{"id":"https://openalex.org/W7225144516","doi":"https://doi.org/10.1109/icem68283.2026.11757493","title":"High-Frequency Impedance Parametric Modeling and Partial Discharge Validation for RUL Estimation of Thermally Aged Stator Insulation","display_name":"High-Frequency Impedance Parametric Modeling and Partial Discharge Validation for RUL Estimation of Thermally Aged Stator Insulation","publication_year":2026,"publication_date":"2026-09-01","ids":{"openalex":"https://openalex.org/W7225144516","doi":"https://doi.org/10.1109/icem68283.2026.11757493"},"language":"en","primary_location":{"id":"doi:10.1109/icem68283.2026.11757493","doi":"https://doi.org/10.1109/icem68283.2026.11757493","is_oa":true,"landing_page_url":"https://doi.org/10.1109/icem68283.2026.11757493","pdf_url":null,"source":{"id":"https://openalex.org/S4363607810","display_name":"International Conference on Electrical Machines (ICEM)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 International Conference on Electrical Machines (ICEM)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/icem68283.2026.11757493","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5074078111","display_name":"Muhammad Usman Sardar","orcid":"https://orcid.org/0000-0002-4294-3918","observed_orcids":["https://orcid.org/0000-0002-4294-3918"]},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Muhammad Usman Sardar","raw_affiliation_strings":["Tallinn University of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040826997","display_name":"Toomas Vaimann","orcid":"https://orcid.org/0000-0003-0481-5066","observed_orcids":["https://orcid.org/0000-0003-0481-5066"]},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Toomas Vaimann","raw_affiliation_strings":["Tallinn University of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5039086540","display_name":"Lauri K\u00fctt","orcid":"https://orcid.org/0000-0003-1353-0396","observed_orcids":["https://orcid.org/0000-0003-1353-0396"]},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Lauri K\u00fctt","raw_affiliation_strings":["Tallinn University of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5084555655","display_name":"Bilal Asad","orcid":"https://orcid.org/0000-0002-9474-2659","observed_orcids":["https://orcid.org/0000-0002-9474-2659"]},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Bilal Asad","raw_affiliation_strings":["Tallinn University of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5022353826","display_name":"Ants Kallaste","orcid":"https://orcid.org/0000-0001-6126-1878","observed_orcids":["https://orcid.org/0000-0001-6126-1878"]},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Ants Kallaste","raw_affiliation_strings":["Tallinn University of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067164595","display_name":"Hujun Peng","orcid":"https://orcid.org/0000-0002-6787-6635","observed_orcids":["https://orcid.org/0000-0002-6787-6635"]},"institutions":[{"id":"https://openalex.org/I111112146","display_name":"Tallinn University of Technology","ror":"https://ror.org/0443cwa12","country_code":"EE","type":"education","lineage":["https://openalex.org/I111112146"]}],"countries":["EE"],"is_corresponding":false,"raw_author_name":"Hujun Peng","raw_affiliation_strings":["Tallinn University of Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Tallinn University of Technology","institution_ids":["https://openalex.org/I111112146"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066936373","display_name":"Simon Steentjes","orcid":"https://orcid.org/0000-0002-3346-4560","observed_orcids":["https://orcid.org/0000-0002-3346-4560"]},"institutions":[{"id":"https://openalex.org/I887968799","display_name":"RWTH Aachen University","ror":"https://ror.org/04xfq0f34","country_code":"DE","type":"education","lineage":["https://openalex.org/I887968799"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Simon Steentjes","raw_affiliation_strings":["RWTH Aachen University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"RWTH Aachen University","institution_ids":["https://openalex.org/I887968799"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"7"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.8384000062942505,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.8384000062942505,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.07580000162124634,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.04129999876022339,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/stator-winding-insulation","display_name":"stator winding insulation","score":0.9300000071525574},{"id":"https://openalex.org/keywords/thermal-aging","display_name":"thermal aging","score":0.8399999737739563},{"id":"https://openalex.org/keywords/remaining-useful-life-prediction","display_name":"remaining useful life prediction","score":0.9200000166893005},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"partial discharge","score":0.718999981880188},{"id":"https://openalex.org/keywords/frequency-response-analysis","display_name":"frequency response analysis","score":0.9559999704360962},{"id":"https://openalex.org/keywords/inception-voltage","display_name":"inception voltage","score":0.8399999737739563},{"id":"https://openalex.org/keywords/insulation-degradation","display_name":"insulation degradation","score":0.7889999747276306},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"condition monitoring","score":0.8529999852180481},{"id":"https://openalex.org/keywords/inverter-fed-machines","display_name":"inverter-fed machines","score":0.8159999847412109},{"id":"https://openalex.org/keywords/predictive-maintenance","display_name":"predictive maintenance","score":0.7089999914169312},{"id":"https://openalex.org/keywords/prognostics","display_name":"prognostics","score":0.7680000066757202}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5414999723434448},{"id":"https://openalex.org/C117251300","wikidata":"https://www.wikidata.org/wiki/Q1849855","display_name":"Parametric