{"id":"https://openalex.org/W7225385342","doi":"https://doi.org/10.1515/teme-2026-0095","title":"Uncertainty analysis of sphere parameter estimation from NMM-1 point cloud measurements","display_name":"Uncertainty analysis of sphere parameter estimation from NMM-1 point cloud measurements","publication_year":2026,"publication_date":"2026-11-06","ids":{"openalex":"https://openalex.org/W7225385342","doi":"https://doi.org/10.1515/teme-2026-0095"},"language":"en","primary_location":{"id":"doi:10.1515/teme-2026-0095","doi":"https://doi.org/10.1515/teme-2026-0095","is_oa":false,"landing_page_url":"https://doi.org/10.1515/teme-2026-0095","pdf_url":null,"source":{"id":"https://openalex.org/S20981179","display_name":"tm - Technisches Messen","issn_l":"0171-8096","issn":["0171-8096","2196-7113"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319967","host_organization_name":"R. Oldenbourg Verlag","host_organization_lineage":["https://openalex.org/P4310319967"],"host_organization_lineage_names":["R. Oldenbourg Verlag"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"tm - Technisches Messen","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5161018086","display_name":"Chao Fan","orcid":"https://orcid.org/0009-0004-0878-2745","observed_orcids":["https://orcid.org/0009-0004-0878-2745"]},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Chao Fan","raw_affiliation_strings":["Institute for Process Measurement and Sensor Technology, Technische Universit\u00e4t Ilmenau , Gustav-Kirchhoff-Stra\u00dfe 1, 98693 , Ilmenau , Germany"],"raw_orcid":"https://orcid.org/0009-0004-0878-2745","affiliations":[{"raw_affiliation_string":"Institute for Process Measurement and Sensor Technology, Technische Universit\u00e4t Ilmenau , Gustav-Kirchhoff-Stra\u00dfe 1, 98693 , Ilmenau , Germany","institution_ids":["https://openalex.org/I119449181"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079906965","display_name":"Johannes Belkner","orcid":"https://orcid.org/0000-0002-9438-883X","observed_orcids":["https://orcid.org/0000-0002-9438-883X"]},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Johannes Belkner","raw_affiliation_strings":["Institute for Process Measurement and Sensor Technology, Technische Universit\u00e4t Ilmenau , Gustav-Kirchhoff-Stra\u00dfe 1, 98693 , Ilmenau , Germany"],"raw_orcid":"https://orcid.org/0000-0002-9438-883X","affiliations":[{"raw_affiliation_string":"Institute for Process Measurement and Sensor Technology, Technische Universit\u00e4t Ilmenau , Gustav-Kirchhoff-Stra\u00dfe 1, 98693 , Ilmenau , Germany","institution_ids":["https://openalex.org/I119449181"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5032588149","display_name":"Ingo Ortlepp","orcid":"https://orcid.org/0000-0002-5611-7852","observed_orcids":["https://orcid.org/0000-0002-5611-7852"]},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Ingo Ortlepp","raw_affiliation_strings":["Institute for Process Measurement and Sensor Technology, Technische Universit\u00e4t Ilmenau , Gustav-Kirchhoff-Stra\u00dfe 1, 98693 , Ilmenau , Germany"],"raw_orcid":"https://orcid.org/0000-0002-5611-7852","affiliations":[{"raw_affiliation_string":"Institute for Process Measurement and Sensor Technology, Technische Universit\u00e4t Ilmenau , Gustav-Kirchhoff-Stra\u00dfe 1, 98693 , Ilmenau , Germany","institution_ids":["https://openalex.org/I119449181"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5003483049","display_name":"Thomas Fr\u00f6hlich","orcid":"https://orcid.org/0000-0002-6060-7248","observed_orcids":["https://orcid.org/0000-0002-6060-7248","https://orcid.org/0000-0002-4709-3211"]},"institutions":[{"id":"https://openalex.org/I119449181","display_name":"Technische Universit\u00e4t Ilmenau","ror":"https://ror.org/01weqhp73","country_code":"DE","type":"education","lineage":["https://openalex.org/I119449181"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Thomas Fr\u00f6hlich","raw_affiliation_strings":["Institute for Process Measurement and Sensor Technology, Technische Universit\u00e4t Ilmenau , Gustav-Kirchhoff-Stra\u00dfe 1, 98693 , Ilmenau , Germany"],"raw_orcid":"https://orcid.org/0000-0002-6060-7248","affiliations":[{"raw_affiliation_string":"Institute for Process Measurement and Sensor Technology, Technische Universit\u00e4t