{"id":"https://openalex.org/W7171193810","doi":"https://doi.org/10.5281/zenodo.21558761","title":"Structural and Morphological Properties of Spray Deposited Lead Telluride Thin Films","display_name":"Structural and Morphological Properties of Spray Deposited Lead Telluride Thin Films","publication_year":2021,"publication_date":"2021-04-15","ids":{"openalex":"https://openalex.org/W7171193810","doi":"https://doi.org/10.5281/zenodo.21558761"},"language":"en","primary_location":{"id":"doi:10.5281/zenodo.21558761","doi":"https://doi.org/10.5281/zenodo.21558761","is_oa":true,"landing_page_url":"https://doi.org/10.5281/zenodo.21558761","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"JournalArticle"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.5281/zenodo.21558761","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067199662","display_name":"Syed Ghause Ibrahim","orcid":"https://orcid.org/0000-0001-5877-412X","observed_orcids":["https://orcid.org/0000-0001-5877-412X"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Ibrahim, Syed Ghause","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5091566144","display_name":"S. A. Waghuley","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"A.Waghuley, S.","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085894964","display_name":"Mohd Mubashshir Hasan Farooqi","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Farooqi, M. M. Hasan","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5002161074","display_name":"A.V. Kadu -","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kadu, A.V.","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.24898469,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.9771000146865845,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10590","display_name":"Chalcogenide Semiconductor Thin Films","score":0.9771000146865845,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10440","display_name":"Advanced Thermoelectric Materials and Devices","score":0.012000000104308128,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13889","display_name":"Advanced Materials and Semiconductor Technologies","score":0.003599999938160181,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/pbte","display_name":"PbTe","score":0.9819999933242798},{"id":"https://openalex.org/keywords/pbte-thin-films","display_name":"PbTe thin films","score":0.9490000009536743},{"id":"https://openalex.org/keywords/spray-pyrolysis","display_name":"spray pyrolysis","score":0.9620000123977661},{"id":"https://openalex.org/keywords/nanocrystalline-thin-films","display_name":"nanocrystalline films","score":0.9390000104904175},{"id":"https://openalex.org/keywords/cubic-crystal-structure","display_name":"cubic crystal structure","score":0.8220000267028809},{"id":"https://openalex.org/keywords/crystallographic-texture","display_name":"crystallographic texture","score":0.8130000233650208},{"id":"https://openalex.org/keywords/direct-band-gap","display_name":"direct band gap","score":0.9580000042915344},{"id":"https://openalex.org/keywords/electrical-resistivity","display_name":"electrical resistivity","score":0.9980000257492065},{"id":"https://openalex.org/keywords/thermoelectric-properties","display_name":"thermoelectric properties","score":0.7900000214576721},{"id":"https://openalex.org/keywords/n-type-conductivity","display_name":"n-type conductivity","score":0.8880000114440918},{"id":"https://openalex.org/keywords/glass-substrates","display_name":"glass substrates","score":0.7919999957084656}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8066999912261963},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.7785000205039978},{"id":"https://openalex.org/C140676511","wikidata":"https://www.wikidata.org/wiki/Q6964018","display_name":"Nanocrystalline material","level":2,"score":0.7258999943733215},{"id":"https://openalex.org/C2988664670","wikidata":"https://www.wikidata.org/wiki/Q505668","display_name":"Spray pyrolysis","level":3,"score":0.6236000061035156},{"id":"https://openalex.org/C2780786182","wikidata":"https://www.wikidata.org/wiki/Q425263","display_name":"Lead telluride","level":3,"score":0.6122000217437744},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.548799991607666},{"id":"https://openalex.org/C2778397788","wikidata":"https://www.wikidata.org/wiki/Q417116","display_name":"Telluride","level":2,"score":0.5012000203132629},{"id":"https://openalex.org/C64297162","wikidata":"https://www.wikidata.org/wiki/Q1987070","display_name":"Deposition (geology)","level":3,"score":0.42719998955726624},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.4244999885559082},{"id":"https://openalex.org/C6110044","wikidata":"https://www.wikidata.org/wiki/Q4118086","display_name":"Cadmium telluride photovoltaics","level":2,"score":0.38760000467300415},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.3874000012874603},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3783999979496002},{"id":"https://openalex.org/C2777038907","wikidata":"https://www.wikidata.org/wiki/Q415256","display_name":"Bismuth telluride","level":4,"score":0.3634999990463257},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.3418000042438507},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.31049999594688416},{"id":"https://openalex.org/C175854130","wikidata":"https://www.wikidata.org/wiki/Q98276914","display_name":"Nanocrystal","level":2,"score":0.30649998784065247},{"id":"https://openalex.org/C75937256","wikidata":"https://www.wikidata.org/wiki/Q1440781","display_name":"Carbon film","level":3,"score":0.30309998989105225},{"id":"https://openalex.org/C199289684","wikidata":"https://www.wikidata.org/wiki/Q83353","display_name":"Mineralogy","level":1,"score":0.2978000044822693},{"id":"https://openalex.org/C171250308","wikidata":"https://www.wikidata.org/wiki/Q11468","display_name":"Nanotechnology","level":1,"score":0.28139999508857727}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.5281/zenodo.21558761","doi":"https://doi.org/10.5281/zenodo.21558761","is_oa":true,"landing_page_url":"https://doi.org/10.5281/zenodo.21558761","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"JournalArticle"},{"id":"doi:10.5281/zenodo.21558762","doi":"https://doi.org/10.5281/zenodo.21558762","is_oa":true,"landing_page_url":"https://doi.org/10.5281/zenodo.21558762","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"JournalArticle"}],"best_oa_location":{"id":"doi:10.5281/zenodo.21558761","doi":"https://doi.org/10.5281/zenodo.21558761","is_oa":true,"landing_page_url":"https://doi.org/10.5281/zenodo.21558761","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"JournalArticle"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W2985402155","https://openalex.org/W2989684982","https://openalex.org/W2185303261","https://openalex.org/W2000643065","https://openalex.org/W2297452564","https://openalex.org/W1987531332","https://openalex.org/W2062878997","https://openalex.org/W1979429488","https://openalex.org/W1964273691","https://openalex.org/W3113236267"],"abstract_inverted_index":{"The":[0,25,50],"present":[1],"research":[2],"work":[3],"reports":[4],"on":[5],"the":[6,15,54,65],"deposition":[7],"of":[8,48,53],"lead":[9,27],"telluride":[10,28],"(PbTe)":[11],"thin":[12],"films":[13,29,56,66],"onto":[14],"glass":[16],"substrates":[17],"by":[18],"economical":[19],"spray":[20],"pyrolysis":[21],"technique":[22],"at":[23],"473K.":[24],"deposited":[26],"are":[30],"nanocrystalline":[31],"in":[32],"nature":[33],"with":[34],"cubic":[35],"lattice":[36],"and":[37,43],"having":[38],"preferred":[39],"orientation":[40],"along":[41],"(200)":[42],"exhibit":[44],"a":[45],"direct":[46],"bandgap":[47],"1.27eV.":[49],"electrical":[51],"resistivity":[52],"as-deposited":[55],"was":[57],"found":[58],"to":[59],"be":[60],"1.80\u00d710-2\u03a9cm.Thermo-emf":[61],"studies":[62],"confirm":[63],"that":[64],"possess":[67],"n-type":[68],"conductivity.":[69]},"counts_by_year":[],"updated_date":"2026-10-28T10:33:24.094632","created_date":"2026-07-26T00:00:00"}