{"id":"https://openalex.org/W7204474711","doi":"https://doi.org/10.61453/intij.20260227","title":"Real-Time Fault Detection in Microcontrollers","display_name":"Real-Time Fault Detection in Microcontrollers","publication_year":2026,"publication_date":"2026-06-16","ids":{"openalex":"https://openalex.org/W7204474711","doi":"https://doi.org/10.61453/intij.20260227"},"language":"en","primary_location":{"id":"doi:10.61453/intij.20260227","doi":"https://doi.org/10.61453/intij.20260227","is_oa":true,"landing_page_url":"https://doi.org/10.61453/intij.20260227","pdf_url":"https://iuojs.intimal.edu.my/index.php/intijournal/article/download/918/933","source":{"id":"https://openalex.org/S4404676336","display_name":"INTI JOURNAL.","issn_l":"2600-7320","issn":["2600-7320"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4404676335","host_organization_name":"INTI International University","host_organization_lineage":["https://openalex.org/P4404676335"],"host_organization_lineage_names":["INTI International University"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"INTI Journal","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"diamond","oa_url":"https://iuojs.intimal.edu.my/index.php/intijournal/article/download/918/933","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102887673","display_name":"M. Ezhilarasi","orcid":"https://orcid.org/0000-0003-1746-4613","observed_orcids":["https://orcid.org/0000-0003-1746-4613","https://orcid.org/0000-0001-8183-0142"]},"institutions":[{"id":"https://openalex.org/I88187127","display_name":"Sri Ramakrishna Engineering College","ror":"https://ror.org/056nttx82","country_code":"IN","type":"education","lineage":["https://openalex.org/I88187127"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"M. Ezhilarasi","raw_affiliation_strings":["Sri Ramakrishna Engineering College"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sri Ramakrishna Engineering College","institution_ids":["https://openalex.org/I88187127"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000130673","display_name":"Vishal Nagarajan","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I88187127","display_name":"Sri Ramakrishna Engineering College","ror":"https://ror.org/056nttx82","country_code":"IN","type":"education","lineage":["https://openalex.org/I88187127"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Vishal Nagarajan","raw_affiliation_strings":["Sri Ramakrishna Engineering College"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sri Ramakrishna Engineering College","institution_ids":["https://openalex.org/I88187127"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I88187127"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"2026","issue":"2","first_page":"224","last_page":"224"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13420","display_name":"Arduino and IoT Applications","score":0.48069998621940613,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13420","display_name":"Arduino and IoT Applications","score":0.48069998621940613,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13293","display_name":"Engineering and Test Systems","score":0.2671000063419342,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.1039000004529953,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/real-time-diagnosis","display_name":"real-time diagnosis","score":0.8050000071525574},{"id":"https://openalex.org/keywords/esp32-cam","display_name":"ESP32-CAM","score":0.7160000205039978},{"id":"https://openalex.org/keywords/arduino-uno","display_name":"Arduino Uno","score":0.7639999985694885},{"id":"https://openalex.org/keywords/electronic-waste-reduction","display_name":"electronic waste reduction","score":0.753000020980835},{"id":"https://openalex.org/keywords/board-testing","display_name":"board testing","score":0.3720000088214874},{"id":"https://openalex.org/keywords/production-line-maintenance","display_name":"production line maintenance","score":0.48899999260902405}],"concepts":[{"id":"https://openalex.org/C173018170","wikidata":"https://www.wikidata.org/wiki/Q165678","display_name":"Microcontroller","level":2,"score":0.9304999709129333},{"id":"https://openalex.org/C2776633867","wikidata":"https://www.wikidata.org/wiki/Q186612","display_name":"Timer","level":3,"score":0.8048999905586243},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.7235999703407288},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.6895999908447266},{"id":"https://openalex.org/C136501162","wikidata":"https://www.wikidata.org/wiki/Q175957","display_name":"Arduino","level":2,"score":0.6338000297546387},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.5547999739646912},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.46070000529289246},{"id":"https://openalex.org/C203479927","wikidata":"https://www.wikidata.org/wiki/Q5165939","display_name":"Controller (irrigation)","level":2,"score":0.4205000102519989},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.415800005197525},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.39989998936653137},{"id":"https://openalex.org/C2779662365","wikidata":"https://www.wikidata.org/wiki/Q5416694","display_name":"Event (particle physics)","level":2,"score":0.3700000047683716},{"id":"https://openalex.org/C102349902","wikidata":"https://www.wikidata.org/wiki/Q385390","display_name":"Serial port","level":3,"score":0.35929998755455017},{"id":"https://openalex.org/C141842801","wikidata":"https://www.wikidata.org/wiki/Q363815","display_name":"Automatic test equipment","level":3,"score":0.3472000062465668},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.33410000801086426},{"id":"https://openalex.org/C109243995","wikidata":"https://www.wikidata.org/wiki/Q650553","display_name":"PIC