{"id":"https://openalex.org/W7204817713","doi":"https://doi.org/10.48550/arxiv.2608.27858","title":"Extending the operating window of scanning electron microscopy through an integrated electron-optical architecture for high-temperature and near-ambient-pressure environments","display_name":"Extending the operating window of scanning electron microscopy through an integrated electron-optical architecture for high-temperature and near-ambient-pressure environments","publication_year":2026,"publication_date":"2026-08-28","ids":{"openalex":"https://openalex.org/W7204817713","doi":"https://doi.org/10.48550/arxiv.2608.27858"},"language":"en","primary_location":{"id":"pmh:oai:arXiv.org:2608.27858","doi":null,"is_oa":true,"landing_page_url":"https://arxiv.org/abs/2608.27858","pdf_url":"https://arxiv.org/pdf/2608.27858","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"volume":null,"type":"preprint","indexed_in":["arxiv","datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://arxiv.org/pdf/2608.27858","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5121776242","display_name":"Yue Chai","orcid":"https://orcid.org/0000-0002-3659-0845","observed_orcids":["https://orcid.org/0000-0002-3659-0845"]},"institutions":[{"id":"https://openalex.org/I30809798","display_name":"ShanghaiTech University","ror":"https://ror.org/030bhh786","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chai, Yue","raw_affiliation_strings":[". School of Physical Science and Technology , ShanghaiTech University , Shanghai 201210 , China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":". School of Physical Science and Technology , ShanghaiTech University , Shanghai 201210 , China","institution_ids":["https://openalex.org/I30809798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5148805872","display_name":"Honglong Zhao","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I30809798","display_name":"ShanghaiTech University","ror":"https://ror.org/030bhh786","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhao, Honglong","raw_affiliation_strings":[". School of Physical Science and Technology , ShanghaiTech University , Shanghai 201210 , China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":". School of Physical Science and Technology , ShanghaiTech University , Shanghai 201210 , China","institution_ids":["https://openalex.org/I30809798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5153490312","display_name":"Xinning Tian","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I30809798","display_name":"ShanghaiTech University","ror":"https://ror.org/030bhh786","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tian, Xinning","raw_affiliation_strings":[". School of Physical Science and Technology , ShanghaiTech University , Shanghai 201210 , China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":". School of Physical Science and Technology , ShanghaiTech University , Shanghai 201210 , China","institution_ids":["https://openalex.org/I30809798"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5124286669","display_name":"Chao Ang","orcid":"https://orcid.org/0009-0003-8127-6745","observed_orcids":["https://orcid.org/0009-0003-8127-6745"]},"institutions":[{"id":"https://openalex.org/I30809798","display_name":"ShanghaiTech University","ror":"https://ror.org/030bhh786","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Ang, Chao","raw_affiliation_strings":[". School of Physical Science and Technology , ShanghaiTech University , Shanghai 201210 , China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":". School of Physical Science and Technology , ShanghaiTech University , Shanghai 201210 , China","institution_ids":["https://openalex.org/I30809798"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100717505","display_name":"Zhu\u2010Jun Wang","orcid":"https://orcid.org/0000-0002-8227-7323","observed_orcids":["https://orcid.org/0000-0002-8227-7323"]},"institutions":[{"id":"https://openalex.org/I30809798","display_name":"ShanghaiTech University","ror":"https://ror.org/030bhh786","country_code":"CN","type":"education","lineage":["https://openalex.org/I30809798"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wang, Zhu-Jun","raw_affiliation_strings":[". School of Physical Science and Technology , ShanghaiTech University , Shanghai 201210 , China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":". School of Physical Science and Technology , ShanghaiTech University , Shanghai 201210 , China","institution_ids":["https://openalex.org/I30809798"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I30809798"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.8359000086784363,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12039","display_name":"Electron and X-Ray Spectroscopy Techniques","score":0.8359000086784363,"subfield":{"id":"https://openalex.org/subfields/2508","display_name":"Surfaces, Coatings and Films"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10857","display_name":"Advanced Electron Microscopy Techniques and Applications","score":0.16279999911785126,"subfield":{"id":"https://openalex.org/subfields/1315","display_name":"Structural Biology"},"field":{"id":"https://openalex.org/fields/13","display_name":"Biochemistry, Genetics and Molecular Biology"},"domain":{"id":"https://openalex.org/domains/1","display_name":"Life Sciences"}},{"id":"https://openalex.org/T13552","display_name":"Advanced Materials Characterization Techniques","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/environmental-scanning-electron-microscopy","display_name":"environmental scanning electron microscopy","score":0.9900000095367432},{"id":"https://openalex.org/keywords/high-temperature-electron-microscopy","display_name":"high-temperature electron microscopy","score":0.7059999704360962},{"id":"https://openalex.org/keywords/electron-beam-transmission","display_name":"electron beam transmission","score":0.8600000143051147},{"id":"https://openalex.org/keywords/detector-optimization","display_name":"detector optimization","score":0.753000020980835},{"id":"https://openalex.org/keywords/gas-phase-chemistry","display_name":"gas-phase chemistry","score":0.675000011920929}],"concepts":[{"id":"https://openalex.org/C55171895","wikidata":"https://www.wikidata.org/wiki/Q268401","display_name":"Environmental scanning electron microscope","level":3,"score":0.7214000225067139},{"id":"https://openalex.org/C94915269","wikidata":"https://www.wikidata.org/wiki/Q1834857","display_name":"Detector","level":2,"score":0.6255000233650208},{"id":"https://openalex.org/C26771246","wikidata":"https://www.wikidata.org/wiki/Q321095","display_name":"Scanning electron microscope","level":2,"score":0.5964000225067139},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5008999705314636},{"id":"https://openalex.org/C193016168","wikidata":"https://www.wikidata.org/wiki/Q874835","display_name":"Scanning transmission electron microscopy","level":3,"score":0.4918999969959259},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.46959999203681946},{"id":"https://openalex.org/C120665830","wikidata":"https://www.wikidata.org/wiki/Q14620","display_name":"Optics","level":1,"score":0.46299999952316284},{"id":"https://openalex.org/C191486275","wikidata":"https://www.wikidata.org/wiki/Q210028","display_name":"Scattering","level":2,"score":0.43560001254081726},{"id":"https://openalex.org/C146088050","wikidata":"https://www.wikidata.org/wiki/Q744818","display_name":"Transmission electron microscopy","level":2,"score":0.421999990940094},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.4092999994754791},{"id":"https://openalex.org/C2993546912","wikidata":"https://www.wikidata.org/wiki/Q591022","display_name":"Direct imaging","level":2,"score":0.4034999907016754},{"id":"https://openalex.org/C2778751112","wikidata":"https://www.wikidata.org/wiki/Q835016","display_name":"Window (computing)","level":2,"score":0.3986999988555908},{"id":"https://openalex.org/C187921700","wikidata":"https://www.wikidata.org/wiki/Q7430074","display_name":"Scanning confocal electron microscopy","level":3,"score":0.3653999865055084},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.36489999294281006},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.3504999876022339},{"id":"https://openalex.org/C140779682","wikidata":"https://www.wikidata.org/wiki/Q210868","display_name":"Sampling (signal processing)","level":3,"score":0.34709998965263367},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.3409000039100647},{"id":"https://openalex.org/C147080431","wikidata":"https://www.wikidata.org/wiki/Q1074953","display_name":"Microscopy","level":2,"score":0.3393000066280365},{"id":"https://openalex.org/C36628996","wikidata":"https://www.wikidata.org/wiki/Q907287","display_name":"Scanning probe microscopy","level":2,"score":0.3111000061035156},{"id":"https://openalex.org/C118530786","wikidata":"https://www.wikidata.org/wiki/Q1134732","display_name":"Instrumentation (computer programming)","level":2,"score":0.2881999909877777},{"id":"https://openalex.org/C53120450","wikidata":"https://www.wikidata.org/wiki/Q899540","display_name":"Dark