{"id":"https://openalex.org/W7213670679","doi":"https://doi.org/10.1117/12.3120905","title":"Research on a full-chain cascaded EBAPS MTF model","display_name":"Research on a full-chain cascaded EBAPS MTF model","publication_year":2026,"publication_date":"2026-09-19","ids":{"openalex":"https://openalex.org/W7213670679","doi":"https://doi.org/10.1117/12.3120905"},"language":"en","primary_location":{"id":"doi:10.1117/12.3120905","doi":"https://doi.org/10.1117/12.3120905","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.3120905","pdf_url":null,"source":{"id":"https://openalex.org/S7407089344","display_name":"Global Intelligent Industry Conference (GIIC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ninth Global Intelligent Industry Conference (GIIC 2026)","raw_type":"proceedings-article"},"parent_works":[],"lineage":["https://openalex.org/W7213670679"],"child_works_count":0,"type":"conference-abstract","is_traditional":false,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5152234074","display_name":"Haocheng Ma","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405269719","display_name":"Kunming Institute of Physics","ror":"https://ror.org/0510x7s97","country_code":"CN","type":"education","lineage":["https://openalex.org/I4405269719"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Haocheng Ma","raw_affiliation_strings":["Kunming Institute of Physics (China)","North Night Vision Technology Co., Ltd. (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kunming Institute of Physics (China)","institution_ids":["https://openalex.org/I4405269719"]},{"raw_affiliation_string":"North Night Vision Technology Co., Ltd. (China)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064717501","display_name":"Changbao Deng","orcid":"https://orcid.org/0000-0001-8734-185X","observed_orcids":["https://orcid.org/0000-0001-8734-185X"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Changbao Deng","raw_affiliation_strings":["North Night Vision Technology Co., Ltd. (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"North Night Vision Technology Co., Ltd. (China)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5152233286","display_name":"Yaobin Li","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yaobin Li","raw_affiliation_strings":["North Night Vision Technology Co., Ltd. (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"North Night Vision Technology Co., Ltd. (China)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5152171503","display_name":"Jun He","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Jun He","raw_affiliation_strings":["North Night Vision Technology Co., Ltd. (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"North Night Vision Technology Co., Ltd. (China)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5152229021","display_name":"Liyun Zhang","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Liyun Zhang","raw_affiliation_strings":["North Night Vision Technology Co., Ltd. (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"North Night Vision Technology Co., Ltd. (China)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5152256564","display_name":"Dongze Li","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dongze Li","raw_affiliation_strings":["North Night Vision Technology Co., Ltd. (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"North Night Vision Technology Co., Ltd. (China)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5067235786","display_name":"Rujing Ai","orcid":"https://orcid.org/0000-0002-4733-6367","observed_orcids":["https://orcid.org/0000-0002-4733-6367"]},"institutions":[{"id":"https://openalex.org/I4405269719","display_name":"Kunming Institute of Physics","ror":"https://ror.org/0510x7s97","country_code":"CN","type":"education","lineage":["https://openalex.org/I4405269719"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Rujing Ai","raw_affiliation_strings":["Kunming Institute of Physics (China)","North Night Vision Technology Co., Ltd. (China)"],"raw_orcid":"https://orcid.org/0000-0002-4733-6367","affiliations":[{"raw_affiliation_string":"Kunming Institute of Physics (China)","institution_ids":["https://openalex.org/I4405269719"]},{"raw_affiliation_string":"North Night Vision Technology Co., Ltd. (China)","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5002240572","display_name":"Wanpeng Ding","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4405269719","display_name":"Kunming Institute of Physics","ror":"https://ror.org/0510x7s97","country_code":"CN","type":"education","lineage":["https://openalex.org/I4405269719"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wanpeng Ding","raw_affiliation_strings":["Kunming Institute of