{"id":"https://openalex.org/W7224955656","doi":"https://doi.org/10.1109/vlsi-soc70418.2026.11740602","title":"A Self-Recoverable Nonvolatile Magnetic Latch with High-Speed SEU-Tolerant Backup Module","display_name":"A Self-Recoverable Nonvolatile Magnetic Latch with High-Speed SEU-Tolerant Backup Module","publication_year":2026,"publication_date":"2026-10-01","ids":{"openalex":"https://openalex.org/W7224955656","doi":"https://doi.org/10.1109/vlsi-soc70418.2026.11740602"},"language":"en","primary_location":{"id":"doi:10.1109/vlsi-soc70418.2026.11740602","doi":"https://doi.org/10.1109/vlsi-soc70418.2026.11740602","is_oa":true,"landing_page_url":"https://doi.org/10.1109/vlsi-soc70418.2026.11740602","pdf_url":null,"source":{"id":"https://openalex.org/S4306418859","display_name":"IFIP/IEEE International Conference on Very Large Scale Integration","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IFIP/IEEE 34th International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/vlsi-soc70418.2026.11740602","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5153832196","display_name":"Shengyuan Yan","orcid":"https://orcid.org/0009-0003-4912-1380","observed_orcids":["https://orcid.org/0009-0003-4912-1380"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shengyuan Yan","raw_affiliation_strings":["Hangzhou International Innovation Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hangzhou International Innovation Institute","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5063574724","display_name":"Kaili Zhang","orcid":"https://orcid.org/0000-0002-1796-6528","observed_orcids":["https://orcid.org/0000-0002-1796-6528"]},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kaili Zhang","raw_affiliation_strings":["Beihang University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Beihang University","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5160227695","display_name":"Wentao Huang","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Wentao Huang","raw_affiliation_strings":["Hangzhou International Innovation Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hangzhou International Innovation Institute","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5160165514","display_name":"Lang Zeng","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Lang Zeng","raw_affiliation_strings":["Hangzhou International Innovation Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hangzhou International Innovation Institute","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5073299668","display_name":"Bi Wang","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Bi Wang","raw_affiliation_strings":["Hangzhou International Innovation Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hangzhou International Innovation Institute","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100333647","display_name":"Yue Zhang","orcid":"https://orcid.org/0000-0001-6893-7199","observed_orcids":["https://orcid.org/0000-0001-6893-7199","https://orcid.org/0000-0003-4768-7519"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yue Zhang","raw_affiliation_strings":["Hangzhou International Innovation Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hangzhou International Innovation Institute","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101698140","display_name":"Yuanqi Hu","orcid":"https://orcid.org/0000-0001-9179-6603","observed_orcids":["https://orcid.org/0000-0001-9179-6603"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yuanqi Hu","raw_affiliation_strings":["Hangzhou International Innovation Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hangzhou International Innovation Institute","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5160201139","display_name":"Weisheng Zhao","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Weisheng Zhao","raw_affiliation_strings":["Hangzhou International Innovation Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hangzhou International Innovation Institute","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5160214431","display_name":"Deming Zhang","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Deming Zhang","raw_affiliation_strings":["Hangzhou International Innovation Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Hangzhou International Innovation Institute","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"5"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.9945999979972839,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/single-event-upset","display_name":"single event upset","score":0.8960000276565552},{"id":"https://openalex.org/keywords/magnetic-tunnel-junctions","display_name":"magnetic tunnel junctions","score":0.8299999833106995},{"id":"https://openalex.org/keywords/low-power-memory","display_name":"low-power