{"id":"https://openalex.org/W7214180940","doi":"https://doi.org/10.48550/arxiv.2609.28096","title":"Achieving 5-angstrom-resolution diffraction contrast with an uncorrected electron probe and nanosized defect characterizations","display_name":"Achieving 5-angstrom-resolution diffraction contrast with an uncorrected electron probe and nanosized defect characterizations","publication_year":2026,"publication_date":"2026-09-23","ids":{"openalex":"https://openalex.org/W7214180940","doi":"https://doi.org/10.48550/arxiv.2609.28096"},"language":"en","primary_location":{"id":"pmh:oai:arXiv.org:2609.28096","doi":null,"is_oa":true,"landing_page_url":"https://arxiv.org/abs/2609.28096","pdf_url":"https://arxiv.org/pdf/2609.28096","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"volume":null,"type":"preprint","is_traditional":true,"indexed_in":["arxiv","datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2609.28096","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5152689202","display_name":"Yao Li","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I1343871089","display_name":"Los Alamos National Laboratory","ror":"https://ror.org/01e41cf67","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210120050"]},{"id":"https://openalex.org/I4210127218","display_name":"Center for Integrated Nanotechnologies","ror":"https://ror.org/031yh0y38","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210104735","https://openalex.org/I4210120050","https://openalex.org/I4210127218"]},{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Li, Yao","raw_affiliation_strings":["Center for Integrated Nanotechnologies , Los Alamos National Laboratory , Los Alamos , NM 87545 , USA","Department of Nuclear Engineering , University of Tennessee , Knoxville , TN 37996 , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Integrated Nanotechnologies , Los Alamos National Laboratory , Los Alamos , NM 87545 , USA","institution_ids":["https://openalex.org/I1343871089","https://openalex.org/I4210127218"]},{"raw_affiliation_string":"Department of Nuclear Engineering , University of Tennessee , Knoxville , TN 37996 , USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5052727828","display_name":"Austin Houston","orcid":"https://orcid.org/0009-0005-8777-4686","observed_orcids":["https://orcid.org/0009-0005-8777-4686"]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Houston, Austin C.","raw_affiliation_strings":["Department of Material Science and Engineering , University of Tennessee , Knoxville , TN 37996 , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Material Science and Engineering , University of Tennessee , Knoxville , TN 37996 , USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069050410","display_name":"Ziang Yu","orcid":"https://orcid.org/0000-0002-4159-0073","observed_orcids":["https://orcid.org/0000-0002-4159-0073","https://orcid.org/0000-0002-9899-8299"]},"institutions":[{"id":"https://openalex.org/I135310074","display_name":"University of Wisconsin\u2013Madison","ror":"https://ror.org/01y2jtd41","country_code":"US","type":"education","lineage":["https://openalex.org/I135310074"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Yu, Ziang","raw_affiliation_strings":["Department of Nuclear Engineering & Engineering Physics , University of Wisconsin , Madison , WI 53706 USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Nuclear Engineering & Engineering Physics , University of Wisconsin , Madison , WI 53706 USA","institution_ids":["https://openalex.org/I135310074"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5152690181","display_name":"Zehui Qi","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Qi, Zehui","raw_affiliation_strings":["Department of Nuclear Engineering , University of Tennessee , Knoxville , TN 37996 , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Nuclear Engineering , University of Tennessee , Knoxville , TN 37996 , USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5152769051","display_name":"Siwei Chen","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chen, Siwei","raw_affiliation_strings":["Department of Nuclear Engineering , University of Tennessee , Knoxville , TN 37996 , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Nuclear Engineering , University of Tennessee , Knoxville , TN 37996 , USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5152770687","display_name":"Yajie