{"id":"https://openalex.org/W7214904255","doi":"https://doi.org/10.1109/jiot.2026.3738796","title":"Identifying Mis-Wiring Induced Earth Faults in Low Voltage Distribution Network using Real-Imaginary Part Separated Regression","display_name":"Identifying Mis-Wiring Induced Earth Faults in Low Voltage Distribution Network using Real-Imaginary Part Separated Regression","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7214904255","doi":"https://doi.org/10.1109/jiot.2026.3738796"},"language":"en","primary_location":{"id":"doi:10.1109/jiot.2026.3738796","doi":"https://doi.org/10.1109/jiot.2026.3738796","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jiot.2026.3738796","pdf_url":null,"source":{"id":"https://openalex.org/S2480266640","display_name":"IEEE Internet of Things Journal","issn_l":"2327-4662","issn":["2327-4662","2372-2541"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["ccf-c","cwts-core","dongbi-b","jufo-2","norway-2","poland-200","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Internet of Things Journal","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/jiot.2026.3738796","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5090111497","display_name":"X J Feng","orcid":"https://orcid.org/0009-0000-1425-1159","observed_orcids":["https://orcid.org/0009-0000-1425-1159"]},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaofei Feng","raw_affiliation_strings":["Changsha University of Science and Technology"],"raw_orcid":"https://orcid.org/0009-0000-1425-1159","affiliations":[{"raw_affiliation_string":"Changsha University of Science and Technology","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5023047019","display_name":"Guanke Liu","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405272762","display_name":"Guangdong Power Grid Company (China)","ror":"https://ror.org/04p8atc80","country_code":"CN","type":"company","lineage":["https://openalex.org/I4405272762"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liu Guanke","raw_affiliation_strings":["Guangdong Power Grid Corp Dongguan Power Supply Bureau"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Guangdong Power Grid Corp Dongguan Power Supply Bureau","institution_ids":["https://openalex.org/I4405272762"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5153653457","display_name":"Chong Yang","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chong Yang","raw_affiliation_strings":["Changsha University of Science and Technology"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Changsha University of Science and Technology","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025296599","display_name":"Bin Li","orcid":"https://orcid.org/0000-0003-4678-8369","observed_orcids":["https://orcid.org/0000-0003-4678-8369"]},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Bin Li","raw_affiliation_strings":["Changsha University of Science and Technology"],"raw_orcid":"https://orcid.org/0000-0003-4678-8369","affiliations":[{"raw_affiliation_string":"Changsha University of Science and Technology","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102954288","display_name":"Sheng Su","orcid":"https://orcid.org/0000-0003-3201-0193","observed_orcids":["https://orcid.org/0000-0003-3201-0193"]},"institutions":[{"id":"https://openalex.org/I56934997","display_name":"Changsha University of Science and Technology","ror":"https://ror.org/03yph8055","country_code":"CN","type":"education","lineage":["https://openalex.org/I56934997"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sheng Su","raw_affiliation_strings":["Changsha University of Science and Technology"],"raw_orcid":"https://orcid.org/0000-0003-3201-0193","affiliations":[{"raw_affiliation_string":"Changsha University of Science and Technology","institution_ids":["https://openalex.org/I56934997"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000057830","display_name":"Paul Barendse","orcid":"https://orcid.org/0000-0002-5598-5068","observed_orcids":["https://orcid.org/0000-0002-5598-5068"]},"institutions":[{"id":"https://openalex.org/I157614274","display_name":"University of Cape Town","ror":"https://ror.org/03p74gp79","country_code":"ZA","type":"education","lineage":["https://openalex.org/I157614274"]}],"countries":["ZA"],"is_corresponding":false,"raw_author_name":"Paul Barendse","raw_affiliation_strings":["University of Cape