{"id":"https://openalex.org/W7225264399","doi":"https://doi.org/10.21203/rs.3.rs-11393438/v1","title":"X-ray tomography and coordinate metrology benchmark for internal cavities in additively manufactured alloys","display_name":"X-ray tomography and coordinate metrology benchmark for internal cavities in additively manufactured alloys","publication_year":2026,"publication_date":"2026-11-04","ids":{"openalex":"https://openalex.org/W7225264399","doi":"https://doi.org/10.21203/rs.3.rs-11393438/v1"},"language":"en","primary_location":{"id":"doi:10.21203/rs.3.rs-11393438/v1","doi":"https://doi.org/10.21203/rs.3.rs-11393438/v1","is_oa":true,"landing_page_url":"https://doi.org/10.21203/rs.3.rs-11393438/v1","pdf_url":"https://www.researchsquare.com/article/rs-11393438/latest.pdf","source":{"id":"https://openalex.org/S4306525896","display_name":"Research Square","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"Research Square","raw_type":"posted-content"},"volume":null,"type":"preprint","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.researchsquare.com/article/rs-11393438/latest.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5128215963","display_name":"Josselin Paccoud","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I9736820","display_name":"\u00c9cole de Technologie Sup\u00e9rieure","ror":"https://ror.org/0020snb74","country_code":"CA","type":"education","lineage":["https://openalex.org/I49663120","https://openalex.org/I9736820"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Josselin Paccoud","raw_affiliation_strings":["\u00c9cole de Technologie Sup\u00e9rieure"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"\u00c9cole de Technologie Sup\u00e9rieure","institution_ids":["https://openalex.org/I9736820"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036382638","display_name":"Hristo Valtchanov","orcid":"https://orcid.org/0000-0003-0580-1678","observed_orcids":["https://orcid.org/0000-0003-0580-1678"]},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Hristo Valtchanov","raw_affiliation_strings":["Polytechnique Montr\u00e9al"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Polytechnique Montr\u00e9al","institution_ids":["https://openalex.org/I45683168"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5151083229","display_name":"Eric Fournier","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Eric Fournier","raw_affiliation_strings":["Comet Technologies Canada Inc"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Comet Technologies Canada Inc","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043856060","display_name":"Vladimir Bra\u00eflovski","orcid":"https://orcid.org/0000-0003-0035-8566","observed_orcids":["https://orcid.org/0000-0003-0035-8566"]},"institutions":[{"id":"https://openalex.org/I9736820","display_name":"\u00c9cole de Technologie Sup\u00e9rieure","ror":"https://ror.org/0020snb74","country_code":"CA","type":"education","lineage":["https://openalex.org/I49663120","https://openalex.org/I9736820"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Vladimir Brailovski","raw_affiliation_strings":["\u00c9cole de Technologie Sup\u00e9rieure"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"\u00c9cole de Technologie Sup\u00e9rieure","institution_ids":["https://openalex.org/I9736820"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026622887","display_name":"Fran\u00e7ois Guibault","orcid":"https://orcid.org/0000-0002-3934-4631","observed_orcids":["https://orcid.org/0000-0002-3934-4631"]},"institutions":[{"id":"https://openalex.org/I45683168","display_name":"Polytechnique Montr\u00e9al","ror":"https://ror.org/05f8d4e86","country_code":"CA","type":"education","lineage":["https://openalex.org/I45683168"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Fran\u00e7ois Guibault","raw_affiliation_strings":["Polytechnique Montr\u00e9al"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Polytechnique Montr\u00e9al","institution_ids":["https://openalex.org/I45683168"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9785000085830688,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9785000085830688,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.003700000001117587,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10705","display_name":"Additive Manufacturing Materials and Processes","score":0.0027000000700354576,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computed-tomography","display_name":"computed tomography","score":0.9829999804496765},{"id":"https://openalex.org/keywords/coordinate-measuring-machine","display_name":"coordinate