{"id":"https://openalex.org/W7214211792","doi":"https://doi.org/10.2351/1.5065727","title":"In process laser beam diagnostics","display_name":"In process laser beam diagnostics","publication_year":2002,"publication_date":"2002-10-01","ids":{"openalex":"https://openalex.org/W7214211792","doi":"https://doi.org/10.2351/1.5065727"},"language":"en","primary_location":{"id":"doi:10.2351/1.5065727","doi":"https://doi.org/10.2351/1.5065727","is_oa":false,"landing_page_url":"https://doi.org/10.2351/1.5065727","pdf_url":null,"source":{"id":"https://openalex.org/S7407088496","display_name":"International Congress on Applications of Lasers & Electro-Optics (ICALEO)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ICALEO 2002: 21st International Congress on Laser Materials Processing and Laser Microfabrication","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5037313053","display_name":"M. Sparkes","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I146655781","display_name":"University of Liverpool","ror":"https://ror.org/04xs57h96","country_code":"GB","type":"education","lineage":["https://openalex.org/I146655781"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"M. Sparkes","raw_affiliation_strings":["Manufacturing Science & Engineering Research Centre Faculty of Engineering, University of Liverpool \u2020 , Liverpool L69 3BX,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Manufacturing Science & Engineering Research Centre Faculty of Engineering, University of Liverpool \u2020 , Liverpool L69 3BX,","institution_ids":["https://openalex.org/I146655781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5152677979","display_name":"W. O'Neill","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I146655781","display_name":"University of Liverpool","ror":"https://ror.org/04xs57h96","country_code":"GB","type":"education","lineage":["https://openalex.org/I146655781"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"W. O'Neill","raw_affiliation_strings":["Manufacturing Science & Engineering Research Centre Faculty of Engineering, University of Liverpool \u2020 , Liverpool L69 3BX,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Manufacturing Science & Engineering Research Centre Faculty of Engineering, University of Liverpool \u2020 , Liverpool L69 3BX,","institution_ids":["https://openalex.org/I146655781"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035934111","display_name":"Jack Gabzdyl","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"J. Gabzdyl","raw_affiliation_strings":["BOC Gases, The Priestly Centre, Guildford \u2020\u2021"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"BOC Gases, The Priestly Centre, Guildford \u2020\u2021","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114924812","display_name":"M. Ikhlasul Amal","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I19128659","display_name":"Indonesian Institute of Sciences","ror":"https://ror.org/03d7c1451","country_code":"ID","type":"facility","lineage":["https://openalex.org/I19128659","https://openalex.org/I4387154144"]}],"countries":["ID"],"is_corresponding":false,"raw_author_name":"M. Ikhlasul Amal","raw_affiliation_strings":["Indonesian Institute of Sciences (LIPI), Tangerang, Indonesia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indonesian Institute of Sciences (LIPI), Tangerang, Indonesia","institution_ids":["https://openalex.org/I19128659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5152670795","display_name":"Satrio Herbirowo","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I19128659","display_name":"Indonesian Institute of Sciences","ror":"https://ror.org/03d7c1451","country_code":"ID","type":"facility","lineage":["https://openalex.org/I19128659","https://openalex.org/I4387154144"]}],"countries":["ID"],"is_corresponding":false,"raw_author_name":"Satrio Herbirowo","raw_affiliation_strings":["Indonesian Institute of Sciences (LIPI), Tangerang, Indonesia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indonesian Institute of Sciences (LIPI), Tangerang, Indonesia","institution_ids":["https://openalex.org/I19128659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5152684767","display_name":"M. Yunan Hasbi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I19128659","display_name":"Indonesian Institute of Sciences","ror":"https://ror.org/03d7c1451","country_code":"ID","type":"facility","lineage":["https://openalex.org/I19128659","https://openalex.org/I4387154144"]}],"countries":["ID"],"is_corresponding":false,"raw_author_name":"M. Yunan Hasbi","raw_affiliation_strings":["Indonesian Institute of Sciences (LIPI), Tangerang, Indonesia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indonesian Institute of Sciences (LIPI), Tangerang, Indonesia","institution_ids":["https://openalex.org/I19128659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059428077","display_name":"Yulinda