{"id":"https://openalex.org/W7204476303","doi":"https://doi.org/10.1134/s1062873826701133","title":"Effect of a-Si and Ta2O5 Interlayers on the Current\u2013Voltage Nonlinearity in Capacitor\u2011Type Cu/(CO40Fe40B20)x(SiO2)100\u2013x/LiNbO3/Cr/Cu/Cr Memristors","display_name":"Effect of a-Si and Ta2O5 Interlayers on the Current\u2013Voltage Nonlinearity in Capacitor\u2011Type Cu/(CO40Fe40B20)x(SiO2)100\u2013x/LiNbO3/Cr/Cu/Cr Memristors","publication_year":2026,"publication_date":"2026-08-01","ids":{"openalex":"https://openalex.org/W7204476303","doi":"https://doi.org/10.1134/s1062873826701133"},"language":"en","primary_location":{"id":"doi:10.1134/s1062873826701133","doi":"https://doi.org/10.1134/s1062873826701133","is_oa":false,"landing_page_url":"https://doi.org/10.1134/s1062873826701133","pdf_url":null,"source":{"id":"https://openalex.org/S138373423","display_name":"Bulletin of the Russian Academy of Sciences Physics","issn_l":"1062-8738","issn":["1062-8738","1934-9432"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310320267","host_organization_name":"Pleiades Publishing","host_organization_lineage":["https://openalex.org/P4310320267","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Pleiades Publishing","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Bulletin of the Russian Academy of Sciences: Physics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005790827","display_name":"\u0410. \u0412. \u0421\u0438\u0442\u043d\u0438\u043a\u043e\u0432","orcid":"https://orcid.org/0000-0002-9438-9234","observed_orcids":["https://orcid.org/0000-0002-9438-9234","https://orcid.org/0000-0002-0639-1685"]},"institutions":[{"id":"https://openalex.org/I2800235667","display_name":"Kurchatov Institute","ror":"https://ror.org/00n1nz186","country_code":"RU","type":"facility","lineage":["https://openalex.org/I2800235667"]},{"id":"https://openalex.org/I4210106257","display_name":"Voronezh State Technical University","ror":"https://ror.org/01m20f643","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210106257"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"A. V. Sitnikov","raw_affiliation_strings":["National Research Centre \u201cKurchatov Institute\u201d, 123098, Moscow, Russia","Voronezh State Technical University, 394000, Voronezh, Russia"],"raw_orcid":"https://orcid.org/0000-0002-9438-9234","affiliations":[{"raw_affiliation_string":"National Research Centre \u201cKurchatov Institute\u201d, 123098, Moscow, Russia","institution_ids":["https://openalex.org/I2800235667"]},{"raw_affiliation_string":"Voronezh State Technical University, 394000, Voronezh, Russia","institution_ids":["https://openalex.org/I4210106257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025399235","display_name":"Yu. E. Kalinin","orcid":"https://orcid.org/0009-0003-5880-946X","observed_orcids":["https://orcid.org/0009-0003-5880-946X"]},"institutions":[{"id":"https://openalex.org/I4210106257","display_name":"Voronezh State Technical University","ror":"https://ror.org/01m20f643","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210106257"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Yu. E. Kalinin","raw_affiliation_strings":["Voronezh State Technical University, 394000, Voronezh, Russia"],"raw_orcid":"https://orcid.org/0009-0003-5880-946X","affiliations":[{"raw_affiliation_string":"Voronezh State Technical University, 394000, Voronezh, Russia","institution_ids":["https://openalex.org/I4210106257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008095298","display_name":"\u0418.