{"id":"https://openalex.org/W7214916030","doi":"https://doi.org/10.21872/annual2025_6591","title":"Digital Image Correlation-Based Non-Destructive Defect Inspection of Additive Manufactured Metamaterials","display_name":"Digital Image Correlation-Based Non-Destructive Defect Inspection of Additive Manufactured Metamaterials","publication_year":2026,"publication_date":"2026-09-30","ids":{"openalex":"https://openalex.org/W7214916030","doi":"https://doi.org/10.21872/annual2025_6591"},"language":"en","primary_location":{"id":"doi:10.21872/annual2025_6591","doi":"https://doi.org/10.21872/annual2025_6591","is_oa":false,"landing_page_url":"https://doi.org/10.21872/annual2025_6591","pdf_url":null,"source":{"id":"https://openalex.org/S7407087832","display_name":"IISE Annual Conference & Expo","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IISE Annual Conference & Expo 2025","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5153613819","display_name":"Tianyu Gao","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Tianyu Gao","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5153613748","display_name":"Jia Liu","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jia Liu","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5153609515","display_name":"Rongxuan Wang","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Rongxuan Wang","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5153682130","display_name":"Chen Kan","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Chen Kan","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.70049092,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.8511000275611877,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.8511000275611877,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.039000000804662704,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10707","display_name":"Cellular and Composite Structures","score":0.029999999329447746,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/metamaterials","display_name":"metamaterials","score":0.902999997138977},{"id":"https://openalex.org/keywords/additive-manufacturing","display_name":"additive manufacturing","score":0.6269999742507935},{"id":"https://openalex.org/keywords/3d-printed-metamaterials","display_name":"3D-printed metamaterials","score":0.7570000290870667},{"id":"https://openalex.org/keywords/non-destructive-testing","display_name":"non-destructive testing","score":0.7580000162124634},{"id":"https://openalex.org/keywords/defect-detection","display_name":"defect detection","score":0.8790000081062317},{"id":"https://openalex.org/keywords/digital-image-correlation","display_name":"digital image correlation","score":0.9879999756813049},{"id":"https://openalex.org/keywords/machine-learning","display_name":"machine learning","score":0.7620000243186951},{"id":"https://openalex.org/keywords/strain-field-measurement","display_name":"strain field measurement","score":0.8949999809265137},{"id":"https://openalex.org/keywords/speckle-tracking","display_name":"speckle tracking","score":0.6600000262260437},{"id":"https://openalex.org/keywords/quality-inspection","display_name":"quality inspection","score":0.7680000066757202}],"concepts":[{"id":"https://openalex.org/C115635565","wikidata":"https://www.wikidata.org/wiki/Q860900","display_name":"Digital image correlation","level":2,"score":0.6636999845504761},{"id":"https://openalex.org/C102290492","wikidata":"https://www.wikidata.org/wiki/Q7575045","display_name":"Speckle pattern","level":2,"score":0.5295000076293945},{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.5062000155448914},{"id":"https://openalex.org/C204366326","wikidata":"https://www.wikidata.org/wiki/Q3027650","display_name":"Deformation (meteorology)","level":2,"score":0.4993000030517578},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4909000098705292},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4794999957084656},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.4537000060081482},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.4336000084877014},{"id":"https://openalex.org/C2775936607","wikidata":"https://www.wikidata.org/wiki/Q466845","display_name":"Tracking (education)","level":2,"score":0.4101000130176544},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3917999863624573},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.38359999656677246},{"id":"https://openalex.org/C42781572","wikidata":"https://www.wikidata.org/wiki/Q1250322","display_name":"Digital image","level":4,"score":0.37229999899864197},{"id":"https://openalex.org/C110367647","wikidata":"https://www.wikidata.org/wiki/Q497166","display_name":"Metamaterial","level":2,"score":0.3720000088214874},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3684000074863434},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3492000102996826},{"id":"https://openalex.org/C9357733","wikidata":"https://www.wikidata.org/wiki/Q6878417","display_name":"Missing