Zhao","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Zhao, Yajie","raw_affiliation_strings":["Department of Nuclear Engineering , University of Tennessee , Knoxville , TN 37996 , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Nuclear Engineering , University of Tennessee , Knoxville , TN 37996 , USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101836635","display_name":"Sung Joo Kim","orcid":"https://orcid.org/0000-0001-9776-1532","observed_orcids":["https://orcid.org/0000-0001-9776-1532"]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Kim, Sung Joo","raw_affiliation_strings":["Electron Microscopy Center , University of Tennessee , Knoxville , TN 37996 , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Electron Microscopy Center , University of Tennessee , Knoxville , TN 37996 , USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057303470","display_name":"Steven John Zinkle","orcid":"https://orcid.org/0000-0003-2890-6915","observed_orcids":["https://orcid.org/0000-0003-2890-6915"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Zinkle, Steven J.","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056385337","display_name":"Gerd J. Duscher","orcid":"https://orcid.org/0000-0002-2039-548X","observed_orcids":["https://orcid.org/0000-0002-2039-548X"]},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Duscher, Gerd","raw_affiliation_strings":["Department of Material Science and Engineering , University of Tennessee , Knoxville , TN 37996 , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Material Science and Engineering , University of Tennessee , Knoxville , TN 37996 , USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010358439","display_name":"Blas Pedro Uberuaga","orcid":"https://orcid.org/0000-0001-6934-6219","observed_orcids":["https://orcid.org/0000-0001-6934-6219"]},"institutions":[{"id":"https://openalex.org/I1343871089","display_name":"Los Alamos National Laboratory","ror":"https://ror.org/01e41cf67","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210120050"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Uberuaga, Blas P.","raw_affiliation_strings":["Materials Science and Technology Division , Los Alamos National Laboratory , Los Alamos , NM 87545 , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Materials Science and Technology Division , Los Alamos National Laboratory , Los Alamos , NM 87545 , USA","institution_ids":["https://openalex.org/I1343871089"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5012384531","display_name":"Benjamin Kyle Derby","orcid":"https://orcid.org/0000-0003-4692-4615","observed_orcids":["https://orcid.org/0000-0003-4692-4615"]},"institutions":[{"id":"https://openalex.org/I1343871089","display_name":"Los Alamos National Laboratory","ror":"https://ror.org/01e41cf67","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210120050"]},{"id":"https://openalex.org/I4210127218","display_name":"Center for Integrated Nanotechnologies","ror":"https://ror.org/031yh0y38","country_code":"US","type":"facility","lineage":["https://openalex.org/I1330989302","https://openalex.org/I1343871089","https://openalex.org/I198811213","https://openalex.org/I4210104735","https://openalex.org/I4210120050","https://openalex.org/I4210127218"]},{"id":"https://openalex.org/I869375964","display_name":"Woodward (United States)","ror":"https://ror.org/01y24f494","country_code":"US","type":"company","lineage":["https://openalex.org/I869375964"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Derby, Benjamin K.","raw_affiliation_strings":["Center for Integrated Nanotechnologies , Los Alamos National Laboratory , Los Alamos , NM 87545 , USA","Woodward, Inc. , Fort Collins , CO 80524 , USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Center for Integrated Nanotechnologies , Los Alamos National Laboratory , Los Alamos , NM 87545 , USA","institution_ids":["https://openalex.org/I1343871089","https://openalex.org/I4210127218"]},{"raw_affiliation_string":"Woodward, Inc. , Fort Collins , CO 80524 , USA","institution_ids":["https://openalex.org/I869375964"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},"topics":[{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.9970999956130981,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.0024999999441206455,"subfield":{"id":"https://openalex.org/subfields/2500","display_name":"General