{"id":"https://openalex.org/W7163555475","doi":"https://doi.org/10.1007/s10854-026-18638-2","title":"Structural, morphological and optical properties of Cd0.7Fe2.3O4 thin films deposited on glass and quartz substrates and electrical investigation of Cd0.7Fe2.3O4/n-Si heterostructure","display_name":"Structural, morphological and optical properties of Cd0.7Fe2.3O4 thin films deposited on glass and quartz substrates and electrical investigation of Cd0.7Fe2.3O4/n-Si heterostructure","publication_year":2026,"publication_date":"2026-10-01","ids":{"openalex":"https://openalex.org/W7163555475","doi":"https://doi.org/10.1007/s10854-026-18638-2"},"language":"en","primary_location":{"id":"doi:10.1007/s10854-026-18638-2","doi":"https://doi.org/10.1007/s10854-026-18638-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10854-026-18638-2","pdf_url":null,"source":{"id":"https://openalex.org/S189509794","display_name":"Journal of Materials Science Materials in Electronics","issn_l":"0957-4522","issn":["0957-4522","1573-482X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Materials Science: Materials in Electronics","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.researchsquare.com/article/rs-9681319/latest.pdf","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5038974095","display_name":"M. Smiti","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I68916915","display_name":"University of Gab\u00e8s","ror":"https://ror.org/022efad20","country_code":"TN","type":"education","lineage":["https://openalex.org/I68916915"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"M. Smiti","raw_affiliation_strings":["Laboratory of Physics of Materials and Nanomaterials Applied to the Environment, Faculty of Sciences of Gabes, University of Gabes, 6079, Gabes, Tunisia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Physics of Materials and Nanomaterials Applied to the Environment, Faculty of Sciences of Gabes, University of Gabes, 6079, Gabes, Tunisia","institution_ids":["https://openalex.org/I68916915"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5137812445","display_name":"S. Mourad","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I68916915","display_name":"University of Gab\u00e8s","ror":"https://ror.org/022efad20","country_code":"TN","type":"education","lineage":["https://openalex.org/I68916915"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"S. Mourad","raw_affiliation_strings":["Laboratory of Physics of Materials and Nanomaterials Applied to the Environment, Faculty of Sciences of Gabes, University of Gabes, 6079, Gabes, Tunisia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Physics of Materials and Nanomaterials Applied to the Environment, Faculty of Sciences of Gabes, University of Gabes, 6079, Gabes, Tunisia","institution_ids":["https://openalex.org/I68916915"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5137811360","display_name":"Rehab Ramadan Shehata Ali","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I89466785","display_name":"Minia University","ror":"https://ror.org/02hcv4z63","country_code":"EG","type":"education","lineage":["https://openalex.org/I89466785"]}],"countries":["EG"],"is_corresponding":false,"raw_author_name":"Rehab Ramadan","raw_affiliation_strings":["Department of Physics, Faculty of Science, Minia University, Minia, 61519, Egypt"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Physics, Faculty of Science, Minia University, Minia, 61519, Egypt","institution_ids":["https://openalex.org/I89466785"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5004240453","display_name":"Ra\u00fal Jos\u00e9 Mart\u00edn-Palma","orcid":"https://orcid.org/0000-0003-3434-8331","observed_orcids":["https://orcid.org/0000-0003-3434-8331"]},"institutions":[{"id":"https://openalex.org/I63634437","display_name":"Universidad Aut\u00f3noma de Madrid","ror":"https://ror.org/01cby8j38","country_code":"ES","type":"education","lineage":["https://openalex.org/I63634437"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"R. J. Mart\u03afn-Palma","raw_affiliation_strings":["Departamento