{"id":"https://openalex.org/W7225007318","doi":"https://doi.org/10.1007/s42341-026-00730-3","title":"Effect of Operating Conditions on Switching Variations in Ag/Ti/SiOx/Au RRAM Devices","display_name":"Effect of Operating Conditions on Switching Variations in Ag/Ti/SiOx/Au RRAM Devices","publication_year":2026,"publication_date":"2026-10-31","ids":{"openalex":"https://openalex.org/W7225007318","doi":"https://doi.org/10.1007/s42341-026-00730-3"},"language":"en","primary_location":{"id":"doi:10.1007/s42341-026-00730-3","doi":"https://doi.org/10.1007/s42341-026-00730-3","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s42341-026-00730-3","pdf_url":"https://link.springer.com/content/pdf/10.1007/s42341-026-00730-3.pdf","source":{"id":"https://openalex.org/S35423755","display_name":"Transactions on Electrical and Electronic Materials","issn_l":"1229-7607","issn":["1229-7607","2092-7592"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","kci-registered","norway-1","poland-20","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Transactions on Electrical and Electronic Materials","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://link.springer.com/content/pdf/10.1007/s42341-026-00730-3.pdf","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111359690","display_name":"Raju Vemuri","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I876193797","display_name":"Vellore Institute of Technology University","ror":"https://ror.org/00qzypv28","country_code":"IN","type":"education","lineage":["https://openalex.org/I876193797"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Raju Vemuri","raw_affiliation_strings":["Department of Micro and Nanoelectronics, School of Electronics Engineering, Vellore Institute of Technology, Vellore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Micro and Nanoelectronics, School of Electronics Engineering, Vellore Institute of Technology, Vellore, India","institution_ids":["https://openalex.org/I876193797"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5142816425","display_name":"Saurabh Nagar","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I244572783","display_name":"Symbiosis International University","ror":"https://ror.org/005r2ww51","country_code":"IN","type":"education","lineage":["https://openalex.org/I244572783"]},{"id":"https://openalex.org/I876193797","display_name":"Vellore Institute of Technology University","ror":"https://ror.org/00qzypv28","country_code":"IN","type":"education","lineage":["https://openalex.org/I876193797"]}],"countries":["IN"],"is_corresponding":true,"raw_author_name":"Saurabh Nagar","raw_affiliation_strings":["Department of Electronics and Telecommunication Engineering, Symbiosis Institute of Technology, Symbiosis International (Deemed University), Pune, India","Department of Micro and Nanoelectronics, School of Electronics Engineering, Vellore Institute of Technology, Vellore, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics and Telecommunication Engineering, Symbiosis Institute of Technology, Symbiosis International (Deemed University), Pune, India","institution_ids":["https://openalex.org/I244572783"]},{"raw_affiliation_string":"Department of Micro and Nanoelectronics, School of Electronics Engineering, Vellore Institute of Technology, Vellore, India","institution_ids":["https://openalex.org/I876193797"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5142816425"],"corresponding_institution_ids":["https://openalex.org/I244572783","https://openalex.org/I876193797"],"apc_list":{"value":3190,"currency":"USD","value_usd":3190},"apc_paid":{"value":3190,"currency":"USD","value_usd":3190},"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.73766738,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12808","display_name":"Ferroelectric and Negative Capacitance Devices","score":0.00139999995008111,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/resistive-random-access-memory","display_name":"resistive random access memory","score":0.9120000004768372},{"id":"https://openalex.org/keywords/switching-variability","display_name":"switching variability","score":0.6290000081062317},{"id":"https://openalex.org/keywords/randomness","display_name":"randomness","score":0.5640000104904175},{"id":"https://openalex.org/keywords/reset-voltage","display_name":"reset