{"id":"https://openalex.org/W7133135607","doi":"https://doi.org/10.64751/j91scc98","title":"A SCHOLARLY EXAMINATION OF THE CONSTANCY AND LEAKAGE MODERATION IN A FULLY SELECTED ELEVENTRANSISTOR STATIC RANDOM-ACCESS MEMORY CELL","display_name":"A SCHOLARLY EXAMINATION OF THE CONSTANCY AND LEAKAGE MODERATION IN A FULLY SELECTED ELEVENTRANSISTOR STATIC RANDOM-ACCESS MEMORY CELL","publication_year":2026,"publication_date":"2026-02-28","ids":{"openalex":"https://openalex.org/W7133135607","doi":"https://doi.org/10.64751/j91scc98"},"language":"en","primary_location":{"id":"doi:10.64751/j91scc98","doi":"https://doi.org/10.64751/j91scc98","is_oa":true,"landing_page_url":"https://doi.org/10.64751/j91scc98","pdf_url":"https://zesterapublications.com/journals/index.php/ijaene/article/download/228/211","source":{"id":"https://openalex.org/S7407053632","display_name":"International Journal of AI Electronics and Nexus Energy","issn_l":"3070-0515","issn":["3070-0515"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of AI Electronics and Nexus Energy","raw_type":"journal-article"},"volume":null,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"hybrid","oa_url":"https://zesterapublications.com/journals/index.php/ijaene/article/download/228/211","any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5127767344","display_name":"P. NAVEEN TRINADH","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"P. NAVEEN TRINADH","raw_affiliation_strings":["2345 UG Students ,"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"2345 UG Students ,","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5127740681","display_name":"PILLI RAGA SRAVANTHI","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"PILLI RAGA SRAVANTHI","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"middle","author":{"id":"https://openalex.org/A5127760712","display_name":"NERUSU KONDALAMMA","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"NERUSU KONDALAMMA","raw_affiliation_strings":["OF ENGINEERING , GUDIVADA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"OF ENGINEERING , GUDIVADA","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5127770118","display_name":"BODDU LAKSHMI NAGA GOWRI","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"BODDU LAKSHMI NAGA GOWRI","raw_affiliation_strings":[],"raw_orcid":null,"affiliations":[]},{"author_position":"last","author":{"id":"https://openalex.org/A5127756687","display_name":"KUCHIPUDI BHAVANI","orcid":null,"observed_orcids":[]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"KUCHIPUDI BHAVANI","raw_affiliation_strings":["OF ENGINEERING , GUDIVADA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"OF ENGINEERING , GUDIVADA","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":0,"institutions_distinct_count":0,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":true,"cited_by_count":0,"citation_normalized_percentile":{"value":0.07441074,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"9","issue":"1","first_page":"18","last_page":"24"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.989300012588501,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.008200000040233135,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10502","display_name":"Advanced Memory and Neural Computing","score":0.0007999999797903001,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/read-disturb","display_name":"read disturb","score":0.7860000133514404},{"id":"https://openalex.org/keywords/bit-interleaving","display_name":"bit interleaving","score":0.7170000076293945},{"id":"https://openalex.org/keywords/low-voltage-operation","display_name":"low-voltage operation","score":0.8159999847412109},{"id":"https://openalex.org/keywords/bias-temperature-instability","display_name":"bias temperature instability","score":0.8109999895095825},{"id":"https://openalex.org/keywords/read-static-noise-margin","display_name":"read static noise margin","score":0.8709999918937683},{"id":"https://openalex.org/keywords/sram-reliability","display_name":"SRAM reliability","score":0.6930000185966492},{"id":"https://openalex.org/keywords/ripple-carry-adder","display_name":"ripple carry