{"id":"https://openalex.org/W7159792913","doi":"https://doi.org/10.5281/zenodo.19987713","title":"Comparison on RF Power Measurements Using Automatic Power Measurement Software","display_name":"Comparison on RF Power Measurements Using Automatic Power Measurement Software","publication_year":2026,"publication_date":"2026-03-04","ids":{"openalex":"https://openalex.org/W7159792913","doi":"https://doi.org/10.5281/zenodo.19987713"},"language":"en","primary_location":{"id":"doi:10.5281/zenodo.19987713","doi":"https://doi.org/10.5281/zenodo.19987713","is_oa":true,"landing_page_url":"https://doi.org/10.5281/zenodo.19987713","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Report"},"volume":null,"type":"report","is_traditional":false,"indexed_in":["datacite"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://doi.org/10.5281/zenodo.19987713","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5005868243","display_name":"Aliye Kartal Do\u011fan","orcid":"https://orcid.org/0000-0002-8674-1592","observed_orcids":["https://orcid.org/0000-0002-8674-1592"]},"institutions":[{"id":"https://openalex.org/I4210124062","display_name":"T\u00fcbitak National Metrology Institute","ror":"https://ror.org/02zcjdk53","country_code":"TR","type":"facility","lineage":["https://openalex.org/I4210124062"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Kartal Dogan, Aliye","raw_affiliation_strings":["T\u00fcbitak National Metrology Institute"],"raw_orcid":"https://orcid.org/0000-0002-8674-1592","affiliations":[{"raw_affiliation_string":"T\u00fcbitak National Metrology Institute","institution_ids":["https://openalex.org/I4210124062"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5118723419","display_name":"Marko Berginc","orcid":"https://orcid.org/0000-0001-6513-4059","observed_orcids":["https://orcid.org/0000-0001-6513-4059"]},"institutions":[{"id":"https://openalex.org/I4210107811","display_name":"Slovenian Institute of Quality and Metrology","ror":"https://ror.org/02gmdvw97","country_code":"SI","type":"facility","lineage":["https://openalex.org/I4210107811"]}],"countries":["SI"],"is_corresponding":false,"raw_author_name":"Berginc, Marko","raw_affiliation_strings":["Slovenian Institute of Quality and Metrology"],"raw_orcid":"https://orcid.org/0000-0001-6513-4059","affiliations":[{"raw_affiliation_string":"Slovenian Institute of Quality and Metrology","institution_ids":["https://openalex.org/I4210107811"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5135008514","display_name":"Emre \u00c7etin","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Cetin, Emre","raw_affiliation_strings":["SPARK Kalibrasyon, Turkiye"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"SPARK Kalibrasyon, Turkiye","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030235624","display_name":"Erkan Danac\u0131","orcid":"https://orcid.org/0000-0001-6358-8807","observed_orcids":["https://orcid.org/0000-0001-6358-8807"]},"institutions":[{"id":"https://openalex.org/I4210124062","display_name":"T\u00fcbitak National Metrology Institute","ror":"https://ror.org/02zcjdk53","country_code":"TR","type":"facility","lineage":["https://openalex.org/I4210124062"]}],"countries":["TR"],"is_corresponding":false,"raw_author_name":"Danac\u0131, Erkan","raw_affiliation_strings":["T\u00fcbitak National Metrology Institute"],"raw_orcid":"https://orcid.org/0000-0001-6358-8807","affiliations":[{"raw_affiliation_string":"T\u00fcbitak National Metrology Institute","institution_ids":["https://openalex.org/I4210124062"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003577733","display_name":"Jan Grajciar","orcid":"https://orcid.org/0000-0003-3111-9349","observed_orcids":["https://orcid.org/0000-0003-3111-9349"]},"institutions":[{"id":"https://openalex.org/I4210124866","display_name":"\u010cesk\u00fd metrologick\u00fd institut","ror":"https://ror.org/02m5haa59","country_code":"CZ","type":"government","lineage":["https://openalex.org/I4210124866"]}],"countries":["CZ"],"is_corresponding":false,"raw_author_name":"Grajciar, Jan","raw_affiliation_strings":["Czech metrology institute"],"raw_orcid":"https://orcid.org/0000-0003-3111-9349","affiliations":[{"raw_affiliation_string":"Czech metrology institute","institution_ids":["https://openalex.org/I4210124866"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085535866","display_name":"Torsten Lippert","orcid":"https://orcid.org/0000-0001-7367-9139","observed_orcids":["https://orcid.org/0000-0001-7367-9139"]},"institutions":[{"id":"https://openalex.org/I4387155293","display_name":"Trescal","ror":"https://ror.org/02se4yf44","country_code":"DK","type":"company","lineage":["https://openalex.org/I4387155293"]}],"countries":["DK"],"is_corresponding":false,"raw_author_name":"Lippert, Torsten","raw_affiliation_strings":["Trescal"],"raw_orcid":"https://orcid.org/0000-0001-7367-9139","affiliations":[{"raw_affiliation_string":"Trescal","institution_ids":["https://openalex.org/I4387155293"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076814681","display_name":"Sean