{"id":"https://openalex.org/W7124461995","doi":"https://doi.org/10.1109/tim.2026.3654751","title":"Online Monitoring Method of Turn-to-Turn Short-Circuit Faults in Dry-Type Reactors Based on Phase Angle Difference","display_name":"Online Monitoring Method of Turn-to-Turn Short-Circuit Faults in Dry-Type Reactors Based on Phase Angle Difference","publication_year":2026,"publication_date":"2026-01-01","ids":{"openalex":"https://openalex.org/W7124461995","doi":"https://doi.org/10.1109/tim.2026.3654751"},"language":"en","primary_location":{"id":"doi:10.1109/tim.2026.3654751","doi":"https://doi.org/10.1109/tim.2026.3654751","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2026.3654751","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-3","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"},"parent_works":[],"lineage":["https://openalex.org/W7124461995"],"child_works_count":0,"type":"article","is_traditional":true,"indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110948163","display_name":"Liang Zou","orcid":"https://orcid.org/0000-0002-9523-3020","observed_orcids":["https://orcid.org/0000-0002-9523-3020"]},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Liang Zou","raw_affiliation_strings":["School of Electrical Engineering, Shandong University, Jinan, China"],"raw_orcid":"https://orcid.org/0000-0002-9523-3020","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5006133101","display_name":"Jiafei Liu","orcid":"https://orcid.org/0000-0001-5678-4893","observed_orcids":["https://orcid.org/0000-0001-5678-4893","https://orcid.org/0009-0004-7236-1849","https://orcid.org/0000-0003-4951-6908"]},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiafei Liu","raw_affiliation_strings":["School of Electrical Engineering, Shandong University, Jinan, China"],"raw_orcid":"https://orcid.org/0009-0004-7236-1849","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025310539","display_name":"Zhiyun Han","orcid":"https://orcid.org/0000-0002-4366-5817","observed_orcids":["https://orcid.org/0000-0002-4366-5817"]},"institutions":[{"id":"https://openalex.org/I154099455","display_name":"Shandong University","ror":"https://ror.org/0207yh398","country_code":"CN","type":"education","lineage":["https://openalex.org/I154099455"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiyun Han","raw_affiliation_strings":["School of Electrical Engineering, Shandong University, Jinan, China"],"raw_orcid":"https://orcid.org/0000-0002-4366-5817","affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Shandong University, Jinan, China","institution_ids":["https://openalex.org/I154099455"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5042702278","display_name":"Wenqi Wang","orcid":"https://orcid.org/0009-0000-2449-9633","observed_orcids":["https://orcid.org/0009-0000-2449-9633"]},"institutions":[{"id":"https://openalex.org/I176808543","display_name":"Liaoning Technical University","ror":"https://ror.org/01n2bd587","country_code":"CN","type":"education","lineage":["https://openalex.org/I176808543"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wenqi Wang","raw_affiliation_strings":["School of Electrical and Control Engineering, Liaoning Technical University, Huludao, China"],"raw_orcid":"https://orcid.org/0009-0000-2449-9633","affiliations":[{"raw_affiliation_string":"School of Electrical and Control Engineering, Liaoning Technical University, Huludao, China","institution_ids":["https://openalex.org/I176808543"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5123231531","display_name":"Kun Guo","orcid":"https://orcid.org/0009-0008-0060-7212","observed_orcids":["https://orcid.org/0009-0008-0060-7212"]},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Kun Guo","raw_affiliation_strings":["Corporation of Shandong Taikai Power Electronics Company Ltd., Taian, China"],"raw_orcid":"https://orcid.org/0009-0008-0060-7212","affiliations":[{"raw_affiliation_string":"Corporation of Shandong Taikai Power Electronics Company Ltd., Taian, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":{"value":2645,"currency":"USD","value_usd":2645},"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.0,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"75","issue":null,"first_page":"1","last_page":"11"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9785000085830688,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.9785000085830688,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10972","display_name":"Power Systems Fault