{"id":"https://openalex.org/W7165913086","doi":"https://doi.org/10.3390/electronics15132792","title":"Architecture-Level Risk-Guided Fault-Injection Prioritization for Systolic AI Accelerators: A Fixed Candidate-Pool Evaluation","display_name":"Architecture-Level Risk-Guided Fault-Injection Prioritization for Systolic AI Accelerators: A Fixed Candidate-Pool Evaluation","publication_year":2026,"publication_date":"2026-06-25","ids":{"openalex":"https://openalex.org/W7165913086","doi":"https://doi.org/10.3390/electronics15132792"},"language":"en","primary_location":{"id":"doi:10.3390/electronics15132792","doi":"https://doi.org/10.3390/electronics15132792","is_oa":true,"landing_page_url":"https://doi.org/10.3390/electronics15132792","pdf_url":"https://www.mdpi.com/2079-9292/15/13/2792/pdf?version=1782367765","source":{"id":"https://openalex.org/S4210202905","display_name":"Electronics","issn_l":"2079-9292","issn":["2079-9292"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","norway-1","poland-100","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics","raw_type":"journal-article"},"volume":null,"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"gold","oa_url":"https://www.mdpi.com/2079-9292/15/13/2792/pdf?version=1782367765","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5121993683","display_name":"Larisa Goffman-Vinopal","orcid":"https://orcid.org/0009-0004-6895-7965","observed_orcids":["https://orcid.org/0009-0004-6895-7965"]},"institutions":[{"id":"https://openalex.org/I13955877","display_name":"Bar-Ilan University","ror":"https://ror.org/03kgsv495","country_code":"IL","type":"education","lineage":["https://openalex.org/I13955877"]}],"countries":["IL"],"is_corresponding":true,"raw_author_name":"Larisa Goffman-Vinopal","raw_affiliation_strings":["Engineering Faculty, Bar-Ilan University, Ramat Gan 5290002, Israel"],"raw_orcid":"https://orcid.org/0009-0004-6895-7965","affiliations":[{"raw_affiliation_string":"Engineering Faculty, Bar-Ilan University, Ramat Gan 5290002, Israel","institution_ids":["https://openalex.org/I13955877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5121993683"],"corresponding_institution_ids":["https://openalex.org/I13955877"],"apc_list":{"value":2400,"currency":"CHF","value_usd":2896},"apc_paid":{"value":2400,"currency":"CHF","value_usd":2896},"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.38033789,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"15","issue":"13","first_page":"2792","last_page":"2792"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.6948000192642212,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.6948000192642212,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":0.07699999958276749,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.06790000200271606,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silent-data-corruption","display_name":"silent data corruption","score":0.9350000023841858}],"concepts":[{"id":"https://openalex.org/C189430467","wikidata":"https://www.wikidata.org/wiki/Q7293293","display_name":"Ranking (information retrieval)","level":2,"score":0.5910999774932861},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5485000014305115},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5260999798774719},{"id":"https://openalex.org/C79337645","wikidata":"https://www.wikidata.org/wiki/Q779824","display_name":"Outlier","level":2,"score":0.4293000102043152},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.42399999499320984},{"id":"https://openalex.org/C164226766","wikidata":"https://www.wikidata.org/wiki/Q7293202","display_name":"Rank (graph theory)","level":2,"score":0.40380001068115234},{"id":"https://openalex.org/C139002025","wikidata":"https://www.wikidata.org/wiki/Q3001212","display_name":"Lift (data mining)","level":2,"score":0.39160001277923584},{"id":"https://openalex.org/C21200559","wikidata":"https://www.wikidata.org/wiki/Q7451068","display_name":"Sensitivity (control