Town"],"raw_orcid":"https://orcid.org/0000-0002-5598-5068","affiliations":[{"raw_affiliation_string":"University of Cape Town","institution_ids":["https://openalex.org/I157614274"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":{"value":2645,"currency":"USD","value_usd":2645},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"1"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.5634999871253967,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.5634999871253967,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13429","display_name":"Electricity Theft Detection Techniques","score":0.24459999799728394,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.07109999656677246,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/ground-faults","display_name":"ground faults","score":0.925000011920929},{"id":"https://openalex.org/keywords/low-voltage-distribution-networks","display_name":"low-voltage distribution networks","score":0.9399999976158142},{"id":"https://openalex.org/keywords/sliding-window","display_name":"sliding window","score":0.6100000143051147},{"id":"https://openalex.org/keywords/dbscan","display_name":"DBSCAN","score":0.9390000104904175},{"id":"https://openalex.org/keywords/leakage-current","display_name":"leakage current","score":0.6129999756813049},{"id":"https://openalex.org/keywords/fault-localization","display_name":"fault location","score":0.6759999990463257}],"concepts":[{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.629800021648407},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48410001397132874},{"id":"https://openalex.org/C3018325918","wikidata":"https://www.wikidata.org/wiki/Q663611","display_name":"Low earth orbit","level":3,"score":0.4311000108718872},{"id":"https://openalex.org/C110121322","wikidata":"https://www.wikidata.org/wiki/Q865811","display_name":"Distribution (mathematics)","level":2,"score":0.40470001101493835},{"id":"https://openalex.org/C152877465","wikidata":"https://www.wikidata.org/wiki/Q208042","display_name":"Regression analysis","level":2,"score":0.3725999891757965},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.37220001220703125},{"id":"https://openalex.org/C83546350","wikidata":"https://www.wikidata.org/wiki/Q1139051","display_name":"Regression","level":2,"score":0.36070001125335693},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.34599998593330383},{"id":"https://openalex.org/C26148502","wikidata":"https://www.wikidata.org/wiki/Q2488752","display_name":"Earth (classical element)","level":2,"score":0.3449999988079071},{"id":"https://openalex.org/C149441793","wikidata":"https://www.wikidata.org/wiki/Q200726","display_name":"Probability distribution","level":2,"score":0.34459999203681946},{"id":"https://openalex.org/C48921125","wikidata":"https://www.wikidata.org/wiki/Q10861030","display_name":"Linear regression","level":2,"score":0.33390000462532043},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.3224000036716461},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3140000104904175},{"id":"https://openalex.org/C118365302","wikidata":"https://www.wikidata.org/wiki/Q4817115","display_name":"Atmospheric model","level":2,"score":0.31200000643730164},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.3034999966621399},{"id":"https://openalex.org/C2986605239","wikidata":"https://www.wikidata.org/wiki/Q925667","display_name":"Numerical models","level":3,"score":0.2948000133037567},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.28450000286102295},{"id":"https://openalex.org/C3020028006","wikidata":"https://www.wikidata.org/wiki/Q9158","display_name":"Electronic mail","level":2,"score":0.26969999074935913},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.2621999979019165},{"id":"https://openalex.org/C104892082","wikidata":"https://www.wikidata.org/wiki/Q17156810","display_name":"Low frequency","level":2,"score":0.25380000472068787},{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.25270000100135803}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/jiot.2026.3738796","doi":"https://doi.org/10.1109/jiot.2026.3738796","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jiot.2026.3738796","pdf_url":null,"source":{"id":"https://openalex.org/S2480266640","display_name":"IEEE Internet of Things