voltage","score":0.9290000200271606},{"id":"https://openalex.org/keywords/compliance-current","display_name":"compliance current","score":0.8560000061988831},{"id":"https://openalex.org/keywords/joule-heating","display_name":"Joule heating","score":0.9919999837875366},{"id":"https://openalex.org/keywords/electric-field","display_name":"electric field","score":0.8100000023841858},{"id":"https://openalex.org/keywords/entropy-source","display_name":"entropy source","score":0.48899999260902405},{"id":"https://openalex.org/keywords/security-applications","display_name":"security applications","score":0.7020000219345093}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8410999774932861},{"id":"https://openalex.org/C2779795794","wikidata":"https://www.wikidata.org/wiki/Q7315343","display_name":"Reset (finance)","level":2,"score":0.795199990272522},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5870000123977661},{"id":"https://openalex.org/C117926987","wikidata":"https://www.wikidata.org/wiki/Q210009","display_name":"Joule heating","level":2,"score":0.554099977016449},{"id":"https://openalex.org/C182019814","wikidata":"https://www.wikidata.org/wiki/Q1143830","display_name":"Resistive random-access memory","level":3,"score":0.5051000118255615},{"id":"https://openalex.org/C14228908","wikidata":"https://www.wikidata.org/wiki/Q2920483","display_name":"Protein filament","level":2,"score":0.4666999876499176},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.46299999952316284},{"id":"https://openalex.org/C20254490","wikidata":"https://www.wikidata.org/wiki/Q719550","display_name":"Biasing","level":3,"score":0.34610000252723694},{"id":"https://openalex.org/C60799052","wikidata":"https://www.wikidata.org/wiki/Q46221","display_name":"Electric field","level":2,"score":0.314300000667572},{"id":"https://openalex.org/C131321042","wikidata":"https://www.wikidata.org/wiki/Q656685","display_name":"Operating temperature","level":2,"score":0.2847999930381775},{"id":"https://openalex.org/C106889404","wikidata":"https://www.wikidata.org/wiki/Q6294587","display_name":"Joule effect","level":3,"score":0.2791999876499176},{"id":"https://openalex.org/C195370968","wikidata":"https://www.wikidata.org/wiki/Q1754002","display_name":"Threshold voltage","level":4,"score":0.2775999903678894},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.27399998903274536},{"id":"https://openalex.org/C2779058145","wikidata":"https://www.wikidata.org/wiki/Q6294583","display_name":"Joule (programming language)","level":3,"score":0.2718000113964081},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27079999446868896},{"id":"https://openalex.org/C106301342","wikidata":"https://www.wikidata.org/wiki/Q4117933","display_name":"Entropy (arrow of time)","level":2,"score":0.2612999975681305},{"id":"https://openalex.org/C9930424","wikidata":"https://www.wikidata.org/wiki/Q7426587","display_name":"Saturation (graph theory)","level":2,"score":0.25940001010894775}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1007/s42341-026-00730-3","doi":"https://doi.org/10.1007/s42341-026-00730-3","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s42341-026-00730-3","pdf_url":"https://link.springer.com/content/pdf/10.1007/s42341-026-00730-3.pdf","source":{"id":"https://openalex.org/S35423755","display_name":"Transactions on Electrical and Electronic Materials","issn_l":"1229-7607","issn":["1229-7607","2092-7592"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","kci-registered","norway-1","poland-20","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Transactions on Electrical and Electronic Materials","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1007/s42341-026-00730-3","doi":"https://doi.org/10.1007/s42341-026-00730-3","is_oa":true,"landing_page_url":"https://doi.org/10.1007/s42341-026-00730-3","pdf_url":"https://link.springer.com/content/pdf/10.1007/s42341-026-00730-3.pdf","source":{"id":"https://openalex.org/S35423755","display_name":"Transactions on Electrical and Electronic Materials","issn_l":"1229-7607","issn":["1229-7607","2092-7592"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","kci-registered","norway-1","poland-20","russia-white-list-2"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Transactions on Electrical and Electronic