statistics","level":2,"score":0.5105000138282776},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.4668000042438507},{"id":"https://openalex.org/C172066009","wikidata":"https://www.wikidata.org/wiki/Q5463955","display_name":"Focused Impedance Measurement","level":3,"score":0.43970000743865967},{"id":"https://openalex.org/C2776529397","wikidata":"https://www.wikidata.org/wiki/Q190312","display_name":"Stator","level":2,"score":0.4269999861717224},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.39410001039505005},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.3716000020503998},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.3634999990463257},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.33180001378059387},{"id":"https://openalex.org/C24574437","wikidata":"https://www.wikidata.org/wiki/Q7135228","display_name":"Parametric model","level":3,"score":0.323199987411499},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2603999972343445},{"id":"https://openalex.org/C57879066","wikidata":"https://www.wikidata.org/wiki/Q41217","display_name":"Mechanics","level":1,"score":0.2529999911785126}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icem68283.2026.11757493","doi":"https://doi.org/10.1109/icem68283.2026.11757493","is_oa":true,"landing_page_url":"https://doi.org/10.1109/icem68283.2026.11757493","pdf_url":null,"source":{"id":"https://openalex.org/S4363607810","display_name":"International Conference on Electrical Machines (ICEM)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 International Conference on Electrical Machines (ICEM)","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1109/icem68283.2026.11757493","doi":"https://doi.org/10.1109/icem68283.2026.11757493","is_oa":true,"landing_page_url":"https://doi.org/10.1109/icem68283.2026.11757493","pdf_url":null,"source":{"id":"https://openalex.org/S4363607810","display_name":"International Conference on Electrical Machines (ICEM)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 International Conference on Electrical Machines (ICEM)","raw_type":"proceedings-article"},"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy","score":0.75},{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.6773999929428101}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W2022076792","https://openalex.org/W2088302359","https://openalex.org/W2921534477","https://openalex.org/W3047817226","https://openalex.org/W3094500487","https://openalex.org/W3122018704","https://openalex.org/W3210882289","https://openalex.org/W3212438638","https://openalex.org/W4205408762","https://openalex.org/W4221081957","https://openalex.org/W4226019514","https://openalex.org/W4320729932","https://openalex.org/W4327796953","https://openalex.org/W4386065621","https://openalex.org/W4387445338","https://openalex.org/W4389723877","https://openalex.org/W4391620898","https://openalex.org/W4393906027","https://openalex.org/W4396570909","https://openalex.org/W4403279205","https://openalex.org/W4405741885","https://openalex.org/W4406864075","https://openalex.org/W4411205814","https://openalex.org/W4416010764","https://openalex.org/W4416109683","https://openalex.org/W7117235200"],"related_works":["https://openalex.org/W7225152440","https://openalex.org/W2775840272","https://openalex.org/W7202360663","https://openalex.org/W2621343782","https://openalex.org/W7202362487","https://openalex.org/W2153581718","https://openalex.org/W1585376134","https://openalex.org/W7171810187","https://openalex.org/W2749523192","https://openalex.org/W2767307839"],"abstract_inverted_index":{"The":[0,57,114,139],"degradation":[1,55],"of":[2,64,133],"stator":[3,23],"winding":[4,24],"insulation":[5,99,148],"is":[6],"a":[7,18,27,88,157],"primary":[8],"contributor":[9],"to":[10,26,52,109,125,146],"failures":[11],"in":[12],"inverter-fed":[13],"machines.":[14],"This":[15],"study":[16],"proposed":[17,43,58],"comprehensive":[19],"condition-monitoring":[20],"framework":[21,142],"for":[22,161],"subjected":[25],"controlled,":[28],"accelerated":[29],"thermal":[30,94],"ageing":[31,95,103],"cycle.":[32],"A":[33],"high-frequency":[34],"(HF)":[35],"frequency":[36],"response":[37],"analysis":[38,77],"(FRA)":[39],"based":[40],"on":[41],"the":[42,110,129],"machine":[44,59,162],"model":[45,60,96],"was":[46,85],"mapped":[47],"with":[48,101,136],"partial":[49],"discharge":[50],"(PD)":[51],"evaluate":[53],"multiple":[54],"levels.":[56],"enabled":[61],"accurate":[62],"tracking":[63],"turn-to-turn":[65],"and":[66,82,155],"phase-to-ground":[67],"capacitance":[68],"variations,":[69],"which":[70],"are":[71],"critical":[72],"dielectric":[73],"markers.":[74],"Furthermore,":[75],"PD":[76,83],"using":[78],"inception":[79],"voltage":[80],"(PDIV)":[81],"charge":[84],"evaluated":[86],"as":[87],"complementary":[89],"discharge-based":[90],"indicator.":[91],"An":[92],"Arrhenius\u2013Miner":[93],"quantified":[97],"cumulative":[98],"damage,":[100],"each":[102],"cycle":[104],"contributing":[105],"approximately":[106],"2.4":[107],"%":[108],"total":[111],"life":[112,117],"consumption.":[113],"remaining":[115],"useful":[116],"(RUL)":[118],"decreased":[119],"monotonically":[120],"from":[121],"100%":[122],"(healthy":[123],"state)":[124],"74":[126],"%,":[127],"validating":[128],"enhanced":[130],"early-stage":[131,147],"sensitivity":[132,145],"FRA":[134],"compared":[135],"conventional":[137],"indicators.":[138],"validated":[140],"model-based":[141],"exhibited":[143],"superior":[144],"degradation,":[149],"thereby":[150],"facilitating":[151],"predictive":[152],"maintenance":[153],"strategies":[154],"providing":[156],"robust":[158],"physics-based":[159],"foundation":[160],"learning\u2013assisted,":[163],"model-driven":[164],"prognostics.":[165]},"counts_by_year":[],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2026-11-04T00:00:00"}