measuring machine","score":0.8640000224113464},{"id":"https://openalex.org/keywords/dimensional-metrology","display_name":"dimensional metrology","score":0.9229999780654907},{"id":"https://openalex.org/keywords/internal-cavities","display_name":"internal cavities","score":0.9490000009536743},{"id":"https://openalex.org/keywords/wall-thickness-measurement","display_name":"wall thickness measurement","score":0.859000027179718},{"id":"https://openalex.org/keywords/benchmark-dataset","display_name":"benchmark dataset","score":0.734000027179718},{"id":"https://openalex.org/keywords/additive-manufacturing","display_name":"additive manufacturing","score":0.7699999809265137},{"id":"https://openalex.org/keywords/ti-6al-4v","display_name":"Ti-6Al-4V","score":0.9729999899864197},{"id":"https://openalex.org/keywords/inconel-625","display_name":"Inconel 625","score":1.0},{"id":"https://openalex.org/keywords/elastic-image-registration","display_name":"elastic registration","score":0.9369999766349792},{"id":"https://openalex.org/keywords/surface-deviation","display_name":"surface deviation","score":0.46399998664855957}],"concepts":[{"id":"https://openalex.org/C185798385","wikidata":"https://www.wikidata.org/wiki/Q1161707","display_name":"Benchmark (surveying)","level":2,"score":0.8684999942779541},{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.8338000178337097},{"id":"https://openalex.org/C2777511293","wikidata":"https://www.wikidata.org/wiki/Q1426871","display_name":"Coordinate-measuring machine","level":2,"score":0.592199981212616},{"id":"https://openalex.org/C57493831","wikidata":"https://www.wikidata.org/wiki/Q3134666","display_name":"Projection (relational algebra)","level":2,"score":0.5911999940872192},{"id":"https://openalex.org/C165880335","wikidata":"https://www.wikidata.org/wiki/Q5277273","display_name":"Dimensional metrology","level":3,"score":0.5515000224113464},{"id":"https://openalex.org/C163716698","wikidata":"https://www.wikidata.org/wiki/Q841267","display_name":"Tomography","level":2,"score":0.47209998965263367},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.47029998898506165},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.43070000410079956},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.4068000018596649},{"id":"https://openalex.org/C154020017","wikidata":"https://www.wikidata.org/wiki/Q520171","display_name":"Repeatability","level":2,"score":0.3723999857902527},{"id":"https://openalex.org/C2778703219","wikidata":"https://www.wikidata.org/wiki/Q898562","display_name":"Inconel","level":3,"score":0.36980000138282776},{"id":"https://openalex.org/C131979681","wikidata":"https://www.wikidata.org/wiki/Q1899648","display_name":"Point cloud","level":2,"score":0.36329999566078186},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.33410000801086426},{"id":"https://openalex.org/C80551277","wikidata":"https://www.wikidata.org/wiki/Q11210","display_name":"Coordinate system","level":2,"score":0.32580000162124634},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.31700000166893005},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.3124000132083893},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.3061999976634979},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.2992999851703644},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.29420000314712524},{"id":"https://openalex.org/C544519230","wikidata":"https://www.wikidata.org/wiki/Q32566","display_name":"Computed tomography","level":2,"score":0.2922999858856201},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.28999999165534973},{"id":"https://openalex.org/C2777625669","wikidata":"https://www.wikidata.org/wiki/Q7645991","display_name":"Surface metrology","level":4,"score":0.2824999988079071},{"id":"https://openalex.org/C60478076","wikidata":"https://www.wikidata.org/wiki/Q3036835","display_name":"Reference data","level":2,"score":0.27889999747276306},{"id":"https://openalex.org/C189430467","wikidata":"https://www.wikidata.org/wiki/Q7293293","display_name":"Ranking (information retrieval)","level":2,"score":0.2759999930858612},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.27149999141693115},{"id":"https://openalex.org/C193581530","wikidata":"https://www.wikidata.org/wiki/Q683778","display_name":"Structured light","level":2,"score":0.26980000734329224},{"id":"https://openalex.org/C141379421","wikidata":"https://www.wikidata.org/wiki/Q6094427","display_name":"Iterative