data","level":2,"score":0.3142000138759613},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.30889999866485596},{"id":"https://openalex.org/C89600930","wikidata":"https://www.wikidata.org/wiki/Q1423946","display_name":"Segmentation","level":2,"score":0.29910001158714294},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.2957000136375427},{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.2939999997615814},{"id":"https://openalex.org/C199639397","wikidata":"https://www.wikidata.org/wiki/Q1788588","display_name":"Engineering drawing","level":1,"score":0.29269999265670776},{"id":"https://openalex.org/C55020928","wikidata":"https://www.wikidata.org/wiki/Q3813865","display_name":"Image quality","level":3,"score":0.29019999504089355},{"id":"https://openalex.org/C146920229","wikidata":"https://www.wikidata.org/wiki/Q2278114","display_name":"Automated X-ray inspection","level":4,"score":0.2775999903678894},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.27730000019073486},{"id":"https://openalex.org/C28843909","wikidata":"https://www.wikidata.org/wiki/Q177625","display_name":"Electromagnetic field","level":2,"score":0.2734000086784363},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.26589998602867126},{"id":"https://openalex.org/C164830781","wikidata":"https://www.wikidata.org/wiki/Q787330","display_name":"Automated optical inspection","level":2,"score":0.25949999690055847},{"id":"https://openalex.org/C2779705975","wikidata":"https://www.wikidata.org/wiki/Q62927","display_name":"Digital camera","level":2,"score":0.2590000033378601},{"id":"https://openalex.org/C56529433","wikidata":"https://www.wikidata.org/wiki/Q626700","display_name":"Nondestructive testing","level":2,"score":0.2558000087738037},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.2549000084400177},{"id":"https://openalex.org/C168820333","wikidata":"https://www.wikidata.org/wiki/Q448889","display_name":"Visual inspection","level":2,"score":0.25110000371932983}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.21872/annual2025_6591","doi":"https://doi.org/10.21872/annual2025_6591","is_oa":false,"landing_page_url":"https://doi.org/10.21872/annual2025_6591","pdf_url":null,"source":{"id":"https://openalex.org/S7407087832","display_name":"IISE Annual Conference & Expo","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IISE Annual Conference & Expo 2025","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.8970999717712402}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4308902442","https://openalex.org/W4394822817","https://openalex.org/W4389166426","https://openalex.org/W7028076745","https://openalex.org/W3021888687","https://openalex.org/W4416024593","https://openalex.org/W4387951598","https://openalex.org/W7220400849","https://openalex.org/W4386091553","https://openalex.org/W6940015990"],"abstract_inverted_index":{"Metamaterials":[0],"are":[1,10],"artificially":[2],"engineered":[3],"structures":[4],"constructed":[5],"by":[6,63],"unit":[7],"cells":[8],"and":[9,17,30,70,153,157,184,187,193],"designed":[11],"to":[12,35,54,134,145],"have":[13,22,130],"unique":[14],"mechanical,":[15,28],"thermal,":[16],"electromagnetic":[18],"properties.":[19],"Therefore,":[20],"they":[21],"a":[23,50,75,82,126,191],"broad":[24],"application":[25],"in":[26,89],"the":[27,103,107,121,135,147,155,158,161,167],"aerospace,":[29],"medical":[31],"industries.":[32],"However,":[33],"due":[34,53],"their":[36,39,188],"complex":[37],"structures,":[38],"quality":[40],"inspection":[41],"can":[42,59,67,111,172],"be":[43,61,68],"challenging":[44],"as":[45,49,81,151,180],"internal":[46],"defects,":[47,178],"such":[48,179],"missing":[51,185],"beam":[52,182],"design":[55],"error":[56],"or":[57,114],"cyber-attack":[58],"only":[60],"observed":[62,148],"x-ray":[64],"imaging,":[65],"which":[66],"costly":[69],"time-consuming.":[71],"This":[72],"study":[73],"investigates":[74],"machine-learning-assisted":[76],"digital":[77],"image":[78,92],"correlation":[79,93],"approach":[80],"non-destructive":[83,195],"evaluation":[84],"technique":[85],"for":[86,197],"identifying":[87],"defects":[88],"metamaterials.":[90,200],"Digital":[91],"is":[94],"an":[95],"image-based":[96],"strain":[97,149],"field":[98,150],"measurement":[99],"technique.":[100],"By":[101],"tracking":[102],"speckle":[104],"painted":[105],"on":[106],"part,":[108],"this":[109],"method":[110,171,196],"detect":[112],"deformation":[113,132],"movement.":[115],"When":[116],"under":[117],"controlled":[118],"load,":[119],"If":[120],"part":[122],"being":[123],"examined":[124],"has":[125,142],"defect,":[127],"it":[128],"will":[129],"different":[131],"compared":[133],"standard":[136],"part.":[137],"A":[138],"machine":[139,169],"learning":[140],"model":[141],"been":[143],"trained":[144],"take":[146],"input":[152],"predict":[154],"location":[156],"size":[159],"of":[160,177],"defects.":[162],"Preliminary":[163],"results":[164],"demonstrate":[165],"that":[166],"proposed":[168],"learning-assisted":[170],"effectively":[173],"identify":[174],"various":[175],"types":[176],"in-complete":[181],"connections":[183],"cells,":[186],"locations,":[189],"providing":[190],"cost-effective":[192],"rapid":[194],"3D":[198],"printed":[199]},"counts_by_year":[],"updated_date":"2026-10-28T10:33:24.094632","created_date":"2026-10-01T00:00:00"}