microcontroller","level":3,"score":0.31279999017715454},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.30730000138282776},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.3052999973297119},{"id":"https://openalex.org/C2986817828","wikidata":"https://www.wikidata.org/wiki/Q235790","display_name":"Stepper motor","level":2,"score":0.30250000953674316},{"id":"https://openalex.org/C201762086","wikidata":"https://www.wikidata.org/wiki/Q728183","display_name":"CAN bus","level":2,"score":0.30169999599456787},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.2992999851703644},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.28940001130104065},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.2728999853134155},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.26030001044273376},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.25360000133514404},{"id":"https://openalex.org/C17500928","wikidata":"https://www.wikidata.org/wiki/Q959968","display_name":"Control system","level":2,"score":0.2515000104904175}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.61453/intij.20260227","doi":"https://doi.org/10.61453/intij.20260227","is_oa":true,"landing_page_url":"https://doi.org/10.61453/intij.20260227","pdf_url":"https://iuojs.intimal.edu.my/index.php/intijournal/article/download/918/933","source":{"id":"https://openalex.org/S4404676336","display_name":"INTI JOURNAL.","issn_l":"2600-7320","issn":["2600-7320"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4404676335","host_organization_name":"INTI International University","host_organization_lineage":["https://openalex.org/P4404676335"],"host_organization_lineage_names":["INTI International University"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"INTI Journal","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.61453/intij.20260227","doi":"https://doi.org/10.61453/intij.20260227","is_oa":true,"landing_page_url":"https://doi.org/10.61453/intij.20260227","pdf_url":"https://iuojs.intimal.edu.my/index.php/intijournal/article/download/918/933","source":{"id":"https://openalex.org/S4404676336","display_name":"INTI JOURNAL.","issn_l":"2600-7320","issn":["2600-7320"],"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4404676335","host_organization_name":"INTI International University","host_organization_lineage":["https://openalex.org/P4404676335"],"host_organization_lineage_names":["INTI International University"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"INTI Journal","raw_type":"journal-article"},"sustainable_development_goals":[{"score":0.5378999710083008,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"},{"score":0.5171999931335449,"id":"https://metadata.un.org/sdg/12","display_name":"Responsible consumption and production"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W7204474711.pdf","grobid_xml":"https://content.openalex.org/works/W7204474711.grobid-xml"},"referenced_works_count":6,"referenced_works":["https://openalex.org/W1963665270","https://openalex.org/W2535362971","https://openalex.org/W2782604932","https://openalex.org/W2783497897","https://openalex.org/W2950093538","https://openalex.org/W4205445735"],"related_works":["https://openalex.org/W2950093538","https://openalex.org/W3013736644","https://openalex.org/W2149043858","https://openalex.org/W7097167343","https://openalex.org/W2151673569","https://openalex.org/W6991052273","https://openalex.org/W2535362971","https://openalex.org/W2382387886","https://openalex.org/W2384312751","https://openalex.org/W2979963397"],"abstract_inverted_index":{"The":[0,98],"innovation":[1,158],"demonstrates":[2],"an":[3,51],"automated":[4],"system":[5,177],"of":[6,29,35,41,59,80,114,122,134,150],"faults":[7],"in":[8,17,38,167,175],"microcontrollers":[9],"detection":[10,143,170],"and":[11,13,22,73,82,109,172],"diagnostics":[12],"provides":[14],"prolonged":[15],"assistance":[16],"the":[18,57,60,66,93,112,119,123,141],"production":[19],"line":[20],"testing":[21],"maintenance.":[23],"Its":[24],"usage":[25],"encompasses":[26],"a":[27,83,101,160],"range":[28],"microcontroller":[30,61,168],"systems":[31],"that":[32],"make":[33],"use":[34],"several":[36],"units,":[37],"which":[39,90,115],"substitution":[40],"entire":[42],"boards":[43,153],"create":[44],"electronic":[45,176],"waste.":[46],"It":[47],"will":[48],"assist":[49],"with":[50,65,95],"ESP32":[52],"CAM":[53],"module":[54],"to":[55,62,87,130,163],"capture":[56],"image":[58],"compare":[63],"it":[64,146],"test":[67],"images":[68],"stored":[69],"on":[70,118],"SD":[71],"cards":[72],"perform":[74],"physical":[75],"fault":[76,142,169],"checks.":[77],"In":[78],"case":[79],"success":[81],"pulse":[84],"is":[85],"transmitted":[86],"Arduino":[88,124],"UNO,":[89],"also":[91],"checks":[92],"controller":[94],"logical":[96],"errors.":[97],"UNO":[99],"has":[100,159],"few":[102],"other":[103],"tests":[104],"such":[105],"as":[106],"pin":[107],"input/output":[108],"timer":[110],"functions,":[111],"results":[113],"are":[116,129],"displayed":[117],"Serial":[120],"Monitor":[121],"IDE.":[125],"These":[126],"two":[127,136],"processes":[128,137],"be":[131],"integrated.":[132],"Integration":[133],"these":[135],"not":[138],"only":[139],"streamlines":[140],"processes,":[144],"but":[145],"promotes":[147],"sustainability":[148],"instead":[149],"replacing":[151],"whole":[152],"by":[154],"reducing":[155],"e-waste.":[156],"This":[157],"higher":[161],"potential":[162],"provide":[164],"significant":[165],"advancement":[166],"technology":[171],"drive":[173],"efficiency":[174],"management.":[178]},"counts_by_year":[],"updated_date":"2026-10-28T10:33:24.094632","created_date":"2026-08-28T00:00:00"}