\u0412. \u0411\u0430\u0431\u043a\u0438\u043d\u0430","orcid":"https://orcid.org/0000-0002-9879-7139","observed_orcids":["https://orcid.org/0000-0002-9879-7139"]},"institutions":[{"id":"https://openalex.org/I4210106257","display_name":"Voronezh State Technical University","ror":"https://ror.org/01m20f643","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210106257"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"I. V. Babkina","raw_affiliation_strings":["Voronezh State Technical University, 394000, Voronezh, Russia"],"raw_orcid":"https://orcid.org/0000-0002-9879-7139","affiliations":[{"raw_affiliation_string":"Voronezh State Technical University, 394000, Voronezh, Russia","institution_ids":["https://openalex.org/I4210106257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055935298","display_name":"Aleksandr Nikonov","orcid":"https://orcid.org/0009-0000-0852-2303","observed_orcids":["https://orcid.org/0009-0000-0852-2303"]},"institutions":[{"id":"https://openalex.org/I2800235667","display_name":"Kurchatov Institute","ror":"https://ror.org/00n1nz186","country_code":"RU","type":"facility","lineage":["https://openalex.org/I2800235667"]},{"id":"https://openalex.org/I4210106257","display_name":"Voronezh State Technical University","ror":"https://ror.org/01m20f643","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210106257"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"A. E. Nikonov","raw_affiliation_strings":["National Research Centre \u201cKurchatov Institute\u201d, 123098, Moscow, Russia","Voronezh State Technical University, 394000, Voronezh, Russia"],"raw_orcid":"https://orcid.org/0009-0000-0852-2303","affiliations":[{"raw_affiliation_string":"National Research Centre \u201cKurchatov Institute\u201d, 123098, Moscow, Russia","institution_ids":["https://openalex.org/I2800235667"]},{"raw_affiliation_string":"Voronezh State Technical University, 394000, Voronezh, Russia","institution_ids":["https://openalex.org/I4210106257"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054966285","display_name":"A. R. Shakurov","orcid":"https://orcid.org/0000-0002-8471-2392","observed_orcids":["https://orcid.org/0000-0002-8471-2392"]},"institutions":[{"id":"https://openalex.org/I2800235667","display_name":"Kurchatov Institute","ror":"https://ror.org/00n1nz186","country_code":"RU","type":"facility","lineage":["https://openalex.org/I2800235667"]},{"id":"https://openalex.org/I4210106257","display_name":"Voronezh State Technical University","ror":"https://ror.org/01m20f643","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210106257"]}],"countries":["RU"],"is_corresponding":true,"raw_author_name":"A. R. Shakurov","raw_affiliation_strings":["National Research Centre \u201cKurchatov Institute\u201d, 123098, Moscow, Russia","Voronezh State Technical University, 394000, Voronezh, Russia"],"raw_orcid":"https://orcid.org/0000-0002-8471-2392","affiliations":[{"raw_affiliation_string":"National Research Centre \u201cKurchatov Institute\u201d, 123098, Moscow, Russia","institution_ids":["https://openalex.org/I2800235667"]},{"raw_affiliation_string":"Voronezh State Technical University, 394000, Voronezh, Russia","institution_ids":["https://openalex.org/I4210106257"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057745169","display_name":"\u041c. \u041d. \u041a\u043e\u043f\u044b\u0442\u0438\u043d","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I4210106257","display_name":"Voronezh State Technical University","ror":"https://ror.org/01m20f643","country_code":"RU","type":"education","lineage":["https://openalex.org/I4210106257"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"M. N. Kopytin","raw_affiliation_strings":["Voronezh State Technical University, 394000, Voronezh, Russia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Voronezh State Technical University, 394000, Voronezh, Russia","institution_ids":["https://openalex.org/I4210106257"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5054966285"],"corresponding_institution_ids":["https://openalex.org/I2800235667","https://openalex.org/I4210106257"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"90","issue":"8","first_page":"1348","last_page":"1354"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11315","display_name":"Phase-change materials and chalcogenides","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13251","display_name":"Electrical and Thermal Properties of Materials","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/memristors","display_name":"memristors","score":0.8740000128746033},{"id":"https://openalex.org/keywords/resistive-switching","display_name":"resistive switching","score":0.9150000214576721},{"id":"https://openalex.org/keywords/nonlinear-current-voltage-characteristics","display_name":"nonlinear