{"id":"https://openalex.org/W7207834872","doi":"https://doi.org/10.1109/icd64907.2026.11665320","title":"Fem Analysis of TEV Sensor Design for Partial Discharge Detection in Power Transformers","display_name":"Fem Analysis of TEV Sensor Design for Partial Discharge Detection in Power Transformers","publication_year":2026,"publication_date":"2026-06-01","ids":{"openalex":"https://openalex.org/W7207834872","doi":"https://doi.org/10.1109/icd64907.2026.11665320"},"language":"en","primary_location":{"id":"doi:10.1109/icd64907.2026.11665320","doi":"https://doi.org/10.1109/icd64907.2026.11665320","is_oa":true,"landing_page_url":"https://doi.org/10.1109/icd64907.2026.11665320","pdf_url":null,"source":{"id":"https://openalex.org/S4363607955","display_name":"IEEE International Conference on Dielectrics (ICD)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 6th International Conference on Dielectrics (ICD)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/icd64907.2026.11665320","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5119394198","display_name":"Mahdi Abbasi","orcid":"https://orcid.org/0009-0001-9805-997X","observed_orcids":["https://orcid.org/0009-0001-9805-997X"]},"institutions":[{"id":"https://openalex.org/I9736820","display_name":"\u00c9cole de Technologie Sup\u00e9rieure","ror":"https://ror.org/0020snb74","country_code":"CA","type":"education","lineage":["https://openalex.org/I49663120","https://openalex.org/I9736820"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Mahdi Abbasi","raw_affiliation_strings":["\u00c9cole de technologie sup\u00e9rieure"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"\u00c9cole de technologie sup\u00e9rieure","institution_ids":["https://openalex.org/I9736820"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006012508","display_name":"Mathieu Lachance","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Mathieu Lachance","raw_affiliation_strings":["OMICRON electronics Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"OMICRON electronics Canada","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5002908609","display_name":"\u00c9ric David","orcid":"https://orcid.org/0000-0002-0886-2890","observed_orcids":["https://orcid.org/0000-0002-0886-2890"]},"institutions":[{"id":"https://openalex.org/I9736820","display_name":"\u00c9cole de Technologie Sup\u00e9rieure","ror":"https://ror.org/0020snb74","country_code":"CA","type":"education","lineage":["https://openalex.org/I49663120","https://openalex.org/I9736820"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Eric David","raw_affiliation_strings":["\u00c9cole de technologie sup\u00e9rieure"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"\u00c9cole de technologie sup\u00e9rieure","institution_ids":["https://openalex.org/I9736820"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.64928569,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.7476000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.7476000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.21400000154972076,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.010099999606609344,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient-earth-voltage","display_name":"transient earth voltage","score":0.8289999961853027},{"id":"https://openalex.org/keywords/partial-discharge-detection","display_name":"partial discharge detection","score":0.9959999918937683},{"id":"https://openalex.org/keywords/power-transformers","display_name":"power transformers","score":0.996999979019165},{"id":"https://openalex.org/keywords/insulation-condition-assessment","display_name":"insulation condition assessment","score":0.7480000257492065},{"id":"https://openalex.org/keywords/sensor-sensitivity","display_name":"sensor sensitivity","score":0.8289999961853027},{"id":"https://openalex.org/keywords/dielectric-thickness","display_name":"dielectric thickness","score":0.7789999842643738},{"id":"https://openalex.org/keywords/insulation-degradation","display_name":"insulation