{"id":"https://openalex.org/W7202298142","doi":"https://doi.org/10.1109/edm69524.2026.11632261","title":"Modeling of the Thermal Field of a Semiconductor Converter for Prediction of Pre-Failure States","display_name":"Modeling of the Thermal Field of a Semiconductor Converter for Prediction of Pre-Failure States","publication_year":2026,"publication_date":"2026-06-01","ids":{"openalex":"https://openalex.org/W7202298142","doi":"https://doi.org/10.1109/edm69524.2026.11632261"},"language":"en","primary_location":{"id":"doi:10.1109/edm69524.2026.11632261","doi":"https://doi.org/10.1109/edm69524.2026.11632261","is_oa":true,"landing_page_url":"https://doi.org/10.1109/edm69524.2026.11632261","pdf_url":null,"source":{"id":"https://openalex.org/S4210202527","display_name":"International Siberian workshops and tutorials on electron devices and materials","issn_l":"1815-3712","issn":["1815-3712"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 27th International Conference of Young Professionals in Electron Devices and Materials (EDM)","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1109/edm69524.2026.11632261","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5034704807","display_name":"Elena A. Punt","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I48074715","display_name":"Moscow State Technical University of Civil Aviation","ror":"https://ror.org/04xhj8132","country_code":"RU","type":"education","lineage":["https://openalex.org/I48074715"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Punt Elena Alexandrovna","raw_affiliation_strings":["Moscow State Technical University of Civil Aviation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Moscow State Technical University of Civil Aviation","institution_ids":["https://openalex.org/I48074715"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008769552","display_name":"Sergey P. Khalyutin","orcid":"https://orcid.org/0000-0002-7790-9189","observed_orcids":["https://orcid.org/0000-0002-7790-9189"]},"institutions":[{"id":"https://openalex.org/I48074715","display_name":"Moscow State Technical University of Civil Aviation","ror":"https://ror.org/04xhj8132","country_code":"RU","type":"education","lineage":["https://openalex.org/I48074715"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Sergey P. Khalyutin","raw_affiliation_strings":["Moscow State Technical University of Civil Aviation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Moscow State Technical University of Civil Aviation","institution_ids":["https://openalex.org/I48074715"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5147052710","display_name":"Razagatova Varvara Valeryevna","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I48074715","display_name":"Moscow State Technical University of Civil Aviation","ror":"https://ror.org/04xhj8132","country_code":"RU","type":"education","lineage":["https://openalex.org/I48074715"]}],"countries":["RU"],"is_corresponding":false,"raw_author_name":"Razagatova Varvara Valeryevna","raw_affiliation_strings":["Moscow State Technical University of Civil Aviation"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Moscow State Technical University of Civil Aviation","institution_ids":["https://openalex.org/I48074715"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I48074715"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"4"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.1492999941110611,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.1492999941110611,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13093","display_name":"Electric Power Systems and Control","score":0.12809999287128448,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13116","display_name":"Heat Transfer and Numerical Methods","score":0.12250000238418579,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/semiconductor-converters","display_name":"semiconductor converters","score":0.8069999814033508},{"id":"https://openalex.org/keywords/temperature-field-simulation","display_name":"temperature field simulation","score":0.9750000238418579},{"id":"https://openalex.org/keywords/digital-twin","display_name":"digital twin","score":0.7789999842643738},{"id":"https://openalex.org/keywords/finite-volume-method","display_name":"finite volume method","score":0.7409999966621399},{"id":"https://openalex.org/keywords/temperature-distribution","display_name":"temperature distribution","score":0.7170000076293945},{"id":"https://openalex.org/keywords/fault-diagnosis","display_name":"fault diagnosis","score":0.5619999766349792},{"id":"https://openalex.org/keywords/technical-condition-assessment","display_name":"technical condition assessment","score":0.6439999938011169}],"concepts":[{"id":"https://openalex.org/C9652623","wikidata":"https://www.wikidata.org/wiki/Q190109","display_name":"Field (mathematics)","level":2,"score":0.48500001430511475},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.4668000042438507},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.44119998812675476},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.3249000012874603},{"id":"https://openalex.org/C97346530","wikidata":"https://www.wikidata.org/wiki/Q487005","display_name":"Thermal