{"id":"https://openalex.org/W7203765858","doi":"https://doi.org/10.1109/icpc2t68221.2026.11646275","title":"Analysis and Simulation of Faults in PV Arrays for Reliable and Efficient Operation","display_name":"Analysis and Simulation of Faults in PV Arrays for Reliable and Efficient Operation","publication_year":2026,"publication_date":"2026-03-01","ids":{"openalex":"https://openalex.org/W7203765858","doi":"https://doi.org/10.1109/icpc2t68221.2026.11646275"},"language":"en","primary_location":{"id":"doi:10.1109/icpc2t68221.2026.11646275","doi":"https://doi.org/10.1109/icpc2t68221.2026.11646275","is_oa":true,"landing_page_url":"https://doi.org/10.1109/icpc2t68221.2026.11646275","pdf_url":null,"source":{"id":"https://openalex.org/S4363608185","display_name":"International Conference on Power, Control and Computing Technologies (ICPC2T)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Fifth International Conference on Power, Control and Computing Technologies (ICPC2T)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/icpc2t68221.2026.11646275","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102867431","display_name":"Harish Kumar Varma Gadiraju","orcid":"https://orcid.org/0000-0001-8834-4606","observed_orcids":["https://orcid.org/0000-0001-8834-4606"]},"institutions":[{"id":"https://openalex.org/I4400009046","display_name":"SRKR Engineering College","ror":"https://ror.org/038qac964","country_code":"IN","type":"education","lineage":["https://openalex.org/I4400009046"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"G Harish Kumar Varma","raw_affiliation_strings":["SRKR Engineering College"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SRKR Engineering College","institution_ids":["https://openalex.org/I4400009046"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5147568405","display_name":"B Venugopal Reddy","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I121750182","display_name":"National Institute of Technology Warangal","ror":"https://ror.org/017ebfz38","country_code":"IN","type":"education","lineage":["https://openalex.org/I121750182"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"B Venugopal Reddy","raw_affiliation_strings":["NIT Warangal"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"NIT Warangal","institution_ids":["https://openalex.org/I121750182"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043480569","display_name":"B.S.S. Santosh","orcid":"https://orcid.org/0000-0001-5644-4055","observed_orcids":["https://orcid.org/0000-0001-5644-4055"]},"institutions":[{"id":"https://openalex.org/I4400009046","display_name":"SRKR Engineering College","ror":"https://ror.org/038qac964","country_code":"IN","type":"education","lineage":["https://openalex.org/I4400009046"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"BSS Santosh","raw_affiliation_strings":["SRKR Engineering College"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SRKR Engineering College","institution_ids":["https://openalex.org/I4400009046"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5027078353","display_name":"Hemanth Kumar Raju Alluri","orcid":"https://orcid.org/0000-0002-3538-1996","observed_orcids":["https://orcid.org/0000-0002-3538-1996"]},"institutions":[{"id":"https://openalex.org/I4400009046","display_name":"SRKR Engineering College","ror":"https://ror.org/038qac964","country_code":"IN","type":"education","lineage":["https://openalex.org/I4400009046"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Hemanth Kumar Raju Alluri","raw_affiliation_strings":["SRKR Engineering College"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SRKR Engineering College","institution_ids":["https://openalex.org/I4400009046"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"635","last_page":"638"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":0.9980000257492065,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.0010000000474974513,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":9.999999747378752e-05,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/photovoltaic-arrays","display_name":"photovoltaic arrays","score":0.8299999833106995},{"id":"https://openalex.org/keywords/fault-analysis","display_name":"fault analysis","score":0.7300000190734863},{"id":"https://openalex.org/keywords/partial-shading","display_name":"partial shading","score":0.9909999966621399},{"id":"https://openalex.org/keywords/open-circuit-conditions","display_name":"open-circuit