{"id":"https://openalex.org/W7225626235","doi":"https://doi.org/10.3390/electronics15215196","title":"DFE-Net: Dual-Stream Gated Cross-Modulation and Spatial-Frequency Detail Compensation for Steel Surface Defect Detection","display_name":"DFE-Net: Dual-Stream Gated Cross-Modulation and Spatial-Frequency Detail Compensation for Steel Surface Defect Detection","publication_year":2026,"publication_date":"2026-11-09","ids":{"openalex":"https://openalex.org/W7225626235","doi":"https://doi.org/10.3390/electronics15215196"},"language":"en","primary_location":{"id":"doi:10.3390/electronics15215196","doi":"https://doi.org/10.3390/electronics15215196","is_oa":true,"landing_page_url":"https://doi.org/10.3390/electronics15215196","pdf_url":null,"source":{"id":"https://openalex.org/S4210202905","display_name":"Electronics","issn_l":"2079-9292","issn":["2079-9292"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","norway-1","poland-100","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://doi.org/10.3390/electronics15215196","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5141295261","display_name":"Mingshang Shi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210162994","display_name":"Xijing University","ror":"https://ror.org/05xsjkb63","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210162994"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingshang Shi","raw_affiliation_strings":["School of Electronic Information, Xijing University, Xi\u2019an 710123, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Information, Xijing University, Xi\u2019an 710123, China","institution_ids":["https://openalex.org/I4210162994"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5161305906","display_name":"Jing Zhao","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210162994","display_name":"Xijing University","ror":"https://ror.org/05xsjkb63","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210162994"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Jing Zhao","raw_affiliation_strings":["School of Electronic Information, Xijing University, Xi\u2019an 710123, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Information, Xijing University, Xi\u2019an 710123, China","institution_ids":["https://openalex.org/I4210162994"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5139835575","display_name":"Weibin Cai","orcid":"https://orcid.org/0009-0005-7460-8160","observed_orcids":["https://orcid.org/0009-0005-7460-8160"]},"institutions":[{"id":"https://openalex.org/I148128674","display_name":"University of Shanghai for Science and Technology","ror":"https://ror.org/00ay9v204","country_code":"CN","type":"education","lineage":["https://openalex.org/I148128674"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weibin Cai","raw_affiliation_strings":["Laboratory of Integrated Opto-Mechanics and Electronics, School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Integrated Opto-Mechanics and Electronics, School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and Technology, Shanghai 200093, China","institution_ids":["https://openalex.org/I148128674"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5117308954","display_name":"Zhipeng Xue","orcid":"https://orcid.org/0009-0002-6681-1343","observed_orcids":["https://orcid.org/0009-0002-6681-1343"]},"institutions":[{"id":"https://openalex.org/I4210162994","display_name":"Xijing University","ror":"https://ror.org/05xsjkb63","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210162994"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhipeng Xue","raw_affiliation_strings":["School of Electronic Information, Xijing University, Xi\u2019an 710123, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electronic Information, Xijing University, Xi\u2019an 710123, China","institution_ids":["https://openalex.org/I4210162994"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5161305906"],"corresponding_institution_ids":["https://openalex.org/I4210162994"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2896},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2896},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"15","issue":"21","first_page":"5196","last_page":"5196"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9984999895095825,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10036","display_name":"Advanced