Physics (China)","North Night Vision Technology Co., Ltd. (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Kunming Institute of Physics (China)","institution_ids":["https://openalex.org/I4405269719"]},{"raw_affiliation_string":"North Night Vision Technology Co., Ltd. (China)","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5152167915","display_name":"Yanyun Zhang","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Yanyun Zhang","raw_affiliation_strings":["North Night Vision Technology Co., Ltd. (China)"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"North Night Vision Technology Co., Ltd. (China)","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"146","last_page":"146"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.9916999936103821,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13418","display_name":"Photocathodes and Microchannel Plates","score":0.0052999998442828655,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11637","display_name":"Advanced Semiconductor Detectors and Materials","score":0.001500000013038516,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/modulation-transfer-function","display_name":"modulation transfer function","score":0.9869999885559082},{"id":"https://openalex.org/keywords/low-light-imaging","display_name":"low-light imaging","score":0.8519999980926514},{"id":"https://openalex.org/keywords/electron-diffusion","display_name":"electron diffusion","score":0.8080000281333923},{"id":"https://openalex.org/keywords/charge-transport","display_name":"charge transport","score":0.6779999732971191},{"id":"https://openalex.org/keywords/surface-films","display_name":"surface films","score":0.6110000014305115},{"id":"https://openalex.org/keywords/continuity-equation","display_name":"continuity equation","score":0.656000018119812},{"id":"https://openalex.org/keywords/surface-recombination-rate","display_name":"surface recombination rate","score":0.8859999775886536},{"id":"https://openalex.org/keywords/image-quality","display_name":"image quality","score":0.421999990940094}],"concepts":[{"id":"https://openalex.org/C147120987","wikidata":"https://www.wikidata.org/wiki/Q2225","display_name":"Electron","level":2,"score":0.6252999901771545},{"id":"https://openalex.org/C69357855","wikidata":"https://www.wikidata.org/wiki/Q163214","display_name":"Diffusion","level":2,"score":0.597100019454956},{"id":"https://openalex.org/C175231954","wikidata":"https://www.wikidata.org/wiki/Q1942321","display_name":"Optical transfer function","level":2,"score":0.5781000256538391},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.5436999797821045},{"id":"https://openalex.org/C13115443","wikidata":"https://www.wikidata.org/wiki/Q1891923","display_name":"Photocathode","level":3,"score":0.5236999988555908},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.5175999999046326},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.4717999994754791},{"id":"https://openalex.org/C146285849","wikidata":"https://www.wikidata.org/wiki/Q1327107","display_name":"Electron scattering","level":3,"score":0.43810001015663147},{"id":"https://openalex.org/C205372480","wikidata":"https://www.wikidata.org/wiki/Q210521","display_name":"Image resolution","level":2,"score":0.4343000054359436},{"id":"https://openalex.org/C2777289219","wikidata":"https://www.wikidata.org/wiki/Q7632154","display_name":"Substrate (aquarium)","level":2,"score":0.39809998869895935},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3686000108718872},{"id":"https://openalex.org/C117896860","wikidata":"https://www.wikidata.org/wiki/Q11376","display_name":"Acceleration","level":2,"score":0.3582000136375427},{"id":"https://openalex.org/C2777953097","wikidata":"https://www.wikidata.org/wiki/Q7252868","display_name":"Proximity effect (electron beam lithography)","level":5,"score":0.3531999886035919},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35260000824928284},{"id":"https://openalex.org/C106782819","wikidata":"https://www.wikidata.org/wiki/Q6501076","display_name":"Electron mobility","level":2,"score":0.3513000011444092},{"id":"https://openalex.org/C30475298","wikidata":"https://www.wikidata.org/wiki/Q909554","display_name":"Computational physics","level":1,"score":0.3488999903202057},{"id":"https://openalex.org/C104232198","wikidata":"https://www.wikidata.org/wiki/Q865807","display_name":"Charge carrier","level":2,"score":0.33959999680519104},{"id":"https://openalex.org/C123079801","wikidata":"https://www.wikidata.org/wiki/Q750240","display_name":"Modulation (music)","level":2,"score":0.3246999979019165},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.3172000050544739},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.3037000000476837},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.30160000920295715},{"id":"https://openalex.org/C34667332","wikidata":"https://www.wikidata.org/wiki/Q2582911","display_name":"Secondary electrons","level":3,"score":0.28450000286102295},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.2806999981403351},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.2745000123977661},{"id":"https://openalex.org/C98446981","wikidata":"https://www.wikidata.org/wiki/Q288224","display_name":"Depletion region","level":3,"score":0.26260000467300415},{"id":"https://openalex.org/C24840226","wikidata":"https://www.wikidata.org/wiki/Q211016","display_name":"Electron transport chain","level":2,"score":0.25369998812675476},{"id":"https://openalex.org/C79635011","wikidata":"https://www.wikidata.org/wiki/Q175805","display_name":"Semiconductor device","level":3,"score":0.25119999051094055}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1117/12.3120905","doi":"https://doi.org/10.1117/12.3120905","is_oa":false,"landing_page_url":"https://doi.org/10.1117/12.3120905","pdf_url":null,"source":{"id":"https://openalex.org/S7407089344","display_name":"Global Intelligent Industry Conference (GIIC)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310315543","host_organization_name":"SPIE","host_organization_lineage":["https://openalex.org/P4310315543"],"host_organization_lineage_names":["SPIE"],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Ninth Global Intelligent Industry Conference (GIIC 2026)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W4405359422","https://openalex.org/W4403372522","https://openalex.org/W2250376812","https://openalex.org/W2067109464","https://openalex.org/W2122484669","https://openalex.org/W4386118645","https://openalex.org/W2120955010","https://openalex.org/W2077197455","https://openalex.org/W2014596326","https://openalex.org/W2152929829"],"abstract_inverted_index":{"The":[0,24,39],"modulation":[1],"transfer":[2],"function":[3],"(MTF)":[4],"characterizes":[5],"the":[6,43,48,55,66,83,87,106,115,119,126,133,157,181,184,197,203,209,213,218,228],"spatial":[7],"frequency":[8],"response":[9],"of":[10,34,58,78,86,95,122,166,183,208,232],"optoelectronic":[11],"imaging":[12,22,37],"devices":[13],"and":[14,51,92,110,164,178,206,223],"serves":[15],"as":[16,160,162],"a":[17,31,71,140,174],"core":[18],"indicator":[19],"for":[20,75,82,145],"evaluating":[21],"quality.":[23],"electron-bombarded":[25],"active":[26],"pixel":[27],"sensor":[28],"(EBAPS)":[29],"is":[30,77,187],"new":[32],"type":[33],"digital":[35],"low-light-level":[36],"device.":[38],"electron":[40,45,102,152,154],"emission":[41],"from":[42],"photocathode,":[44],"diffusion":[46,120,165,230],"in":[47,105,156],"proximity":[49,88,108,158],"region,":[50,159],"charge":[52,214],"transport":[53,103],"within":[54],"surface":[56,90,224],"films":[57,91],"CMOS":[59,96],"chips":[60],"all":[61],"exert":[62],"remarkable":[63],"effects":[64],"on":[65,132,196],"device\u2019s":[67],"MTF.":[68,146],"Therefore,":[69],"establishing":[70],"physical":[72,116,148],"MTF":[73,127,199],"model":[74,144,186,200],"EBAPS":[76],"important":[79],"guiding":[80],"significance":[81],"optimal":[84],"design":[85],"structure,":[89],"overall":[93],"structure":[94],"chips.":[97],"Existing":[98],"studies":[99],"have":[100],"investigated":[101],"characteristics":[104],"vacuum":[107],"region":[109],"solid-state":[111],"substrate":[112,210],"separately.":[113],"However,":[114],"mechanism":[117],"whereby":[118],"dynamics":[121],"multiplied":[123,167],"electrons":[124,168],"affect":[125],"remains":[128],"poorly":[129],"understood.":[130],"Based":[131],"steady-state":[134],"continuity":[135],"equation,":[136],"this":[137],"paper":[138],"constructs":[139],"full-link":[141],"cascaded":[142],"theoretical":[143],"All":[147],"processes,":[149],"including":[150],"photocathode":[151],"emission,":[153],"acceleration":[155],"well":[161],"scattering":[163],"inside":[169],"pixels,":[170],"are":[171],"integrated":[172],"into":[173],"unified":[175],"analytical":[176],"framework":[177],"solved.":[179],"Meanwhile,":[180],"validity":[182],"proposed":[185],"verified":[188],"via":[189],"resolution":[190],"measurement":[191],"results.":[192],"Simulation":[193],"results":[194],"based":[195],"established":[198],"indicate":[201],"that":[202],"doping":[204],"concentration":[205],"thickness":[207],"primarily":[211],"determine":[212],"collection":[215],"boundary,":[216],"while":[217],"initial":[219],"lateral":[220,229],"spread":[221],"coefficient":[222],"recombination":[225],"rate":[226],"dominate":[227],"range":[231],"electrons.":[233]},"counts_by_year":[],"updated_date":"2026-11-14T11:04:58.165337","created_date":"2026-09-20T00:00:00"}