{"id":"https://openalex.org/W7204139564","doi":"https://doi.org/10.1109/lsens.2026.3726740","title":"Multilayer PCB Sensor for Eddy Current Inspection of Accident Tolerant Fuel Rods","display_name":"Multilayer PCB Sensor for Eddy Current Inspection of Accident Tolerant Fuel Rods","publication_year":2026,"publication_date":"2026-08-24","ids":{"openalex":"https://openalex.org/W7204139564","doi":"https://doi.org/10.1109/lsens.2026.3726740"},"language":"en","primary_location":{"id":"doi:10.1109/lsens.2026.3726740","doi":"https://doi.org/10.1109/lsens.2026.3726740","is_oa":true,"landing_page_url":"https://doi.org/10.1109/lsens.2026.3726740","pdf_url":null,"source":{"id":"https://openalex.org/S4210220808","display_name":"IEEE Sensors Letters","issn_l":"2475-1472","issn":["2475-1472"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-20","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Sensors Letters","raw_type":"journal-article"},"parent_works":[],"lineage":["https://openalex.org/W7204139564"],"child_works_count":0,"type":"article","is_traditional":true,"indexed_in":["crossref","datacite"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/lsens.2026.3726740","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5118972548","display_name":"Maren Rake","orcid":"https://orcid.org/0009-0001-0454-3139","observed_orcids":["https://orcid.org/0009-0001-0454-3139"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Maren Rake","raw_affiliation_strings":["Eddy current Methods"],"raw_orcid":"https://orcid.org/0009-0001-0454-3139","affiliations":[{"raw_affiliation_string":"Eddy current Methods","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5128220569","display_name":"Martin Schulze","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Martin Schulze","raw_affiliation_strings":["Eddy current Methods"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Eddy current Methods","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5147971770","display_name":"Joo Lee","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Joo Lee","raw_affiliation_strings":["Samyong Inspection & Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samyong Inspection & Engineering","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5110600872","display_name":"Su Chung Chi","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Su Chung Chi","raw_affiliation_strings":["Samyong Inspection & Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samyong Inspection & Engineering","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5118972547","display_name":"Dae Gyun Ko","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Dae Gyun Ko","raw_affiliation_strings":["Nuclear Fuel Technology Department"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nuclear Fuel Technology Department","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5147956785","display_name":"Kwang-Young Lim","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kwang-Young Lim","raw_affiliation_strings":["Nuclear Fuel Technology Department"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nuclear Fuel Technology Department","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091735724","display_name":"Duill Kim","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Duill Kim","raw_affiliation_strings":["Samyong Inspection & Engineering"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Samyong Inspection & Engineering","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5009673921","display_name":"Henning Heuer","orcid":"https://orcid.org/0000-0002-9380-7043","observed_orcids":["https://orcid.org/0000-0002-9380-7043"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Henning Heuer","raw_affiliation_strings":["Eddy current Methods"],"raw_orcid":"https://orcid.org/0000-0002-9380-7043","affiliations":[{"raw_affiliation_string":"Eddy current Methods","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":{"value":2645,"currency":"USD","value_usd":2645},"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"10","issue":"10","first_page":"1502004","last_page":"1502004"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11778","display_name":"Electrical and Bioimpedance Tomography","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.00019999999494757503,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/accident-tolerant-fuel","display_name":"accident tolerant fuel","score":0.8169999718666077},{"id":"https://openalex.org/keywords/fuel-rod-inspection","display_name":"fuel rod inspection","score":0.7730000019073486},{"id":"https://openalex.org/keywords/eddy-current-testing","display_name":"eddy current testing","score":0.8349999785423279},{"id":"https://openalex.org/keywords/probe-optimization","display_name":"probe design optimization","score":0.6439999938011169},{"id":"https://openalex.org/keywords/measurement-uncertainty","display_name":"measurement uncertainty","score":0.6480000019073486},{"id":"https://openalex.org/keywords/in-service-inspection","display_name":"in-service inspection","score":0.6460000276565552}],"concepts":[{"id":"https://openalex.org/C162184086","wikidata":"https://www.wikidata.org/wiki/Q505544","display_name":"Rod","level":3,"score":0.4487000107765198},{"id":"https://openalex.org/C39432304","wikidata":"https://www.wikidata.org/wiki/Q188847","display_name":"Environmental science","level":0,"score":0.3977000117301941},{"id":"https://openalex.org/C131357438","wikidata":"https://www.wikidata.org/wiki/Q208598","display_name":"Eddy