Detection","score":0.008299999870359898,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.005200000014156103,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/phase-difference","display_name":"phase difference","score":0.8389999866485596},{"id":"https://openalex.org/keywords/insulation-breakdown","display_name":"insulation failure","score":0.6069999933242798},{"id":"https://openalex.org/keywords/fault-detection","display_name":"fault detection","score":0.5040000081062317},{"id":"https://openalex.org/keywords/winding-current","display_name":"winding current","score":0.38199999928474426},{"id":"https://openalex.org/keywords/distribution-network-reliability","display_name":"distribution network reliability","score":0.652999997138977},{"id":"https://openalex.org/keywords/online-monitoring","display_name":"online monitoring","score":0.5249999761581421}],"concepts":[{"id":"https://openalex.org/C30403606","wikidata":"https://www.wikidata.org/wiki/Q2981904","display_name":"Electromagnetic coil","level":2,"score":0.6618000268936157},{"id":"https://openalex.org/C170222088","wikidata":"https://www.wikidata.org/wiki/Q2059855","display_name":"Phase angle (astronomy)","level":2,"score":0.590399980545044},{"id":"https://openalex.org/C77019957","wikidata":"https://www.wikidata.org/wiki/Q2689057","display_name":"Dependability","level":2,"score":0.5310999751091003},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4975999891757965},{"id":"https://openalex.org/C44280652","wikidata":"https://www.wikidata.org/wiki/Q104837","display_name":"Phase (matter)","level":2,"score":0.46000000834465027},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.4383000135421753},{"id":"https://openalex.org/C2775936607","wikidata":"https://www.wikidata.org/wiki/Q466845","display_name":"Tracking (education)","level":2,"score":0.4296000003814697},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4239000082015991},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.4036000072956085},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3937999904155731},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3837999999523163},{"id":"https://openalex.org/C173871940","wikidata":"https://www.wikidata.org/wiki/Q471846","display_name":"Three-phase","level":3,"score":0.37299999594688416},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.3499999940395355},{"id":"https://openalex.org/C3017413879","wikidata":"https://www.wikidata.org/wiki/Q185553","display_name":"Phase difference","level":3,"score":0.34459999203681946},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3255999982357025},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.31610000133514404},{"id":"https://openalex.org/C24890656","wikidata":"https://www.wikidata.org/wiki/Q82811","display_name":"Acoustics","level":1,"score":0.31189998984336853},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.30970001220703125},{"id":"https://openalex.org/C116834253","wikidata":"https://www.wikidata.org/wiki/Q2039217","display_name":"Identification (biology)","level":2,"score":0.3034000098705292},{"id":"https://openalex.org/C168993435","wikidata":"https://www.wikidata.org/wiki/Q6501125","display_name":"Ground","level":2,"score":0.2971999943256378},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.2879999876022339},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.2791000008583069},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2741999924182892},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.2705000042915344},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.26989999413490295},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.2678999900817871},{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.2646999955177307},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.2637999951839447},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.2524999976158142},{"id":"https://openalex.org/C139676723","wikidata":"https://www.wikidata.org/wiki/Q1193832","display_name":"Sign (mathematics)","level":2,"score":0.2508000135421753}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/tim.2026.3654751","doi":"https://doi.org/10.1109/tim.2026.3654751","is_oa":false,"landing_page_url":"https://doi.org/10.1109/tim.2026.3654751","pdf_url":null,"source":{"id":"https://openalex.org/S10892749","display_name":"IEEE Transactions on Instrumentation and