conductivity","level":2,"score":0.3172000050544739},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.3138999938964844},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.30880001187324524},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3084000051021576},{"id":"https://openalex.org/C172100665","wikidata":"https://www.wikidata.org/wiki/Q7465774","display_name":"Thermal conduction","level":2,"score":0.2946999967098236},{"id":"https://openalex.org/C79635011","wikidata":"https://www.wikidata.org/wiki/Q175805","display_name":"Semiconductor device","level":3,"score":0.26739999651908875},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.26269999146461487}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/edm69524.2026.11632261","doi":"https://doi.org/10.1109/edm69524.2026.11632261","is_oa":true,"landing_page_url":"https://doi.org/10.1109/edm69524.2026.11632261","pdf_url":null,"source":{"id":"https://openalex.org/S4210202527","display_name":"International Siberian workshops and tutorials on electron devices and materials","issn_l":"1815-3712","issn":["1815-3712"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 27th International Conference of Young Professionals in Electron Devices and Materials (EDM)","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1109/edm69524.2026.11632261","doi":"https://doi.org/10.1109/edm69524.2026.11632261","is_oa":true,"landing_page_url":"https://doi.org/10.1109/edm69524.2026.11632261","pdf_url":null,"source":{"id":"https://openalex.org/S4210202527","display_name":"International Siberian workshops and tutorials on electron devices and materials","issn_l":"1815-3712","issn":["1815-3712"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":["norway-1"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2026 IEEE 27th International Conference of Young Professionals in Electron Devices and Materials (EDM)","raw_type":"proceedings-article"},"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.5690000057220459},{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5378999710083008}],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":5,"referenced_works":["https://openalex.org/W2046074714","https://openalex.org/W3166658900","https://openalex.org/W4311106092","https://openalex.org/W4402055870","https://openalex.org/W4409862676"],"related_works":["https://openalex.org/W2466764280","https://openalex.org/W7039448820","https://openalex.org/W3090606237","https://openalex.org/W7202243444","https://openalex.org/W1661576327","https://openalex.org/W3043156496","https://openalex.org/W2134941569","https://openalex.org/W2802520659","https://openalex.org/W3181508708","https://openalex.org/W3177981169"],"abstract_inverted_index":{"At":[0],"present,":[1],"the":[2,27,50,54,57,65,68,80,83,86,105,114,117,127,154,159,164,168,185],"role":[3],"of":[4,16,29,53,59,67,82,93,107,116,119,122,130,136,158,163,170,188],"semiconductor":[5,132],"converters":[6],"within":[7],"aircraft":[8,17],"electrical":[9],"power":[10],"supply":[11],"systems":[12],"on":[13,64,104],"modern":[14],"types":[15],"is":[18],"significantly":[19],"increasing.":[20],"This":[21,98],"leads":[22],"to":[23,48,152,179,193],"an":[24,146],"increase":[25],"in":[26,145,167],"number":[28],"emergency":[30],"operating":[31],"modes":[32],"and":[33,89],"converter":[34],"failures,":[35],"which":[36,175],"substantially":[37],"affects":[38],"flight":[39],"safety.":[40],"Diagnostic":[41],"methods":[42,61,75],"currently":[43],"used":[44,178],"make":[45],"it":[46,150],"possible":[47,96,151],"monitor":[49],"technical":[51,182],"condition":[52,183],"device;":[55],"however,":[56],"accuracy":[58,66],"such":[60],"directly":[62],"depends":[63],"measuring":[69],"instruments":[70],"used.":[71],"In":[72],"addition,":[73],"existing":[74],"provide":[76],"information":[77],"only":[78],"about":[79],"state":[81],"device":[84],"at":[85,184],"current":[87,186],"moment":[88,187],"are":[90],"not":[91],"capable":[92],"predicting":[94],"a":[95,101,108,131,142,171],"failure.":[97],"paper":[99],"proposes":[100],"methodology":[102],"based":[103],"use":[106,135],"modified":[109],"finite":[110],"volume":[111],"method":[112,118],"with":[113],"application":[115],"mathematical":[120],"prototyping":[121],"energy":[123],"processes":[124],"for":[125],"modeling":[126],"thermal":[128,173],"field":[129,162],"converter.":[133],"The":[134],"digital":[137,172],"twin":[138],"technology":[139],"when":[140],"implementing":[141],"diagnostic":[143],"algorithm":[144],"onboard":[147],"computer":[148],"makes":[149],"present":[153],"obtained":[155],"analytical":[156],"function":[157],"scalar":[160],"temperature":[161],"investigated":[165],"object":[166],"form":[169],"portrait,":[174],"can":[176],"be":[177],"assess":[180],"its":[181,195],"time,":[189],"as":[190,192],"well":[191],"predict":[194],"pre-failure":[196],"states.":[197]},"counts_by_year":[],"updated_date":"2026-11-08T12:12:28.789561","created_date":"2026-08-13T00:00:00"}