adder","score":0.8489999771118164},{"id":"https://openalex.org/keywords/kogge-stone-adder","display_name":"Kogge-Stone adder","score":0.9929999709129333},{"id":"https://openalex.org/keywords/brent-kung-adder","display_name":"Brent-Kung adder","score":0.9610000252723694},{"id":"https://openalex.org/keywords/arithmetic-circuits","display_name":"arithmetic circuits","score":0.3199999928474426}],"concepts":[{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.8446000218391418},{"id":"https://openalex.org/C164620267","wikidata":"https://www.wikidata.org/wiki/Q376953","display_name":"Adder","level":3,"score":0.7777000069618225},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.6912999749183655},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5672000050544739},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.548799991607666},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.54830002784729},{"id":"https://openalex.org/C179499742","wikidata":"https://www.wikidata.org/wiki/Q1324892","display_name":"Noise margin","level":4,"score":0.46639999747276306},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.46209999918937683},{"id":"https://openalex.org/C2779599953","wikidata":"https://www.wikidata.org/wiki/Q1776117","display_name":"Ripple","level":3,"score":0.43459999561309814},{"id":"https://openalex.org/C81843906","wikidata":"https://www.wikidata.org/wiki/Q173156","display_name":"Digital electronics","level":3,"score":0.3853999972343445},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.3734000027179718},{"id":"https://openalex.org/C2777042071","wikidata":"https://www.wikidata.org/wiki/Q6509304","display_name":"Leakage (economics)","level":2,"score":0.3732999861240387},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.3716999888420105},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.3671000003814697},{"id":"https://openalex.org/C2987719587","wikidata":"https://www.wikidata.org/wiki/Q1811428","display_name":"Leakage power","level":4,"score":0.3467000126838684},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3456999957561493},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.33250001072883606},{"id":"https://openalex.org/C2776638159","wikidata":"https://www.wikidata.org/wiki/Q18343761","display_name":"Memory cell","level":4,"score":0.32710000872612},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.3100999891757965},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3068999946117401},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.29440000653266907},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.2939000129699707},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2888999879360199},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.2793999910354614},{"id":"https://openalex.org/C117551214","wikidata":"https://www.wikidata.org/wiki/Q6692774","display_name":"Low-power electronics","level":4,"score":0.27129998803138733},{"id":"https://openalex.org/C124584101","wikidata":"https://www.wikidata.org/wiki/Q1053266","display_name":"Multiplier (economics)","level":2,"score":0.26440000534057617},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.2540999948978424}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.64751/j91scc98","doi":"https://doi.org/10.64751/j91scc98","is_oa":true,"landing_page_url":"https://doi.org/10.64751/j91scc98","pdf_url":"https://zesterapublications.com/journals/index.php/ijaene/article/download/228/211","source":{"id":"https://openalex.org/S7407053632","display_name":"International Journal of AI Electronics and Nexus Energy","issn_l":"3070-0515","issn":["3070-0515"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of AI Electronics and Nexus Energy","raw_type":"journal-article"},{"id":"pmh:oai:ojs2.zesterapublications.com:article/228","doi":null,"is_oa":true,"landing_page_url":"https://zesterapublications.com/journals/index.php/ijaene/article/view/228","pdf_url":null,"source":{"id":"https://openalex.org/S7407053632","display_name":"International Journal of AI Electronics and Nexus