Measurement","issn_l":"0018-9456","issn":["0018-9456","1557-9662"],"is_oa":false,"is_in_doaj":false,"is_core":true,"listed_in":["anvur-scientific","cwts-core","dongbi-b","jufo-3","norway-1","poland-100","russia-white-list-1","vabb-shw"],"host_organization":"https://openalex.org/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https://openalex.org/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Instrumentation and Measurement","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.75,"id":"https://metadata.un.org/sdg/7","display_name":"Affordable and clean energy"},{"score":0.6773999929428101,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"study_designs":[],"awards":[{"id":"https://openalex.org/G2521644382","display_name":null,"funder_award_id":"U24B2092","funder_id":"https://openalex.org/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1546436210","https://openalex.org/W1830883996","https://openalex.org/W1977607524","https://openalex.org/W2038940896","https://openalex.org/W2055421572","https://openalex.org/W2080425874","https://openalex.org/W2795098050","https://openalex.org/W2810098870","https://openalex.org/W3171760520","https://openalex.org/W4223934367","https://openalex.org/W4280511092","https://openalex.org/W4281712141","https://openalex.org/W4283753196","https://openalex.org/W4285158733","https://openalex.org/W4312846492","https://openalex.org/W4319993269","https://openalex.org/W4376527567","https://openalex.org/W4381735280","https://openalex.org/W4383213769","https://openalex.org/W4386754812","https://openalex.org/W4387500191","https://openalex.org/W4387638723","https://openalex.org/W4389735570","https://openalex.org/W4390495463","https://openalex.org/W4392376126","https://openalex.org/W4392696497","https://openalex.org/W4394890934","https://openalex.org/W4396685144","https://openalex.org/W4401192021","https://openalex.org/W4402419782","https://openalex.org/W4406850839"],"related_works":["https://openalex.org/W7127634710","https://openalex.org/W2991577551","https://openalex.org/W2810245545","https://openalex.org/W1898686515","https://openalex.org/W4406110434","https://openalex.org/W4384284277","https://openalex.org/W2990813845","https://openalex.org/W4404997315","https://openalex.org/W4200144638","https://openalex.org/W3042255677"],"abstract_inverted_index":{"Due":[0],"to":[1,20,122,187],"the":[2,12,21,40,88,96,127,139,175],"difficulty":[3],"of":[4,14,23,54,129,164],"real-time":[5,48],"monitoring,":[6],"frequent":[7],"turn-to-turn":[8],"short-circuit":[9],"faults":[10],"in":[11,148,154],"windings":[13],"dry-type":[15],"reactors":[16],"pose":[17],"serious":[18],"problems":[19],"dependability":[22],"power":[24],"distribution.":[25],"To":[26],"address":[27],"this":[28,30],"issue,":[29],"study":[31],"proposes":[32],"a":[33,149,155,162,184],"novel":[34],"fault":[35,49],"identification":[36],"method":[37,177],"based":[38],"on":[39,62],"phase":[41,81,89,140],"angle":[42,82,90,141],"difference":[43,91,142],"variation":[44,64,92],"rate":[45,93],"(\u03b7),":[46],"enabling":[47],"detection":[50],"and":[51,80,99,110,117,124,160],"early":[52],"warning":[53],"insulation":[55,74,108,131,146,167,181],"degradation.":[56],"A":[57],"systematic":[58],"investigation":[59],"was":[60],"conducted":[61],"parameter":[63],"characteristics":[65],"during":[66],"single-turn":[67],"short-circuits":[68],"at":[69,114],"different":[70],"winding":[71,78],"locations.":[72],"Simulating":[73],"deterioration":[75],"reveals":[76],"evolving":[77],"currents":[79],"differences.":[83],"The":[84,144],"results":[85],"demonstrate":[86],"that":[87,174],"(\u03b7)":[94],"exhibits":[95],"most":[97],"pronounced":[98],"detectable":[100],"changes":[101],"among":[102],"all":[103],"parameters.":[104],"Critical":[105],"thresholds":[106],"for":[107],"degradation":[109,132,156],"breakdown":[111],"were":[112],"identified":[113],"100":[115],"m\u03a9":[116],"10":[118],"m\u03a9,":[119],"respectively.":[120],"According":[121],"simulation":[123],"experimental":[125],"results,":[126],"degree":[128],"inter-turn":[130,145,166,180],"can":[133],"be":[134],"precisely":[135],"determined":[136],"by":[137],"tracking":[138],"rate.":[143],"is":[147],"normal":[150],"state":[151],"when":[152,158,169],"\u03b7\u226430%,":[153],"stage":[157],"30%<\u03b7<75%,":[159],"as":[161],"sign":[163],"an":[165],"failure":[168],"\u03b7\u226575%.":[170],"Experimental":[171],"verification":[172],"confirms":[173],"proposed":[176],"effectively":[178],"diagnoses":[179],"status,":[182],"providing":[183],"practical":[185],"solution":[186],"enhance":[188],"distribution":[189],"network":[190],"reliability.":[191]},"counts_by_year":[],"updated_date":"2026-10-28T10:33:24.094632","created_date":"2026-01-17T00:00:00"}