{"id":"https://openalex.org/W7220420666","doi":"https://doi.org/10.48550/arxiv.2610.02871","title":"Orientation refinement for nanobeam precession electron diffraction patterns using spot intensity profiles","display_name":"Orientation refinement for nanobeam precession electron diffraction patterns using spot intensity profiles","publication_year":2026,"publication_date":"2026-10-02","ids":{"openalex":"https://openalex.org/W7220420666","doi":"https://doi.org/10.48550/arxiv.2610.02871"},"language":"en","primary_location":{"id":"pmh:oai:arXiv.org:2610.02871","doi":null,"is_oa":true,"landing_page_url":"https://arxiv.org/abs/2610.02871","pdf_url":"https://arxiv.org/pdf/2610.02871","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"volume":null,"type":"preprint","is_traditional":true,"indexed_in":["arxiv","datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2610.02871","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5021234899","display_name":"Arthur Despr\u00e9s","orcid":"https://orcid.org/0000-0001-8370-8511","observed_orcids":["https://orcid.org/0000-0001-8370-8511"]},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210094574","display_name":"Science et Ing\u00e9nierie des Mat\u00e9riaux et Proc\u00e9d\u00e9s","ror":"https://ror.org/00m7zca23","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210094574","https://openalex.org/I4210128300","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Despr\u00e9s, Arthur","raw_affiliation_strings":["Univ. Grenoble Alpes , CNRS , Grenoble INP , SIMaP , F-38000 Grenoble , France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes , CNRS , Grenoble INP , SIMaP , F-38000 Grenoble , France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210094574","https://openalex.org/I899635006"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5157392514","display_name":"Muriel V\u00e9rion","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"V\u00e9rion, Muriel","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5061767157","display_name":"Edgar Fernand Rauch","orcid":"https://orcid.org/0000-0002-5551-9198","observed_orcids":["https://orcid.org/0000-0002-5551-9198"]},"institutions":[{"id":"https://openalex.org/I106785703","display_name":"Institut polytechnique de Grenoble","ror":"https://ror.org/05sbt2524","country_code":"FR","type":"education","lineage":["https://openalex.org/I106785703","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210094574","display_name":"Science et Ing\u00e9nierie des Mat\u00e9riaux et Proc\u00e9d\u00e9s","ror":"https://ror.org/00m7zca23","country_code":"FR","type":"facility","lineage":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210094574","https://openalex.org/I4210128300","https://openalex.org/I899635006"]},{"id":"https://openalex.org/I899635006","display_name":"Universit\u00e9 Grenoble Alpes","ror":"https://ror.org/02rx3b187","country_code":"FR","type":"education","lineage":["https://openalex.org/I899635006"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Rauch, Edgar F.","raw_affiliation_strings":["Univ. Grenoble Alpes , CNRS , Grenoble INP , SIMaP , F-38000 Grenoble , France"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Univ. Grenoble Alpes , CNRS , Grenoble INP , SIMaP , F-38000 Grenoble , France","institution_ids":["https://openalex.org/I106785703","https://openalex.org/I1294671590","https://openalex.org/I4210094574","https://openalex.org/I899635006"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.0019000000320374966,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.0005000000237487257,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/precession-electron-diffraction","display_name":"precession electron diffraction","score":0.9100000262260437},{"id":"https://openalex.org/keywords/crystal-orientation","display_name":"crystal orientation","score":0.8510000109672546},{"id":"https://openalex.org/keywords/4d-stem","display_name":"4D-STEM","score":0.7820000052452087},{"id":"https://openalex.org/keywords/tilt-series","display_name":"tilt series","score":0.7080000042915344},{"id":"https://openalex.org/keywords/angular-resolution","display_name":"angular resolution","score":0.5860000252723694},{"id":"https://openalex.org/keywords/shot-noise","display_name":"shot noise","score":0.8270000219345093},{"id":"https://openalex.org/keywords/bias-correction","display_name":"bias correction","score":0.7350000143051147},{"id":"https://openalex.org/keywords/single-crystal-silicon","display_name":"monocrystalline silicon","score":0.5730000138282776}],"concepts":[{"id":"https://openalex.org/C2779844322","wikidata":"https://www.wikidata.org/wiki/Q2919140","display_name":"Tilt (camera)","level":2,"score":0.8230000138282776},{"id":"https://openalex.org/C48806519","wikidata":"https://www.wikidata.org/wiki/Q1126161","display_name":"Goniometer","level":2,"score":0.7221999764442444},{"id":"https://openalex.org/C16345878","wikidata":"https://www.wikidata.org/wiki/Q107472979","display_name":"Orientation (vector space)","level":2,"score":0.6434999704360962},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.6308000087738037},{"id":"https://openalex.org/C133848361","wikidata":"https://www.wikidata.org/wiki/Q4764027","display_name":"Angular resolution (graph drawing)","level":2,"score":0.6223999857902527},{"id":"https://openalex.org/C81502235","wikidata":"https://www.wikidata.org/wiki/Q104225","display_name":"Precession","level":2,"score":0.5900999903678894},{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.5695000290870667},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.5397999882698059},{"id":"https://openalex.org/C77557913","wikidata":"https://www.wikidata.org/wiki/Q864822","display_name":"Electron