Energy","issn_l":"3070-0515","issn":["3070-0515"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"3070-0515","raw_type":"info:eu-repo/semantics/article"}],"best_oa_location":{"id":"doi:10.64751/j91scc98","doi":"https://doi.org/10.64751/j91scc98","is_oa":true,"landing_page_url":"https://doi.org/10.64751/j91scc98","pdf_url":"https://zesterapublications.com/journals/index.php/ijaene/article/download/228/211","source":{"id":"https://openalex.org/S7407053632","display_name":"International Journal of AI Electronics and Nexus Energy","issn_l":"3070-0515","issn":["3070-0515"],"is_oa":false,"is_in_doaj":false,"is_core":false,"listed_in":[],"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"journal"},"license":"cc-by-nc-nd","license_id":"https://openalex.org/licenses/cc-by-nc-nd","version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"International Journal of AI Electronics and Nexus Energy","raw_type":"journal-article"},"sustainable_development_goals":[],"study_designs":[],"awards":[],"funders":[],"has_content":{"pdf":true,"grobid_xml":true},"content_urls":{"pdf":"https://content.openalex.org/works/W7133135607.pdf","grobid_xml":"https://content.openalex.org/works/W7133135607.grobid-xml"},"referenced_works_count":1,"referenced_works":["https://openalex.org/W4406677004"],"related_works":["https://openalex.org/W2804691385","https://openalex.org/W7201984456","https://openalex.org/W2794137945","https://openalex.org/W4399829483","https://openalex.org/W4400234335","https://openalex.org/W3131820532","https://openalex.org/W4283812833","https://openalex.org/W2945938935","https://openalex.org/W2951246649","https://openalex.org/W3005076390"],"abstract_inverted_index":{"This":[0],"study":[1,105],"presents":[2],"two":[3],"novel":[4],"11T":[5,78],"SRAM":[6,63,119,157],"cell":[7,67,82],"architectures,":[8],"11T-1":[9,66],"and":[10,26,33,57,80,128,176,189],"11T-2,":[11],"designed":[12],"to":[13,29,144],"be":[14],"entirely":[15],"half-select-free":[16],"for":[17],"efficient":[18],"bit":[19],"interleaving.":[20],"Both":[21],"architectures":[22],"employ":[23],"powercutoff":[24,91],"mechanisms":[25],"write-\u20180\u2019/\u20181\u2019-only":[27],"strategies":[28],"mitigate":[30],"Read":[31,134],"disturb":[32,36],"Write":[34],"half-select":[35],"issues,":[37],"while":[38],"simultaneously":[39],"enhancing":[40],"write-ability.":[41],"At":[42],"a":[43,69],"supply":[44],"voltage":[45],"of":[46,60,109,139,152],"0.9":[47],"V,":[48],"the":[49,55,85,104,107,150],"proposed":[50],"cells":[51,141],"achieve":[52],"approximately":[53],"twice":[54],"read":[56],"write":[58,71],"yield":[59],"conventional":[61],"6T":[62],"cells.":[64],"The":[65,133,159],"demonstrates":[68],"mean":[70],"margin":[72],"(WM)":[73],"13.6%":[74],"higher":[75],"than":[76],"existing":[77],"designs,":[79],"neither":[81],"suffers":[83],"from":[84],"floatingnode":[86],"problem":[87],"associated":[88],"with":[89],"previous":[90],"implementations.":[92],"Monte":[93],"Carlo":[94],"simulations":[95],"confirm":[96],"robust":[97],"low-voltage":[98],"operation":[99],"without":[100],"auxiliary":[101],"circuits.":[102],"Furthermore,":[103],"examines":[106],"impact":[108],"32":[110],"nm":[111],"high-k":[112],"metal":[113],"gate":[114,185],"CMOS":[115],"technology":[116],"variations":[117],"on":[118,123,131],"reliability,":[120],"particularly":[121],"focusing":[122],"Bias":[124],"Temperature":[125],"Instability":[126],"(BTI)":[127],"its":[129],"effect":[130],"performance.":[132],"Static":[135],"Noise":[136],"Margin":[137],"(RSNM)":[138],"all":[140],"is":[142],"observed":[143],"decrease":[145],"under":[146],"static":[147],"stress,":[148],"emphasizing":[149],"importance":[151],"stability":[153],"considerations":[154],"in":[155,182],"advanced":[156],"designs.":[158],"findings":[160],"are":[161],"validated":[162],"across":[163],"various":[164],"digital":[165],"arithmetic":[166],"circuits":[167],"including":[168],"Ripple":[169],"Carry":[170],"Adders":[171,174,178],"(RCA),":[172],"Kogge-Stone":[173],"(KSA),":[175],"BrentKung":[177],"(BKA),":[179],"highlighting":[180],"improvements":[181],"transistor":[183],"count,":[184,186],"power":[187],"consumption,":[188],"delay.":[190]},"counts_by_year":[],"updated_date":"2026-11-04T10:54:05.112534","created_date":"2026-03-02T00:00:00"}