systems)","level":2,"score":0.38580000400543213},{"id":"https://openalex.org/C2777615720","wikidata":"https://www.wikidata.org/wiki/Q11888847","display_name":"Prioritization","level":2,"score":0.3824000060558319},{"id":"https://openalex.org/C148220186","wikidata":"https://www.wikidata.org/wiki/Q7111912","display_name":"Outcome (game theory)","level":2,"score":0.35440000891685486},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.33379998803138733},{"id":"https://openalex.org/C65660741","wikidata":"https://www.wikidata.org/wiki/Q3952743","display_name":"Score","level":2,"score":0.3287000060081482},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3100000023841858},{"id":"https://openalex.org/C193244246","wikidata":"https://www.wikidata.org/wiki/Q5432696","display_name":"False discovery rate","level":3,"score":0.3089999854564667},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.30329999327659607},{"id":"https://openalex.org/C2781198647","wikidata":"https://www.wikidata.org/wiki/Q1633673","display_name":"Datapath","level":2,"score":0.2948000133037567},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.29260000586509705},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.29030001163482666},{"id":"https://openalex.org/C43711488","wikidata":"https://www.wikidata.org/wiki/Q7534783","display_name":"Skew","level":2,"score":0.2791999876499176},{"id":"https://openalex.org/C148524875","wikidata":"https://www.wikidata.org/wiki/Q6975395","display_name":"F1 score","level":2,"score":0.27639999985694885},{"id":"https://openalex.org/C165064840","wikidata":"https://www.wikidata.org/wiki/Q1321061","display_name":"Matching (statistics)","level":2,"score":0.2662000060081482},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.2639999985694885},{"id":"https://openalex.org/C2776365744","wikidata":"https://www.wikidata.org/wiki/Q5438149","display_name":"Fault Simulator","level":5,"score":0.25949999690055847},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25870001316070557},{"id":"https://openalex.org/C117220453","wikidata":"https://www.wikidata.org/wiki/Q5172842","display_name":"Correlation","level":2,"score":0.25780001282691956},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.25600001215934753},{"id":"https://openalex.org/C165838908","wikidata":"https://www.wikidata.org/wiki/Q736777","display_name":"Calibration","level":2,"score":0.25060001015663147}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.3390/electronics15132792","doi":"https://doi.org/10.3390/electronics15132792","is_oa":true,"landing_page_url":"https://doi.org/10.3390/electronics15132792","pdf_url":"https://www.mdpi.com/2079-9292/15/13/2792/pdf?version=1782367765","source":{"id":"https://openalex.org/S4210202905","display_name":"Electronics","issn_l":"2079-9292","issn":["2079-9292"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","norway-1","poland-100","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics","raw_type":"journal-article"}],"best_oa_location":{"id":"doi:10.3390/electronics15132792","doi":"https://doi.org/10.3390/electronics15132792","is_oa":true,"landing_page_url":"https://doi.org/10.3390/electronics15132792","pdf_url":"https://www.mdpi.com/2079-9292/15/13/2792/pdf?version=1782367765","source":{"id":"https://openalex.org/S4210202905","display_name":"Electronics","issn_l":"2079-9292","issn":["2079-9292"],"is_oa":true,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","norway-1","poland-100","russia-white-list-2","vabb-shw"],"host_organization":"https://openalex.org/P4310310987","host_organization_name":"Multidisciplinary Digital Publishing Institute","host_organization_lineage":["https://openalex.org/P4310310987"],"host_organization_lineage_names":["Multidisciplinary Digital Publishing Institute"],"type":"journal"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Electronics","raw_type":"journal-article"},"sustainable_development_goals":[],"sustainable_development_goals_aurora":[{"display_name":"Peace, justice, and strong