degradation","score":0.49399998784065247}],"concepts":[{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.531000018119812},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.4578000009059906},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.3700999915599823},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3628000020980835},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3573000133037567},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3303999900817871},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3255000114440918},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.289000004529953},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2678999900817871},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.2678000032901764},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2639000117778778},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2524000108242035}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/icd64907.2026.11665320","doi":"https://doi.org/10.1109/icd64907.2026.11665320","is_oa":true,"landing_page_url":"https://doi.org/10.1109/icd64907.2026.11665320","pdf_url":null,"source":{"id":"https://openalex.org/S4363607955","display_name":"IEEE International Conference on Dielectrics (ICD)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 6th International Conference on Dielectrics (ICD)","raw_type":"proceedings-article"},{"id":"pmh:oai:espace2.etsmtl.ca:34731","doi":null,"is_oa":false,"landing_page_url":"https://espace2.etsmtl.ca/id/eprint/34731/","pdf_url":null,"source":{"id":"https://openalex.org/S4306402392","display_name":"Espace \u00c9TS (ETS)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I9736820","host_organization_name":"\u00c9cole de Technologie Sup\u00e9rieure","host_organization_lineage":["https://openalex.org/I9736820"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Compte rendu de conf\u00e9rence"}],"best_oa_location":{"id":"doi:10.1109/icd64907.2026.11665320","doi":"https://doi.org/10.1109/icd64907.2026.11665320","is_oa":true,"landing_page_url":"https://doi.org/10.1109/icd64907.2026.11665320","pdf_url":null,"source":{"id":"https://openalex.org/S4363607955","display_name":"IEEE International Conference on Dielectrics (ICD)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 6th International Conference on Dielectrics (ICD)","raw_type":"proceedings-article"},"sustainable_development_goals":[{"score":0.5378999710083008,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2060703843","https://openalex.org/W2140785014","https://openalex.org/W2234076383","https://openalex.org/W2789572732","https://openalex.org/W2965761875","https://openalex.org/W3005117577","https://openalex.org/W4311688822","https://openalex.org/W4387868614","https://openalex.org/W4404954234","https://openalex.org/W4413442669","https://openalex.org/W4414385554","https://openalex.org/W4416183580"],"related_works":["https://openalex.org/W7207536860","https://openalex.org/W7144493183","https://openalex.org/W4226437475","https://openalex.org/W7033282364","https://openalex.org/W7018271475","https://openalex.org/W1516751482","https://openalex.org/W7202350687","https://openalex.org/W2753787929","https://openalex.org/W2507085933","https://openalex.org/W2066184532"],"abstract_inverted_index":{"Partial":[0],"discharge":[1],"(PD)":[2],"measurement":[3],"is":[4,16,32],"essential":[5],"for":[6],"assessing":[7],"the":[8,50,53,56,84,89,97,102,114,118,134],"insulation":[9,24,108],"condition":[10],"of":[11,23,43,52,55,88,101,129,137],"power":[12],"transformers,":[13],"as":[14,94,96],"PD":[15],"both":[17],"a":[18,21,33,72],"symptom":[19],"and":[20,71,86,91,110],"cause":[22],"degradation.":[25],"The":[26,104,127],"transient":[27],"earth":[28],"voltage":[29,121],"(TEV)":[30],"sensor":[31,58],"non-intrusive":[34],"technique":[35],"that":[36,107],"can":[37],"be":[38],"used":[39],"during":[40],"online":[41],"operation":[42],"transformers.":[44],"This":[45],"paper":[46],"aims":[47],"to":[48],"study":[49],"impact":[51],"structure":[54],"TEV":[57,73,120],"on":[59,117],"its":[60,68],"sensitivity.":[61],"A$120":[62],"\\mathrm{V}":[63],"/":[64],"25":[65],"\\text{kV}$transformer,":[66],"including":[67,83],"active":[69],"part":[70],"sensor,":[74],"was":[75,140],"modeled":[76],"in":[77,133],"COMSOL.":[78],"Five":[79],"parameters":[80],"were":[81],"investigated,":[82],"thickness":[85,109,139],"material":[87],"dielectric":[90],"electrode":[92,138],"layers,":[93],"well":[95],"effective":[98],"sensing":[99,111],"area":[100,112],"sensor.":[103],"results":[105],"reveal":[106],"have":[113],"greatest":[115],"influence":[116,136],"detected":[119],"amplitude":[122],"compared":[123],"with":[124],"other":[125],"parameters.":[126],"role":[128],"electromagnetic":[130],"skin":[131],"depth":[132],"limited":[135],"also":[141],"discussed.":[142]},"counts_by_year":[],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2026-09-04T00:00:00"}