{"id":"https://openalex.org/W7221582950","doi":"https://doi.org/10.48557/lzenae","title":"Replication Data for: A Very-High Frequency Solution-Processed Organic Field-Effect Transistor with Improved Voltage-Normalized Frequency of Transition","display_name":"Replication Data for: A Very-High Frequency Solution-Processed Organic Field-Effect Transistor with Improved Voltage-Normalized Frequency of Transition","publication_year":2026,"publication_date":"2026-05-25","ids":{"openalex":"https://openalex.org/W7221582950","doi":"https://doi.org/10.48557/lzenae"},"language":"en","primary_location":{"id":"doi:10.48557/lzenae","doi":"https://doi.org/10.48557/lzenae","is_oa":true,"landing_page_url":"https://doi.org/10.48557/lzenae","pdf_url":null,"source":{"id":"https://openalex.org/S7407051716","display_name":"Istituto Italiano di Tecnologia","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Dataset"},"volume":null,"type":"dataset","is_traditional":false,"indexed_in":["datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.48557/lzenae","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5002619683","display_name":"Mario Caironi","orcid":"https://orcid.org/0000-0002-0442-4439","observed_orcids":["https://orcid.org/0000-0002-0442-4439"]},"institutions":[{"id":"https://openalex.org/I30771326","display_name":"Italian Institute of Technology","ror":"https://ror.org/042t93s57","country_code":"IT","type":"facility","lineage":["https://openalex.org/I30771326"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Caironi, Mario","raw_affiliation_strings":["Istituto Italiano di Tecnologia"],"raw_orcid":"https://orcid.org/0000-0002-0442-4439","affiliations":[{"raw_affiliation_string":"Istituto Italiano di Tecnologia","institution_ids":["https://openalex.org/I30771326"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061161076","display_name":"Tommaso Losi","orcid":"https://orcid.org/0009-0004-2065-1916","observed_orcids":["https://orcid.org/0009-0004-2065-1916"]},"institutions":[{"id":"https://openalex.org/I30771326","display_name":"Italian Institute of Technology","ror":"https://ror.org/042t93s57","country_code":"IT","type":"facility","lineage":["https://openalex.org/I30771326"]}],"countries":["IT"],"is_corresponding":false,"raw_author_name":"Losi, Tommaso","raw_affiliation_strings":["Istituto Italiano di Tecnologia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Istituto Italiano di Tecnologia","institution_ids":["https://openalex.org/I30771326"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5049510723","display_name":"Kyle van Oosterhout","orcid":"https://orcid.org/0000-0001-7469-9182","observed_orcids":["https://orcid.org/0000-0001-7469-9182"]},"institutions":[{"id":"https://openalex.org/I83019370","display_name":"Eindhoven University of Technology","ror":"https://ror.org/02c2kyt77","country_code":"NL","type":"education","lineage":["https://openalex.org/I83019370"]}],"countries":["NL"],"is_corresponding":false,"raw_author_name":"van Oosterhout, Kyle","raw_affiliation_strings":["Eindhoven University of Technology"],"raw_orcid":"https://orcid.org/0000-0001-7469-9182","affiliations":[{"raw_affiliation_string":"Eindhoven University of Technology","institution_ids":["https://openalex.org/I83019370"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10045","display_name":"Organic Electronics and Photovoltaics","score":0.9897000193595886,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10623","display_name":"Thin-Film Transistor Technologies","score":0.0031999999191612005,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10611","display_name":"Organic Light-Emitting Diodes Research","score":0.000699999975040555,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/organic-field-effect-transistors","display_name":"organic field-effect transistors","score":0.9729999899864197},{"id":"https://openalex.org/keywords/solution-processed-organic-semiconductors","display_name":"solution-processed organic semiconductors","score":0.8360000252723694},{"id":"https://openalex.org/keywords/s-parameters","display_name":"S-parameters","score":0.9860000014305115},{"id":"https://openalex.org/keywords/electrical-modeling","display_name":"electrical