de F\u00edsica Aplicada and Instituto Universitario de Ciencia de Materiales \u201cNicol\u00b4as Cabrera\u201d (INC), Universidad Aut\u00f3noma de Madrid, Campus de Cantoblanco, 28049, Madrid, Spain"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Departamento de F\u00edsica Aplicada and Instituto Universitario de Ciencia de Materiales \u201cNicol\u00b4as Cabrera\u201d (INC), Universidad Aut\u00f3noma de Madrid, Campus de Cantoblanco, 28049, Madrid, Spain","institution_ids":["https://openalex.org/I63634437"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066485919","display_name":"Ahmed Slimani","orcid":"https://orcid.org/0000-0002-4303-4169","observed_orcids":["https://orcid.org/0000-0002-4303-4169"]},"institutions":[{"id":"https://openalex.org/I4210141120","display_name":"Sorbonne University Abu Dhabi","ror":"https://ror.org/03e1ymy32","country_code":"AE","type":"education","lineage":["https://openalex.org/I4210141120"]}],"countries":["AE"],"is_corresponding":false,"raw_author_name":"Ahmed Slimani","raw_affiliation_strings":["Sciences and Engineering Department, Sorbonne University Abu Dhabi, Al Reem Island, P.O. Box 38044, Abu Dhabi, UAE"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Sciences and Engineering Department, Sorbonne University Abu Dhabi, Al Reem Island, P.O. Box 38044, Abu Dhabi, UAE","institution_ids":["https://openalex.org/I4210141120"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5113132385","display_name":"Omayma Amorri","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I68916915","display_name":"University of Gab\u00e8s","ror":"https://ror.org/022efad20","country_code":"TN","type":"education","lineage":["https://openalex.org/I68916915"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"O. Amorri","raw_affiliation_strings":["Laboratory of Physics of Materials and Nanomaterials Applied to the Environment, Faculty of Sciences of Gabes, University of Gabes, 6079, Gabes, Tunisia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Physics of Materials and Nanomaterials Applied to the Environment, Faculty of Sciences of Gabes, University of Gabes, 6079, Gabes, Tunisia","institution_ids":["https://openalex.org/I68916915"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5137889030","display_name":"F. Tiss","orcid":null,"observed_orcids":[]},"institutions":[{"id":"https://openalex.org/I68916915","display_name":"University of Gab\u00e8s","ror":"https://ror.org/022efad20","country_code":"TN","type":"education","lineage":["https://openalex.org/I68916915"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"F. Tiss","raw_affiliation_strings":["Laboratory of Physics of Materials and Nanomaterials Applied to the Environment, Faculty of Sciences of Gabes, University of Gabes, 6079, Gabes, Tunisia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Physics of Materials and Nanomaterials Applied to the Environment, Faculty of Sciences of Gabes, University of Gabes, 6079, Gabes, Tunisia","institution_ids":["https://openalex.org/I68916915"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027801193","display_name":"K. Khirouni","orcid":"https://orcid.org/0000-0001-8310-1621","observed_orcids":["https://orcid.org/0000-0001-8310-1621"]},"institutions":[{"id":"https://openalex.org/I68916915","display_name":"University of Gab\u00e8s","ror":"https://ror.org/022efad20","country_code":"TN","type":"education","lineage":["https://openalex.org/I68916915"]}],"countries":["TN"],"is_corresponding":true,"raw_author_name":"K. Khirouni","raw_affiliation_strings":["Laboratory of Physics of Materials and Nanomaterials Applied to the Environment, Faculty of Sciences of Gabes, University of Gabes, 6079, Gabes, Tunisia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Physics of Materials and Nanomaterials Applied to the Environment, Faculty of Sciences of Gabes, University of Gabes, 6079, Gabes, Tunisia","institution_ids":["https://openalex.org/I68916915"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5011729230","display_name":"Essebti