Materials Science"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/diffraction-contrast","display_name":"diffraction contrast","score":0.9070000052452087},{"id":"https://openalex.org/keywords/atomic-resolution-imaging","display_name":"atomic resolution imaging","score":0.6420000195503235},{"id":"https://openalex.org/keywords/dislocation-loops","display_name":"dislocation loops","score":0.8809999823570251},{"id":"https://openalex.org/keywords/phase-structure","display_name":"phase structure","score":0.6639999747276306},{"id":"https://openalex.org/keywords/steel","display_name":"steel","score":0.9100000262260437}],"concepts":[{"id":"https://openalex.org/C207114421","wikidata":"https://www.wikidata.org/wiki/Q133900","display_name":"Diffraction","level":2,"score":0.7641000151634216},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.6675999760627747},{"id":"https://openalex.org/C77557913","wikidata":"https://www.wikidata.org/wiki/Q864822","display_name":"Electron diffraction","level":3,"score":0.6065000295639038},{"id":"https://openalex.org/C146088050","wikidata":"https://www.wikidata.org/wiki/Q744818","display_name":"Transmission electron microscopy","level":2,"score":0.6061000227928162},{"id":"https://openalex.org/C159122135","wikidata":"https://www.wikidata.org/wiki/Q737571","display_name":"Dislocation","level":2,"score":0.5390999913215637},{"id":"https://openalex.org/C138268822","wikidata":"https://www.wikidata.org/wiki/Q1051925","display_name":"Resolution (logic)","level":2,"score":0.5095999836921692},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5015000104904175},{"id":"https://openalex.org/C2776502983","wikidata":"https://www.wikidata.org/wiki/Q690182","display_name":"Contrast (vision)","level":2,"score":0.42100000381469727},{"id":"https://openalex.org/C27461994","wikidata":"https://www.wikidata.org/wiki/Q7447708","display_name":"Selected area diffraction","level":3,"score":0.4108000099658966},{"id":"https://openalex.org/C27805521","wikidata":"https://www.wikidata.org/wiki/Q1326017","display_name":"Electron backscatter diffraction","level":3,"score":0.4075999855995178},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.390500009059906},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.38260000944137573},{"id":"https://openalex.org/C93877712","wikidata":"https://www.wikidata.org/wiki/Q132560","display_name":"Electron microscope","level":2,"score":0.35280001163482666},{"id":"https://openalex.org/C3018302497","wikidata":"https://www.wikidata.org/wiki/Q690182","display_name":"Image contrast","level":2,"score":0.3409000039100647},{"id":"https://openalex.org/C50515024","wikidata":"https://www.wikidata.org/wiki/Q826582","display_name":"X-ray crystallography","level":3,"score":0.3337000012397766},{"id":"https://openalex.org/C8010536","wikidata":"https://www.wikidata.org/wiki/Q160398","display_name":"Crystallography","level":1,"score":0.32600000500679016},{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.3222000002861023},{"id":"https://openalex.org/C53120450","wikidata":"https://www.wikidata.org/wiki/Q899540","display_name":"Dark field microscopy","level":3,"score":0.30640000104904175},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.28610000014305115},{"id":"https://openalex.org/C3020199158","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"High resolution","level":2,"score":0.28450000286102295},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.27869999408721924},{"id":"https://openalex.org/C161368742","wikidata":"https://www.wikidata.org/wiki/Q874906","display_name":"High-resolution transmission electron microscopy","level":3,"score":0.2621000111103058},{"id":"https://openalex.org/C58640550","wikidata":"https://www.wikidata.org/wiki/Q7180908","display_name":"Phase-contrast imaging","level":3,"score":0.26010000705718994},{"id":"https://openalex.org/C151193507","wikidata":"https://www.wikidata.org/wiki/Q898815","display_name":"Phase contrast microscopy","level":2,"score":0.25369998812675476},{"id":"https://openalex.org/C144783951","wikidata":"https://www.wikidata.org/wiki/Q907728","display_name":"Energy filtered transmission electron