institutions","score":0.8175614476203918,"id":"https://metadata.un.org/sdg/16"}],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W7165913086.pdf","grobid_xml":"https://content.openalex.org/works/W7165913086.grobid-xml"},"referenced_works_count":14,"referenced_works":["https://openalex.org/W2017369466","https://openalex.org/W2048266589","https://openalex.org/W2104114347","https://openalex.org/W2125169487","https://openalex.org/W2129960401","https://openalex.org/W2152839228","https://openalex.org/W2604319603","https://openalex.org/W2606722458","https://openalex.org/W2767260595","https://openalex.org/W2897162667","https://openalex.org/W2906043559","https://openalex.org/W2980200167","https://openalex.org/W3101271453","https://openalex.org/W4379115502"],"related_works":[],"abstract_inverted_index":{"Fault-injection":[0],"campaigns":[1,16],"are":[2,25,104,110,118],"widely":[3],"used":[4],"to":[5,92],"evaluate":[6],"silent":[7],"data":[8],"corruption":[9],"(SDC)":[10],"in":[11,124],"AI":[12,38],"hardware,":[13],"but":[14],"exhaustive":[15],"over":[17],"workloads,":[18,95],"dataflows,":[19],"processing":[20],"elements,":[21],"and":[22,99,109,141,151,168,201,211],"datapath":[23],"roles":[24],"expensive.":[26],"This":[27],"paper":[28],"presents":[29],"an":[30],"architecture-level":[31,122,148,240],"risk-guided":[32],"fault-injection":[33],"prioritization":[34],"method":[35,41,158,234],"for":[36,198,203,243,250],"systolic":[37],"accelerators.":[39],"The":[40,70,130,233],"ranks":[42],"candidate":[43,75,85,108],"transient":[44,121],"functional":[45],"perturbations":[46,123],"before":[47],"downstream":[48],"validation,":[49],"with":[50,171,196],"the":[51,55,82,146,153,156,160,176,182,216,221],"goal":[52],"of":[53,57,112,191],"enriching":[54],"discovery":[56],"candidates":[58],"that":[59,220],"produce":[60],"a":[61,66,73,142,187,238,248],"thresholded":[62],"relative-output-error":[63],"outcome":[64,231],"under":[65,152,228],"limited":[67],"validation":[68,244],"budget.":[69],"evaluation":[71],"uses":[72],"fixed":[74],"fault":[76],"pool:":[77],"all":[78,113],"ranking":[79,114,179],"policies":[80],"score":[81,133,223],"same":[83],"21,000":[84],"faults":[86,117],"across":[87],"30":[88],"workload/dataflow/array":[89],"configurations,":[90],"corresponding":[91],"five":[93],"GEMM-derived":[94],"three":[96],"array":[97],"sizes,":[98],"two":[100],"dataflows.":[101],"Fault":[102],"magnitudes":[103],"sampled":[105],"once":[106],"per":[107],"independent":[111],"scores.":[115],"Candidate":[116],"modeled":[119],"as":[120,237,247],"MAC,":[125],"accumulator,":[126],"or":[127,254],"forwarding":[128],"paths.":[129],"proposed":[131,147,157,222],"full-risk":[132],"combines":[134],"activity,":[135],"composite":[136],"spatial":[137],"stress,":[138],"tensor":[139],"sensitivity,":[140,210],"path-class":[143],"weight.":[144],"In":[145],"simulation":[149],"environment":[150],"fixed-pool":[154],"protocol,":[155],"achieves":[159,186],"highest":[161],"mean":[162,188],"top-10%":[163,189],"SDC-proxy":[164],"lift,":[165],"AUPRC,":[166],"NDCG@10%,":[167],"rank":[169],"correlation":[170],"relative":[172],"output":[173,204],"error":[174],"among":[175],"evaluated":[177],"principle-based":[178],"policies.":[180],"At":[181],"calibrated":[183],"threshold,":[184],"it":[185],"lift":[190],"5.65\u00d7":[192],"[4.91,":[193],"6.38],":[194],"compared":[195],"4.61\u00d7":[197],"AVF-like":[199],"exposure":[200],"4.33\u00d7":[202],"sensitivity.":[205],"Paired":[206],"configuration-level":[207],"tests,":[208],"threshold":[209],"outcome-model":[212],"sensitivity":[213],"analyses":[214],"characterize":[215],"result":[217],"while":[218],"showing":[219],"is":[224,235],"not":[225,246],"universally":[226],"dominant":[227],"every":[229],"synthetic":[230],"assumption.":[232],"intended":[236],"front-end":[239],"screening":[241],"tool":[242],"prioritization,":[245],"replacement":[249],"RTL,":[251],"gate-level,":[252],"FPGA,":[253],"silicon":[255],"reliability":[256],"signoff.":[257]},"counts_by_year":[],"updated_date":"2026-10-14T16:39:01.820549","created_date":"2026-06-26T00:00:00"}