{"id":"https://openalex.org/W7225645381","doi":"https://doi.org/10.1007/s00170-026-19446-y","title":"Vision-language models for zero- and few-shot industrial anomaly detection: an evidence-grounded survey","display_name":"Vision-language models for zero- and few-shot industrial anomaly detection: an evidence-grounded survey","publication_year":2026,"publication_date":"2026-11-09","ids":{"openalex":"https://openalex.org/W7225645381","doi":"https://doi.org/10.1007/s00170-026-19446-y"},"language":"en","primary_location":{"id":"doi:10.1007/s00170-026-19446-y","doi":"https://doi.org/10.1007/s00170-026-19446-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00170-026-19446-y","pdf_url":null,"source":{"id":"https://openalex.org/S77056576","display_name":"The International Journal of Advanced Manufacturing Technology","issn_l":"0268-3768","issn":["0268-3768","1433-3015"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The International Journal of Advanced Manufacturing Technology","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5043854775","display_name":"Di Wang","orcid":"https://orcid.org/0000-0002-7992-7743","observed_orcids":["https://orcid.org/0000-0002-7992-7743"]},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Di Wang","raw_affiliation_strings":["Foxconn, 611 E Wisconsin Ave, Milwaukee, 53202, WI, USA"],"raw_orcid":"https://orcid.org/0000-0002-7992-7743","affiliations":[{"raw_affiliation_string":"Foxconn, 611 E Wisconsin Ave, Milwaukee, 53202, WI, USA","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5161305406","display_name":"Yang Chen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yang Chen","raw_affiliation_strings":["Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computational Sciences and Engineering Division, Oak Ridge National Laboratory, Oak Ridge, TN, USA","institution_ids":["https://openalex.org/I1289243028"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5043854775"],"corresponding_institution_ids":[],"apc_list":{"value":3990,"currency":"USD","value_usd":3990},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.0006000000284984708,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/industrial-anomaly-detection","display_name":"industrial anomaly detection","score":0.9629999995231628},{"id":"https://openalex.org/keywords/vision-language-models","display_name":"vision-language models","score":0.9779999852180481},{"id":"https://openalex.org/keywords/zero-shot-learning","display_name":"zero-shot learning","score":0.8610000014305115},{"id":"https://openalex.org/keywords/few-shot-learning","display_name":"few-shot learning","score":0.996999979019165},{"id":"https://openalex.org/keywords/evidence-grounding","display_name":"evidence grounding","score":0.878000020980835},{"id":"https://openalex.org/keywords/reference-calibration","display_name":"reference calibration","score":0.6690000295639038},{"id":"https://openalex.org/keywords/domain-shift","display_name":"domain shift","score":0.6039999723434448},{"id":"https://openalex.org/keywords/defect-localization","display_name":"defect localization","score":0.4779999852180481},{"id":"https://openalex.org/keywords/normality-modeling","display_name":"normality modeling","score":0.6669999957084656},{"id":"https://openalex.org/keywords/multimodal-routing","display_name":"multimodal routing","score":0.6309999823570251}],"concepts":[{"id":"https://openalex.org/C12997251","wikidata":"https://www.wikidata.org/wiki/Q567560","display_name":"Anomaly (physics)","level":2,"score":0.5924000144004822},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.49219998717308044},{"id":"https://openalex.org/C739882","wikidata":"https://www.wikidata.org/wiki/Q3560506","display_name":"Anomaly detection","level":2,"score":0.38339999318122864},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33399999141693115},{"id":"https://openalex.org/C13280743","wikidata":"https://www.wikidata.org/wiki/Q131089","display_name":"Geodesy","level":1,"score":0.29100000858306885},{"id":"https://openalex.org/C8058405","wikidata":"https://www.wikidata.org/wiki/Q46255","display_name":"Geophysics","level":1,"score":0.2897999882698059},{"id":"https://openalex.org/C43154580","wikidata":"https://www.wikidata.org/wiki/Q381526","display_name":"Aeromagnetic survey","level":3,"score":0.2802000045776367},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.2745000123977661},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24629999697208405},{"id":"https://openalex.org/C13736549","wikidata":"https://www.wikidata.org/wiki/Q4489420","display_name":"Industrial engineering","level":1,"score":0.24160000681877136}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s00170-026-19446-y","doi":"https://doi.org/10.1007/s00170-026-19446-y","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s00170-026-19446-y","pdf_url":null,"source":{"id":"https://openalex.org/S77056576","display_name":"The