memory","score":0.4020000100135803}],"concepts":[{"id":"https://openalex.org/C2780945871","wikidata":"https://www.wikidata.org/wiki/Q194274","display_name":"Backup","level":2,"score":0.5575000047683716},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.536899983882904},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4352000057697296},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4065999984741211},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3675999939441681},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.33869999647140503},{"id":"https://openalex.org/C147494362","wikidata":"https://www.wikidata.org/wiki/Q2078905","display_name":"Troubleshooting","level":2,"score":0.33649998903274536},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.27950000762939453},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.24699999392032623},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.24060000479221344}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/vlsi-soc70418.2026.11740602","doi":"https://doi.org/10.1109/vlsi-soc70418.2026.11740602","is_oa":true,"landing_page_url":"https://doi.org/10.1109/vlsi-soc70418.2026.11740602","pdf_url":null,"source":{"id":"https://openalex.org/S4306418859","display_name":"IFIP/IEEE International Conference on Very Large Scale Integration","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IFIP/IEEE 34th International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1109/vlsi-soc70418.2026.11740602","doi":"https://doi.org/10.1109/vlsi-soc70418.2026.11740602","is_oa":true,"landing_page_url":"https://doi.org/10.1109/vlsi-soc70418.2026.11740602","pdf_url":null,"source":{"id":"https://openalex.org/S4306418859","display_name":"IFIP/IEEE International Conference on Very Large Scale Integration","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IFIP/IEEE 34th International Conference on Very Large Scale Integration (VLSI-SoC)","raw_type":"proceedings-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1974831841","https://openalex.org/W1995380717","https://openalex.org/W2088797290","https://openalex.org/W2110134128","https://openalex.org/W2895216356","https://openalex.org/W2980855339","https://openalex.org/W3130547687","https://openalex.org/W3157243988","https://openalex.org/W4379116040","https://openalex.org/W4387757633","https://openalex.org/W4399110696","https://openalex.org/W4401507213","https://openalex.org/W4402661149","https://openalex.org/W4406323164","https://openalex.org/W4406727903","https://openalex.org/W4410029420","https://openalex.org/W4410226393","https://openalex.org/W7108208309"],"related_works":["https://openalex.org/W4410582292","https://openalex.org/W2061506901","https://openalex.org/W2165678574","https://openalex.org/W7215081814","https://openalex.org/W2770533820","https://openalex.org/W7212320540","https://openalex.org/W3209966609","https://openalex.org/W7214144772","https://openalex.org/W1011947702","https://openalex.org/W2036359829"],"abstract_inverted_index":{"With":[0],"the":[1,36,54,124,159,170,178],"continuous":[2],"scaling":[3],"of":[4,83,132,138,166],"transistor":[5],"technologies,":[6],"single":[7],"event":[8],"upset":[9],"(SEU)":[10],"induced":[11],"by":[12],"space":[13],"radiation":[14],"particles":[15],"has":[16],"become":[17],"a":[18,29,65,71,80,109,115,129,135,142,163],"critical":[19],"reliability":[20],"challenge":[21],"for":[22,122],"aerospace":[23],"digital":[24],"circuits.":[25],"This":[26],"paper":[27],"proposes":[28],"radiation-hardened":[30],"self-recoverable":[31],"nonvolatile":[32],"(NV)":[33],"latch,":[34,38],"termed":[35],"SRHS-STBM":[37],"which":[39],"integrates":[40],"magnetic":[41],"tunnel":[42],"junctions":[43],"(MTJs)":[44],"with":[45,162],"CMOS":[46,119],"circuitry.":[47],"To":[48],"achieve":[49],"complete":[50],"recovery":[51],"from":[52,184],"SEUs,":[53],"proposed":[55,97,125],"latch":[56,127],"employs":[57],"four":[58],"cross-coupled":[59],"dual-input":[60],"standard":[61],"C-elements":[62],"(DSCs)":[63],"forming":[64],"robust":[66],"feedback":[67],"structure.":[68],"In":[69],"addition,":[70],"novel":[72],"SEU-tolerant":[73],"backup":[74,88,101,106,171],"module":[75,98],"is":[76,173],"developed":[77],"to":[78,92],"address":[79],"key":[81],"limitation":[82],"prior":[84],"NV":[85],"latches,":[86],"where":[87],"operations":[89],"are":[90],"vulnerable":[91],"radiation-induced":[93],"data":[94],"corruption.":[95],"The":[96],"ensures":[99],"reliable":[100],"operation":[102],"while":[103],"significantly":[104],"improving":[105],"speed.":[107],"Using":[108],"physics-based":[110],"STT-MTJ":[111],"compact":[112],"model":[113],"and":[114,141,177],"commercial":[116],"40":[117],"nm":[118],"design":[120],"kit":[121],"simulations,":[123],"SRHSSTBM":[126],"achieves":[128],"D-Q":[130],"delay":[131,137,172],"60.85":[133],"ps,":[134,140],"restore":[136],"43.60":[139],"static":[143],"power":[144],"consumption":[145],"as":[146,148],"low":[147],"0.16":[149],"\u03bcW.":[150],"Monte":[151],"Carlo":[152],"simulations":[153],"further":[154],"reveal":[155],"that,":[156],"even":[157],"in":[158],"worst":[160],"case":[161],"deposited":[164],"charge":[165],"Qinj=":[167],"2":[168],"pC,":[169],"only":[174],"3.73":[175],"ns":[176],"internal":[179],"nodes":[180],"can":[181],"fully":[182],"recover":[183],"SEUs.":[185]},"counts_by_year":[],"updated_date":"2026-11-10T11:39:43.021295","created_date":"2026-10-31T00:00:00"}