Neural Network Applications","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11606","display_name":"Infrastructure Maintenance and Monitoring","score":0.0003000000142492354,"subfield":{"id":"https://openalex.org/subfields/2205","display_name":"Civil and Structural Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/steel-surface-defect-detection","display_name":"steel surface defect detection","score":0.9890000224113464},{"id":"https://openalex.org/keywords/hot-rolled-strip","display_name":"hot-rolled strip","score":0.9670000076293945},{"id":"https://openalex.org/keywords/yolo11n","display_name":"YOLOv11n","score":0.8140000104904175},{"id":"https://openalex.org/keywords/channel-attention","display_name":"channel attention","score":0.8050000071525574},{"id":"https://openalex.org/keywords/group-convolution","display_name":"group convolution","score":0.6320000290870667},{"id":"https://openalex.org/keywords/lightweight-object-detection","display_name":"lightweight object detection","score":0.628000020980835}],"concepts":[{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.7670999765396118},{"id":"https://openalex.org/C200925200","wikidata":"https://www.wikidata.org/wiki/Q7624170","display_name":"STRIPS","level":2,"score":0.6834999918937683},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6559000015258789},{"id":"https://openalex.org/C45374587","wikidata":"https://www.wikidata.org/wiki/Q12525525","display_name":"Computation","level":2,"score":0.6473000049591064},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.49079999327659607},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.43630000948905945},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.38989999890327454},{"id":"https://openalex.org/C142575187","wikidata":"https://www.wikidata.org/wiki/Q3358290","display_name":"Pyramid (geometry)","level":2,"score":0.388700008392334},{"id":"https://openalex.org/C62611344","wikidata":"https://www.wikidata.org/wiki/Q1062658","display_name":"Node (physics)","level":2,"score":0.3880000114440918},{"id":"https://openalex.org/C118732077","wikidata":"https://www.wikidata.org/wiki/Q273176","display_name":"Normal","level":3,"score":0.38109999895095825},{"id":"https://openalex.org/C127162648","wikidata":"https://www.wikidata.org/wiki/Q16858953","display_name":"Channel (broadcasting)","level":2,"score":0.36570000648498535},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.35339999198913574},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3418000042438507},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.33390000462532043},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.32749998569488525},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.3208000063896179},{"id":"https://openalex.org/C2776151529","wikidata":"https://www.wikidata.org/wiki/Q3045304","display_name":"Object detection","level":3,"score":0.31200000643730164},{"id":"https://openalex.org/C2780023022","wikidata":"https://www.wikidata.org/wiki/Q1338171","display_name":"Compensation (psychology)","level":2,"score":0.3093000054359436},{"id":"https://openalex.org/C3018391215","wikidata":"https://www.wikidata.org/wiki/Q2449377","display_name":"Flat surface","level":2,"score":0.30250000953674316},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.2904999852180481},{"id":"https://openalex.org/C82876162","wikidata":"https://www.wikidata.org/wiki/Q17096504","display_name":"Latency (audio)","level":2,"score":0.2653999924659729},{"id":"https://openalex.org/C33954974","wikidata":"https://www.wikidata.org/wiki/Q486494","display_name":"Sensor fusion","level":2,"score":0.26109999418258667},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2506999969482422}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3390/electronics15215196","doi":"https://doi.org/10.3390/electronics15215196","is_oa":true,"landing_page_url":"https://doi.org/10.3390/electronics15215196","pdf_url":null,"source":{"id":"https://openalex.org/S4210202905","display_name":"Electronics","issn_l":"2079-9292","issn":["2079-9292"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","norway-1","poland-100","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.3390/electronics15215196","doi":"https://doi.org/10.3390/electronics15215196","is_oa":true,"landing_page_url":"https://doi.org/10.3390/electronics15215196","pdf_url":null,"source":{"id":"https://openalex.org/S4210202905","display_name":"Electronics","issn_l":"2079-9292","issn":["2079-9292"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","norway-1","poland-100","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320321106","display_name":"Ministry