Dhahri","orcid":"https://orcid.org/0000-0002-6919-8778","observed_orcids":["https://orcid.org/0000-0002-6919-8778","https://orcid.org/0000-0002-0277-0223","https://orcid.org/0000-0003-2363-6792"]},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]},{"id":"https://openalex.org/I4405252705","display_name":"Faculty of Sciences of Sfax","ror":"https://ror.org/01thp0k37","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784","https://openalex.org/I4405252705"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"E. Dhahri","raw_affiliation_strings":["Laboratory of Applied Physics, Faculty of Sciences, University of Sfax, Sfax, Tunisia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratory of Applied Physics, Faculty of Sciences, University of Sfax, Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784","https://openalex.org/I4405252705"]}]}],"institutions":[],"countries_distinct_count":4,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5027801193"],"corresponding_institution_ids":["https://openalex.org/I68916915"],"apc_list":{"value":3990,"currency":"USD","value_usd":3990},"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.22881183,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"37","issue":"30","first_page":"2240","last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.2849000096321106,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10090","display_name":"ZnO doping and properties","score":0.2849000096321106,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10922","display_name":"Magnetic Properties and Synthesis of Ferrites","score":0.2709999978542328,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11853","display_name":"Semiconductor materials and interfaces","score":0.12099999934434891,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/thin-films","display_name":"thin films","score":0.8370000123977661},{"id":"https://openalex.org/keywords/spray-pyrolysis","display_name":"spray pyrolysis","score":0.9269999861717224},{"id":"https://openalex.org/keywords/spinel-structure","display_name":"spinel structure","score":0.828000009059906},{"id":"https://openalex.org/keywords/annealing-temperature","display_name":"annealing temperature","score":0.9879999756813049},{"id":"https://openalex.org/keywords/optical-band-gap","display_name":"optical band gap","score":0.8259999752044678},{"id":"https://openalex.org/keywords/electrical-properties","display_name":"electrical properties","score":0.5239999890327454},{"id":"https://openalex.org/keywords/rectifying-behavior","display_name":"rectifying behavior","score":0.7239999771118164},{"id":"https://openalex.org/keywords/ideality-factor","display_name":"ideality factor","score":0.8709999918937683},{"id":"https://openalex.org/keywords/optoelectronic-materials","display_name":"optoelectronic materials","score":0.8830000162124634}],"concepts":[{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.8090999722480774},{"id":"https://openalex.org/C19067145","wikidata":"https://www.wikidata.org/wiki/Q1137203","display_name":"Thin film","level":2,"score":0.7185999751091003},{"id":"https://openalex.org/C2777855556","wikidata":"https://www.wikidata.org/wiki/Q4339544","display_name":"Annealing (glass)","level":2,"score":0.7050999999046326},{"id":"https://openalex.org/C2779870107","wikidata":"https://www.wikidata.org/wiki/Q43010","display_name":"Quartz","level":2,"score":0.6222000122070312},{"id":"https://openalex.org/C2776230739","wikidata":"https://www.wikidata.org/wiki/Q191310","display_name":"Spinel","level":2,"score":0.5396000146865845},{"id":"https://openalex.org/C181966813","wikidata":"https://www.wikidata.org/wiki/Q806352","display_name":"Band gap","level":2,"score":0.5189999938011169},{"id":"https://openalex.org/C2988664670","wikidata":"https://www.wikidata.org/wiki/Q505668","display_name":"Spray pyrolysis","level":3,"score":0.5012999773025513},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4717000126838684},{"id":"https://openalex.org/C2779441425","wikidata":"https://www.wikidata.org/wiki/Q2122463","display_name":"Fused