Ilmenau , Gustav-Kirchhoff-Stra\u00dfe 1, 98693 , Ilmenau , Germany","institution_ids":["https://openalex.org/I119449181"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I119449181"],"apc_list":{"value":2400,"currency":"EUR","value_usd":2712},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.006000000052154064,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.0008999999845400453,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"measurement uncertainty","score":0.6620000004768372},{"id":"https://openalex.org/keywords/point-clouds","display_name":"point clouds","score":0.6370000243186951},{"id":"https://openalex.org/keywords/least-squares-fitting","display_name":"least squares fitting","score":0.8489999771118164},{"id":"https://openalex.org/keywords/sampling-strategy","display_name":"sampling strategy","score":0.6110000014305115},{"id":"https://openalex.org/keywords/subsampling","display_name":"subsampling","score":0.7179999947547913},{"id":"https://openalex.org/keywords/bearing-balls","display_name":"bearing balls","score":0.7990000247955322},{"id":"https://openalex.org/keywords/precision-metrology","display_name":"precision metrology","score":0.6520000100135803}],"concepts":[{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.628000020980835},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.5764999985694885},{"id":"https://openalex.org/C177803969","wikidata":"https://www.wikidata.org/wiki/Q29205","display_name":"Uncertainty analysis","level":2,"score":0.5580999851226807},{"id":"https://openalex.org/C167928553","wikidata":"https://www.wikidata.org/wiki/Q1376021","display_name":"Estimation theory","level":2,"score":0.5302000045776367},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.5049999952316284},{"id":"https://openalex.org/C12426560","wikidata":"https://www.wikidata.org/wiki/Q189569","display_name":"Basis (linear algebra)","level":2,"score":0.4952999949455261},{"id":"https://openalex.org/C122041747","wikidata":"https://www.wikidata.org/wiki/Q838611","display_name":"Ball (mathematics)","level":2,"score":0.4691999852657318},{"id":"https://openalex.org/C176147448","wikidata":"https://www.wikidata.org/wiki/Q1889114","display_name":"Sensitivity analysis","level":3,"score":0.44200000166893005},{"id":"https://openalex.org/C41426520","wikidata":"https://www.wikidata.org/wiki/Q1192065","display_name":"Point estimation","level":2,"score":0.4408000111579895},{"id":"https://openalex.org/C21080849","wikidata":"https://www.wikidata.org/wiki/Q13611879","display_name":"Data point","level":2,"score":0.4399999976158142},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.4307999908924103},{"id":"https://openalex.org/C131979681","wikidata":"https://www.wikidata.org/wiki/Q1899648","display_name":"Point cloud","level":2,"score":0.41589999198913574},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.41440001130104065},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.39959999918937683},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.3578000068664551},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.3488999903202057},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3463999927043915},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.31769999861717224},{"id":"https://openalex.org/C28826006","wikidata":"https://www.wikidata.org/wiki/Q33521","display_name":"Applied mathematics","level":1,"score":0.30059999227523804},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.29269999265670776},{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.28029999136924744},{"id":"https://openalex.org/C32230216","wikidata":"https://www.wikidata.org/wiki/Q7882499","display_name":"Uncertainty quantification","level":2,"score":0.27090001106262207},{"id":"https://openalex.org/C55037315","wikidata":"https://www.wikidata.org/wiki/Q5421151","display_name":"Experimental data","level":2,"score":0.265500009059906},{"id":"https://openalex.org/C2983447341","wikidata":"https://www.wikidata.org/wiki/Q1413083","display_name":"Model parameter","level":2,"score":0.26159998774528503},{"id":"https://openalex.org/C202799725","wikidata":"https://www.wikidata.org/wiki/Q272035","display_name":"Accuracy and precision","level":2,"score":0.2581000030040741},{"id":"https://openalex.org/C39847760","wikidata":"https://www.wikidata.org/wiki/Q1385465","display_name":"Extreme