Lestari","orcid":"https://orcid.org/0000-0002-5141-8592","observed_orcids":["https://orcid.org/0000-0002-5141-8592"]},"institutions":[{"id":"https://openalex.org/I19128659","display_name":"Indonesian Institute of Sciences","ror":"https://ror.org/03d7c1451","country_code":"ID","type":"facility","lineage":["https://openalex.org/I19128659","https://openalex.org/I4387154144"]}],"countries":["ID"],"is_corresponding":false,"raw_author_name":"Yulinda Lestari","raw_affiliation_strings":["Indonesian Institute of Sciences (LIPI), Tangerang, Indonesia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indonesian Institute of Sciences (LIPI), Tangerang, Indonesia","institution_ids":["https://openalex.org/I19128659"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006379160","display_name":"Dhyah Annur","orcid":"https://orcid.org/0000-0003-1833-9718","observed_orcids":["https://orcid.org/0000-0003-1833-9718"]},"institutions":[{"id":"https://openalex.org/I19128659","display_name":"Indonesian Institute of Sciences","ror":"https://ror.org/03d7c1451","country_code":"ID","type":"facility","lineage":["https://openalex.org/I19128659","https://openalex.org/I4387154144"]}],"countries":["ID"],"is_corresponding":false,"raw_author_name":"Dhyah Annur","raw_affiliation_strings":["Indonesian Institute of Sciences (LIPI), Tangerang, Indonesia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indonesian Institute of Sciences (LIPI), Tangerang, Indonesia","institution_ids":["https://openalex.org/I19128659"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5085034563","display_name":"Daniel Panghihutan Malau","orcid":"https://orcid.org/0000-0002-0557-3030","observed_orcids":["https://orcid.org/0000-0002-0557-3030"]},"institutions":[{"id":"https://openalex.org/I19128659","display_name":"Indonesian Institute of Sciences","ror":"https://ror.org/03d7c1451","country_code":"ID","type":"facility","lineage":["https://openalex.org/I19128659","https://openalex.org/I4387154144"]}],"countries":["ID"],"is_corresponding":false,"raw_author_name":"Daniel Panghihutan Malau","raw_affiliation_strings":["Indonesian Institute of Sciences (LIPI), Tangerang, Indonesia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Indonesian Institute of Sciences (LIPI), Tangerang, Indonesia","institution_ids":["https://openalex.org/I19128659"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.5018,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.83858958,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T14158","display_name":"Optical Systems and Laser Technology","score":0.625,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10834","display_name":"Welding Techniques and Residual Stresses","score":0.13779999315738678,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14257","display_name":"Advanced Measurement and Detection Methods","score":0.03779999911785126,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/laser-beam-diagnostics","display_name":"laser beam diagnostics","score":0.9409999847412109},{"id":"https://openalex.org/keywords/online-process-monitoring","display_name":"real-time process monitoring","score":0.8029999732971191},{"id":"https://openalex.org/keywords/fractional-sampling","display_name":"fractional sampling","score":0.718999981880188},{"id":"https://openalex.org/keywords/high-power-lasers","display_name":"high-power lasers","score":0.5210000276565552},{"id":"https://openalex.org/keywords/beam-diameter-measurement","display_name":"beam diameter measurement","score":0.9829999804496765},{"id":"https://openalex.org/keywords/beam-intensity-measurement","display_name":"beam intensity measurement","score":0.8700000047683716},{"id":"https://openalex.org/keywords/beam-position-measurement","display_name":"beam position measurement","score":0.9670000076293945},{"id":"https://openalex.org/keywords/laser-materials-processing","display_name":"laser materials processing","score":0.9190000295639038}],"concepts":[{"id":"https://openalex.org/C168834538","wikidata":"https://www.wikidata.org/wiki/Q3705329","display_name":"Beam (structure)","level":2,"score":0.6938999891281128},{"id":"https://openalex.org/C100796255","wikidata":"https://www.wikidata.org/wiki/Q180407","display_name":"Beam parameter product","level":5,"score":0.6238999962806702},{"id":"https://openalex.org/C115171683","wikidata":"https://www.wikidata.org/wiki/Q6493038","display_name":"Laser beam quality","level":4,"score":0.5799999833106995},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5767999887466431},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5663999915122986},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.548799991607666},{"id":"https://openalex.org/C520434653","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser","level":2,"score":0.5214999914169312},{"id":"https://openalex.org/C2984025587","wikidata":"https://www.wikidata.org/wiki/Q38867","display_name":"Laser