diffraction","level":3,"score":0.5347999930381775},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.47029998898506165},{"id":"https://openalex.org/C93038891","wikidata":"https://www.wikidata.org/wiki/Q1061524","display_name":"Intensity (physics)","level":2,"score":0.46560001373291016},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.45249998569488525},{"id":"https://openalex.org/C6448772","wikidata":"https://www.wikidata.org/wiki/Q61949987","display_name":"Kikuchi line","level":5,"score":0.3946000039577484},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.384799987077713},{"id":"https://openalex.org/C2781285689","wikidata":"https://www.wikidata.org/wiki/Q21921428","display_name":"Crystal (programming language)","level":2,"score":0.3628999888896942},{"id":"https://openalex.org/C2776319068","wikidata":"https://www.wikidata.org/wiki/Q18385644","display_name":"Zone axis","level":4,"score":0.33489999175071716},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.33250001072883606},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.328900009393692},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.27059999108314514},{"id":"https://openalex.org/C143724316","wikidata":"https://www.wikidata.org/wiki/Q312468","display_name":"Series (stratigraphy)","level":2,"score":0.2639999985694885},{"id":"https://openalex.org/C159737794","wikidata":"https://www.wikidata.org/wiki/Q124274","display_name":"Azimuth","level":2,"score":0.26350000500679016},{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.26170000433921814},{"id":"https://openalex.org/C149364088","wikidata":"https://www.wikidata.org/wiki/Q185917","display_name":"Translation (biology)","level":4,"score":0.2547999918460846},{"id":"https://openalex.org/C180205008","wikidata":"https://www.wikidata.org/wiki/Q159190","display_name":"Amplitude","level":2,"score":0.25189998745918274}],"mesh":[],"locations_count":2,"locations":[{"id":"pmh:oai:arXiv.org:2610.02871","doi":null,"is_oa":true,"landing_page_url":"https://arxiv.org/abs/2610.02871","pdf_url":"https://arxiv.org/pdf/2610.02871","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"doi:10.48550/arxiv.2610.02871","doi":"https://doi.org/10.48550/arxiv.2610.02871","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2610.02871","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Preprint"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2610.02871","doi":null,"is_oa":true,"landing_page_url":"https://arxiv.org/abs/2610.02871","pdf_url":"https://arxiv.org/pdf/2610.02871","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W7220420666.pdf","grobid_xml":"https://content.openalex.org/works/W7220420666.grobid-xml"},"referenced_works_count":21,"referenced_works":["https://openalex.org/W645317766","https://openalex.org/W1968578263","https://openalex.org/W1995453209","https://openalex.org/W1996774873","https://openalex.org/W2014298488","https://openalex.org/W2055973445","https://openalex.org/W2067858689","https://openalex.org/W2081321639","https://openalex.org/W2117498733","https://openalex.org/W2145177085","https://openalex.org/W2582924619","https://openalex.org/W2796710136","https://openalex.org/W2964370749","https://openalex.org/W2987766614","https://openalex.org/W3012644610","https://openalex.org/W3111070418","https://openalex.org/W3213758824","https://openalex.org/W4237784099","https://openalex.org/W4297243320","https://openalex.org/W4377089357","https://openalex.org/W4391151923"],"related_works":["https://openalex.org/W4391151923","https://openalex.org/W2560386915","https://openalex.org/W3129933469","https://openalex.org/W2046859837","https://openalex.org/W3195620135","https://openalex.org/W2126747332","https://openalex.org/W2063887499","https://openalex.org/W4403496560","https://openalex.org/W2055973445","https://openalex.org/W2560084563"],"abstract_inverted_index":{"We":[0,26],"develop":[1],"a":[2,51,68,78,95,121,130],"method":[3,60,127],"to":[4,20,42,45,97,104,120,123],"measure":[5,46],"crystallographic":[6,48],"orientations":[7],"with":[8,50,57,73,94,100,106],"high":[9],"angular":[10,54],"resolution":[11,55],"for":[12],"nano-beam":[13],"precession":[14,23],"electron":[15,24],"diffraction":[16,35],"patterns,":[17],"and":[18,40],"applicable":[19],"4D":[21],"scanning":[22],"diffraction.":[25],"show":[27],"that":[28,56],"internal":[29],"variations":[30,44],"of":[31,61,80,133],"intensity":[32],"in":[33],"the":[34,47,58,83,88,107,118],"spots":[36],"can":[37],"be":[38],"simulated":[39],"correlated":[41],"experimental":[43],"orientation":[49,64],"much":[52],"better":[53],"standard":[59,108],"automated":[62],"crystal":[63],"mapping":[65],"(ACOM).":[66],"In":[67],"tilt":[69,86,90],"series":[70],"carried":[71],"out":[72],"long":[74],"exposure":[75,111],"time":[76],"on":[77],"monocrystal":[79],"silicon":[81],"around":[82],"main":[84],"goniometer":[85],"axis,":[87],"imposed":[89],"angles":[91],"are":[92],"retrieved":[93],"0.044\u00b0":[96],"0.054\u00b0":[98,122],"precision":[99,119],"refinement,":[101],"against":[102],"0.25\u00b0":[103],"0.33\u00b0":[105],"method.":[109],"Shorter":[110],"times,":[112],"introducing":[113],"Poisson":[114],"noise,":[115],"marginally":[116],"degrade":[117],"0.066\u00b0":[124],"range.":[125],"The":[126],"also":[128],"corrects":[129],"systematic":[131],"error":[132],"ACOM":[134],"near":[135],"zone":[136],"axis.":[137]},"counts_by_year":[],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2026-10-06T00:00:00"}