Materials","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G614516102","display_name":null,"funder_award_id":"INUP-i2i","funder_id":"https://openalex.org/F4320325255","funder_display_name":"Ministry of Electronics and Information technology"}],"funders":[{"id":"https://openalex.org/F4320322211","display_name":"Indian Institute of Technology Madras","ror":"https://ror.org/03v0r5n49"},{"id":"https://openalex.org/F4320322838","display_name":"VIT University","ror":"https://ror.org/00qzypv28"},{"id":"https://openalex.org/F4320325255","display_name":"Ministry of Electronics and Information technology","ror":null}],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W7225007318.pdf","grobid_xml":"https://content.openalex.org/works/W7225007318.grobid-xml"},"referenced_works_count":40,"referenced_works":["https://openalex.org/W1519309621","https://openalex.org/W1983964264","https://openalex.org/W2044814508","https://openalex.org/W2121908414","https://openalex.org/W2141566011","https://openalex.org/W2245091630","https://openalex.org/W2582965610","https://openalex.org/W2610511700","https://openalex.org/W2615015060","https://openalex.org/W2786143922","https://openalex.org/W2901527199","https://openalex.org/W2905240398","https://openalex.org/W2922052116","https://openalex.org/W2955850047","https://openalex.org/W2999665993","https://openalex.org/W3090449864","https://openalex.org/W3123801173","https://openalex.org/W3128698472","https://openalex.org/W3159509798","https://openalex.org/W3189394813","https://openalex.org/W3195943422","https://openalex.org/W3209780868","https://openalex.org/W4207054909","https://openalex.org/W4213048315","https://openalex.org/W4283276369","https://openalex.org/W4294363524","https://openalex.org/W4379382319","https://openalex.org/W4386736788","https://openalex.org/W4390910730","https://openalex.org/W4394565786","https://openalex.org/W4395453639","https://openalex.org/W4400112217","https://openalex.org/W4406379111","https://openalex.org/W4407607652","https://openalex.org/W4407873836","https://openalex.org/W4408061250","https://openalex.org/W4409187357","https://openalex.org/W4413026503","https://openalex.org/W4413077487","https://openalex.org/W4414282752"],"related_works":["https://openalex.org/W2899237444","https://openalex.org/W3183445419","https://openalex.org/W4399996973","https://openalex.org/W2099554009","https://openalex.org/W7154309413","https://openalex.org/W2525791443","https://openalex.org/W7092683540","https://openalex.org/W1598108378","https://openalex.org/W2045255215","https://openalex.org/W2067242107"],"abstract_inverted_index":{"In":[0],"this":[1],"work,":[2],"Ag/Ti/SiOx/Au":[3],"RRAM":[4],"devices":[5,32,130,140],"were":[6,12],"fabricated,":[7],"and":[8,37,57,61,77],"their":[9],"electrical":[10,144],"characteristics":[11],"investigated":[13],"under":[14,141],"different":[15,142],"operating":[16,126,143],"conditions":[17],"to":[18,122,131],"understand":[19],"the":[20,31,44,65,70,93,124],"stochastic":[21],"nature.":[22],"For":[23],"increasing":[24,69,107],"compliance":[25,120],"(250":[26],"\u00b5A":[27],"\u2013":[28],"1":[29],"mA),":[30],"exhibit":[33],"coexistence":[34],"of":[35,111,138,152],"volatile":[36,60],"non-volatile":[38,62],"behaviour":[39],"from":[40,52,59,98],"cycle-to-cycle":[41,99],"that":[42,96],"broadens":[43],"overall":[45],"switching":[46],"voltages":[47],"variability.":[48,108,135],"This":[49],"trend":[50],"results":[51],"stochasticity":[53],"in":[54],"filament":[55,90],"formation":[56],"rupture":[58,91],"switching.":[63],"Furthermore,":[64],"variability":[66,137],"enhances":[67],"through":[68],"reset":[71,83,94,103],"voltage.":[72],"The":[73,109,136],"increased":[74],"electric":[75],"field":[76],"Joule":[78],"heating":[79],"at":[80,101,117],"a":[81,150],"higher":[82,133],"voltage":[84,104],"(\u2013":[85],"1.5":[86,113],"V)":[87],"cause":[88],"larger":[89],"during":[92],"operation":[95],"varies":[97],"than":[100],"lower":[102],"biases,":[105],"thereby":[106],"combination":[110],"\u00b1":[112],"V":[114],"sweep":[115],"bias":[116],"5":[118],"mA":[119],"appears":[121],"be":[123,147],"optimal":[125],"parameters":[127,145],"for":[128,154],"our":[129],"achieve":[132],"switching-voltage":[134],"these":[139],"can":[146],"utilized":[148],"as":[149],"source":[151],"entropy":[153],"security":[155],"applications.":[156]},"counts_by_year":[],"updated_date":"2026-11-03T10:50:19.383937","created_date":"2026-11-01T00:00:00"}