quartz","level":3,"score":0.4090999960899353},{"id":"https://openalex.org/C79794668","wikidata":"https://www.wikidata.org/wiki/Q1616270","display_name":"Heterojunction","level":2,"score":0.4072999954223633},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.40639999508857727},{"id":"https://openalex.org/C2780841128","wikidata":"https://www.wikidata.org/wiki/Q5073781","display_name":"Characterization (materials science)","level":2,"score":0.39590001106262207},{"id":"https://openalex.org/C119824511","wikidata":"https://www.wikidata.org/wiki/Q13553575","display_name":"Absorption spectroscopy","level":2,"score":0.3869999945163727},{"id":"https://openalex.org/C160892712","wikidata":"https://www.wikidata.org/wiki/Q901559","display_name":"Fourier transform infrared spectroscopy","level":2,"score":0.3603000044822693},{"id":"https://openalex.org/C69990965","wikidata":"https://www.wikidata.org/wiki/Q65402698","display_name":"Electrical resistivity and conductivity","level":2,"score":0.3571000099182129},{"id":"https://openalex.org/C125287762","wikidata":"https://www.wikidata.org/wiki/Q1758948","display_name":"Absorption (acoustics)","level":2,"score":0.3564999997615814},{"id":"https://openalex.org/C199289684","wikidata":"https://www.wikidata.org/wiki/Q83353","display_name":"Mineralogy","level":1,"score":0.334199994802475},{"id":"https://openalex.org/C113196181","wikidata":"https://www.wikidata.org/wiki/Q485223","display_name":"Analytical Chemistry (journal)","level":2,"score":0.3163999915122986},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.28380000591278076},{"id":"https://openalex.org/C2779667780","wikidata":"https://www.wikidata.org/wiki/Q18206302","display_name":"Crystalline silicon","level":3,"score":0.2793000042438507}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1007/s10854-026-18638-2","doi":"https://doi.org/10.1007/s10854-026-18638-2","is_oa":false,"landing_page_url":"https://doi.org/10.1007/s10854-026-18638-2","pdf_url":null,"source":{"id":"https://openalex.org/S189509794","display_name":"Journal of Materials Science Materials in Electronics","issn_l":"0957-4522","issn":["0957-4522","1573-482X"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["cwts-core","dongbi-d","jufo-1","norway-1","poland-70","russia-white-list-1"],"host_organization":"https://openalex.org/P4310319900","host_organization_name":"Springer Science+Business Media","host_organization_lineage":["https://openalex.org/P4310319900","https://openalex.org/P4310319965"],"host_organization_lineage_names":["Springer Science+Business Media","Springer Nature"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"Journal of Materials Science: Materials in Electronics","raw_type":"journal-article"},{"id":"doi:10.21203/rs.3.rs-9681319/v1","doi":"https://doi.org/10.21203/rs.3.rs-9681319/v1","is_oa":true,"landing_page_url":"https://doi.org/10.21203/rs.3.rs-9681319/v1","pdf_url":"https://www.researchsquare.com/article/rs-9681319/latest.pdf","source":{"id":"https://openalex.org/S4306525896","display_name":"Research Square","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"Research Square","raw_type":"posted-content"},{"id":"pmh:oai:HAL:hal-05834178v1","doi":null,"is_oa":false,"landing_page_url":"https://hal.science/hal-05834178","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I4405252976","host_organization_name":"Centre pour la Communication Scientifique Directe","host_organization_lineage":["https://openalex.org/I4405252976"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Journal of Materials Science: Materials in Electronics, 2026, 37 (30), pp.2240. ⟨10.1007/s10854-026-18638-2⟩","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.21203/rs.3.rs-9681319/v1","doi":"https://doi.org/10.21203/rs.3.rs-9681319/v1","is_oa":true,"landing_page_url":"https://doi.org/10.21203/rs.3.rs-9681319/v1","pdf_url":"https://www.researchsquare.com/article/rs-9681319/latest.pdf","source":{"id":"https://openalex.org/S4306525896","display_name":"Research