{"id":"https://openalex.org/W7165199366","doi":"https://doi.org/10.1145/3787109.3815291","title":"Fault Analysis of Microscaling Formats on a RISC-V SoC","display_name":"Fault Analysis of Microscaling Formats on a RISC-V SoC","publication_year":2026,"publication_date":"2026-06-18","ids":{"openalex":"https://openalex.org/W7165199366","doi":"https://doi.org/10.1145/3787109.3815291"},"language":"en","primary_location":{"id":"doi:10.1145/3787109.3815291","doi":"https://doi.org/10.1145/3787109.3815291","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3787109.3815291","pdf_url":null,"source":{"id":"https://openalex.org/S4363608736","display_name":"ACM Great Lakes Symposium on VLSI (GLSVLSI)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Great Lakes Symposium on VLSI 2026","raw_type":"proceedings-article"},"volume":null,"type":"conference-paper","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://doi.org/10.1145/3787109.3815291","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5048335800","display_name":"Dillibabu Shanmugam","orcid":"https://orcid.org/0000-0003-3018-777X","observed_orcids":["https://orcid.org/0000-0003-3018-777X"]},"institutions":[{"id":"https://openalex.org/I107077323","display_name":"Worcester Polytechnic Institute","ror":"https://ror.org/05ejpqr48","country_code":"US","type":"education","lineage":["https://openalex.org/I107077323"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Dillibabu Shanmugam","raw_affiliation_strings":["Worcester Polytechnic Institute, Worcester, MA, USA"],"raw_orcid":"https://orcid.org/0000-0003-3018-777X","affiliations":[{"raw_affiliation_string":"Worcester Polytechnic Institute, Worcester, MA, USA","institution_ids":["https://openalex.org/I107077323"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5088000939","display_name":"Patrick R. Schaumont","orcid":"https://orcid.org/0000-0002-4586-5476","observed_orcids":["https://orcid.org/0000-0002-4586-5476","https://orcid.org/0009-0003-2250-7101"]},"institutions":[{"id":"https://openalex.org/I107077323","display_name":"Worcester Polytechnic Institute","ror":"https://ror.org/05ejpqr48","country_code":"US","type":"education","lineage":["https://openalex.org/I107077323"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Patrick Schaumont","raw_affiliation_strings":["Worcester Polytechnic Institite, Worcester, MA, USA"],"raw_orcid":"https://orcid.org/0000-0002-4586-5476","affiliations":[{"raw_affiliation_string":"Worcester Polytechnic Institite, Worcester, MA, USA","institution_ids":["https://openalex.org/I107077323"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I107077323"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.34860823,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"83","last_page":"88"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.6460000276565552,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":0.6460000276565552,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11697","display_name":"Numerical Methods and Algorithms","score":0.13940000534057617,"subfield":{"id":"https://openalex.org/subfields/1703","display_name":"Computational Theory and Mathematics"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.12610000371932983,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-injection","display_name":"fault injection","score":0.6489999890327454},{"id":"https://openalex.org/keywords/risc-v-soc","display_name":"RISC-V SoC","score":0.8149999976158142},{"id":"https://openalex.org/keywords/attention-mechanism","display_name":"attention mechanism","score":0.5870000123977661},{"id":"https://openalex.org/keywords/hardware-security","display_name":"hardware security","score":0.675000011920929},{"id":"https://openalex.org/keywords/low-precision-arithmetic","display_name":"low-precision arithmetic","score":0.5210000276565552}],"concepts":[{"id":"https://openalex.org/C2780388253","wikidata":"https://www.wikidata.org/wiki/Q5421508","display_name":"Exponent","level":2,"score":0.6316999793052673},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6180999875068665},{"id":"https://openalex.org/C2778476105","wikidata":"https://www.wikidata.org/wiki/Q628539","display_name":"Workload","level":2,"score":0.5935999751091003},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.46369999647140503},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.41659998893737793},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.3921999931335449},{"id":"https://openalex.org/C167391956","wikidata":"https://www.wikidata.org/wiki/Q1401211","display_name":"Fault model","level":3,"score":0.3840999901294708},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.37790000438690186},{"id":"https://openalex.org/C2777210771","wikidata":"https://www.wikidata.org/wiki/Q4927124","display_name":"Block (permutation group theory)","level":2,"score":0.3506999909877777},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3262999951839447},{"id":"https://openalex.org/C186370098","wikidata":"https://www.wikidata.org/wiki/Q442787","display_name":"Energy (signal processing)","level":2,"score":0.32339999079704285},{"id":"https://openalex.org/C2778049214","wikidata":"https://www.wikidata.org/wiki/Q7512234","display_name":"Sigma","level":2,"score":0.3165999948978424},{"id":"https://openalex.org/C125411270","wikidata":"https://www.wikidata.org/wiki/Q18653","display_name":"Encoding (memory)","level":2,"score":0.3091999888420105},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3043000102043152},{"id":"https://openalex.org/C120314980","wikidata":"https://www.wikidata.org/wiki/Q180634","display_name":"Distributed computing","level":1,"score":0.29319998621940613},{"id":"https://openalex.org/C113775141","wikidata":"https://www.wikidata.org/wiki/Q428691","display_name":"Computer engineering","level":1,"score":0.2930999994277954},{"id":"https://openalex.org/C74172769","wikidata":"https://www.wikidata.org/wiki/Q1446839","display_name":"Routing (electronic design automation)","level":2,"score":0.2874999940395355},{"id":"https://openalex.org/C200288055","wikidata":"https://www.wikidata.org/wiki/Q2621792","display_name":"Element (criminal law)","level":2,"score":0.2856000065803528},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.2768999934196472},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.27300000190734863}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1145/3787109.3815291","doi":"https://doi.org/10.1145/3787109.3815291","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3787109.3815291","pdf_url":null,"source":{"id":"https://openalex.org/S4363608736","display_name":"ACM Great Lakes Symposium on VLSI (GLSVLSI)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Great Lakes Symposium on VLSI 2026","raw_type":"proceedings-article"}],"best_oa_location":{"id":"doi:10.1145/3787109.3815291","doi":"https://doi.org/10.1145/3787109.3815291","is_oa":true,"landing_page_url":"https://doi.org/10.1145/3787109.3815291","pdf_url":null,"source":{"id":"https://openalex.org/S4363608736","display_name":"ACM Great Lakes Symposium on VLSI (GLSVLSI)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Proceedings of the Great Lakes Symposium on VLSI 2026","raw_type":"proceedings-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G444482813","display_name":"Collaborative: FMitF: Track I: A Principled Approach to Modeling and Analysis of Hardware Fault Attacks on Embedded Software","funder_award_id":"2219810","funder_id":"https://openalex.org/F4320306076","funder_display_name":"National Science Foundation"}],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1999085092","https://openalex.org/W2807835252","https://openalex.org/W2981860227","https://openalex.org/W4252174618","https://openalex.org/W4296914491","https://openalex.org/W4413361539","https://openalex.org/W4415322843","https://openalex.org/W4416963295","https://openalex.org/W4416963812","https://openalex.org/W7130556588","https://openalex.org/W7163523010"],"related_works":["https://openalex.org/W7221170055","https://openalex.org/W7207147089","https://openalex.org/W4413361539","https://openalex.org/W3012458502","https://openalex.org/W6903688446","https://openalex.org/W7221522419","https://openalex.org/W7160670158","https://openalex.org/W4400397824","https://openalex.org/W7038734192","https://openalex.org/W7160919198"],"abstract_inverted_index":{"Microscaling":[0],"(MX)":[1],"formats":[2],"share":[3],"one":[4],"exponent":[5,21,79],"across":[6,45,131],"an":[7,145],"element":[8,137],"block,":[9],"creating":[10],"a":[11,15,128,151],"new":[12],"fault":[13,43,89,120],"surface:":[14],"single-bit":[16,41],"flip":[17],"in":[18,91,103],"the":[19,52,57,92,118],"shared":[20],"corrupts":[22],"all":[23,99],"block":[24],"elements":[25],"simultaneously.":[26],"Five":[27],"MX-compatible":[28],"8-bit":[29],"encodings":[30],"(MXINT8,":[31],"MXFP8-E4M3,":[32],"MXFP8-E5M2,":[33],"LOG8-SUM,":[34],"and":[35,87,105,125,134],"LOG8-MAX)":[36],"are":[37],"compared":[38],"through":[39],"exhaustive":[40],"weight":[42],"injection":[44],"four":[46],"workloads":[47],"using":[48],"gate-level":[49],"simulation":[50],"on":[51,62,112],"CAPRI1":[53],"RISC-V":[54],"SoC,":[55],"with":[56,122],"primary":[58],"workload":[59],"additionally":[60],"validated":[61],"fabricated":[63],"silicon.":[64],"Format":[65],"choice":[66],"alone":[67],"can":[68],"substantially":[69],"change":[70],"vulnerability.":[71],"Three":[72],"MX-specific":[73],"mechanisms":[74],"explain":[75],"this":[76],"variation:":[77],"block-shared":[78],"amplification,":[80],"attention":[81,114],"routing":[82],"inversion":[83],"from":[84],"exponent-field":[85],"faults,":[86],"log-domain":[88],"filtering":[90],"max-reduction":[93],"variant.":[94],"No":[95],"single":[96],"format":[97],"dominates":[98],"axes:":[100],"LOG8-MAX":[101],"leads":[102],"speed":[104],"energy":[106],"but":[107,148],"is":[108],"limited":[109],"by":[110],"accuracy":[111],"some":[113],"workloads,":[115],"MXINT8":[116],"provides":[117],"strongest":[119],"resilience":[121],"full":[123],"accuracy,":[124,133],"LOG8-SUM":[126],"offers":[127],"balanced":[129],"compromise":[130],"speed,":[132],"resilience.":[135],"MX":[136],"encoding":[138],"should":[139],"be":[140],"treated":[141],"not":[142],"only":[143],"as":[144,150],"accuracy-efficiency":[146],"choice,":[147],"also":[149],"security-relevant":[152],"design":[153],"decision.":[154]},"counts_by_year":[],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2026-06-19T00:00:00"}