of Education of the People's Republic of China","ror":"https://ror.org/01mv9t934"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W7203892579","https://openalex.org/W7202347798","https://openalex.org/W7164582888","https://openalex.org/W4414317095","https://openalex.org/W4415368549","https://openalex.org/W4415425205","https://openalex.org/W7204201388","https://openalex.org/W4389084827","https://openalex.org/W4399681218","https://openalex.org/W7172536799"],"abstract_inverted_index":{"Surface":[0],"defects":[1],"on":[2,196,225,235],"hot-rolled":[3],"steel":[4,25],"strips":[5],"are":[6],"often":[7],"low":[8],"in":[9,157,162],"contrast,":[10],"resemble":[11],"the":[12,38,80,93,147,176,179],"background,":[13],"and":[14,45,57,63,91,118,132,142,161,193,216,229,253],"co-occur.":[15],"This":[16],"paper":[17],"presents":[18],"DFE-Net,":[19],"a":[20,42,53,58,67,113,167,169,226,236,243,247],"refinement":[21],"of":[22,95,166,178],"YOLO11n":[23],"for":[24,175,255],"surface":[26],"defect":[27],"detection.":[28],"A":[29,70,106],"defect-aware":[30],"dual-stream":[31],"gated":[32],"cross-modulation":[33],"module":[34],"(DA-GCM),":[35],"derived":[36],"from":[37,211,220,230],"FCM":[39],"block,":[40,90],"lets":[41],"semantic":[43],"stream":[44,48],"an":[46,87,99],"appearance":[47],"modulate":[49],"each":[50],"other":[51],"through":[52],"dual-pooling":[54],"channel":[55],"attention":[56,62],"multiscale":[59],"strip":[60],"spatial":[61],"combines":[64],"them":[65,85],"with":[66,86,98,137,198,246],"pixel-wise":[68],"gate.":[69],"spatial-frequency":[71],"detail-compensation":[72],"pyramid":[73],"(SFDP)":[74],"injects":[75],"space-to-depth":[76],"P2":[77],"features":[78],"into":[79],"P3":[81],"fusion":[82],"node,":[83],"refines":[84],"FFT-based":[88],"large-kernel":[89],"aggregates":[92],"inputs":[94],"every":[96],"node":[97],"adopted":[100],"Global":[101],"Modulated":[102],"Fusion":[103],"(GMF)":[104],"module.":[105],"shared-stem":[107],"parameter-efficient":[108],"detection":[109],"head":[110],"(SSP-Head)":[111],"shares":[112],"grouped-convolution":[114],"stem":[115],"between":[116],"regression":[117],"classification.":[119],"On":[120],"NEU-DET,":[121],"over":[122],"five":[123,159,164],"paired":[124],"seeds,":[125],"DFE-Net":[126,186,240],"reaches":[127],"74.27":[128],"\u00b1":[129,134],"0.81%":[130],"mAP@0.5":[131],"41.83":[133],"0.55%":[135],"mAP@0.5:0.95":[136,154],"2.24":[138],"M":[139],"parameters,":[140],"0.91":[141],"0.58":[143],"points":[144],"above":[145],"YOLO11n;":[146],"95%":[148],"confidence":[149],"intervals":[150],"include":[151],"zero,":[152],"although":[153],"is":[155,187,241],"higher":[156],"all":[158,163],"seeds":[160],"folds":[165],"cross-validation,":[168],"consistent":[170],"direction":[171],"that":[172],"tests":[173],"corrected":[174],"overlap":[177],"cross-validation":[180],"training":[181],"sets":[182],"do":[183],"not":[184],"confirm.":[185],"significantly":[188],"more":[189],"accurate":[190],"than":[191,205],"YOLOv8n":[192],"YOLO26n":[194],"but":[195,207],"par":[197],"YOLOv9t.":[199],"It":[200],"has":[201],"13.2%":[202],"fewer":[203],"parameters":[204],"YOLO11n,":[206],"its":[208,217,251],"computation":[209],"rises":[210],"6.3":[212],"to":[213,222,232],"7.4":[214],"GFLOPs":[215],"batch-1":[218],"latency":[219],"5.63":[221],"14.31":[223],"ms":[224,234],"desktop":[227],"GPU":[228],"10.15":[231],"28.73":[233],"Jetson":[237],"Orin":[238],"Nano.":[239],"thus":[242],"compact":[244],"detector":[245],"modest":[248],"accuracy":[249],"gain;":[250],"robustness":[252],"suitability":[254],"online":[256],"inspection":[257],"require":[258],"further":[259],"validation.":[260]},"counts_by_year":[],"updated_date":"2026-11-11T12:16:26.678958","created_date":"2026-11-10T00:00:00"}