Square","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":"acceptedVersion","is_accepted":true,"is_published":false,"raw_source_name":"Research Square","raw_type":"posted-content"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W7163555475.pdf","grobid_xml":"https://content.openalex.org/works/W7163555475.grobid-xml"},"referenced_works_count":47,"referenced_works":["https://openalex.org/W242261655","https://openalex.org/W347710458","https://openalex.org/W1967074837","https://openalex.org/W1976146517","https://openalex.org/W1990761838","https://openalex.org/W1996512654","https://openalex.org/W2002684493","https://openalex.org/W2014585115","https://openalex.org/W2016613982","https://openalex.org/W2018658251","https://openalex.org/W2050028440","https://openalex.org/W2054214286","https://openalex.org/W2069591696","https://openalex.org/W2083997188","https://openalex.org/W2091861150","https://openalex.org/W2101966673","https://openalex.org/W2573412306","https://openalex.org/W2591938283","https://openalex.org/W2736448419","https://openalex.org/W2789990985","https://openalex.org/W2790425330","https://openalex.org/W2888931219","https://openalex.org/W2995274993","https://openalex.org/W3008648585","https://openalex.org/W3082432206","https://openalex.org/W3091339504","https://openalex.org/W3109690503","https://openalex.org/W3110704407","https://openalex.org/W3150339287","https://openalex.org/W3201094435","https://openalex.org/W3202413961","https://openalex.org/W4224256056","https://openalex.org/W4281256860","https://openalex.org/W4283373301","https://openalex.org/W4320922088","https://openalex.org/W4360796986","https://openalex.org/W4403379928","https://openalex.org/W4403996522","https://openalex.org/W4405024025","https://openalex.org/W4407450750","https://openalex.org/W4409726256","https://openalex.org/W4409902098","https://openalex.org/W4410079235","https://openalex.org/W4410314847","https://openalex.org/W7134953018","https://openalex.org/W7196956791","https://openalex.org/W7213043435"],"related_works":["https://openalex.org/W3089952129","https://openalex.org/W2943064790","https://openalex.org/W2198211025","https://openalex.org/W4403483714","https://openalex.org/W2016444724","https://openalex.org/W2952047183","https://openalex.org/W1984763268","https://openalex.org/W2141755673","https://openalex.org/W4296266678","https://openalex.org/W4415783716"],"abstract_inverted_index":{"Abstract":[0],"Thin":[1],"films":[2],"of":[3,25,42,76,83,117],"Cd":[4,85],"0.7":[5,86],"Fe":[6,87],"2.3":[7,88],"O":[8,89],"4":[9,90],"were":[10],"deposited":[11],"by":[12,49],"spray":[13],"pyrolysis":[14],"on":[15,28],"glass,":[16],"quartz,":[17],"and":[18,22,32,78,122],"n-type":[19],"silicon":[20],"substrates,":[21],"the":[23,40,58,74,84,97,115],"effect":[24],"annealing":[26],"temperature":[27,106],"their":[29],"structural,":[30],"optical,":[31],"electrical":[33],"properties":[34],"was":[35],"investigated.":[36],"XRD":[37],"results":[38,113],"confirm":[39],"formation":[41],"a":[43,62],"spinel":[44],"structure":[45],"after":[46],"annealing,":[47],"accompanied":[48],"improved":[50,109],"crystallinity.":[51],"Optical":[52],"measurements":[53],"reveal":[54],"strong":[55],"absorption":[56],"in":[57],"UV\u2013visible":[59],"range,":[60],"with":[61,96],"band":[63],"gap":[64],"varying":[65],"from":[66,101],"3.14":[67],"to":[68,103],"3.85":[69],"eV.":[70],"FTIR":[71],"analysis":[72],"confirms":[73],"presence":[75],"Cd\u2013O":[77],"Fe\u2013O":[79],"bonds.":[80],"Electrical":[81],"characterization":[82],"/n-Si":[91],"heterostructure":[92],"shows":[93],"rectifying":[94],"behavior,":[95],"ideality":[98],"factor":[99],"decreasing":[100],"6":[102],"1":[104],"as":[105],"increases,":[107],"indicating":[108],"carrier":[110],"transport.":[111],"These":[112],"demonstrate":[114],"potential":[116],"this":[118],"material":[119],"for":[120],"electronic":[121],"optoelectronic":[123],"applications.":[124]},"counts_by_year":[],"updated_date":"2026-11-05T12:25:35.769452","created_date":"2026-06-05T00:00:00"}