{"id":"https://openalex.org/W7204146271","doi":"https://doi.org/10.1109/paee71887.2026.11660707","title":"Development of methods for measuring and analyzing temperature in medium and low voltage switchboards","display_name":"Development of methods for measuring and analyzing temperature in medium and low voltage switchboards","publication_year":2026,"publication_date":"2026-06-01","ids":{"openalex":"https://openalex.org/W7204146271","doi":"https://doi.org/10.1109/paee71887.2026.11660707"},"language":"en","primary_location":{"id":"doi:10.1109/paee71887.2026.11660707","doi":"https://doi.org/10.1109/paee71887.2026.11660707","is_oa":true,"landing_page_url":"https://doi.org/10.1109/paee71887.2026.11660707","pdf_url":null,"source":{"id":"https://openalex.org/S7407085986","display_name":"Progress in Applied Electrical Engineering (PAEE)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Progress in Applied Electrical Engineering (PAEE)","raw_type":"proceedings-article"},"parent_works":[],"lineage":["https://openalex.org/W7204146271"],"child_works_count":0,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/paee71887.2026.11660707","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5007844542","display_name":"J. Chudorli\u0144ski","orcid":"https://orcid.org/0000-0001-6840-3912","observed_orcids":["https://orcid.org/0000-0001-6840-3912"]},"institutions":[{"id":"https://openalex.org/I4210105040","display_name":"\u0141ukasiewicz Research Network - Tele and Radio Research Institute","ror":"https://ror.org/01bkj6835","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210105040","https://openalex.org/I4210129336"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Jerzy Chudorli\u0144ski","raw_affiliation_strings":["\u0141ukasiewicz Research Network \u2013 Tele and Radio Research Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"\u0141ukasiewicz Research Network \u2013 Tele and Radio Research Institute","institution_ids":["https://openalex.org/I4210105040"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5034664758","display_name":"Mariusz Kucharek","orcid":"https://orcid.org/0000-0002-5492-3666","observed_orcids":["https://orcid.org/0000-0002-5492-3666"]},"institutions":[{"id":"https://openalex.org/I4210105040","display_name":"\u0141ukasiewicz Research Network - Tele and Radio Research Institute","ror":"https://ror.org/01bkj6835","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210105040","https://openalex.org/I4210129336"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Mariusz Kucharek","raw_affiliation_strings":["\u0141ukasiewicz Research Network \u2013 Tele and Radio Research Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"\u0141ukasiewicz Research Network \u2013 Tele and Radio Research Institute","institution_ids":["https://openalex.org/I4210105040"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070705718","display_name":"Aleksander Lisowiec","orcid":"https://orcid.org/0000-0002-4488-179X","observed_orcids":["https://orcid.org/0000-0002-4488-179X"]},"institutions":[{"id":"https://openalex.org/I4210105040","display_name":"\u0141ukasiewicz Research Network - Tele and Radio Research Institute","ror":"https://ror.org/01bkj6835","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210105040","https://openalex.org/I4210129336"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Aleksander Lisowiec","raw_affiliation_strings":["\u0141ukasiewicz Research Network \u2013 Tele and Radio Research Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"\u0141ukasiewicz Research Network \u2013 Tele and Radio Research Institute","institution_ids":["https://openalex.org/I4210105040"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5046296799","display_name":"P. Michalski","orcid":"https://orcid.org/0000-0002-2567-1762","observed_orcids":["https://orcid.org/0000-0002-2567-1762"]},"institutions":[{"id":"https://openalex.org/I4210105040","display_name":"\u0141ukasiewicz Research Network - Tele and Radio Research Institute","ror":"https://ror.org/01bkj6835","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210105040","https://openalex.org/I4210129336"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Pawe\u0142 Michalski","raw_affiliation_strings":["\u0141ukasiewicz Research Network \u2013 Tele and Radio Research Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"\u0141ukasiewicz Research Network \u2013 Tele and Radio Research Institute","institution_ids":["https://openalex.org/I4210105040"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5083453882","display_name":"Leszek Ksi\u0105\u017cek","orcid":"https://orcid.org/0000-0003-0678-3328","observed_orcids":["https://orcid.org/0000-0003-0678-3328"]},"institutions":[{"id":"https://openalex.org/I4210105040","display_name":"\u0141ukasiewicz Research Network - Tele and Radio Research Institute","ror":"https://ror.org/01bkj6835","country_code":"PL","type":"facility","lineage":["https://openalex.org/I4210105040","https://openalex.org/I4210129336"]}],"countries":["PL"],"is_corresponding":false,"raw_author_name":"Leszek