.org/keywords/mcm-d","display_name":"MCM-D","score":0.6980000138282776},{"id":"https://openalex.org/keywords/integrated-passive-devices","display_name":"integrated passive devices","score":0.7979999780654907},{"id":"https://openalex.org/keywords/fault-diagnosis","display_name":"fault diagnosis","score":0.41600000858306885}],"concepts":[{"id":"https://openalex.org/C992767","wikidata":"https://www.wikidata.org/wiki/Q895156","display_name":"Boundary scan","level":3,"score":0.9477599859237671},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.7142937779426575},{"id":"https://openalex.org/C62907940","wikidata":"https://www.wikidata.org/wiki/Q1541329","display_name":"Mixed-signal integrated circuit","level":3,"score":0.614784836769104},{"id":"https://openalex.org/C62354387","wikidata":"https://www.wikidata.org/wiki/Q875399","display_name":"Boundary (topology)","level":2,"score":0.6136268377304077},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5064922571182251},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4933716356754303},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.48246389627456665},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.4661741256713867},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35632961988449097},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34400707483291626},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3153364360332489},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2695910334587097},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.06122848391532898},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.1007/978-0-387-35311-1_42","doi":"https://doi.org/10.1007/978-0-387-35311-1_42","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-0-387-35311-1_42","pdf_url":"https://link.springer.com/content/pdf/10.1007%2F978-0-387-35311-1_42.pdf","source":{"id":"https://openalex.org/S4306463937","display_name":"Springer eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI: Integrated Systems on Silicon","raw_type":"book-chapter"},{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/84bfd64a-a36c-44ed-a400-7b8119e708b4","doi":null,"is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/84bfd64a-a36c-44ed-a400-7b8119e708b4","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Kerkhoff, H G, Boom, G & Speek, H 1997, Boundary-Scan Testing for Mixed-Signal MCMs. in Proceedings VLSI'97 Chapman & Hall. Gramado Brasil, pp. 515-525.","raw_type":"info:eu-repo/semantics/conferenceObject"},{"id":"pmh:oai:ris.utwente.nl:openaire_cris_publications/b8a109bf-cfdb-4a1a-841f-993fac229dc3","doi":null,"is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/b8a109bf-cfdb-4a1a-841f-993fac229dc3","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Kerkhoff, H G, Boom, G & Speek, H 1997, Boundary-scan Testing for Mixed-Signal MCMs. Dish Hotel Enschede The Netherlands.","raw_type":"info:eu-repo/semantics/other"},{"id":"pmh:ut:oai:ris.utwente.nl:publications/84bfd64a-a36c-44ed-a400-7b8119e708b4","doi":null,"is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/boundaryscan-testing-for-mixedsignal-mcms(84bfd64a-a36c-44ed-a400-7b8119e708b4).html","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Proceedings VLSI'97 Chapman & Hall, 515 - 525","raw_type":"info:eu-repo/semantics/conferencepaper"},{"id":"pmh:ut:oai:ris.utwente.nl:publications/b8a109bf-cfdb-4a1a-841f-993fac229dc3","doi":null,"is_oa":false,"landing_page_url":"https://research.utwente.nl/en/publications/boundaryscan-testing-for-mixedsignal-mcms(b8a109bf-cfdb-4a1a-841f-993fac229dc3).html","pdf_url":null,"source":{"id":"https://openalex.org/S4406922991","display_name":"University of Twente Research Information","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"info:eu-repo/semantics/other"}],"best_oa_location":{"id":"doi:10.1007/978-0-387-35311-1_42","doi":"https://doi.org/10.1007/978-0-387-35311-1_42","is_oa":true,"landing_page_url":"https://doi.org/10.1007/978-0-387-35311-1_42","pdf_url":"https://link.springer.com/content/pdf/10.1007%2F978-0-387-35311-1_42.pdf","source":{"id":"https://openalex.org/S4306463937","display_name":"Springer eBooks","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319965","host_organization_name":"Springer Nature","host_organization_lineage":["https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Nature"],"type":"ebook platform"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"VLSI: Integrated Systems on Silicon","raw_type":"book-chapter"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W800701192.pdf","grobid_xml":"https://content.openalex.org/works/W800701192.grobid-xml"},"referenced_works_count":10,"referenced_works":["https://openalex.org/W2107525390","https://openalex.org/W2121050790","https://openalex.org/W2121229000","https://openalex.org/W2126375077","https://openalex.org/W2137651210","https://openalex.org/W2141624138","https://openalex.org/W2163399571","https://openalex.org/W2499417317","https://openalex.org/W4245250847","https://openalex.org/W6813746080"],"related_works":["https://openalex.org/W2737173551","https://openalex.org/W2137651210","https://openalex.org/W2135785602","https://openalex.org/W1932631770","https://openalex.org/W1852363244","https://openalex.org/W2281984572","https://openalex.org/W2161129633","https://openalex.org/W2117223397","https://openalex.org/W4392440251","https://openalex.org/W2154609118"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-10-12T09:40:04.860316","created_date":"2016-06-24T00:00:00"}