International Journal of Advanced Manufacturing Technology","issn_l":"0268-3768","issn":["0268-3768","1433-3015"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-c","jufo-1","ki-jl-1","norway-2","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"The International Journal of Advanced Manufacturing Technology","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":107,"referenced_works":["https://openalex.org/W2887985146","https://openalex.org/W2948982773","https://openalex.org/W2995022099","https://openalex.org/W3099658315","https://openalex.org/W3118615836","https://openalex.org/W3123497531","https://openalex.org/W3169651898","https://openalex.org/W3198377975","https://openalex.org/W4212874935","https://openalex.org/W4212919149","https://openalex.org/W4214694907","https://openalex.org/W4226058394","https://openalex.org/W4310628941","https://openalex.org/W4312605624","https://openalex.org/W4312960937","https://openalex.org/W4366208220","https://openalex.org/W4377130839","https://openalex.org/W4384436171","https://openalex.org/W4386065385","https://openalex.org/W4386065775","https://openalex.org/W4386113989","https://openalex.org/W4386351457","https://openalex.org/W4388994230","https://openalex.org/W4390872445","https://openalex.org/W4390874575","https://openalex.org/W4390875033","https://openalex.org/W4391887109","https://openalex.org/W4393158476","https://openalex.org/W4393160204","https://openalex.org/W4399804593","https://openalex.org/W4400163146","https://openalex.org/W4401024015","https://openalex.org/W4402702916","https://openalex.org/W4402703054","https://openalex.org/W4402716375","https://openalex.org/W4402727938","https://openalex.org/W4402733578","https://openalex.org/W4402733597","https://openalex.org/W4402753796","https://openalex.org/W4402953742","https://openalex.org/W4402961681","https://openalex.org/W4403780904","https://openalex.org/W4404115949","https://openalex.org/W4404400293","https://openalex.org/W4404420613","https://openalex.org/W4404612908","https://openalex.org/W4405093242","https://openalex.org/W4405101982","https://openalex.org/W4407056550","https://openalex.org/W4407800509","https://openalex.org/W4408352134","https://openalex.org/W4408352761","https://openalex.org/W4408611000","https://openalex.org/W4409195436","https://openalex.org/W4409248769","https://openalex.org/W4409368445","https://openalex.org/W4410492138","https://openalex.org/W4411119927","https://openalex.org/W4411310919","https://openalex.org/W4412507263","https://openalex.org/W4412567591","https://openalex.org/W4412924272","https://openalex.org/W4413144726","https://openalex.org/W4413145415","https://openalex.org/W4413145783","https://openalex.org/W4413156682","https://openalex.org/W4413278288","https://openalex.org/W4413805044","https://openalex.org/W4414841072","https://openalex.org/W4414877323","https://openalex.org/W4415084519","https://openalex.org/W4415189553","https://openalex.org/W4415213137","https://openalex.org/W4415242914","https://openalex.org/W4415540103","https://openalex.org/W4415598949","https://openalex.org/W4415709246","https://openalex.org/W4415796365","https://openalex.org/W4415797756","https://openalex.org/W4416542159","https://openalex.org/W4416542271","https://openalex.org/W4416839779","https://openalex.org/W4417042385","https://openalex.org/W4417114434","https://openalex.org/W4417413481","https://openalex.org/W4417460382","https://openalex.org/W4417511351","https://openalex.org/W6929289419","https://openalex.org/W7127594799","https://openalex.org/W7128311409","https://openalex.org/W7133196460","https://openalex.org/W7133218064","https://openalex.org/W7134897445","https://openalex.org/W7137931916","https://openalex.org/W7137941890","https://openalex.org/W7138363754","https://openalex.org/W7140161513","https://openalex.org/W7160024193","https://openalex.org/W7160046384","https://openalex.org/W7160059800","https://openalex.org/W7160167382","https://openalex.org/W7160170808","https://openalex.org/W7160354428","https://openalex.org/W7160966377","https://openalex.org/W7161935992","https://openalex.org/W7164807263","https://openalex.org/W7207557950"],"related_works":["https://openalex.org/W7224995742","https://openalex.org/W7213863852","https://openalex.org/W7223653782","https://openalex.org/W7221790798","https://openalex.org/W4402953742","https://openalex.org/W7215037690","https://openalex.org/W7204088390","https://openalex.org/W4388093160","https://openalex.org/W7164885757","https://openalex.org/W7222984640"],"abstract_inverted_index":null,"counts_by_year":[],"updated_date":"2026-11-12T12:28:57.059296","created_date":"2026-11-10T00:00:00"}