Prendergast","orcid":"https://orcid.org/0009-0007-9238-1283","observed_orcids":["https://orcid.org/0009-0007-9238-1283"]},"institutions":[{"id":"https://openalex.org/I4387156077","display_name":"National Standards Authority of Ireland","ror":"https://ror.org/04h30wa73","country_code":"IE","type":"government","lineage":["https://openalex.org/I4387156077"]}],"countries":["IE"],"is_corresponding":false,"raw_author_name":"Prendergast, Sean","raw_affiliation_strings":["National Standards Authority of Ireland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"National Standards Authority of Ireland","institution_ids":["https://openalex.org/I4387156077"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5066819425","display_name":"Osman Sibonjic","orcid":"https://orcid.org/0009-0004-6545-3841","observed_orcids":["https://orcid.org/0009-0004-6545-3841"]},"institutions":[{"id":"https://openalex.org/I4210094856","display_name":"Institute of Metrology of Bosnia and Herzegovina","ror":"https://ror.org/00h90tt32","country_code":"BA","type":"facility","lineage":["https://openalex.org/I4210094856"]}],"countries":["BA"],"is_corresponding":false,"raw_author_name":"Sibonjic, Osman","raw_affiliation_strings":["Institute of Metrology of Bosnia and Herzegovina"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Metrology of Bosnia and Herzegovina","institution_ids":["https://openalex.org/I4210094856"]}]}],"institutions":[],"countries_distinct_count":6,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":null,"last_page":null},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.6133000254631042,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12300","display_name":"Advanced Electrical Measurement Techniques","score":0.6133000254631042,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11890","display_name":"Scientific Measurement and Uncertainty Evaluation","score":0.13609999418258667,"subfield":{"id":"https://openalex.org/subfields/3105","display_name":"Instrumentation"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11607","display_name":"Microwave and Dielectric Measurement Techniques","score":0.13439999520778656,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/rf-power-measurement","display_name":"RF power measurement","score":0.9980000257492065},{"id":"https://openalex.org/keywords/interlaboratory-comparison","display_name":"interlaboratory comparison","score":0.921999990940094},{"id":"https://openalex.org/keywords/signal-generator","display_name":"signal generator","score":0.7710000276565552},{"id":"https://openalex.org/keywords/microwave-metrology","display_name":"microwave metrology","score":0.9259999990463257}],"concepts":[{"id":"https://openalex.org/C195766429","wikidata":"https://www.wikidata.org/wiki/Q394","display_name":"Metrology","level":2,"score":0.7143999934196472},{"id":"https://openalex.org/C196054291","wikidata":"https://www.wikidata.org/wiki/Q7276624","display_name":"RF power amplifier","level":4,"score":0.5982999801635742},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.5863999724388123},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5720000267028809},{"id":"https://openalex.org/C207912722","wikidata":"https://www.wikidata.org/wiki/Q1259123","display_name":"Signal generator","level":3,"score":0.5598000288009644},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.5181999802589417},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5073999762535095},{"id":"https://openalex.org/C74064498","wikidata":"https://www.wikidata.org/wiki/Q3396184","display_name":"Radio frequency","level":2,"score":0.49959999322891235},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.4812999963760376},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4287000000476837},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40959998965263367},{"id":"https://openalex.org/C44838205","wikidata":"https://www.wikidata.org/wiki/Q127995","display_name":"Microwave","level":2,"score":0.4041999876499176},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3939000070095062},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.39320001006126404},{"id":"https://openalex.org/C37649242","wikidata":"https://www.wikidata.org/wiki/Q932268","display_name":"System of measurement","level":2,"score":0.37380000948905945},{"id":"https://openalex.org/C19619285","wikidata":"https://www.wikidata.org/wiki/Q196372","display_name":"Observational error","level":2,"score":0.35199999809265137},{"id":"https://openalex.org/C64424096","wikidata":"https://www.wikidata.org/wiki/Q750454","display_name":"Power factor","level":3,"score":0.3370000123977661},{"id":"https://openalex.org/C161893790","wikidata":"https://www.wikidata.org/wiki/Q7276619","display_name":"RF