microscopy","level":4,"score":0.2502000033855438}],"mesh":[],"locations_count":2,"locations":[{"id":"pmh:oai:arXiv.org:2609.28096","doi":null,"is_oa":true,"landing_page_url":"https://arxiv.org/abs/2609.28096","pdf_url":"https://arxiv.org/pdf/2609.28096","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"doi:10.48550/arxiv.2609.28096","doi":"https://doi.org/10.48550/arxiv.2609.28096","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2609.28096","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Preprint"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2609.28096","doi":null,"is_oa":true,"landing_page_url":"https://arxiv.org/abs/2609.28096","pdf_url":"https://arxiv.org/pdf/2609.28096","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G1017065088","display_name":null,"funder_award_id":"#89233218CNA000001","funder_id":"https://openalex.org/F4320306084","funder_display_name":"U.S. Department of Energy"},{"id":"https://openalex.org/G1279347439","display_name":null,"funder_award_id":"89233218CNA 000001","funder_id":"https://openalex.org/F4320338304","funder_display_name":"Los Alamos National Laboratory"},{"id":"https://openalex.org/G1527848044","display_name":null,"funder_award_id":"89233218CNA000001","funder_id":"https://openalex.org/F4320332359","funder_display_name":"Office of Science"},{"id":"https://openalex.org/G3137353516","display_name":null,"funder_award_id":"#89233218CNA000001","funder_id":"https://openalex.org/F4320337480","funder_display_name":"Basic Energy Sciences"},{"id":"https://openalex.org/G6410514744","display_name":null,"funder_award_id":"89233218C-NA000001","funder_id":"https://openalex.org/F4320332369","funder_display_name":"National Nuclear Security Administration"},{"id":"https://openalex.org/G6563880843","display_name":null,"funder_award_id":"No.  89233218CNA000001","funder_id":"https://openalex.org/F4320332369","funder_display_name":"National Nuclear Security Administration"}],"funders":[{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320332359","display_name":"Office of Science","ror":"https://ror.org/00mmn6b08"},{"id":"https://openalex.org/F4320332369","display_name":"National Nuclear Security Administration","ror":"https://ror.org/03sk1we31"},{"id":"https://openalex.org/F4320337480","display_name":"Basic Energy Sciences","ror":"https://ror.org/05mg91w61"},{"id":"https://openalex.org/F4320338304","display_name":"Los Alamos National Laboratory","ror":"https://ror.org/01e41cf67"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W7214180940.pdf","grobid_xml":"https://content.openalex.org/works/W7214180940.grobid-xml"},"referenced_works_count":1,"referenced_works":["https://openalex.org/W3082038201"],"related_works":["https://openalex.org/W2158825520","https://openalex.org/W1986970759","https://openalex.org/W2008584342","https://openalex.org/W4254161184","https://openalex.org/W4230332983","https://openalex.org/W2047904683","https://openalex.org/W156511717","https://openalex.org/W3036417992","https://openalex.org/W3036734080","https://openalex.org/W2529549768"],"abstract_inverted_index":{"Atomic-resolution":[0],"micrographs":[1],"remain":[2],"limited":[3],"in":[4,23,55,61,88],"application":[5],"due":[6],"to":[7,66],"small":[8],"field":[9],"of":[10,15,71,80],"view":[11],"and":[12,57,84],"low":[13],"numbers":[14],"recorded":[16],"defects.":[17],"Defect":[18],"imaging":[19],"with":[20,34,51],"reliable":[21],"statistics":[22],"transmission":[24],"electron":[25],"microscopy":[26],"(TEM)":[27],"relies":[28],"heavily":[29],"on":[30],"diffraction":[31,42,62],"contrast.":[32],"However,":[33],"200-300":[35],"kV":[36],"electrons,":[37],"low-curvature":[38],"Ewald":[39],"sphere":[40],"limits":[41],"resolution":[43,60],"at":[44],"~5":[45],"nm.":[46,68],"Here,":[47],"we":[48],"imaged":[49],"defects":[50],"a":[52,81],"forbidden":[53],"condition":[54,107],"TEM":[56],"improved":[58],"the":[59,78,104],"contrast":[63],"from":[64],"5":[65],"0.5":[67],"The":[69],"superiority":[70],"our":[72],"equal-s":[73,100],"method":[74],"is":[75],"demonstrated":[76],"by":[77],"discovery":[79],"novel":[82],"phase":[83],"dislocation":[85],"loop":[86],"structure":[87],"steels,":[89],"which":[90],"have":[91],"not":[92],"been":[93],"previously":[94],"reported":[95],"experimentally":[96],"or":[97],"theoretically.":[98],"Our":[99],"can":[101],"largely":[102],"replace":[103],"classical":[105],"two-beam":[106],"for":[108],"defect":[109],"study.":[110]},"counts_by_year":[],"updated_date":"2026-11-07T11:25:07.637180","created_date":"2026-09-25T00:00:00"}