conditions","score":0.8429999947547913},{"id":"https://openalex.org/keywords/short-circuit-conditions","display_name":"short-circuit conditions","score":0.984000027179718},{"id":"https://openalex.org/keywords/p-v-curve","display_name":"P-V curve","score":0.7450000047683716},{"id":"https://openalex.org/keywords/fault-detection","display_name":"fault detection","score":0.9589999914169312},{"id":"https://openalex.org/keywords/pv-system-reliability","display_name":"PV system reliability","score":0.8059999942779541},{"id":"https://openalex.org/keywords/photovoltaic-system-efficiency","display_name":"PV system efficiency","score":0.703000009059906}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5054000020027161},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.40529999136924744},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.31630000472068787},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.310699999332428},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.2962000072002411},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.2784999907016754},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.275299996137619},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.2712000012397766},{"id":"https://openalex.org/C2780009758","wikidata":"https://www.wikidata.org/wiki/Q6804172","display_name":"Measure (data warehouse)","level":2,"score":0.27000001072883606},{"id":"https://openalex.org/C18762648","wikidata":"https://www.wikidata.org/wiki/Q42213","display_name":"Work (physics)","level":2,"score":0.23639999330043793}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/icpc2t68221.2026.11646275","doi":"https://doi.org/10.1109/icpc2t68221.2026.11646275","is_oa":true,"landing_page_url":"https://doi.org/10.1109/icpc2t68221.2026.11646275","pdf_url":null,"source":{"id":"https://openalex.org/S4363608185","display_name":"International Conference on Power, Control and Computing Technologies (ICPC2T)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Fifth International Conference on Power, Control and Computing Technologies (ICPC2T)","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1109/icpc2t68221.2026.11646275","doi":"https://doi.org/10.1109/icpc2t68221.2026.11646275","is_oa":true,"landing_page_url":"https://doi.org/10.1109/icpc2t68221.2026.11646275","pdf_url":null,"source":{"id":"https://openalex.org/S4363608185","display_name":"International Conference on Power, Control and Computing Technologies (ICPC2T)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 Fifth International Conference on Power, Control and Computing Technologies (ICPC2T)","raw_type":"proceedings-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8485000133514404}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2106642194","https://openalex.org/W2623213677","https://openalex.org/W2767142322","https://openalex.org/W3008941275","https://openalex.org/W3181608395","https://openalex.org/W4200616200","https://openalex.org/W4381800835","https://openalex.org/W4408929606"],"related_works":["https://openalex.org/W4225795797","https://openalex.org/W7203775146","https://openalex.org/W4387954991","https://openalex.org/W1513373572","https://openalex.org/W2153196835","https://openalex.org/W3088337417","https://openalex.org/W6927484142","https://openalex.org/W2997408575","https://openalex.org/W3016014297","https://openalex.org/W7172527769"],"abstract_inverted_index":{"Photovoltaic":[0],"(PV)":[1],"systems":[2],"are":[3,14,53],"gaining":[4],"importance":[5],"as":[6],"reliable":[7],"green":[8],"source":[9],"of":[10,19,33,50,64,78,84],"energy,":[11],"However":[12],"they":[13],"susceptible":[15],"to":[16,74],"many":[17],"types":[18,32],"faults,":[20],"which":[21],"drastically":[22],"reduce":[23],"the":[24,36,59,62,65,76,79,87,93,97],"reliability":[25,77],"and":[26,44,95],"efficiency.":[27,100],"This":[28,69,81],"work":[29],"analyzes":[30],"different":[31],"faults":[34,52],"on":[35],"PV":[37],"system":[38,89,99],"like":[39],"partial":[40],"shading,":[41],"open":[42],"circuit":[43,46],"short":[45],"conditions.":[47],"The":[48],"severity":[49],"these":[51],"simulated":[54],"using":[55],"MATLAB":[56],"simulations.":[57],"Based":[58],"P-V":[60],"curves":[61],"effectiveness":[63],"fault":[66,85],"is":[67,72],"identified.":[68],"timely":[70],"identification":[71],"significant":[73],"enhance":[75],"system.":[80],"effective":[82],"detection":[83],"improves":[86],"overall":[88,98],"performance":[90],"by":[91],"minimizing":[92],"losses":[94],"improving":[96]},"counts_by_year":[],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2026-08-20T00:00:00"}