modeling","score":0.43299999833106995}],"concepts":[{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6331999897956848},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.4311000108718872},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.42419999837875366},{"id":"https://openalex.org/C145598152","wikidata":"https://www.wikidata.org/wiki/Q176097","display_name":"Field-effect transistor","level":4,"score":0.3783000111579895},{"id":"https://openalex.org/C158470141","wikidata":"https://www.wikidata.org/wiki/Q7604169","display_name":"Static induction transistor","level":5,"score":0.3709000051021576},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34929999709129333},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3382999897003174},{"id":"https://openalex.org/C8590192","wikidata":"https://www.wikidata.org/wiki/Q1054694","display_name":"Frequency response","level":2,"score":0.32910001277923584},{"id":"https://openalex.org/C150169584","wikidata":"https://www.wikidata.org/wiki/Q7834319","display_name":"Transistor model","level":4,"score":0.3276999890804291},{"id":"https://openalex.org/C6142545","wikidata":"https://www.wikidata.org/wiki/Q1455881","display_name":"Cutoff frequency","level":2,"score":0.32330000400543213},{"id":"https://openalex.org/C12590798","wikidata":"https://www.wikidata.org/wiki/Q3933199","display_name":"Replication (statistics)","level":2,"score":0.32100000977516174},{"id":"https://openalex.org/C2776175482","wikidata":"https://www.wikidata.org/wiki/Q1195816","display_name":"Transfer (computing)","level":2,"score":0.31839999556541443},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2976999878883362},{"id":"https://openalex.org/C194232998","wikidata":"https://www.wikidata.org/wiki/Q1606712","display_name":"Transition (genetics)","level":3,"score":0.28519999980926514},{"id":"https://openalex.org/C3018695096","wikidata":"https://www.wikidata.org/wiki/Q11652","display_name":"Frequency dependence","level":2,"score":0.2653999924659729}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.48557/lzenae","doi":"https://doi.org/10.48557/lzenae","is_oa":true,"landing_page_url":"https://doi.org/10.48557/lzenae","pdf_url":null,"source":{"id":"https://openalex.org/S7407051716","display_name":"Istituto Italiano di Tecnologia","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Dataset"}],"best_oa_location":{"id":"doi:10.48557/lzenae","doi":"https://doi.org/10.48557/lzenae","is_oa":true,"landing_page_url":"https://doi.org/10.48557/lzenae","pdf_url":null,"source":{"id":"https://openalex.org/S7407051716","display_name":"Istituto Italiano di Tecnologia","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Dataset"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2059239256","https://openalex.org/W7212780191","https://openalex.org/W3036581972","https://openalex.org/W2288626437","https://openalex.org/W4231199030","https://openalex.org/W2943359065","https://openalex.org/W2568496882","https://openalex.org/W3113343660","https://openalex.org/W2991135271","https://openalex.org/W2613513412"],"abstract_inverted_index":{"Dataset":[0],"containing":[1],"the":[2,7,49,64,67,76],"raw":[3],"data":[4,27,69],"related":[5],"to":[6],"following":[8],"paper:":[9],"A":[10],"Very-High":[11],"Frequency":[12,20],"Solution-Processed":[13],"Organic":[14],"Field-Effect":[15,39],"Transistor":[16],"with":[17],"Improved":[18],"Voltage-Normalized":[19],"of":[21,38,48,53,63],"Transition":[22],"(Losi,":[23],"et":[24],"al.).":[25],"Such":[26],"are:":[28],"Transfer":[29],"Characteristic":[30,33],"Curves,":[31,34],"Output":[32],"and":[35,45,52,60],"S-parameters":[36],"measurements":[37],"Transistors":[40],"published":[41],"in":[42,75],"Figure":[43,46,54,56,58,61],"2":[44],"3":[47],"main":[50],"text,":[51],"S2,":[55],"S3,":[57],"S4":[59],"S5":[62],"Supplementary":[65],"Information;":[66],"electrical":[68],"used":[70],"for":[71],"model":[72],"fit":[73],"reported":[74],"same":[77],"figures.":[78]},"counts_by_year":[],"updated_date":"2026-10-28T10:33:24.094632","created_date":"2026-10-14T00:00:00"}