current","level":2,"score":0.39309999346733093},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3752000033855438},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3635999858379364},{"id":"https://openalex.org/C77595967","wikidata":"https://www.wikidata.org/wiki/Q3151013","display_name":"Forensic engineering","level":1,"score":0.34950000047683716},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.30399999022483826},{"id":"https://openalex.org/C6441794","wikidata":"https://www.wikidata.org/wiki/Q1420867","display_name":"Eddy-current testing","level":3,"score":0.3000999987125397},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.2980000078678131},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.28220000863075256},{"id":"https://openalex.org/C2780289543","wikidata":"https://www.wikidata.org/wiki/Q424630","display_name":"Accident (philosophy)","level":2,"score":0.27869999408721924},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.2757999897003174}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/lsens.2026.3726740","doi":"https://doi.org/10.1109/lsens.2026.3726740","is_oa":true,"landing_page_url":"https://doi.org/10.1109/lsens.2026.3726740","pdf_url":null,"source":{"id":"https://openalex.org/S4210220808","display_name":"IEEE Sensors Letters","issn_l":"2475-1472","issn":["2475-1472"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-20","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Sensors Letters","raw_type":"journal-article"},{"id":"pmh:oai:publica.fraunhofer.de:publica/524617","doi":null,"is_oa":false,"landing_page_url":"https://publica.fraunhofer.de/handle/publica/524617","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"journal article"},{"id":"doi:10.24406/publica-10458","doi":"https://doi.org/10.24406/publica-10458","is_oa":true,"landing_page_url":"https://doi.org/10.24406/publica-10458","pdf_url":null,"source":{"id":"https://openalex.org/S4306400318","display_name":"Fraunhofer-Publica (Fraunhofer-Gesellschaft)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4923324","host_organization_name":"Fraunhofer-Gesellschaft","host_organization_lineage":["https://openalex.org/I4923324"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Other"}],"best_oa_location":{"id":"doi:10.1109/lsens.2026.3726740","doi":"https://doi.org/10.1109/lsens.2026.3726740","is_oa":true,"landing_page_url":"https://doi.org/10.1109/lsens.2026.3726740","pdf_url":null,"source":{"id":"https://openalex.org/S4210220808","display_name":"IEEE Sensors Letters","issn_l":"2475-1472","issn":["2475-1472"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-20","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Sensors Letters","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W619450810","https://openalex.org/W2055063382","https://openalex.org/W2997591727","https://openalex.org/W4200115772","https://openalex.org/W4225140803","https://openalex.org/W4239910945","https://openalex.org/W4400906425","https://openalex.org/W4407900342","https://openalex.org/W4412383907"],"related_works":["https://openalex.org/W4379260810","https://openalex.org/W4416331679","https://openalex.org/W4402705468","https://openalex.org/W4225140803","https://openalex.org/W4407900342","https://openalex.org/W49266395","https://openalex.org/W4412383907","https://openalex.org/W277218704","https://openalex.org/W4408176243","https://openalex.org/W2122540556"],"abstract_inverted_index":{"Fuel":[0],"rods":[1,33],"in":[2,14,83],"nuclear":[3],"power":[4],"plants":[5],"operate":[6],"for":[7,75,101,162],"3\u20136":[8],"years":[9],"under":[10],"extreme":[11],"conditions\u2014requiring":[12],"regular":[13],"service":[15],"inspections":[16],"to":[17,36,93,104],"prevent":[18],"failures":[19],"and":[20,50,67,127,142],"ensure":[21],"optimal":[22],"performance.":[23],"The":[24,78,135],"thin":[25],"chromium":[26],"coating":[27,158],"applied":[28],"on":[29,153],"the":[30,71,98,115,122,130],"ATF":[31],"fuel":[32],"(typically":[34],"10":[35],"20":[37],"\u03bcm)":[38],"as":[39,41],"well":[40],"any":[42],"oxidation":[43],"occurring":[44],"during":[45],"operation":[46],"are":[47],"safety":[48],"relevant":[49],"can":[51],"be":[52],"inspected":[53],"by":[54],"means":[55],"of":[56,91,118,129,149],"eddy":[57,79],"currents.":[58],"This":[59],"letter":[60],"evaluates":[61],"several":[62],"PCB-based":[63],"sensor":[64],"designs\u2014including":[65],"single-layer":[66],"multi-layer":[68],"configurations\u2014to":[69],"identify":[70],"most":[72],"robust":[73],"solution":[74],"real-time":[76],"monitoring.":[77],"current":[80],"instrument":[81],"operates":[82],"a":[84,88,108,146],"sweep":[85],"mode":[86],"with":[87,156],"frequency":[89],"range":[90],"0.5":[92],"100":[94],"MHz.":[95],"When":[96],"analysing":[97],"measurement":[99,147],"signal":[100,143],"its":[102],"suitability":[103],"determine":[105],"chrome":[106],"thicknesses":[107],"high-dimensional":[109],"feature":[110],"space":[111],"involving":[112],"not":[113],"only":[114],"high":[116],"number":[117],"frequencies":[119],"but":[120],"also":[121],"real,":[123],"imaginary":[124],"part,":[125],"magnitude,":[126],"phase":[128],"complex":[131],"voltage":[132],"is":[133],"available.":[134],"study":[136],"demonstrates":[137],"that":[138],"optimized":[139],"probe":[140],"design":[141],"processing":[144],"achieve":[145],"uncertainty":[148],"<":[150],"\u00b10.7":[151],"\u03bcm":[152],"reference":[154],"specimen":[155],"known":[157],"thickness":[159],"-":[160],"sufficient":[161],"early":[163],"degradation":[164],"detection.":[165]},"counts_by_year":[],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2026-08-25T00:00:00"}