Journal","issn_l":"2327-4662","issn":["2327-4662","2372-2541"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["ccf-c","cwts-core","dongbi-b","jufo-2","norway-2","poland-200","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Internet of Things Journal","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.1109/jiot.2026.3738796","doi":"https://doi.org/10.1109/jiot.2026.3738796","is_oa":true,"landing_page_url":"https://doi.org/10.1109/jiot.2026.3738796","pdf_url":null,"source":{"id":"https://openalex.org/S2480266640","display_name":"IEEE Internet of Things Journal","issn_l":"2327-4662","issn":["2327-4662","2372-2541"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["ccf-c","cwts-core","dongbi-b","jufo-2","norway-2","poland-200","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Internet of Things Journal","raw_type":"journal-article"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","score":0.7207000255584717,"id":"https://metadata.un.org/sdg/9"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W7133538728","https://openalex.org/W1507853317","https://openalex.org/W7169579040","https://openalex.org/W2989756800","https://openalex.org/W1511952296","https://openalex.org/W2133505647","https://openalex.org/W2785724813","https://openalex.org/W7125595259","https://openalex.org/W2613289379","https://openalex.org/W7128310605"],"abstract_inverted_index":{"Wiring":[0],"faults":[1],"involving":[2],"the":[3,27,40,52,93,113,121,127,133,140,155,189,197,206],"neutral":[4],"and":[5,54,68,86,95,139],"ground":[6],"wire":[7],"of":[8,30,39,42,56,136,144,159,169,223],"user":[9],"in":[10,89],"low-voltage":[11],"distribution":[12],"networks":[13],"(LVDNs)":[14],"are":[15],"prevalent":[16],"yet":[17],"notoriously":[18],"difficult":[19],"to":[20,26,71,111,131,153,176],"diagnose,":[21],"posing":[22],"a":[23,104,147,165,182],"significant":[24],"threat":[25],"reliable":[28],"operation":[29],"residual":[31],"current":[32],"protection":[33],"devices":[34],"(RCDs).":[35],"The":[36],"extensive":[37],"application":[38],"Internet":[41],"Things":[43],"(IoT)":[44],"meter":[45],"has":[46],"provided":[47],"critical":[48],"data":[49,138],"support":[50],"for":[51,98],"monitoring":[53],"identification":[55,81],"users":[57],"associated":[58],"with":[59,171,212],"wiring":[60],"fault.":[61],"Existing":[62],"studies":[63,180],"primarily":[64],"utilize":[65],"multi-variables":[66],"regression":[67,108],"thresholding":[69],"segmentation":[70],"identify":[72],"anomalous":[73],"users;":[74],"however,":[75],"they":[76],"still":[77],"suffer":[78],"from":[79],"inadequate":[80],"accuracy,":[82],"high":[83],"computational":[84,114],"overhead":[85],"limited":[87,141],"transferability":[88],"different":[90],"LVDNs.":[91],"Considering":[92],"timeliness":[94],"exactness":[96],"requirements":[97],"fault":[99],"localization,":[100],"this":[101],"paper":[102],"proposed":[103,198],"real-imaginary":[105],"part":[106],"separated":[107],"(RIPSR)":[109],"model":[110],"accelerate":[112],"speed":[115],"by":[116,202,209],"mapping":[117],"complex-domain":[118],"operations":[119],"into":[120],"real":[122],"domain":[123],"while":[124,204],"fully":[125],"preserving":[126],"complex-valued":[128,213],"information.":[129],"Furthermore,":[130],"address":[132],"time-varying":[134],"characteristics":[135],"leakage":[137],"discriminative":[142],"capability":[143],"rigid":[145],"thresholding,":[146],"sliding":[148],"window":[149],"mechanism":[150],"is":[151,174,217],"adopted":[152],"extract":[154],"temporal":[156],"variation":[157],"trajectories":[158],"each":[160],"user\u2019s":[161],"weight":[162],"coefficient.":[163],"Subsequently,":[164],"density-based":[166],"spatial":[167],"clustering":[168],"applications":[170],"noise":[172],"(DBSCAN)":[173],"employed":[175],"cluster":[177],"users.":[178],"Simulation":[179],"on":[181],"204-user":[183],"LVDN":[184],"platform":[185],"indicate":[186],"that,":[187],"within":[188],"low":[190],"false":[191],"positive":[192],"rate":[193],"region":[194],"below":[195],"2%,":[196],"method":[199],"improves":[200],"recall":[201],"21.2%":[203],"reducing":[205],"computation":[207],"time":[208],"65%":[210],"compared":[211],"regression.":[214],"Its":[215],"robustness":[216],"further":[218],"tested":[219],"under":[220],"conditions":[221],"representative":[222],"practical":[224],"engineering":[225],"environments.":[226]},"counts_by_year":[],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2026-10-01T00:00:00"}