beams","level":3,"score":0.5012999773025513},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.46709999442100525},{"id":"https://openalex.org/C119440689","wikidata":"https://www.wikidata.org/wiki/Q4876179","display_name":"Beam diameter","level":4,"score":0.423799991607666},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3896999955177307},{"id":"https://openalex.org/C62172962","wikidata":"https://www.wikidata.org/wiki/Q1230543","display_name":"Beam divergence","level":5,"score":0.31529998779296875},{"id":"https://openalex.org/C93038891","wikidata":"https://www.wikidata.org/wiki/Q1061524","display_name":"Intensity (physics)","level":2,"score":0.3140999972820282},{"id":"https://openalex.org/C173781883","wikidata":"https://www.wikidata.org/wiki/Q850928","display_name":"M squared","level":5,"score":0.29919999837875366},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.25780001282691956},{"id":"https://openalex.org/C93063454","wikidata":"https://www.wikidata.org/wiki/Q4876184","display_name":"Beam expander","level":4,"score":0.25440001487731934},{"id":"https://openalex.org/C200649887","wikidata":"https://www.wikidata.org/wiki/Q17154544","display_name":"Laser power scaling","level":3,"score":0.25119999051094055}],"mesh":[],"locations_count":5,"locations":[{"id":"doi:10.2351/1.5065727","doi":"https://doi.org/10.2351/1.5065727","is_oa":false,"landing_page_url":"https://doi.org/10.2351/1.5065727","pdf_url":null,"source":{"id":"https://openalex.org/S7407088496","display_name":"International Congress on Applications of Lasers & Electro-Optics (ICALEO)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ICALEO 2002: 21st International Congress on Laser Materials Processing and Laser Microfabrication","raw_type":"proceedings-article"},{"id":"doi:10.2351/1.5066191","doi":"https://doi.org/10.2351/1.5066191","is_oa":false,"landing_page_url":"https://doi.org/10.2351/1.5066191","pdf_url":null,"source":{"id":"https://openalex.org/S7407088496","display_name":"International Congress on Applications of Lasers & Electro-Optics (ICALEO)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"ICALEO 2002: 21st International Congress on Laser Materials Processing and Laser Microfabrication","raw_type":"proceedings-article"},{"id":"pmh:oai:generic.eprints.org:328013","doi":null,"is_oa":false,"landing_page_url":"http://publications.eng.cam.ac.uk/328013/","pdf_url":null,"source":{"id":"https://openalex.org/S4406922847","display_name":"Cambridge University Engineering Department Publications Database","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Conference or Workshop Item"},{"id":"pmh:oai:generic.eprints.org:467950","doi":null,"is_oa":false,"landing_page_url":"http://publications.eng.cam.ac.uk/467950/","pdf_url":null,"source":{"id":"https://openalex.org/S4406922847","display_name":"Cambridge University Engineering Department Publications Database","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"},{"id":"pmh:oai:generic.eprints.org:467952","doi":null,"is_oa":false,"landing_page_url":"http://publications.eng.cam.ac.uk/467952/","pdf_url":null,"source":{"id":"https://openalex.org/S4406922847","display_name":"Cambridge University Engineering Department Publications Database","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"","raw_type":"Article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":2,"referenced_works":["https://openalex.org/W2040613535","https://openalex.org/W2060994488"],"related_works":["https://openalex.org/W2897114288","https://openalex.org/W1036188210","https://openalex.org/W1632335142","https://openalex.org/W2212436186","https://openalex.org/W2896840473","https://openalex.org/W2294064090","https://openalex.org/W2897603002","https://openalex.org/W2025407564","https://openalex.org/W2000896997","https://openalex.org/W108074868"],"abstract_inverted_index":{"Laser":[0],"beam":[1,34,42,46,50,63],"diagnosis":[2,35],"is":[3],"usually":[4],"carried":[5,18],"out":[6],"off-line":[7],"in":[8,40],"order":[9],"to":[10,14],"minimise":[11],"the":[12,15,23,55,66],"disruption":[13],"process":[16,41],"being":[17],"out.":[19],"This":[20],"paper":[21,53],"presents":[22],"results":[24],"of":[25,38,57],"a":[26,31],"fractional":[27],"sampling":[28,59],"device":[29],"for":[30,61],"high":[32],"power":[33],"system":[36],"capable":[37],"measuring":[39],"properties":[43,64],"such":[44],"as":[45],"diameter,":[47],"intensity":[48],"and":[49],"position.":[51],"The":[52],"discusses":[54],"application":[56],"this":[58],"technique":[60],"monitoring":[62],"during":[65],"laser":[67],"materials":[68],"processing":[69],"operation.":[70]},"counts_by_year":[],"updated_date":"2026-10-12T09:40:04.860316","created_date":"2026-09-25T00:00:00"}