current-voltage characteristics","score":0.8799999952316284},{"id":"https://openalex.org/keywords/amorphous-silicon-interlayer","display_name":"amorphous silicon interlayer","score":0.8169999718666077},{"id":"https://openalex.org/keywords/lithium-niobate","display_name":"lithium niobate","score":0.8019999861717224},{"id":"https://openalex.org/keywords/charge-transport-mechanism","display_name":"charge transport mechanism","score":0.8510000109672546},{"id":"https://openalex.org/keywords/metal-insulator-metal-structures","display_name":"metal-insulator-metal structures","score":0.42500001192092896}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8181999921798706},{"id":"https://openalex.org/C150072547","wikidata":"https://www.wikidata.org/wiki/Q212923","display_name":"Memristor","level":2,"score":0.7361999750137329},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.5861999988555908},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.5440999865531921},{"id":"https://openalex.org/C19694890","wikidata":"https://www.wikidata.org/wiki/Q101667","display_name":"Hadron","level":2,"score":0.27959999442100525},{"id":"https://openalex.org/C26873012","wikidata":"https://www.wikidata.org/wiki/Q214781","display_name":"Condensed matter physics","level":1,"score":0.27160000801086426},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.25839999318122864},{"id":"https://openalex.org/C107814960","wikidata":"https://www.wikidata.org/wiki/Q611957","display_name":"Solid-state","level":2,"score":0.25769999623298645},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.24320000410079956},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.24250000715255737}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1134/s1062873826701133","doi":"https://doi.org/10.1134/s1062873826701133","is_oa":false,"landing_page_url":"https://doi.org/10.1134/s1062873826701133","pdf_url":null,"source":{"id":"https://openalex.org/S138373423","display_name":"Bulletin of the Russian Academy of Sciences Physics","issn_l":"1062-8738","issn":["1062-8738","1934-9432"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["jufo-1","poland-40","russia-white-list-3"],"host_organization":"https://openalex.org/P4310320267","host_organization_name":"Pleiades Publishing","host_organization_lineage":["https://openalex.org/P4310320267","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Pleiades Publishing","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Bulletin of the Russian Academy of Sciences: Physics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1989963329","https://openalex.org/W2789248677","https://openalex.org/W2797998833","https://openalex.org/W2805128883","https://openalex.org/W2955906003","https://openalex.org/W2978313259","https://openalex.org/W3150228123","https://openalex.org/W4388796759","https://openalex.org/W4394967438","https://openalex.org/W4404699597","https://openalex.org/W4406535497"],"related_works":["https://openalex.org/W2017250210","https://openalex.org/W2002406245","https://openalex.org/W1910430087","https://openalex.org/W4399698687","https://openalex.org/W2325341939","https://openalex.org/W2564885653","https://openalex.org/W7135058251","https://openalex.org/W4308075301","https://openalex.org/W3047393148","https://openalex.org/W3044198747"],"abstract_inverted_index":{"Abstract":[0],"We":[1],"studied":[2],"the":[3,14,20,31,35,41,44,50,56],"influence":[4],"of":[5,16,30,40,43],"a-Si":[6],"and":[7,24,49],"Ta2O5":[8],"interlayers":[9],"on":[10],"resistive":[11],"switching":[12],"processes,":[13],"nonlinearity":[15,42],"current\u2013voltage":[17,45],"characteristics":[18,46],"in":[19,55],"induced":[21],"low-resistance":[22],"state,":[23],"conductivity":[25],"mechanisms":[26,54],"as":[27],"a":[28],"function":[29],"current":[32],"flowing":[33],"through":[34],"investigated":[36],"structures.":[37],"The":[38],"origins":[39],"were":[47,59],"examined,":[48],"limiting":[51],"charge":[52],"transport":[53],"fabricated":[57],"structures":[58],"identified.":[60]},"counts_by_year":[],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2026-08-28T00:00:00"}