Ksi\u0105\u017cek","raw_affiliation_strings":["\u0141ukasiewicz Research Network \u2013 Tele and Radio Research Institute"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"\u0141ukasiewicz Research Network \u2013 Tele and Radio Research Institute","institution_ids":["https://openalex.org/I4210105040"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210105040"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.8095999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.8095999956130981,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14225","display_name":"Advanced Sensor and Control Systems","score":0.05139999836683273,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":0.045499999076128006,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/switchgear","display_name":"switchgear","score":0.7590000033378601},{"id":"https://openalex.org/keywords/low-voltage-switchboards","display_name":"low-voltage switchboards","score":0.9990000128746033},{"id":"https://openalex.org/keywords/preventive-diagnostics","display_name":"preventive diagnostics","score":0.8149999976158142},{"id":"https://openalex.org/keywords/thermal-anomalies","display_name":"thermal anomalies","score":0.8650000095367432},{"id":"https://openalex.org/keywords/overheating","display_name":"overheating","score":0.7590000033378601},{"id":"https://openalex.org/keywords/temperature-measurement-system","display_name":"temperature measurement system","score":0.800000011920929},{"id":"https://openalex.org/keywords/real-world-operating-conditions","display_name":"real-world operating conditions","score":0.8029999732971191}],"concepts":[{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.4291999936103821},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.40310001373291016},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.38999998569488525},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.37470000982284546},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3734000027179718},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3449000120162964},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31630000472068787},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.2791000008583069},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.2572000026702881},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.24250000715255737}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/paee71887.2026.11660707","doi":"https://doi.org/10.1109/paee71887.2026.11660707","is_oa":true,"landing_page_url":"https://doi.org/10.1109/paee71887.2026.11660707","pdf_url":null,"source":{"id":"https://openalex.org/S7407085986","display_name":"Progress in Applied Electrical Engineering (PAEE)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Progress in Applied Electrical Engineering (PAEE)","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1109/paee71887.2026.11660707","doi":"https://doi.org/10.1109/paee71887.2026.11660707","is_oa":true,"landing_page_url":"https://doi.org/10.1109/paee71887.2026.11660707","pdf_url":null,"source":{"id":"https://openalex.org/S7407085986","display_name":"Progress in Applied Electrical Engineering (PAEE)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Progress in Applied Electrical Engineering (PAEE)","raw_type":"proceedings-article"},"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5378999710083008}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W2946781649","https://openalex.org/W4234144543","https://openalex.org/W4308211934","https://openalex.org/W4309235560","https://openalex.org/W4312081665","https://openalex.org/W4401997651","https://openalex.org/W4412973957"],"related_works":["https://openalex.org/W2361257462","https://openalex.org/W4309235560","https://openalex.org/W2946669535","https://openalex.org/W193419156","https://openalex.org/W2349227484","https://openalex.org/W589675225","https://openalex.org/W2526427068","https://openalex.org/W3160846079","https://openalex.org/W4312361152","https://openalex.org/W7204074756"],"abstract_inverted_index":{"Monitoring":[0],"and":[1,21,31,41,51],"analyzing":[2],"the":[3,28],"temperature":[4,37,46,59],"of":[5,12,18,58],"switchgear":[6,53],"busbars":[7],"is":[8,54],"an":[9],"important":[10],"element":[11],"preventive":[13],"diagnostics,":[14],"enabling":[15],"early":[16],"detection":[17],"thermal":[19],"anomalies":[20],"minimizing":[22],"overheating-related":[23],"failures.":[24],"This":[25],"article":[26],"discusses":[27],"legal":[29],"requirements":[30],"measurement":[32,47],"methods":[33],"related":[34],"to":[35],"busbar":[36],"assessment":[38],"in":[39],"medium-":[40,50],"low-voltage":[42,52],"switchgear.":[43],"A":[44],"dedicated":[45],"system":[48],"for":[49],"presented.":[55],"The":[56],"results":[57],"tests":[60],"conducted":[61],"under":[62],"real-world":[63],"operating":[64],"conditions":[65],"are":[66],"discussed.":[67]},"counts_by_year":[],"updated_date":"2026-11-14T11:04:58.165337","created_date":"2026-08-25T00:00:00"}