probe","level":5,"score":0.3019999861717224},{"id":"https://openalex.org/C2989149083","wikidata":"https://www.wikidata.org/wiki/Q7935121","display_name":"Virtual instrument","level":3,"score":0.2971999943256378},{"id":"https://openalex.org/C202799725","wikidata":"https://www.wikidata.org/wiki/Q272035","display_name":"Accuracy and precision","level":2,"score":0.29420000314712524},{"id":"https://openalex.org/C108755667","wikidata":"https://www.wikidata.org/wiki/Q1930258","display_name":"AC power","level":3,"score":0.27630001306533813},{"id":"https://openalex.org/C2986567525","wikidata":"https://www.wikidata.org/wiki/Q747066","display_name":"Microwave power","level":3,"score":0.2563999891281128},{"id":"https://openalex.org/C189714311","wikidata":"https://www.wikidata.org/wiki/Q1530371","display_name":"Common-mode signal","level":4,"score":0.25279998779296875},{"id":"https://openalex.org/C104267543","wikidata":"https://www.wikidata.org/wiki/Q208163","display_name":"Signal processing","level":3,"score":0.25220000743865967},{"id":"https://openalex.org/C2983886724","wikidata":"https://www.wikidata.org/wiki/Q4262","display_name":"Radio signal","level":3,"score":0.25029999017715454}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.5281/zenodo.19987713","doi":"https://doi.org/10.5281/zenodo.19987713","is_oa":true,"landing_page_url":"https://doi.org/10.5281/zenodo.19987713","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Report"},{"id":"doi:10.5281/zenodo.19987714","doi":"https://doi.org/10.5281/zenodo.19987714","is_oa":true,"landing_page_url":"https://doi.org/10.5281/zenodo.19987714","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Report"}],"best_oa_location":{"id":"doi:10.5281/zenodo.19987713","doi":"https://doi.org/10.5281/zenodo.19987713","is_oa":true,"landing_page_url":"https://doi.org/10.5281/zenodo.19987713","pdf_url":null,"source":{"id":"https://openalex.org/S4306400562","display_name":"Zenodo (CERN European Organization for Nuclear Research)","issn_l":null,"issn":null,"is_oa":true,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":"https://openalex.org/I67311998","host_organization_name":"European Organization for Nuclear Research","host_organization_lineage":["https://openalex.org/I67311998"],"host_organization_lineage_names":[],"type":"repository"},"license":"cc-by","license_id":"https://openalex.org/licenses/cc-by","version":null,"is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":"Report"},"sustainable_development_goals":[],"study_designs":[],"awards":[{"id":"https://openalex.org/G8444179495","display_name":null,"funder_award_id":"22RPT04","funder_id":"https://openalex.org/F4320313458","funder_display_name":"European Association of National Metrology Institutes"}],"funders":[{"id":"https://openalex.org/F4320313458","display_name":"European Association of National Metrology Institutes","ror":"https://ror.org/03csrq586"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":0,"referenced_works":[],"related_works":["https://openalex.org/W7167545741","https://openalex.org/W7160255147","https://openalex.org/W4206630562","https://openalex.org/W1970090861","https://openalex.org/W2149929253","https://openalex.org/W2365335779","https://openalex.org/W4246444560","https://openalex.org/W2118082507","https://openalex.org/W7159823017","https://openalex.org/W3186741036"],"abstract_inverted_index":{"A":[0],"comparison":[1,29,47,78],"of":[2,19,33,37,89,133],"RF":[3,38,86],"power":[4,12,87,113],"measurement":[5,13],"using":[6],"a":[7],"signal":[8,72,91],"generator":[9,73,92],"and":[10,39,60,108,121,129],"automatic":[11],"was":[14,31,48,79,125],"planned":[15],"among":[16],"the":[17,20,34,53,63,71,75,84,90,131,134],"partners":[18],"EPM":[21],"(European":[22],"Partnership":[23],"on":[24],"Metrology)":[25],"project.":[26],"This":[27],"inter-laboratory":[28],"exercise":[30],"part":[32],"project":[35],"\u201cDevelopment":[36],"Microwave":[40],"Metrology":[41],"Capability":[42],"II\u201d":[43],"(22RPT04":[44],"\u2018RFMicrowave2\u2019).":[45],"The":[46,77,111],"conducted":[49],"in":[50],"accordance":[51],"with":[52],"Technical":[54],"Protocol":[55],"prepared":[56],"by":[57,62,82],"T\u00dcB\u0130TAK":[58,124],"UME":[59],"approved":[61],"participants.":[64],"Trescal":[65],"(Trescal":[66],"A/S)":[67],"from":[68],"Denmark":[69],"provided":[70],"for":[74,127],"comparison.":[76,135],"carried":[80],"out":[81],"measuring":[83],"absolute":[85],"output":[88],"at":[93],"six":[94],"frequencies":[95],"which":[96],"were":[97,116],"2":[98],"GHz,":[99,101,103,105,107],"5":[100],"8":[102],"12":[104],"15":[106],"18":[109],"GHz.":[110],"nominal":[112],"levels":[114],"used":[115],"10":[117],"dBm,":[118,120],"0":[119],"\u201310":[122],"dBm.":[123],"responsible":[126],"analyzing":[128],"reporting":[130],"results":[132]},"counts_by_year":[],"updated_date":"2026-10-28T10:33:24.094632","created_date":"2026-05-03T00:00:00"}