field microscopy","level":3,"score":0.2879999876022339},{"id":"https://openalex.org/C144783951","wikidata":"https://www.wikidata.org/wiki/Q907728","display_name":"Energy filtered transmission electron microscopy","level":4,"score":0.2736999988555908},{"id":"https://openalex.org/C16777580","wikidata":"https://www.wikidata.org/wiki/Q7430068","display_name":"Scanning ion-conductance microscopy","level":4,"score":0.25209999084472656},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.25029999017715454}],"mesh":[],"locations_count":2,"locations":[{"id":"pmh:oai:arXiv.org:2608.27858","doi":null,"is_oa":true,"landing_page_url":"https://arxiv.org/abs/2608.27858","pdf_url":"https://arxiv.org/pdf/2608.27858","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},{"id":"doi:10.48550/arxiv.2608.27858","doi":"https://doi.org/10.48550/arxiv.2608.27858","is_oa":true,"landing_page_url":"https://doi.org/10.48550/arxiv.2608.27858","pdf_url":null,"source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Preprint"}],"best_oa_location":{"id":"pmh:oai:arXiv.org:2608.27858","doi":null,"is_oa":true,"landing_page_url":"https://arxiv.org/abs/2608.27858","pdf_url":"https://arxiv.org/pdf/2608.27858","source":{"id":"https://openalex.org/S4306400194","display_name":"arXiv (Cornell University)","issn_l":"2331-8422","issn":["2331-8422"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I205783295","host_organization_name":"Cornell University","host_organization_lineage":["https://openalex.org/I205783295"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"text"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W7204817713.pdf","grobid_xml":"https://content.openalex.org/works/W7204817713.grobid-xml"},"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2308591645","https://openalex.org/W2910217268","https://openalex.org/W2020214085","https://openalex.org/W2769109340","https://openalex.org/W3154477875","https://openalex.org/W2107424270","https://openalex.org/W3036254029","https://openalex.org/W6925342521","https://openalex.org/W2915708450","https://openalex.org/W2205160630"],"abstract_inverted_index":{"Scanning":[0],"electron":[1,36],"microscopy":[2,37],"(SEM)":[3],"under":[4,100],"simultaneously":[5],"high-temperature,":[6],"near-ambient-pressure":[7],"(NAP),":[8],"and":[9,22,59,71,87,94,103,118,132,162],"reactive-gas":[10],"environments":[11,154],"requires":[12],"coordinated":[13],"control":[14],"of":[15,33,128],"vacuum":[16],"isolation,":[17],"electron-beam":[18,72],"transmission,":[19],"signal":[20],"generation,":[21],"thermal":[23,57],"management,":[24,58],"constraints":[25],"that":[26,46],"have":[27],"long":[28],"limited":[29],"the":[30],"operating":[31],"window":[32],"environmental":[34],"scanning":[35],"(ESEM).":[38],"Here":[39],"we":[40],"establish":[41,143],"an":[42],"integrated":[43],"electron-optical":[44,146],"architecture":[45,63],"combines":[47],"a":[48,60,65,144],"multistage":[49],"differential-pressure":[50],"pathway,":[51],"front-stage":[52],"pressure":[53,102],"transition,":[54],"detector":[55,92],"optimization,":[56],"gas-focusing":[61],"sampling":[62],"into":[64],"unified":[66],"ESEM":[67,150],"platform.":[68],"Pressure":[69],"distribution":[70],"transmission":[73],"are":[74],"quantitatively":[75],"validated":[76],"through":[77],"computational":[78],"fluid":[79],"dynamics":[80],"(CFD),":[81],"Monte":[82],"Carlo":[83],"electron-gas":[84],"scattering":[85],"analysis,":[86],"direct":[88],"beam-current":[89],"measurements,":[90],"while":[91],"optimization":[93],"thermionic-electron":[95],"suppression":[96],"preserve":[97],"stable":[98,109],"imaging":[99,111,120],"elevated":[101,156],"temperature.":[104],"The":[105],"resulting":[106],"system":[107],"enables":[108],"SEM":[110],"at":[112],"pressures":[113],"up":[114,121],"to":[115,122],"20,000":[116],"Pa":[117],"high-temperature":[119],"1,400":[123],"degrees":[124],"C,":[125],"continuous":[126],"observation":[127],"hydrated":[129],"biological":[130],"specimens,":[131],"synchronized":[133],"SEM-QMS":[134],"operando":[135,153],"characterization":[136],"using":[137],"local":[138],"gas":[139],"sampling.":[140],"These":[141],"developments":[142],"general":[145],"framework":[147],"for":[148],"extending":[149],"toward":[151],"realistic":[152],"where":[155],"temperature,":[157],"reactive":[158],"gases,":[159],"structural":[160],"evolution,":[161],"gas-phase":[163],"chemistry":[164],"can":[165],"be":[166],"investigated":[167],"simultaneously.":[168]},"counts_by_year":[],"updated_date":"2026-10-28T10:33:24.094632","created_date":"2026-09-01T00:00:00"}