reconstruction","level":2,"score":0.2612000107765198},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25760000944137573}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.21203/rs.3.rs-11393438/v1","doi":"https://doi.org/10.21203/rs.3.rs-11393438/v1","is_oa":true,"landing_page_url":"https://doi.org/10.21203/rs.3.rs-11393438/v1","pdf_url":"https://www.researchsquare.com/article/rs-11393438/latest.pdf","source":{"id":"https://openalex.org/S4306525896","display_name":"Research Square","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"Research Square","raw_type":"posted-content"}],"best_oa_location":{"id":"doi:10.21203/rs.3.rs-11393438/v1","doi":"https://doi.org/10.21203/rs.3.rs-11393438/v1","is_oa":true,"landing_page_url":"https://doi.org/10.21203/rs.3.rs-11393438/v1","pdf_url":"https://www.researchsquare.com/article/rs-11393438/latest.pdf","source":{"id":"https://openalex.org/S4306525896","display_name":"Research Square","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"Research Square","raw_type":"posted-content"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W7225264399.pdf","grobid_xml":"https://content.openalex.org/works/W7225264399.grobid-xml"},"referenced_works_count":26,"referenced_works":["https://openalex.org/W1986545556","https://openalex.org/W2073498690","https://openalex.org/W2391998465","https://openalex.org/W2616737559","https://openalex.org/W2753284738","https://openalex.org/W2755798765","https://openalex.org/W2770839309","https://openalex.org/W2943358984","https://openalex.org/W2952232639","https://openalex.org/W2966397899","https://openalex.org/W2990385206","https://openalex.org/W3089778988","https://openalex.org/W3094947381","https://openalex.org/W3173640801","https://openalex.org/W3188551960","https://openalex.org/W4200161564","https://openalex.org/W4283465151","https://openalex.org/W4312427897","https://openalex.org/W4366179580","https://openalex.org/W4392303557","https://openalex.org/W4408051493","https://openalex.org/W4410838234","https://openalex.org/W4415383680","https://openalex.org/W4415396012","https://openalex.org/W7164404756","https://openalex.org/W7212003857"],"related_works":["https://openalex.org/W2753284738","https://openalex.org/W7045233020","https://openalex.org/W2779010343","https://openalex.org/W2885691535","https://openalex.org/W69901305","https://openalex.org/W1998290737","https://openalex.org/W6983646681","https://openalex.org/W2891384743","https://openalex.org/W7201936830","https://openalex.org/W4293244979"],"abstract_inverted_index":{"Abstract":[0],"X-ray":[1],"computed":[2],"tomography":[3],"(CT)":[4],"is":[5,54],"widely":[6],"used":[7],"for":[8,26,38,56,118],"dimensional":[9,129],"inspection":[10],"of":[11,45,127],"inaccessible":[12],"internal":[13,27,51],"geometry,":[14],"but":[15],"multi-modal":[16],"public":[17],"benchmark":[18,37,109,124],"datasets":[19],"with":[20,48,95],"reference":[21],"metrology":[22,130],"remain":[23],"scarce,":[24],"particularly":[25],"cavities.":[28],"This":[29],"paper":[30,106],"releases":[31],"a":[32,49],"CT--coordinate":[33],"measuring":[34],"machine":[35],"(CMM)":[36],"wall-thickness":[39],"measurements":[40],"using":[41],"CT":[42,83,85,89],"surface":[43,90,138],"extraction":[44],"an":[46],"artefact":[47],"complex":[50],"cavity":[52],"that":[53,141],"disassembled":[55],"tactile":[57],"probing.":[58],"Four":[59],"cases":[60],"span":[61],"Ti-6Al-4V":[62],"and":[63,68,99,102,111,114,120,133],"Inconel":[64],"625":[65],"in":[66,131,144],"rough":[67],"chemically":[69],"milled":[70],"states.":[71],"Each":[72],"case":[73],"includes":[74],"nominal":[75],"computer-aided":[76],"design":[77],"(CAD)":[78],"geometry":[79],"aligned":[80],"to":[81],"the":[82,108],"reconstruction,":[84],"projections,":[86],"reconstructed":[87],"volumes,":[88],"segmentations,":[91],"CMM":[92],"point":[93],"clouds":[94],"predefined":[96],"thickness-pair":[97],"vectors,":[98],"derived":[100],"surface-":[101],"thickness-deviation":[103],"labels.":[104],"The":[105,123],"defines":[107],"tasks":[110],"reporting":[112],"convention":[113],"reports":[115],"baseline":[116],"results":[117],"reconstruction-based":[119],"CAD-informed":[121],"routes.":[122],"permits":[125],"validation":[126],"CT-based":[128],"noisy":[132],"clean":[134],"environments,":[135],"including":[136],"CAD-constrained":[137],"reconstruction":[139],"approaches":[140],"work":[142],"entirely":[143],"projection":[145],"space,":[146],"such":[147],"as":[148],"elastic":[149],"registration.":[150]},"counts_by_year":[],"updated_date":"2026-11-06T12:05:46.655746","created_date":"2026-11-05T00:00:00"}