point","level":2,"score":0.257099986076355},{"id":"https://openalex.org/C81917197","wikidata":"https://www.wikidata.org/wiki/Q628760","display_name":"Selection (genetic algorithm)","level":2,"score":0.2563000023365021},{"id":"https://openalex.org/C149441793","wikidata":"https://www.wikidata.org/wiki/Q200726","display_name":"Probability distribution","level":2,"score":0.2547999918460846}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1515/teme-2026-0095","doi":"https://doi.org/10.1515/teme-2026-0095","is_oa":false,"landing_page_url":"https://doi.org/10.1515/teme-2026-0095","pdf_url":null,"source":{"id":"https://openalex.org/S20981179","display_name":"tm - Technisches Messen","issn_l":"0171-8096","issn":["0171-8096","2196-7113"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-c","norway-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310319967","host_organization_name":"R. Oldenbourg Verlag","host_organization_lineage":["https://openalex.org/P4310319967"],"host_organization_lineage_names":["R. Oldenbourg Verlag"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"tm - Technisches Messen","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":27,"referenced_works":["https://openalex.org/W156427511","https://openalex.org/W1975177302","https://openalex.org/W1993772918","https://openalex.org/W1996966341","https://openalex.org/W2000354489","https://openalex.org/W2028184867","https://openalex.org/W2031005109","https://openalex.org/W2034456101","https://openalex.org/W2051177771","https://openalex.org/W2054585288","https://openalex.org/W2064043142","https://openalex.org/W2070976821","https://openalex.org/W2093545817","https://openalex.org/W2618376619","https://openalex.org/W2791236522","https://openalex.org/W2977864360","https://openalex.org/W3107005063","https://openalex.org/W4221032191","https://openalex.org/W4229077918","https://openalex.org/W4250785422","https://openalex.org/W4318447263","https://openalex.org/W4381885531","https://openalex.org/W4387664406","https://openalex.org/W4392619657","https://openalex.org/W4404940372","https://openalex.org/W4408799733","https://openalex.org/W4416506036"],"related_works":["https://openalex.org/W1993772918","https://openalex.org/W2028184867","https://openalex.org/W1999068638","https://openalex.org/W2070976821","https://openalex.org/W1975177302","https://openalex.org/W2736871679","https://openalex.org/W4416506036","https://openalex.org/W3048729674","https://openalex.org/W2130730845","https://openalex.org/W2380176816"],"abstract_inverted_index":{"Abstract":[0],"The":[1,78],"reliable":[2,139],"estimation":[3,142],"of":[4,21,24,34,47,70,91,100,108,135],"sphere":[5,35,140],"parameters":[6,73],"is":[7],"important":[8],"for":[9,130,138],"precision":[10],"metrology,":[11],"calibration,":[12],"and":[13,27,133],"uncertainty":[14,33,69,84],"evaluation.":[15],"This":[16,123],"study":[17,124],"investigates":[18],"the":[19,22,28,32,39,55,68,71,82,89,97,101,106,114,131],"effects":[20],"number":[23,90,107],"measurement":[25,92,145],"points":[26,109],"sampled":[29,102],"region":[30],"on":[31,54,88,96],"parameter":[36,141],"fitting":[37,83,112],"using":[38,58],"least-squares":[40],"(LS)":[41],"method.":[42],"Contact":[43],"surface":[44],"topography":[45],"data":[46],"a":[48,120],"high-precision":[49],"bearing":[50],"ball":[51],"were":[52],"acquired":[53],"NMM-1":[56],"platform":[57],"two":[59],"scanning":[60],"strategies.":[61],"Repeated":[62],"subsampling":[63],"was":[64],"applied":[65],"to":[66],"evaluate":[67],"fitted":[72],"under":[74,143],"different":[75],"sampling":[76,136],"conditions.":[77,146],"results":[79],"show":[80],"that":[81],"depends":[85],"not":[86],"only":[87],"points,":[93],"but":[94],"also":[95],"geometric":[98],"coverage":[99],"region.":[103],"Although":[104],"increasing":[105],"generally":[110],"improves":[111],"stability,":[113],"gain":[115],"becomes":[116],"progressively":[117],"smaller":[118],"beyond":[119],"certain":[121],"range.":[122],"therefore":[125],"provides":[126],"an":[127],"experimental":[128],"basis":[129],"design":[132],"selection":[134],"strategies":[137],"non-ideal":[144]},"counts_by_year":[],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2026-11-07T00:00:00"}